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Powering the c-Si Roadmap APPLIED HCT WAFERING SYSTEMS

APPLIED HCT WAFERING SYSTEMS

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Page 1: APPLIED HCT WAFERING SYSTEMS

Powering the c-Si Roadmap

APPLIED HCT WAFERING SYSTEMS

Page 2: APPLIED HCT WAFERING SYSTEMS

32

Silicon and wafering costs together represent over 50% of module cost. They must be reduced dramatically to meet industry cost reduction objectives.

The rapid expansion of solar energy is fueled by a relentless reduction in cost per watt. Because silicon and wafering represent over 50% of total module cost, advances in wafering technology are paramount. Applied HCT, the world leader in wafering technology, is accelerating the c-Si

Wire size has a major impact on silicon cost through kerf loss. Process optimization drives nearly 1/4 of total wafer cost, primarily through slicing yield, wire and slurry consumables and tool fixed costs. Process performance has direct impact on wafer slicing yield. Wafering process optimization is also critical to achieve even thinner wafers.

Achieving lowest overall wafering cost requires process optimization among multiple variables. Each reduction strategy has potential trade-offs. An integrated approach to process optimization using platform design flexibility, advanced consumables and process know-how is required for lowest total cost.

WAFERING COST

LOWEST TOTAL COST PER WAFER

PROCESS OPTIMIZATION CHALLENGE

DRIVINGDOWN

THE CHALLENGE

Slicing YieldYield has tremendous leverage in reducing wafering cost. Yield is affected by wafer surface quality (TTV, TV, saw marks) and wafers lost during the wafering process (wafer and wire breaks). Advances in net throughput, consumables and wire technology must be accomplished without sacrificing yield. Large load size and advanced wire handling, along with tight process control and sophisticated tool automation are key yield enablers.

Reduced Silicon UsageSilicon is still the largest single cost component of wafer cost. Ultra-thin wire capability is required to reduce kerf loss but it can come at the expense of productivity to keep slicing yield high. Balance of the trade-off depends largely on raw silicon market price which can fluctuate and so can optimal wire size. Thinner wafers lower the cost of Si per wafer but challenge kerf loss, yield and productivity. Careful process optimization is required to achieve the potential gain.

Consumables CostWire and slurry consumption drive consumables cost. Slurry recycling is a powerful way to lower slurry cost if slicing yield is not impacted. Wire breakage severely impacts consumables cost — process optimization is critical in keeping productivity high at the same time as maintaining low wire breakage rates. Advanced wire technologies, such as structured and diamond wire, promise to lower consumables cost per wafer while boosting productivity.

Net ThroughputAchieving high productivity or MW/Y from the system has a direct impact on fixed costs and return on invested capital. Both higher table speed and higher load size can boost productivity but careful balance with yield is required.

TargetCurrent

Mod

ule

Cos

t – $

/Wat

t

Modules

Cells

Poly and Wafer

$1.40

$1.20

$1.00

$0.80

$0.60

$0.40

$0.20

$0

Poly andWafer

Poly andWafer

Cells

Modules

Cells

Modules

roadmap with process solutions to attack all high leverage areas that reduce wafer cost. From advances in platform architecture that enhance productivity and performance, to accelerating new wire technology, Applied HCT is propelling the industry forward with unique wire saw innovation.

Silicon and wafering are >50% of module cost

Driving c-Si to below $1 per watt

Wafering influences nearly 2/3 of wafer costs

Wafering cost reduction strategies

MaterialYield(kerf)

Wafer Si Consumables

Capital CostsSlicing Yield

WaferingWafer Cost

Thinner Wire

Higher Table Speed

Lower Wire Speed

Recycled Slurry

Thinner Wafer

Increased Material Yield

Decreased Fixed and Wire Costs

Decreased Wire Cost

Decreased Slurry Cost

Decreased Si Wafer Cost

Reduced Productivityand Slicing Yield

Reduced Slicing Yield

Reduced Slicing Yield

Reduced Slicing Yield

Reduced Productivityand Material Yield

Page 3: APPLIED HCT WAFERING SYSTEMS

54

THE APPLIED HCT B5

B5 WAFERING TECHNoLoGyTHE FUNDAMENTAL ADVANTAGE OF LARGER LOAD SIZE

A wider process window delivers yield with higher productivity

B5 uniquely optimizes load and table speed for lowest total cost

With 2x the load potential of conventional competing systems, the B5 gives users a wider process window to tune load size and table speed for highest yield and productivity and as a result lowest wafer cost.

