MAN-22060-US001_D00_SSMTT-27 _Single_E1_MMD

1E1 Module

E1 Module

for the MTT and xDSL

Family of Products

User’s ManualSSMTT-27LM

302 Enzo Drive San Jose, CA 95138

Tel: 1-408-363-8000 Fax: 1-408-363-8313

MAN-22060-US001 Rev D00

2 SSMTT-27L

WARNINGUsing the supplied equipment in a manner not specified by Sunrise Telecom mayimpair the protection provided by the equipment.

CAUTIONS• Do not remove or insert the module while the test set is on. Inserting or re -

moving a module with the power on may damage the module.• Do not remove or insert the software cartridge while the test set is on. Oth -

erwise, damage could occur to the cartridge.

End of Life Recycling and Disposal InformationDO NOT dispose of Waste Electrical and Electronic Equipment (WEEE) asunsorted municipal waste. For proper disposal return the product to SunriseTelecom. Please contact our local offices or service centers for information onhow to arrange the return and recycling of any of our products.

EC Directive on Waste Electrical and Electronic Equipment (WEEE

The Waste Electrical and Electronic Equipment Directive aims to

minimize the impact of the disposal of electrical and electronic

equipment on the environment. It encourages and sets criteria for

the collection, treatment, recycling, recovery, and disposal of waste

electrical and electronic equipment.

2010 Sunrise Telecom Incorporated. All rights reserved.

Disclaimer: Contents subject to change without notice and are

not guaranteed for accuracy.

3E1 Module

E1 Single Module

1 E1 Single Module ...............................................5

1.1 E1 LEDs ............................................................................5

1.2 E1 Connector Panels .........................................................6

1.3 Status Key .........................................................................7

1.4 Storage Allocation .............................................................8

2 Menus .................................................................9

2.1 Test Configuration ............................................................10

2.2 Test Pattern ......................................................................14

2.3 Measurement Result .......................................................18

2.3.1 General Definitions and Result Screens .......................19

2.4 Other Measurement .........................................................252.4.1 View Received Data .....................................................25

2.4.2 View Current Event .......................................................262.4.3 View FAS Words ...........................................................262.4.4 View MFAS Words ........................................................27

2.4.5 Pulse Mask Analysis.....................................................282.4.5.1 Start New Analysis ....................................................28

2.4.5.2 View Last Pulse Shape ..............................................292.4.6 C-Bit Analysis ...............................................................29

2.4.7 Histogram Analysis .......................................................312.4.7.1 Format SRAM ............................................................312.4.7.2 Current Histogram .....................................................31

2.4.7.3 Saved Histogram .......................................................332.4.8 Propagation Delay ........................................................34

2.4.9 Channel Loopback ........................................................34

2.5 VF Channel Access .........................................................352.5.1 VF & Noise Measurement.............................................35

2.5.2 View Line CAS ..............................................................382.5.3 Call Emulator ................................................................392.5.3.1 Standard Emulations .................................................39

2.5.3.2 Place a Call ...............................................................402.5.3.3 Receive a Call ...........................................................41

2.5.3.4 User Emulation ..........................................................422.5.4 Dial Parameters ............................................................45

2.6 Other Features ................................................................46

2.6.1 Error Injection ...............................................................462.6.2 Alarm Generation .........................................................482.6.3 Send Frame Words .......................................................49

2.7 System Parameters .........................................................51

2.7.1 Measurement Configuration .........................................51

4 SSMTT-27L

2.8 View/Store/Print ...............................................................552.8.1 Saving a Test ................................................................56

2.8.2 Viewing a Stored Test ...................................................562.8.3 Printing a Stored Test ...................................................56

2.8.4 Deleting a Stored Test ..................................................562.8.5 Locking and Unlocking a Stored Test............................562.8.6 Renaming a Stored Test ...............................................57

2.9 Profiles .............................................................................58

3 Applications .....................................................59

3.1 Connecting the Cords ......................................................59

3.2 Accept a New Circuit .......................................................60

3.3 In-Service Circuit Monitoring ...........................................61

3.4 Checking for Frequency Synchronization ........................62

3.5 Measuring Signal Level ...................................................63

3.6 V.54 Channel Loopback Test ...........................................64

3.7 Running a Timed Test ......................................................65

3.7.1 Manual Start .................................................................653.7.2 Auto Start......................................................................65

