ADVANCED VLSI CHAP3-2

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    Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf

    Topics

    Electrical properties of static combinational

    gates:

    transfer characteristics;

    delay;

    power.

    Effects of parasitics on gate.

    Driving large loads.

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    Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf

    Logic levels

    Solid logic 0/1 defined by VSS/VDD.

    Inner bounds of logic values VL/VH are not

    directly determined by circuit properties, as

    in some other logic families.

    logic 1

    logic 0

    unknown

    VDD

    VSS

    VH

    VL

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    Logic level matching

    Levels at output of one gate must be

    sufficient to drive next gate.

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    Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf

    Transfer characteristics

    Transfer curve shows static input/output

    relationshiphold input voltage, measure

    output voltage.

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    Inverter transfer curve

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    Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf

    Logic thresholds

    Choose threshold voltages at points where

    slope of transfer curve = -1.

    Inverter has a high gain between VIL and

    VIH points, low gain at outer regions of

    transfer curve.

    Note that logic 0 and 1 regions are not equalsizedin this case, high pullup resistance

    leads to smaller logic 1 range.

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    Noise margin

    Noise margin = voltage difference between

    output of one gate and input of next. Noise

    must exceed noise margin to make secondgate produce wrong output.

    In static gates, t= voltages are VDD and

    VSS, so noise margins are VDD-VIH and VIL-VSS.

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    Delay

    Assume ideal input (step), RC load.

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    Delay assumptions

    Assume that only one transistor is on at a

    time. This gives two cases:

    rise time, pullup on;

    fall time, pullup off.

    Assume resistor model for transistor.

    Ignores saturation region andmischaracterizes linear region, but results

    are acceptable.

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    Current through transistor

    Transistor starts in saturation region, then

    moves to linear region.

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    Modern VLSI Design 4e: Chapter 3 Copyright 2008 Wayne Wolf

    Capacitive load

    Most capacitance

    comes from the next

    gate. Load is measured or

    analyzed by Spice.

    Cl: load presented by

    one minimum-size

    transistor.

    CL = S (W/L)i Cl

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    Resistive model for transistor

    Average V/I at two voltages:

    maximum output voltage

    middle of linear region

    Voltage is Vds, current is given Id at that

    drain voltage. Step input means that Vgs =

    VDD always.

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    Resistive approximation

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    Ways of measuring gate delay

    Delay: time required for gates output to

    reach 50% of final value.

    Transition time: time required for gatesoutput to reach 10% (logic 0) or 90% (logic

    1) of final value.

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    Inverter delay circuit

    Load is resistor + capacitor, driver is

    resistor.

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    Inverter delay with t model

    t model: gate delay based on RC time

    constant t.

    Vout(t) = VDD exp{-t/(Rn+RL)/ CL}

    tf= 2.2 R CL

    For pullup time, use pullup resistance.

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    t model inverter delay

    0.5 micron process:

    Rn = 6.47 kW

    Cl = 0.89 fF

    CL = 1.78 fF

    So

    td = 0.69 x 6.47E3 x 1.78E-15 = 7.8 ps.

    tf= 2.2 x 6.47E3 x 1.78E-15 = 26.4 ps.

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    Quality of RC approximation

    li f i

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    Quality of step input

    approximation

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    Power consumption analysis

    Almost all power consumption comes from

    switching behavior.

    Static power dissipation comes fromleakage currents.

    Surprising result: power consumption is

    independent of the sizes of the pullups andpulldowns.

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    Other models

    Current source model (used in power/delay

    studies):

    tf= CL (VDD-VSS)/Id

    = CL (VDD-VSS)/0.5 k (W/L) (VDD-VSS -Vt)2

    Fitted model: fit curve to measured circuit

    characteristics.

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    Body effect and gates

    Difference between source and substrate

    voltages causes body effect.

    Source for gates in middle of network maynot equal substrate:

    0

    0Source above VSS

    B d ff d i

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    Body effect and gate input

    ordering

    To minimize body effect, put early arriving

    signals at transistors closest to power

    supply:

    Early arriving signal

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    Power consumption circuit

    Input is square wave.

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    Power consumption

    A single cycle requires one charge and one

    discharge of capacitor: E = CL(VDD - VSS)2 .

    Clock frequency f = 1/t.

    Energy E = CL(VDD - VSS)2.

    Power = E x f = f CL(VDD - VSS)2.

    Ob ti

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    Observations on power

    consumption

    Resistance of pullup/pulldown drops out of

    energy calculation.

    Power consumption depends on operatingfrequency.

    Slower-running circuits use less power (but not

    less energy to perform the same computation).

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    Speed-power product

    Also known aspower-delay product.

    Helps measure quality of a logic family.

    For static CMOS:

    SP = P/f = CV2.

    Static CMOS speed-power product is

    independent of operating frequency.

    Voltage scaling depends on this fact.

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    Parasitics and performance

    b

    a

    c

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    Effect of parasitics

    a: Capacitance on power supply is not bad,

    can be good in absence of inductance.

    Resistance slows down static gates, maycause pseudo-nMOS circuits to fail.

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    Effects of parasitics, contd

    b: Increasing capacitance/resistance reduces

    input slope.

    c: Similar to parasitics atb, but resistancenear source is more damaging, since it must

    charge more capacitance.

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    Cascaded driver circuit

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    Optimal sizing

    Use a chain of inverters, each stage has

    transistors a larger than previous stage.

    Minimize total delay through driver chain:ttot = n(Cbig/Cg)

    1/n tmin.

    Optimal number of stages:

    nopt = ln(Cbig/Cg).

    Driver sizes are exponentially tapered with

    size ratio a.