As load size increases above 1m, table speed is reduced to optimize performance and yield. However, the larger load size more than compensates, delivering higher overall productivity. At work here is the unique relationship linking productivity to table speed and load, P = ƒ (load size x table speed) and higher tool uptime with less frequent swaps of larger loads. By tuning load and table speed, users can maintain yield and rapidly increase productivity, for the lowest total cost.

Reference data collected by Applied HCT on a B5 with 120μm wire, 180μm wafer, 80% recycled slurry, with load size 0.85m, 1.1m and 1.73m.

BEST IN CLASS YIELD INDUSTRY’S HIGHEST PRODUCTIVITY LOWEST TOTAL COST

• The benchmark in process performance

• Industry leading throughput and lowest total cost

• Designed for high availability in volume manufacturing

• Proven thin wire capability down to 120μm and below

• Robust platform extendable to advanced wire technologies

Load Length

Tabl

e Sp

eed

1mLoad Tool

2mLoad Tool

Productivity = ƒ (load size x table speed)

Flexible loading up to 2m

The unique 4 position architecture has the capacity for up to 2m in total load, easily configurable to provide a high degree of flexibility to meet industry roadmaps at high yield with major advances in productivity.

B5 2m Load LengthConventional 1m Load Length

1m 1.25m 1.5m 1.75m 2m

Load Length

0.6

400

350

300

250

200

150

Optimized table speed

Minimum table speed

0.8 1.0 1.2 1.4

Load in Meters

Tabl

e Sp

eed

in µ

m/m

in

1.6 1.8 2.0

9.5

9.0

8.5

8.0

7.5

7.0

0.5 1.0

Load in Meters

Prod

uctiv

ity in

MW

/Y

1.5 2.0

0.5 1.0

Load in Meters

Tota

l CoO

in $

/waf

er

1.5 2.0

0.6

100%

99%

98%

97%1.0 1.4

Load in Meters

Table Speed Productivity in MW/Y

Process Yield Wafer Total Cost

Slic

ing

Yie

ld %

1.8

Page 4: APPLIED HCT WAFERING SYSTEMS

76

THE DIFFERENCE

BEST IN CLASS YIELD 98% yield with >15% more productivityData collected at Applied HCT Cheseaux R&D Center: 120µm Wire, 180µm Wafer and 80% Recycled Slurry

INDUSTRY’S HIGHEST NET THROUGHPUT AND LOWEST TOTAL COST

Total wafer cost savings combined with higher productivity results in a powerful cash flow generation per tool advantage for wafer manufacturers. The B5 advantage results in a 20% higher net cash flow generation.

A wider B5 process window enables high yield with greater productivity. Comparison of process data for runs at 0.85m, 1.1m and 1.73m loads shows virtually identical process yields >98% at industry leading 30µm TTV, 20µm TV and 20µm saw marks limit while productivity increases by nearly 25%.

As part of the 20% productivity advantage of larger load, lies a lower system downtime advantage due to less frequent swaps of larger loads.

Both load sizes demonstrate best in class performance TV yield >98% at <20µm limit.

Total wafer cost modeling comparison at 120µm wire size and 180µm wafer size shows as much as a 3¢/wafer total CoO advantage between a 7.9MW/Y 0.95m load conventional tool and a 9.2MW/Y 1.73m load B5.

Both load sizes demonstrate best in class performance saw marks yield >98% at <20µm limit, with a 13µm average.

At industry leading 120µm wire size and 180µm wafer thickness, the B5 load advantage delivers >15% higher productivity per system when compared with conventional 1m load tools. When combined with the B5 25% footprint advantage over these same tools, the productivity advantage for a given factory size approaches 50% more wafers per year.

Both load sizes demonstrate best in class performance TTV yield >98% at <30µm limit, with a 15µm average.

