ADVANCED VLSI CHAP8-5

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Topics

    Testability and architecture. Design methodologies. Multiprocessor system-on-chip.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Architecture testing

    Want to make system as testable as possible with minimum cost in hardware,testing time.

    Can use knowledge of architecture to helpchoose testability points.

    May want to modify architecture toimprove testability.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Some scan latches are moreuseful than others

    Acyclic register-transfer graphs are easy totest.

    Register-transfers with feedback are harder to test state becomes contaminatedduring test.

    When choosing partial scan registers,choose feedback paths first.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Identifying partial scanopportunities

    Construct register graph, which showsconnections between registers:

    nodes are registers; edge between two nodes if there is a

    combinational path between them.

    Sequential depth is distance from primaryinput to a node.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Analyzing register graphs

    High sequential depth implies that theregister is harder to test.

    Registers contained register-graph cycles(FF2-FF3) are hard to test (although self-loops are not hard).

    Add partial scan registers to effectivelyreduce sequential depth of node and itsneighbors.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Built-in self test (BIST)

    Includes on-chip machine responsible for: generating tests;

    evaluating correctness of tests. Allows many tests to be applied. Cant afford large memory for test

    results rely on compression andstatistical analysis.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Generating vectors

    Use a linear-feedback shift register to generatea pseudo-random sequence of bit vectors:

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    BIST architecutre

    One LFSR to generates test sequence. Another LFSR captures/compresses

    results. Can store a small number of signatures

    which contain expected compressed resultfor valid system.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Design methodologies

    Every company has its own designmethodology.

    Methodology depends on: size of chip; design time constraints;

    cost/performance; available tools.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Generic design flow

    architecturalsimulation

    floorplan

    register-transfer design

    logicdesign

    circuitdesignlayout

    functional/ performance

    verification

    testability

    detailed

    specs

    tapeout

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    Specification and planning

    Driven by contradictory impulses: customer-centric concerns about cost,

    performance, etc.; forecasts of feasibility of cost and performance.

    Features, performance, power, etc. may be

    negotiated at early stages; negotiation atlater stages creates problems.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Estimation and planning

    Estimation techniques vary with module: memories may be generated once size is

    known; data paths may be estimated from previous

    design;

    controllers are hard to estimate without details. Estimates must include speed, area, power.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Floorplanning and budgeting

    The purpose of early floorplanning is toestablish budgets for each major

    component: area, delay, power, etc. The project leader must ensure that

    budgets are met at all times. If it becomes

    clear that meeting a budget for acomponent is impossible, the floorplanmust be redone ASAP.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Logic design

    For controllers, good state assignment isusually requires CAD tools.

    Logic synthesis is an option: very good for non-critical logic; can work well for speed-critical logic.

    Logic synthesis system may be sensitive tochanges in the input specification.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Circuit/layout design

    Tasks: size transistors;

    draw layout. Alternative design styles:

    full custom logic (very tedious);

    standard cell. Full custom most likely for datapaths, least

    likely for random logic off critical path.

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    Design validation

    Must verify: layout (design rule check = DRC);

    circuit performance; clock distribution; functionality;

    power consumption / power bussing.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Testing

    Automatic test pattern generation = ATPG. Must verify that circuit can be tested,

    generate a compact set of manufacturingtest vectors.

    Test vectors often comprised of vectorstaken from simulation + ATPG-generatedvectors.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Tapeout

    Tapeout: generating final files for masks.Shipped to mask-making house.

    Pre-tapeout verification is importancesince it will take months to get results fromfab.

    Tapeout party follows. Size of partydepends on importance of chip design

    project.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Multiprocessor systems-on-chips

    System-on-chip is a complete integratedsystem.

    MPSoC has more than one processingelement:

    CPU.

    DSP. Hardwired accelerator.

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    Modern VLSI Design 4e: Chapter 8 Copyright 2008 Wayne Wolf

    Styles of MPSoC

    Homogeneous, as in multicore. Heterogeneous:

    Several different types of processing elements. Non-uniform memory system, with different

    PEs accessing different parts of memory.

    Non-uniform interconnect structure.

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    MPSoCs and IP

    MPSoCs require a lot of IP: Processing elements.

    Memories. Networks-on-chip. I/O devices.

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