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Material and Method Material and Method Tea plants ( Tea plants ( camellia camellia sinensis sinensis L. cv. Yabukita L. cv. Yabukita ) ) (At (At National Institute of Vegetable and National Institute of Vegetable and Tea Science, Tea Science, NARO, NARO, Makurazaki) Makurazaki) N-fertilizing conditions N-fertilizing conditions 0%, 50%, 10 0%, 50%, 10 0%, 150%, 0%, 150%, 200% 200% / standard fe / standard fe rtilize; rtilize; 40kg/year/10a 40kg/year/10a Non-distractive measurement Non-distractive measurement Spectral reflectance Spectral reflectance Areas; 30cm x 30cm Areas; 30cm x 30cm SPEC:3nm SPEC:3nm 400 400 1100nm 1100nm KE-1 KE-1 1nm 1nm 300 300 2500nm 2500nm 25° 25° Fiel Fiel d Spec d Spec Spectral image Spectral image Image interpretation Image interpretation using ERDAS IMAGINE using ERDAS IMAGINE As usual measurement As usual measurement Areas; 30cm x 30cm Areas; 30cm x 30cm Picked up tea leaves in Picked up tea leaves in Analyzed the components Analyzed the components by NIR-Analyzer by NIR-Analyzer Experiment field Experiment field Development of Yield and Quality Estimation Methods for Tea-plant by Image Processing. Development of Yield and Quality Estimation Methods for Tea-plant by Image Processing. 1) Faculty of Agriculture, Kagoshima University, 1-21-24 Korimoto, Kagoshima, 890 -0065, Japan 2) National Agric. and Bio-Oriented Res. Organization, 87 Seto-cho, Makurazaki, K agoshima, 898-0082, Japan 3) National Agric. and Bio-Oriented Res. Organization, 2421 Suya, Goushi, Kumamot o, 861-1192, Japan Ishikawa Daitaro 1) , Ishiguro Etsuji 1) , Sekioka Shin-ichi 1) , Okamoto Tsuyoshi 2) , Nesumi Atsushi 2) , Ohba Kazuhiko 3) , Annual meeting on ASA (13th to 15th Nov. 2006 at Indianapolis) Principal Component Eigenvalu e Contributi on Ratio(%) Accumulat ed Contribut ion Ratio(%) No.1 2.2504 75.01 75.01 No.2 0.5401 18.00 93.02 No.3 0.2095 6.98 100.00 97 97 100 100 104 104 105 105 81 81 86 86 93 93 83 83 The purpose The purpose This study was focused on developing a new estimation technique of growth levels and quality of tea plants with nondestructive and real time measurement. Therefore, the relationship among spectral reflectance, leaf temperature, chlorophyll and other traits of tea plants were investigated. Measurement area of spectral reflectance The results The results The spectral reflectance measured without contacting a plant non- destructively is effective in evaluating the leaf growing condition, estimating the leaf quality, and determining the optimal leaf picking day for the best leaf quality. It can be an alternative to conventional methods using a chlorophyll meter. Moreover, the spectral images taken by a video camera with band pass filters will Please contact us ・・ ・・ M inimum M axim um Shadow 3.02±1.52 7.36±0.59 O ld Leaves ―――― 9.82±0.43 D ark Portin N ew Leaves ―――― 11.99±0.90 N ew Leaves 14.75±0.68 25.79±0.19 BrightPortin N ew Leaves 28.71±0.67 31.58±1.24 M ostBrightPort in N ew Leaves ―――― 35.99±1.66

Material and Method ☆Tea plants ( camellia sinensis L. cv. Yabukita )

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86. 83. Experiment field. Measurement area of spectral reflectance. 81. 93. 97. 100. 104. 105. Annual meeting on ASA (13th to 15th Nov. 2006 at Indianapolis). Development of Yield and Quality Estimation Methods for Tea-plant by Image Processing. - PowerPoint PPT Presentation

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Page 1: Material and Method ☆Tea plants ( camellia sinensis  L. cv. Yabukita )

Material and MethodMaterial and Method

☆☆Tea plants (Tea plants (camelliacamellia sinensissinensis L. cv. Yabukita L. cv. Yabukita)) (At (At National Institute of Vegetable and Tea Science, National Institute of Vegetable and Tea Science, NARO,NARO, Makurazaki)Makurazaki)✓✓ N-fertilizing conditionsN-fertilizing conditions :: 0%, 50%, 100%, 150%, 0%, 50%, 100%, 150%, 200%200% / standard fertilize;/ standard fertilize; 40kg/year/10a40kg/year/10a☆☆Non-distractive measurementNon-distractive measurement ①①Spectral reflectanceSpectral reflectance Areas; 30cm x 30cmAreas; 30cm x 30cm SPEC:3nmSPEC:3nm 、、 400400 ~~ 1100nm1100nm 、、 3° 3° :: KE-1KE-1    1nm1nm 、、 300300 ~~ 2500nm2500nm 、、 25°25° :: Field SpecField Spec ②②Spectral imageSpectral image Image interpretation Image interpretation using ERDAS IMAGINEusing ERDAS IMAGINE

☆☆As usual measurement As usual measurement Areas; 30cm x 30cmAreas; 30cm x 30cm Picked up tea leaves inPicked up tea leaves in

Analyzed the components Analyzed the components by NIR-Analyzerby NIR-Analyzer

Experiment fieldExperiment field

Development of Yield and Quality Estimation Methods for Tea-plant by Image Processing.Development of Yield and Quality Estimation Methods for Tea-plant by Image Processing.

  

1) Faculty of Agriculture, Kagoshima University, 1-21-24 Korimoto, Kagoshima, 890-0065, Japan2) National Agric. and Bio-Oriented Res. Organization, 87 Seto-cho, Makurazaki, Kagoshima, 898-0082, Japan3) National Agric. and Bio-Oriented Res. Organization, 2421 Suya, Goushi, Kumamoto, 861-1192, Japan

Ishikawa Daitaro1), Ishiguro Etsuji1), Sekioka Shin-ichi1), Okamoto Tsuyoshi2), Nesumi Atsushi2), Ohba Kazuhiko3),

Annual meeting on ASA (13th to 15th Nov. 2006 at Indianapolis)

Principal Component

EigenvalueContribution

Ratio(%)

Accumulated Contribution

Ratio(%)

No.1 2.2504 75.01 75.01

No.2 0.5401 18.00 93.02

No.3 0.2095 6.98 100.00

9797 100100 104104 105105

8181 8686 93938383

The purposeThe purpose  This study was focused on developing a new estimation technique of growth levels and quality of tea plants with nondestructive and real time measurement. Therefore, the relationship among spectral reflectance, leaf temperature, chlorophyll and other traits of tea plants were investigated.

Measurement area of spectral reflectance

The resultsThe results The spectral reflectance measured without contacting a plant non-destructively is effective in evaluating the leaf growing condition, estimating the leaf quality, and determining the optimal leaf picking day for the best leaf quality. It can be an alternative to conventional methods using a chlorophyll meter. Moreover, the spectral images taken by a video camera with band pass filters will make it possible to analyze differences of growth stages of plants.

Please contact us ・・・・

Minimum Maximum

Shadow 3.02±1.52 7.36±0.59

Old Leaves ―――― 9.82±0.43

Dark Port in New

Leaves ―――― 11.99±0.90

New Leaves 14.75±0.68 25.79±0.19

Bright Port in New

Leaves 28.71±0.67 31.58±1.24

Most Bright Port

in New Leaves ―――― 35.99±1.66