20% GREATER CASH FLoW/TooLyIELD LoAD SIZE CoMPARISoN

30% LoWER SySTEM DoWNTIMETV LoAD SIZE CoMPARISoN

3¢ LoWER CoST/WAFERSAW MARKS LoAD SIZE CoMPARISoN

TTV LoAD SIZE CoMPARISoN

Productivity is driven by larger load size

High availability through reduced loading frequency

100

90

80

70

60

50

40

30

20

10

0

TTV<30μmPos A1.41%

TT

V μ

m

TTV<30μmPos D0.86%

100

90

80

70

60

50

40

30

20

10

0

TTV<30μmPos A1.54%

TTV Average

TTV<30μmPos B1.46%

TTV<30μmPos C1.06%

TTV<30μmPos D1.21%

TT

V μ

m

TTV LimitTTV Average

0.85m Load, 7.4MW/Y 1.73m Load, 9.2MW/Y

TTV Limit

50

45

40

35

30

25

20

15

10

5

0

SM<20μmPos A0.66%

Saw

Mar

ks μ

m

SM<20μmPos D0.67%

50

45

40

35

30

25

20

15

10

5

0

SM<20μmPos A1.54%

TTV Average

SM<20μmPos B1.71%

SM<20μmPos C0.59%

SM<20μmPos D0.51%

Saw

Mar

ks μ

m

TTV LimitTTV Average

0.85m Load, 7.4MW/Y 1.73m Load, 9.2MW/Y

TTV Limit

230

220

210

200

190

180

170

160

150

140

130

TV±20μmPos A0.50%

Thic

knes

s μm

TV±20μmPos D0.57%

230

220

210

200

190

180

170

160

150

140

130

TV±20μmPos A0.83%

TTV Average

TV±20μmPos B

2.20%

TV±20μmPos C

0.94%

TV±20μmPos D0.81%

Thic

knes

s μm

TTV LimitTTV Average

0.85m Load, 7.4MW/Y 1.73m Load, 9.2MW/Y

TTV Limit

0.85m, 7.4MW/Y

Limits: 30μm TTV, 20μm TV, 20μm Saw Marks

1.1m, 8.6MW/Y 1.73m, 9.2MW/Y

100%

99%

98%

97%

96%

95%

94%

93%

92%

91%

90%

0.95m Load, 7.9MW/Y 1.73m Load, 9.2MW/Y

2.21

2.20

2.19

2.18

2.17

2.16

Tota

l CoO

in $

/Waf

er

0.95m Load7.9MW/Y

1.73m Load9.2MW/Y

0.95m Load7.9MW/Y

Discounted Cash Flow (10%)Net Cash Flow

1.73m Load9.2MW/Y

12

10

8

6

4

2

0

5 Ye

ar N

et C

ash

Flow

Per

Too

l in

$M

0.95mConventional

1.73mOptimized

9.5

9

8.5

8

7.5

7

1.00

0.90

0.80

0.70

0.60

0.50

0.40

0.30

0.20

0.10

0.00

0.95mConventional

MW

/Y P

er T

ool P

er m

2 of F

acto

ry

MW

/Y P

er T

ool

1.73mOptimized

0.95m Load, 7.9MW/Y

1.73m Load, 9.2MW/Y

Load SwapDowntime

>15% MoRE MW/y PER TooL

Page 5: APPLIED HCT WAFERING SYSTEMS

98

DESIGNED FOR HIGH AVAILABILITY IN VOLUME MANUFACTURING

PROVEN THIN WIRE CAPABILITY DOWN TO 120μm AND BELOW

Flexible load sizeFlexible 2m maximum load size, in 0.25m increments, lets factories adjust capacity and achieve the highest yield and productivity.

Reduced downtime for slurry changeThe B5 design provides for simple, rapid change of slurry canisters, with the option for automatic slurry refill.

Greater process reproducibilityInterface to Applied’s E3 process automation software enables real-time data logging, fault detection and function control.

Minimal downtime for breakageEarly-warning wire wear detection alerts operators before wire failure, minimizing yield loss and downtime.

Reduced footprintWith 25% smaller footprint than competing tools, the B5 produces 50% more MW annually for a given factory size.

Minimal wire breakageAdvanced wire management continuously controls acceleration, tension and alignment angle for low breakage and consistent cut.