3.8 Observing Network Codes or Channel Data ...................66

3.9 Monitoring a Voice Frequency Channel ...........................67

3.10 Simple Talk/Listen ..........................................................68

3.11 Send a Tone...................................................................69

3.12 Nx64 kbit/s Testing .........................................................70

4 Reference .........................................................734.1 E1 Technology Overview .................................................734.1.1 Technical Standards .....................................................734.1.2 Basic Definitions ...........................................................73

4.1.3 Converting a Voice Signal .............................................734.1.4 2.048 Mbit/s Data Rate .................................................74

4.1.5 Line Coding ..................................................................754.1.6 Signal Levels ................................................................76

4.1.7 2.048 Mbit/s Framing ....................................................77

4.2 MFR2/DTMF/DP Technology ...........................................81

5 General Information ........................................83

5.1 Testing and Calibration Statement ...................................83

5.2 Ofces .............................................................................83

5.3 Express Limited Warranty ................................................85

Index ......................................................................87

5E1 Module

1 E1 Single Module

1.1 E1 LEDs

The LEDs provide information on the test set’s current test status.

SSMTT-ACM and -ACM+ SSMTT-B -CFigure 1 Test Set LED Panels

The described LEDs here are used by the module:

MODULE

• Green: The test set is in module mode.

SIGNAL

Active when in E1 mode.

• Green: Receiving an E1 signal as expected.

• Red: Not receiving an E1 signal as expected.

FRAME

This LED is active when in a framed test mode.

• Green: Frame synchronization has been achieved and the fram-

ing found on the received signal of the selected line matches

the framing set in TEST CONFIGURATION-FRAMING.

• Red: The congured framing type is not found on the received

signal on the line selected in TEST CONFIGURATION-

FRAMING. This could indicate either a loss of framing on the

received signal or a framing mismatch.

PAT SYNC

Active when performing a BERT test with a known test pattern.

• Red: No pattern synchronization, or synchronization is lost.

• Green: Pattern synchronization has been achieved.

Pattern synchronization occurs when the test set is receiving

the same pattern as the one transmitted by the test set.

• Inactive: The test set is in VF Channel Testing.

BIT ERR

Active when performing a BERT with a known test pattern.

• Red: Currently detecting a bit error.

• Blinking Red: Previously detected bit errors, but currently, there

are none. Press HISTORY to clear.

6 SSMTT-27L

AIS

• Red: Currently detecting an AIS (all 1, no framing).

• Blinking Red: Previously detected an AIS, but currently none

are detected. Press HISTORY to clear.

ALARM

• Red: Currently detecting an alarm condition.

• Blinking Red: Previously detected an alarm condition, but cur-

rently none are detected. Press HISTORY to clear.

ERRORS

• Red: Currently detecting an error. This can be a framing bit,

CRC-6 or other errors other than BPV or bit error.

• Blinking Red: Previously detected errors, but currently none

are detected. Press HISTORY to clear.

BPV/CODE

• Red: Currently detecting a Bipolar Violation or Code error.

• Blinking Red: Previously detected a Bipolar Violation or Code er-

ror, but currently none are detected. Press HISTORY to clear.

1.2 E1 Connector Panels

The E1 module connector panels are shown in Figure 2.

SSMTT-27L with RJ-11 ports

SSMTT-27L with BNC ports

HEAD

PHONE

TX RX EXT CLOCK

HEAD

PHONE

TX EXT CLOCKRX

Figure 2 E1 Connector Panels

HEADPHONE

Use a stereo head set with a 3 conductor mini connector.

TX and RX

An RJ-11 or BNC for TX (Transmit) RX (Recieve) connector

method is used to connect to an E1 line.

RJ-11 Port Pinout

Pin 1,2: E1-Rx

Pin 4,5: E1-Tx

EXT CLOCK

External clock signal input, using RJ-11 or BNC connectors.

7E1 Module

1.3 Status Key

The STATUS key is used to display a graphic of the current circuit

configuration and status. The graphic may be invoked during basic

menu setups and basic operations, such as: TEST CONFIGURA-

TION, SEND TEST PATTERN, and VF CHANNEL ACCESS. Press

STATUS upon completing a TEST CONFIGURATION setup to

see if the proper settings are selected. The graphics will update

based on the TEST CONFIGURATION settings.

E1SINGL

FRAMING : PCM30C

CODING : HDB3

PAT: 2e15

TEST RATE: 2048 Kbps

Line 1

TERM

Tx

Rx

T

R

Meas 8:21:36

Figure 3 Status Screen

The following is a description of some of the elements common

to a graphic display.

