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S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 1 S. Bhatnagar NRAO, Socorro Parametrization of the Measurement Equation

Parametrization of the Measurement Equation

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Page 1: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 1

– S. Bhatnagar– NRAO, Socorro

Parametrization of the Measurement Equation

Page 2: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 2

● Generic Measurement Equation:

Data Corruptions Sky

:direction independent corruptions.

:direction dependent (image plane) corruptions.

– Jij is multiplicative in the Fourier domain

– Js

ij is multiplicative in the Image domain only if Js

i = Js

j

V ijObs =J ij , t ∫ J ij

S S , , t I S eS.Bij d S

V ijObs=J ij W ij E ij V

o where E ij=F J ijs FT

J ij=J i⊗J j∗

J ijs=J i

s⊗J js∗

WF≡A : The Measurement Matrix

The Measurement Equation

Page 3: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 3

● Calibration: ➔ Keep sky fixed: ➔ VM = Data on a source with known structure (Primary Cal.)

● Imaging: A-1 does not exist. Non-linear inversion required

➔ Keep Jij fixed

➔ Final image:

● Self-Calibration: Treat Jij

and VM (or IM) as orthogonal

➔ Iteratively, but independently, improve Jij and VM

min :∣V ijObs−J ij .V ij

M∣2 w.r.t. J i

min :∣J ij−1 V ij

Obs−A I M∣2 w.r.t. I M

I=I M /PB

Generalized Data Reduction

Page 4: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 4

● Unknowns of the ME

– Sky: Position, Flux, scale– Frequency, polarization & time dependence

– Known effects– W-term, PB, dependence of PB on poln. and

frequency

– Unknown instrumental & atmospheric effects– Complex gains, poln. leakage (direction indep.)– Pointing, PB deformation, ionosphere

Parameters of the Measurement Equation

Page 5: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 5

● Parametrization of the ME in existing algorithms :

● More sophisticated parametrization required for imaging dynamic range (DR) >50dB

– Correct for PB effects, DD atmospheric effects– Scale sensitive image decomposition

V ijObs =J ij , t ∫ J ij

S S , , t I S eS.Bij d S

J ijS S , , t =PB : Indep. of  t , , S & i− j

I S=∑kP x k , yk: Pixel Basis

J ij , t =J i , t ⊗J j∗ , t : Direction indep.

Existing Parametrization

Page 6: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 6

● Use of pixel basis for image representation: deconvolution errors limit: DR ~ 104-105

● Single pointing L-Band observations limited due to pointing/PB asymmetries: ~DR ~ few X 105.

– Next generation telescopes hope to do >10x better

● Mosaicking dynamic range limited by pointing errors and azimuthally asymmetric PB/sidelobes.

● Frequency dependence of the sky & the instrument: DR ~ 104-105

Motivation

Page 7: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 7

● Decomposition of the sky in a more appropriate basis

➔ Frequency sensitive

● Efficient algorithms to correct for image plane effects

➔ Approximate inverse transform (Vis -> Image)

➔ Forward transform (accurate)

● Solvers for the “unknown” image plane effects

➔ As expensive as imaging!

● Larger computers! (More memory, CPU power, fast I/O)

➔ Parallel computing and I/O, GPU computing?

Pieces of the Puzzle

Page 8: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 8

● Pixel-to-pixel noise in the image is correlated

The scale of emission fundamentally separates signal (Io) from the noise (IN).

● Asp-Clean (Bhatnagar & Cornwell, A&A,2004)➔ Search for local scale, amplitude and position

I D=PI oPI N where P=Beam Matrix

Scale Sensitive Imaging: Asp-Clean

Page 9: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 9

● Solve the normal equation➔ Compute the approx. update direction: ➔ Update the model: (Minor Cycle)

(Steepest Descent minimization: Clean algorithm) ➔ Compute residuals: (Major Cycle)

● Transform implemented using FFT:➔ Forward transform: CA➔ Backward transform: [CA]-1=ATCT

● Approximate methods:➔ Accurate forward and approximate backward transform is sufficient

V M=C [ A I M ]

AT [V−A I ]=0I R=AT [V R]I i

M=T I i−1M , I R

Forward :V M=AI M

Backward :I R=[ AT A]−1 ATV R

General Structure of the Imaging Algorithms

Page 10: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 10

● Unknowns of the problem: Jij ,Js

ij, and IM.

● Js

i = Js

j and independent of time

Imaging and calibration as orthogonal operations

● Js

i (t) = Js

j (t) (Poln. squint, PB correction, etc.)

➔ Js

ij is multiplicative in the image plane for appropriate

I D∝ℜ [∑nJ sT

n∇ T ∑ij[V ij ∇ T eS.Bij]]

∇ T

(Cornwell,EVLA Memo 62)

Hierarchy of Algorithms

Page 11: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 11

● (Pointing offsets, PB variations, etc.)

➔ Image plane effects not known a-priori Pointing selfcal

➔ Correct for Js

ij during image deconvolution

W-Projection, PB-Projection

● Simultaneous solver for Jij ,Js

ij, and IM!!