PRoVEN PERFoRMANCE

Low inertia wire managementA proprietary low-inertia design carefully controls wire vibration and strain at the wafer level and reduces tension in transition periods.

Controlled acceleration and deceleration algorithmsThe B5 system’s control software continuously manages wire acceleration/deceleration to reduce the potential for wire breakage.

Continuously adjustable wire trackingContinuous wire position tracking at the feeding spool ensures optimum alignment during unwinding, avoiding unwanted tension and wire breakage risk.

B5 design optimized for thin wire performance

Existing installed B5 tools can be easily upgraded to

thin wire capability with a thin wire retrofit kit. Local

process application consultation can assist customers

to achieve optimal process performance and

productivity with the B5 platform.

Minimal downtime for wire changeThe B5’s unique conical take-up spool and expandable shaft feeding spool enable fast wire change in a production environment.

Thin wire capability is essential to reduce kerf loss.

With Applied HCT’s system engineering approach,

the proven B5 system has been designed for optimum

performance with thin wire technology, providing

high yield with industry leading productivity. With

over 500 systems in production with thin wire

capability, the B5 is the clear leader in bringing thin

wire to volume manufacturing.

The experience from more than 1000 systems in volume production.

Page 6: APPLIED HCT WAFERING SYSTEMS

1110

Current: Loose Abrasive

Future: Fixed Abrasive

Direction of wire

Direction of wire

Straight Wire

Structured Wire

Slurry motion

STRUCTURED WIRE DIAMoND WIREBenefits•Efficient slurry transport

•Faster cut rate

•Cooler slicing process

• Expected better surface quality and TTV

Challenges•~1% increase in kerf loss

•Lower wire breaking load

•Some wire price increase

Benefits•Water based coolant, no slurry

•Dramatic improvement in cut rate

•Reduced energy consumption

•Expected lower sub-surface damage

Challenges•Quality of diamond wire

•Wire price and consumption

•Wire damage/breakage risk

• Coolant formulation, distribution and price

•Mono vs. multi dependence

WIRE RoADMAP

Advanced wire technology promises to improve cut performance, increase productivity and substantially reduce slurry costs. However, implementation is a significant challenge: hardware, consumables and process must be fully optimized for yield, high productivity and low cost. Applied Materials has an aggressive roadmap to deliver the new wire technologies as they become proven

STRUCTURED WIRE: AN EXCLUSIVE TECHNoLoGy FRoM APPLIED HCT

Applied HCT is pioneering structured wire to

deliver an immediate performance and productivity

advantage to wafering. In parallel, our engineers

continue development of reliable, cost-effective

diamond wire technology.

EVoLUTIoNARy REVoLUTIoNARyStructured wire is the industry-proven solution for squaring, which can be rapidly implemented as a low-risk approach on current or new B5 wafering systems. The enhanced cut rate and efficient slurry utilization enhances productivity.

Diamond wire is currently being optimized in both cropping and squaring applications to ensure robust release for wafering applications, expected in 2012. This staged approach reduces risks associated with implementation of diamond wire technology.

ROBUST PLATFORM EXTENDABLE TO ADVANCED WIRE TECHNOLOGIES

Dual wire technology roadmap

2010 2011 2012

Standard wire CoO

Thin structured wire CoO

Thin structured wire productivity

Diamond wire CoO

Diamond wire productivity

Standard wire productivity

Increased by

10–20%

Reduced by

0–5% Reduced by

5–10%

Increased by

100–200%

Structured Wire

Diamond Wire

Proven B5 platform reduces risk

robust for manufacturing with lower overall cost. As part of this commitment to excellence, Applied has ongoing development partnerships with both wire and slurry manufacturers to optimize performance, reduce cost and ensure multiple sources of supply. Collaborations with leading customers are helping to accelerate learning in volume manufacturing.

Page 7: APPLIED HCT WAFERING SYSTEMS

1312

Meeting customers’ cost and productivity challenges requires high-output wafering hardware, process control software, plus advanced wire technology and slurry management. Applied Materials’ has the engineering depth, financial strength and industry experience to meet these technology challenges and deliver innovation at all levels.