• R: This is where the test set performs its received measure -

ment results.

• T: This is where the test set transmits a test pattern.

- Arrows denote the direction the signal is travelling.

Boxed words, or abbreviations, provide additional information:

• Tx: The transmit port of the noted line (1 or 2).

• Rx: The receive port of the noted line.

• FRAMING reports the framing type, and if CRC checking is

present.

• CODING: Transmitted coding type.

• PAT: Test pattern.

• TEST RATE: Full or fractional test rate.

• BRDG, TERM, or MON: TERM is reported.

8 SSMTT-27L

1.4 Storage Allocation

Depending on the feature, some results are stored on the MMC

card while others are stored on the SRAM card. Table 1 shows

where the results from each feature are stored

Feature Location

E1 BERT MMC

Pulse Mask Analysis SRAM

Histogram SRAM

Jitter Measurement SRAM

Jitter Tolerance MMC

Jitter Transfer MMC

Wander Measurement MMC > TIE

SRAM > Histogram

GPRS Abis Statistics MMC

GPRS Gb Analysis MMC

ISDN Protocol Analysis SRAM

GSM Protocol Analysis SRAM

V5 SRAM

VF Call Analysis MMC

VF Call Emulation MMC

Table 1 Storage Allocation

9E1 Module

2 Menus

Figure 4 outlines the major functions of the E1 module.

MODULE

Key

PROTOCOLS

See Separate Option User’s Manuals

E1 MAIN MENU

OTHER MEASUREMENT

2.4

MEASUREMENT RESULT

2.3

TEST PATTERN

2.2

TEST CONFIGURATION

2.1

VF CHANNEL ACCESS

2.5

OTHER FEATURES

2.6

SYSTEM PARAMETERS

2.7

VIEW/STORE/PRINT

2.8

PROFILES

2.9

C-BIT ANALYSIS

2.4.6

OTHER MEASUREMENTS

PULSE MASK ANALYSIS

2.4.5

VIEW MFAS WORDS

2.4.4

VIEW FAS WORDS

2.4.3

VIEW CURRENT EVENT

2.4.2

VIEW RECEIVED DATA

2.4.1

HISTOGRAM ANALYSIS

2.4.7

PROPAGATION DELAY

2.4.8

CHANNEL LOOBACK

2.4.9

VF CHANNEL ACCESS

CALL EMULATOR

2.5.3

VIEW LINE CAS

2.5.2

VF & NOISE MEASUREMENTS

2.5.1

DIAL PARAMETERS

2.5.4

VIEW/STORE/PRINT

2.8

OTHER FEATURES

SEND FRAME WORDS

2.6.3

ALARM GENERATION

2.6.2

ERROR INJECTION

2.6.1

MEAS CONFIGURATION

2.7.1

SYSTEM PARAMETERS

Figure 4 Menu Tree

10 SSMTT-27L

2.1 Test Configuration

A circuit is accessed by:

1. Conguring the TEST CONFIGURATION menu to correspond

to the circuit under test.

2. Connecting the test set to the circuit.

The module can be configured to automatically detect incoming

framing and test pattern by pressing AUTO.

Note: Configuration is the most important part of the entire test

procedure. If the test conguration items are congured incorrectly,

all measurement results will be meaningless.

To congure the test set, use the following procedure:

1. From the E1 MAIN MENU, select TEST CONFIGURATION.

2. Refer to the following two sections for conguration details.

08:21:36

TEST CONFIGURATION

Tx SOURCE : TESTPAT

FRAMING : PCM-30

CRC-4 : NO

TEST RATE : 2.048M

Rx PORT : TERM

Tx CLOCK : Rx

LOOP TESTPAT

Figure 5 E1 Test Configuration Screen

Tx SOURCE

Options: LOOP (F1), TESTPAT (F2)

• LOOP: The signal received on the RX jack will be transmitted

out the TX jack of the test set.

• TESTPAT: A test pattern is transmitted by the test set. During

Nx64 or VF testing, an idle code is inserted on unused chan-

nels.

FRAMING

Options: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)

Choose the appropriate framing for the circuit.

• PCM-30: The test set will synchronize on both FAS (Frame

Alignment Signal) and MFAS (MultiFrame Alignment Signal).

• PCM-31: The test set will synchronize only on FAS.

11E1 Module

Notes:

• If unsure of the proper framing, push AUTO. Use the combi -

nation which synchronizes properly and/or allows error free

measurement results.

