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7/28/2019 ADVANCED VLSI CHAP3-2
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Topics
Electrical properties of static combinational
gates:
transfer characteristics;
delay;
power.
Effects of parasitics on gate.
Driving large loads.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Logic levels
Solid logic 0/1 defined by VSS/VDD.
Inner bounds of logic values VL/VH are not
directly determined by circuit properties, as
in some other logic families.
logic 1
logic 0
unknown
VDD
VSS
VH
VL
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Logic level matching
Levels at output of one gate must be
sufficient to drive next gate.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Transfer characteristics
Transfer curve shows static input/output
relationshiphold input voltage, measure
output voltage.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Inverter transfer curve
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Logic thresholds
Choose threshold voltages at points where
slope of transfer curve = -1.
Inverter has a high gain between VIL and
VIH points, low gain at outer regions of
transfer curve.
Note that logic 0 and 1 regions are not equalsizedin this case, high pullup resistance
leads to smaller logic 1 range.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Noise margin
Noise margin = voltage difference between
output of one gate and input of next. Noise
must exceed noise margin to make secondgate produce wrong output.
In static gates, t= voltages are VDD and
VSS, so noise margins are VDD-VIH and VIL-VSS.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Delay
Assume ideal input (step), RC load.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Delay assumptions
Assume that only one transistor is on at a
time. This gives two cases:
rise time, pullup on;
fall time, pullup off.
Assume resistor model for transistor.
Ignores saturation region andmischaracterizes linear region, but results
are acceptable.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Current through transistor
Transistor starts in saturation region, then
moves to linear region.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Capacitive load
Most capacitance
comes from the next
gate. Load is measured or
analyzed by Spice.
Cl: load presented by
one minimum-size
transistor.
CL = S (W/L)i Cl
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Resistive model for transistor
Average V/I at two voltages:
maximum output voltage
middle of linear region
Voltage is Vds, current is given Id at that
drain voltage. Step input means that Vgs =
VDD always.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Resistive approximation
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Ways of measuring gate delay
Delay: time required for gates output to
reach 50% of final value.
Transition time: time required for gatesoutput to reach 10% (logic 0) or 90% (logic
1) of final value.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Inverter delay circuit
Load is resistor + capacitor, driver is
resistor.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Inverter delay with t model
t model: gate delay based on RC time
constant t.
Vout(t) = VDD exp{-t/(Rn+RL)/ CL}
tf= 2.2 R CL
For pullup time, use pullup resistance.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
t model inverter delay
0.5 micron process:
Rn = 6.47 kW
Cl = 0.89 fF
CL = 1.78 fF
So
td = 0.69 x 6.47E3 x 1.78E-15 = 7.8 ps.
tf= 2.2 x 6.47E3 x 1.78E-15 = 26.4 ps.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Quality of RC approximation
li f i
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Quality of step input
approximation
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Power consumption analysis
Almost all power consumption comes from
switching behavior.
Static power dissipation comes fromleakage currents.
Surprising result: power consumption is
independent of the sizes of the pullups andpulldowns.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Other models
Current source model (used in power/delay
studies):
tf= CL (VDD-VSS)/Id
= CL (VDD-VSS)/0.5 k (W/L) (VDD-VSS -Vt)2
Fitted model: fit curve to measured circuit
characteristics.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Body effect and gates
Difference between source and substrate
voltages causes body effect.
Source for gates in middle of network maynot equal substrate:
0
0Source above VSS
B d ff d i
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Body effect and gate input
ordering
To minimize body effect, put early arriving
signals at transistors closest to power
supply:
Early arriving signal
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Power consumption circuit
Input is square wave.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Power consumption
A single cycle requires one charge and one
discharge of capacitor: E = CL(VDD - VSS)2 .
Clock frequency f = 1/t.
Energy E = CL(VDD - VSS)2.
Power = E x f = f CL(VDD - VSS)2.
Ob ti
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Observations on power
consumption
Resistance of pullup/pulldown drops out of
energy calculation.
Power consumption depends on operatingfrequency.
Slower-running circuits use less power (but not
less energy to perform the same computation).
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Speed-power product
Also known aspower-delay product.
Helps measure quality of a logic family.
For static CMOS:
SP = P/f = CV2.
Static CMOS speed-power product is
independent of operating frequency.
Voltage scaling depends on this fact.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Parasitics and performance
b
a
c
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Effect of parasitics
a: Capacitance on power supply is not bad,
can be good in absence of inductance.
Resistance slows down static gates, maycause pseudo-nMOS circuits to fail.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Effects of parasitics, contd
b: Increasing capacitance/resistance reduces
input slope.
c: Similar to parasitics atb, but resistancenear source is more damaging, since it must
charge more capacitance.
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Cascaded driver circuit
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Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf
Optimal sizing
Use a chain of inverters, each stage has
transistors a larger than previous stage.
Minimize total delay through driver chain:ttot = n(Cbig/Cg)
1/n tmin.
Optimal number of stages:
nopt = ln(Cbig/Cg).
Driver sizes are exponentially tapered with
size ratio a.