CoMPLETE SoLUTIoN

AUTOMATION SOFTWARE

APPLIED GLOBAL SERVICES

CROPPER

E3 AUTOMATION

SQUARER B5

SMARTFACTORY

The Applied HCT Cropper cuts the tops and tails from crystalline silicon ingots at a high load capacity. It offers the same low kerf loss, high throughput and high reliability as the Applied HCT Squarers.

The Applied HCT Squarer is capable of squaring both mono and multi-crystalline silicon ingots with productivity of up to 80MW per year and low kerf loss (0.30–0.35μm wire). The system is upgradable to both diamond and thick structured wire.

The Applied HCT B5 wafering system cuts both monocrystalline and multi-crystalline silicon stock into ultra-thin wafers. The system provides best in class process yield with the industry’s highest productivity, and is a proven platform for advanced wire technologies.

The Applied Materials E3 equipment diagnostics platform connects to any solar tool, providing pre-integrated MES connectivity specifically designed for c-Si manufacturing. For example, the E3 SPC component automatically detects product quality variations, providing control charts, automatic notification and a corrective action plan to factory operators.

SmartFactory is a scalable, affordable factory automation solution that improves tool utilization and increases throughput. By tracking work-in-progress (WIP) within a factory, SmartFactory assures high factory productivity.

Applied Global Services has the solar industry’s largest team of highly trained support experts and provides spare parts, parts refurbishment and system upgrades, all designed to help you get the most out of your tools.

Ingot production

Squaring Cropping Wafering Grinding & Chamfer

Clean Metrology

A FULL RANGE OF SOLUTIONS FOR CRITICAL WAFERING STEPS

Page 8: APPLIED HCT WAFERING SYSTEMS

1514

REDUCING THE TIME, CoST AND RISK FoR CUSToMERS•Advancedwaferingequipmentdevelopment•Processresearchandoptimization•Wiretechnologydevelopmentandperformancevalidation•Waferperformancevalidationonfullcellline•Applicationdevelopmentforcustomerspecificsolutions

STATE OF THE ART R&D TECHNoLoGy CAPABILITy

R&D LEADERSHIP

Wafering Apps and Cell Manufacturing Lab Xi’an ChinaProcess validation on wider data sets

Hardware reliability testing

Performance validation on cell line

Customer demos and training

Wafering Center of ExcellenceCheseaux, Switzerland New product and process development

Development and demonstration of advanced wire sawing processes

Customer demos and training

Engineering fast turn design for

manufacturability

R&D Lab for performance

validation

Manufacturing proximity to

engineering for fast cycles of learning

SWISS DESIGN, ACCELERATED LEARNING

APPLIED MATERIALS + HCT

First wire saw produced in 1984

First wire saw for 300mm wafers

First to develop wire saw for ingot squaring

First to use wire saws for ingot cropping

First to use wire saws for cutting multiple ingots

First to offer 2m load potential

First to cut 120µm thin wafers in volume production

First to cut Jumbo (Gen 5) ingot in less than three hours

First to introduce structured wire technology

MARKET AND TECHNoLoGy LEADERSHIP

OF LEADERSHIP IN WIRE SAW TECHNOLOGY

OVER 25 YEARS

Born of Swiss precision engineering

combined with Applied Materials volume

production experience.

Over 2000 systems in volume

manufacturing worldwide.

Market leader for wafering systems.

Track record of system reliability and

manufacturing productivity.

Backed by the global service, supply chain, process expertise and factory

automation capability of Applied Materials.

From the #1 producer of solar and

semiconductor processing equipment.

Page 9: APPLIED HCT WAFERING SYSTEMS

Applied Materials3050 Bowers AvenueP.O. Box 58039Santa Clara, CA 95054-3299U.S.A.Tel: +1-408-727-5555

Applied Materials Route de Genève 421033 CheseauxSwitzerlandTel: 41 21 731 9100Fax: 41 21 731 9101

[email protected]

www.appliedmaterials.com/technologies/solar

© Applied Materials, Inc. 2011. Applied Materials, the Applied Materials logo, and other trademarks so designated or otherwise indicated as product names or services, are trademarks of Applied Materials, Inc. in the U.S. and other countries. All rights reserved. April 2011.