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Christophe Chevallier
Workshop on Data-Abundant System Technology April 22-23, 2014
© 2014 Christophe Chevallier1
What is Resistive RAM?
Comparison to other emerging technology
Comparison to existing technologies
Applications
Development status
© 2014 Christophe Chevallier 2
Stack
Model
Properties
© 2014 Christophe Chevallier
Bottom E.
MetalOxide
Top Electrode
Bottom E.
MetalOxide
Top Electrode
Initial Structure “Formed” Structure
Programmed Erased
read
Bottom E.
MetalOxide
Top Electrode
Bottom E.
MetalOxide
Top Electrode
3
1D –1R1T –1R
2 terminal device
◦ Can be stacked for density
Known materials
◦ Ease of Fab integration
BEOL – Back End Of Line fabrication
◦ No impact on existing standard cell
libraries
◦ Easier integration
Bit writable – bit erasable
◦ Faster system through-put
Low Voltage operation low power
© 2014 Christophe Chevallier
Bottom E.
MetalOxide
Top Electrode
L0
L1
L2
L3
4
Many structures and
materials
The most studied
approach is ReRAM,
with binary oxide
Cell type: ReRAM CBRAM Tunnel RRAM
principle filament filamentInterfacial switching
Write / read current
high High Low
Forming yes yes no
Voltage ~3.5V 1V ~2.5V
materialsBinary Oxide
Ag, Cu Filament
in electrolyte
Perovskite + tunnel oxide
reliability Better data retentionmedium
data retention
Best applications
Embedded / fastaccess
Ultra Low power
High density
Who wins? It depends on the
application
© 2014 Christophe Chevallier 5
45nm node PCM(Phase Change)
STT-MRAM(Spin Torque Transfer)
RRAM(Resistive / Redox)
CNT RAM(Carbon Nanotube)
Materials
Write Energy 4 pJ 1 pJ 1 pJ <1 pJ
Write Time 10 ns 5 ns 10 ns 3 ns
Endurance 108 1010 106 1012
Retention 10 yrs, 85oC 10 yrs, 85oC 10 yrs, 85oC 1000 yrs, 85oC
Production
status
Gb level 64 Mb 1 Mb,Limited production
One source only,
Not in production
RRAM: fab-friendly materials, and good specs – a lot of developments © 2014 Christophe Chevallier
electrode
CNT mesh
electrode
6
What is Resistive RAM?
Comparison to other emerging technology
Comparison to existing technologies
Applications◦ Impact on storage appliance
Development status
© 2014 Christophe Chevallier 7
L1, SRAM
Archive: Tape, Non Volatile, s
Flash:Non-Volatile, μs
DRAMVolatile, 10s ns
L2/L3 Cache, ns
Disk:Non-Volatile, ms
DRAMVolatile, 10s ns
Archive: Tape, Disk
L1SRAM
Storage Class Memory: Non-Volatile, 10s ns
L2/L3 Cache, ns
© 2014 Christophe Chevallier 8
Latency
density
Cost/bit
RRAM could replace DRAM and Flash. RRAM could provide a fast latency ( < 1 us), high density solution.
application EmbeddeduC code, exec.NOR-like
RAM-likeCached data
NAND-likestorage
FPGA Logic (D-FlipFlopreplacement)
Best in class e-Flash, OTP fuses
DRAM, PCM, MRAM?
NAND SRAM (MRAM)
Read access < 50 ns < 20ns 25 us latency
ns ns
Endurancerequirement
10 typ. / 104 106 to 108 104 100 1012
Data retention
10 years at 85C/125C
30 days at 55C
1 year at 70C
10 years at 85C
Seconds to years
RRAM today? Difficult for the automotive spec
Stretchesendurance, possible
Yield of large density chip unproven, possible
Possible Endurance is too low, Algorithm hard to implement
© 2014 Christophe Chevallier 9
Cache replacement
8MB of MRAM hard drive
cache
Fast read and write access
Buffalo SSD (MRAM / NAND)
Skyera / Everspin
Techon 5/21/2012
RRAM advantage: small cell sizeFast write speedLower power (NVM, no refresh)
© 2014 Christophe Chevallier 10
NAND
RRAM,PCM,MRAM
• USB key, cards– Endurance: 100 typ.