J is t ≠J j

s t

(EVLA Memo 84)

(EVLA Memo 67) (EVLA Memo 100)

Hierarchy of Algorithms

Page 12: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 12

Measured direction dependent effects

● Eij as a function of direction is measured a-priori (nominal full

beam polarimetric imaging)

● Aperture Function: Ei

different for each poln. product pq and

baseline (pointing offsets correction)

Needs a solver: Pointing SelfCal

● Asymmetric Primary Beams:

Parameterize Eo

V ijM=E ij [ A I M ]ij where E ij ui ,u j ; pi , p j=Eo f pi , p j

Page 13: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 13

● Full Stokes imaging requires full Sky-Muller matrix

J ipS≡Antenna voltage patterns

J ipq S≡Polarization leakage

J ij S is not identity or even diagonal matrix for DR104

Full-beam Full-Stokes Imaging

Page 14: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 14

J03J

00

J00

-J11

Structure of the Sky-Muller Matrix

Page 15: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 15

Correction of DD effects during imaging

• A class of Direction Dependent effects can be corrected during imaging – The effect should be “band limited”– Incorporate DD but “band limited” effects in the operator C– The operator C should be unitary (or approximately so)

• Devise an approximate backward and accurate forward transform

• Forward transform:– Replace the operator C by:

• Backward transform:–

E ijP=E Po

f i− jei− j

V P , Gnu , mv=E ijPT

V P uij , vijnu , mvI d=det FT [EPT

]−1 FT V P , G

Page 16: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 16

Model for VLA antenna power patterns at L-band (modeling code courtesy W.Brisken)

Stokes-I Stokes-V

Power Patterns

Page 17: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 17

Real part of JiJT

i(0,1)

Imag. part of J

iJT

i(0,1)

Approximately Unitary Sky-Jones Matrix

Page 18: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 18

Stokes-I imaging with and without PB effects(Polarization squint, Pointing offsets, PB rotation)

RMS ~15µJy/beam RMS ~1µJy/beam

Simulations: Stokes-I

Page 19: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 19

Stokes-V imaging with and without PB effects(Polarization squint, Pointing offsets, PB rotation)

Simulations: Stokes-V

Page 20: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 20

VLA L-Band, C-array, Stokes-I

Page 21: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 21

VLA L-Band, C-array, Stokes-V

Page 22: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 22

Continuous lines: Typical antenna pointing offsets for VLA as a function of time (Mean between +/-25” and RMS of 5”).

Dashed lines: Residual pointing errors. RMS ~1”.

Model image using 59 sources from NVSS.Flux range ~2-200 mJy

Details in EVLA Memo 84 (2004)http://www.aoc.nrao.edu/evla/geninfo/memoseries/evlamemo84.pdf

Pointing correction

Page 23: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 23

● Stokes-I imaging: Before and after pointing correction

Pointing Selfcal

Page 24: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 24

● Stokes-V imaging: Need to use component imaging?

Pointing Selfcal

Page 25: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 25

Test for the solver using simulated data

Red: Simulated pointing offsets τ=60sec

Blue: Solutions τ=600sec

Pointing selfcal: Unit test

Page 26: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 26

● Code development time much longer➔ Complexity – code base

Partly unavoidable Improvements: Possible & Necessary Use of simpler UI (UNIX command-line, inp/set/save/go)

➢ Currently usable on real data (minus data selection)

➔ Complexity – algorithm Very difficult to predict (more difficult in evolving code-base) Can run into dead-ends

● Optimization and stability/robustness➔ From “working algorithm” to “usable implementation”➔ Stability/robustness/numerical testing: Time consuming & related to the

code-base complexity/stability/evolution.

Time lines: Development

Page 27: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 27

● Use aperture function / eliminate re-gridding [Done]● Write the imaging and solver code [Done]● SelfCal <-> imaging iterations [Testing]● Component image model (Asp-Clean + PB-Projection + W-

Projection) [Next!]

● Is current deep L-band imaging pointing-error limited? ● Mosaicking dynamic range limited by pointing errors?● Wide-band imaging

➔ Use PB-projection to correct for PB scaling ➔ MSF extensions: Freq. sensitive image plane modeling (Component

based imaging)

Progress so far

Page 28: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 28

● Significant increase in run-time due to more sophisticated parameterization

➔ Deconvolution: Fast transform (both ways) E.g. limits the use of MCMC approach

➔ Calibration: Fast prediction

● Cost of computing residual visibilities is dominated by I/O costs for large datasets (~500GB for EVLA)

➔ Deconvolution: Approx. 20 access of the entire dataset➔ Calibration: Each trial step in the search accesses the entire

dataset

● 10 -100 Gflops + multi Terabyte I/O load

Computing and I/O costs

Page 29: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 29

1. Hamaker, Bregman & Sault, 1996, A&AS, 117, 137

2. Cornwell, 1995, The Generic Interferometer: II Image Solvers, AIPS++ Note 184

3.Bhatnagar & Cornwell, 2004, Scale sensitive deconvolution of interferometric images, A&A, 426, 747-754, 2004 (astro-ph/0407225)

4.Cornwell, Golap & Bhatnagar, 2003, W-Projection: A new algorithm for non-coplanar baselines, Tech. rep., EVLA Memo 67

5.Brisken, 2003, Using Grasp8 To Study The VLA Beam, Tech. rep., EVLA Memo 58

6.Bhatnagar, Cornwell & Golap, 2004, Solving for the antenna based pointing errors, Tech. rep., EVLA Memo 84

7.Bhatnagar, Cornwell & Golap, 2006., Image plane corrections, EVLA Memo 100

http://www.aoc.nrao.edu/~sbhatnag/talks.html

References

Page 30: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 30

Maximumgain variationsat the location of the sidelobes

Numerical errors:Variations in the peak of the sidelobe.

Image re-griddingvs. direct evaluation

Variable sidelobe gains

Page 31: Parametrization of the Measurement Equation

S.Bhatnagar: SKA Imaging and Calibration Workshop, Cape Town, Dec., 2006 31

AvgPB - PB(to) Azimuthal cuts at 50%, 10% and 1%of the Stokes-I error pattern AvgPB - PB(to)

Error Patterns