• If the received signal framing and CRC-4 status don’t match

the framing and CRC-4 settings, the test set will display Loss

of Frame condition and may display loss of CRC DET.

• AMI is the default line code. The line code can be congured for

AMI or HDB3 in: E1 MAIN MENU > SYSTEM PARAMETERS

> MEAS CONFIGURATION.

CRC-4

Options: YES (F1), NO (F2)

• YES: Allows measurement of CRC-4 errors on an incoming

signal and also transmits the CRC-4 bits on the outgoing signal.

CRC-4 only works with PCM-31 and PCM-30 framing.

• If UNFRAME has been selected for framing, the test set will

force the CRC-4 conguration to NO.

TEST RATE

Options: 2.048M (F1), Nx64K (F2)

• 2.048M: Used for full rate testing. If uncertain about which one

to choose, select this for full rate testing.

• Nx64: Use for fractional

testing. Upon pressing, the

SELECT TIMESLOT screen to

the right is displayed. In it

select each timeslot to test,

these can be selected

automatically, or manually.

Figure 6 Select Timeslot

Screen

Manual Selection of Timeslots

1. Use to choose a timeslot, then press SELECT (F2).

2. Repeat until all the necessary timeslots have been selected.

Selected timeslots remain highlighted, as in Figure 6.

• Press UN-SEL (F3) to deselect a timeslot.

• Press CLR-ALL (F4) to clear all selections and to start over.

Automatic Selection of Timeslots

1. Press AUTO (F1).

• If receiving a signal which is already formatted in the N (or M)

x64 kbit/s fractional E1 format, the quickest method for select-

ing timeslots is to press AUTO (F1).

12 SSMTT-27L

2. Press ENTER to set the choices, and return to the TEST

CONFIGURATION screen.

• In AUTO, the test set will automatically congure the timeslots

by looking for active data. It will congure the transmit side to be

the same as the active timeslots on the receive side. The test

set determines which timeslots are active by rst determining

which timeslots are idle. Any timeslot that is not idle is assumed

to be active. The test set determines that a timeslot is idle when

it nds the line’s idle code. This is set in SYSTEM PARAMETERS

> MEAS CONFIGURATION-CODE CONFIGUR.

Notes:

• In PCM-31 framing, timeslots 1-31 correspond to channels 1-31.

In PCM-30 framing, timeslots 1-15 correspond to channels

1-15, and timeslots 17-31 correspond to channels 16-30. In

PCM-30, timeslot 16 is used for the multiframe alignment signal.

Fractional E1 is not offered with unframed signals, because

framing is required to determine the location of timeslots.

• The timeslots specied for transmit/receive need not be the

same. The number of selected timeslots can differ from the Tx

side to the Rx side. The test set will assume that all incoming

data is received byte by byte in ascending channel order.

Rx PORT

Options: TERM (F1), BRIDGE (F2), MONITOR (F3)

Congures the Line 1 2.048 Mbit/s receiver.

These settings let the test set electrically decode a 2.048 Mbit/s

signal under a wide range of resistive cable losses. They also

determine which electrical load will be placed on the circuit by

the test set. These settings have no effect on the transmitters. On

a 2.048 Mbit/s circuit, there must always be exactly one receiver

that applies the low impedance (75/120Ω) termination. There

should never be two or more receivers applying a low impedance

termination.

CAUTION: If uncertain, select BRIDGE, this will protect the

2.048 Mbit/s signal.

• TERM mode terminates the received signal with a 75 or 120Ω

impedance termination. The tested signal has been transmitted

over real cable at a level between approximately +6 and -43

dB. Using TERM mode will disrupt the circuit.

• In BRIDGE mode, the test set applies high-impedance isola-

tion resistors to the circuit. This isolation circuit will protect

the signal from any possible disruption. The tested signal has

been transmitted over regular cable at a approximate level of

13E1 Module

+6 and -43 dB.

• MONITOR mode should be used when a measurement is

made at a protected monitoring point, at a level between -15

and -30 dB. The signal is provided from the protected MONI-

TOR jack of a network equipment.

In MONITOR mode, if a 0 dB signal is received, the CODE

ERR LED will light red. This often happens when the test

set is plugged into an OUT jack. In this case, choose TERM

instead. If you are uncertain if a jack is bridged or protected,

try BRIDGE rst.

TX CLOCK

Options: RX (F1), INTERN (F2), EXT CLK (F3), OFFSET (more,

F1), TTL (more, F2)

This is used to time the transmit signal.

• Rx: Use the timing from the signal received on the selected

line as the clock source.