– Data Retention: months, at 70C
– Temperature: room
– Reliability: low
• Mobile Storage (phones, tablets) Endurance: 104
Data Retention: months at 85C
• SSD Endurance: 104
– Data Retention: years at 85C
– Temperature: 0 -70C
– Reliability: high
• Data Center• DRAM / Drive replacement
• Cache for hard drives
– Endurance: high
– Data Retention: days at 55C
– Temperature: controlled
– Reliability: high
– Fast power-up
PerformanceReliability
Low Cost
RRAM advantage: • endurance• fast write speed • byte erasable• low power
© 2014 Christophe Chevallier 11
Comparing ReRAM to NAND.
Technological Basis for advantages
Power: Low Voltage, small arrays (low C)
Speed (latency): small array (low RC)
Cost: lower mask count (no HV devices, no Floating
Gate)
Endurance / Retention: “more electrons”, different
technology. Not proven in high density or compared to
3D-NAND
© 2014 Christophe Chevallier 12
NAND RRAM
3D
NANDRRAM
What is Resistive RAM?
Comparison to other emerging technology
Comparison to existing technologies
Applications◦ Impact on storage appliance
Development status
© 2014 Christophe Chevallier 13
© 2014 Christophe Chevallier
Bottom E.
MetalOxide
Top Electrode
Many levels of development:
Cell Chip SSD Storage Applicance Data Center Cloud /internet user
14
Function of an SSD controller
Read and write caching
Error-correcting code (ECC)
handling
Bad block mapping
Wear leveling
Read disturb management
Garbage collection
Encryption
Compression
© 2014 Christophe Chevallier
ReRAM advantages
small block, low latency
Same or worse (for now)
Much simpler
Still needed but better
Better or not needed
Much less frequent
Similar
Similar
15
Resistive RAM will greatly simplify memory management and improve system speed
Function of a data
center:
Persistence - ACID
transactions
De-duplication, …
Operations: search,
social media vs.
compute intensive
apps
© 2014 Christophe Chevallier 16
Resistive RAM will speed up processing with lower latency, faster random access operations. The proper architecture needs to be designed in.
Jichuang Chang, HP labs
© 2014 Christophe Chevallier
Power advantage: low
energy datapaths, co-
location of computing
and data storage
Strukov, PNAS 2009 ReRAM can be stacked up above and near the logic circuitry
Nano-Stores at HP-Labs
17
F. Alibart, CNRS, Lille, France© 2014 Christophe Chevallier
The crosspoint array is perfectly suited to massive parallel processing. Each ReRAM cell can be programmed to an analog weight.
18
What is Resistive RAM?
Comparison to other emerging technology
Comparison to existing technologies
Applications
Development status
© 2014 Christophe Chevallier 19
ISSCC 2012 -14 / IEDM 2011
NAND 128 Gb, in high volume production
PCM 8 Gb, small volume production
MRAM 64Mb, in production
RRAM 16Gb/32Gb test chips, 8Mb in pre-
production
16nm 128 Gb NAND
180 nm RRAM 8Mb macro
65 nm 64Mb MRAM
20nm 8Gb PCM
24nm, 32Gb RRAM (test chip)
27nm, 16Gb CBRAM(test chip)
© 2014 Christophe Chevallier 20
Embedded code and parameters storage◦ Existing implementations
Cache (1T - 1R)◦ Will replace DRAM, displace MRAM, PCM with lower
power, simpler fabrication
High Density (1D – 1R)◦ Will displace NAND with low latency, higher endurance,
and byte-level operations
© 2014 Christophe Chevallier
KB densitySensors(90 – 130 nm)
MB densityCache(40 – 130nm)
GB densityNAND displacement(20 – 45 nm)
2013
21
Resistive RAM can bring:
Low latency, low power and high density
Fast system speed – byte operability
Higher reliability than NAND Flash
With new data processing demands, new
architectures are required. Resistive RAM can
enable these architectures.
© 2014 Christophe Chevallier 22
Resistive RAM will displace NAND, not replace it. It will enable architectures optimized for data-focused applications.