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AD LEEM-PEEM_ONUS / 10-July Europe: Omicron NanoTechnology GmbH Tel: +49(0) 6128 / 987 - 0 e-mail: [email protected] Web: www.omicron.de North America: Omicron NanoTechnology USA Tel: 952 345 5240 e-mail: [email protected] FOCUS PEEM NanoESCA NanoESCA: Aberration compensated energy filter • Unsurpassed ESCA lateral resolution • Fast and controlled switching between real space and k-space Focus PEEM: • 20 nm lateral resolution • Easy to operate • Solutions for local spectroscopy • Compatible with MULTIPROBE UHV systems Electron Spectroscopy Ag(100): Fermi surface map measured with FOCUS IS-PEEM with retarding field analyser (IEF). Surface Science Instruments

NanoESCA FOCUS PEEM Electron Spectroscopy America: Omicron NanoTechnology USA Tel: 952 345 5240 e-mail: [email protected] FOCUS PEEM NanoESCA NanoESCA: …

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AD

LEE

M-P

EEM

_ON

US

/ 1

0-J

uly

Europe: Omicron NanoTechnology GmbHTel: +49(0) 6128 / 987 - 0

e-mail: [email protected]: www.omicron.de

North America: Omicron NanoTechnology USATel: 952 345 5240

e-mail: [email protected]

FOCUS PEEM

NanoESCA

NanoESCA: Aberration compensated energy fi lter• Unsurpassed ESCA lateral

resolution• Fast and controlled switching

between real space and k-space

Focus PEEM: • 20 nm lateral resolution• Easy to operate• Solutions for local

spectroscopy• Compatible with

MULTIPROBE UHV systems

Electron Spectroscopy

Ag(100): Fermi surface

map measured with FOCUS

IS-PEEM with retarding

fi eld analyser (IEF).

Surface Science Instruments

NanoESCA

Ag(100): Fermi surface

map measured with FOCUS

IS-PEEM with retarding

fi eld analyser (IEF).

NanoESCA

Ag(100): Fermi surface

map measured with FOCUS

IS-PEEM with retarding

fi eld analyser (IEF).