• INTERN: Use the internal timing of the test set. This timing is

not synchronized to the network. You should use internal timing

in loopback testing where synchronization is not required.

• EXT CLK: A signal received on EXT CLOCK provides tim-

ing.

• OFFSET: The test set uses a

digital synthesizer to shift the

transmit frequency in 1, 10,

100, or 1000 Hz steps. Shift

up to +/- 50,000 Hz (25K

ppm). The screen to the right

is displayed.

Figure 7 DDS Shift Screen

1. Set DDS SHIFT from 0 and 50,000 Hz by using INC (F1) or

DEC (F2).

2. Set the SCALE of the shift by using INC (F1) and DEC (F2).

Choose among 1, 10, 100, and 1000 (i.e., a shift of 3 Hz with

a SCALE of 10 would shift the frequency 13 Hz).

• TTL: The test set uses a G.703 sinusoidal clock plugged into

EXT CLOCK as the timing source.

14 SSMTT-27L

2.2 Test Pattern

Figure 8 Send Test Pattern

Standard Test Patterns

To send one of the standard patterns:

1. Use to select a pattern. As each pattern is selected,

the test set begins transmitting that pattern.

2. Press INVERT (F2) to send the pattern with an inverted polarity

(1s and 0s reversed). Press NORMAL (F2) to send the pattern

with a normal polarity.

3. At the MEASURE MODE line in SYSTEM PARAMETERS >

MEAS CONFIGURATION, select BER or LIVE. In BER, the

test set looks for a BERT pattern. In LIVE, the test set does

not look for a pattern, it tests live trafc. If LIVE is selected,

the PAT SYNC LED is off.

The long patterns are written in hexadecimal notation, also known

as ‘hex’. A pattern written in hex will be written with pairs of num-

bers separated by commas. Hex is a 16 digit number system

consisting of the digits 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, A, B, C, D, E,

and F. The hex pattern 15 FA translates to the binary pattern 0001

0101 1111 1010, where the left most bit is transmitted rst.

The following test patterns are available:

2e23: Industry-standard 2e23-1 pseudo random bit sequence

and is formed from a 23 stage shift register, and is not zero-con-

strained. It contains up to 22 zeros in a row and violates standards

for consecutive zeros in AMI-coded transmission.

2e20: Industry-standard 2e20-1 pseudo random bit sequence is

formed from a 20 stage shift register and is not zero-constrained.

It contains up to 19 zeros in a row and violates standards for

15E1 Module

consecutive zeros in AMI-coded transmission. The QRS pattern

is derived from the 2e20 pattern.

2e15: Industry-standard 2e15-1 pseudo random bit sequence is


It contains up to 14 zeros in a row and does not violate standards

for consecutive zeros in AMI-coded transmission.

20ITU: This is the 2e20-1 pseudo random bit sequence and is


It conforms to the ITU O.153 technical standard. It is not identical

to 2e20, because different feedback mechanisms are used when

the patterns are produced by means of shift registers. 20ITU

suppresses consecutive sequences of more than 18 zeros, as

opposed to 14 zeros in 2e20.

2047: Industry-standard bit code used for DDS applications.

511, 127, 63: Industry-standard bit codes used for DDS.

1111: Industry-standard all ones pattern is used for stress testing

E1 AMI, and B8ZS lines. If it is sent unframed, it will be interpreted

as an AIS (Alarm Indication Signal). This is the pattern in its binary

form: 1111.

1010: Industry-standard alternating ones and zeros pattern. It is

frame aligned with ‘f’ showing the location of the framing bit. The

pattern is: f 0101 0101.

0000: Industry-standard all zeros pattern is often used to make

sure that clear-channel lines have been properly provisioned for

B8ZS during circuit turn-up. If a portion of the circuit is AMI, then

pattern synch and/or signal will be lost. The pattern is: 0000.

FOX: Industry-standard pattern is used in data communications

applications. The ASCII translation of the pattern is the ‘Quick

brown fox ....’ sentence. The pattern is frame aligned to ensure

proper ASCII translation of the bits. It is recommended that the

pattern be sent with framed signals, otherwise ASCII translation

is not possible. This is the pattern: 2A, 12, A2, 04, 8A, AA, 92, C2,

D2, 04, 42, 4A, F2, EA, 72, 04, 62, F2, 1A, 04, 52, AA, B2, 0A, CA,

04, F2, 6A, A2, 4A, 04, 2A, 12, A2, 04, 32, 82, 5A, 9A, 04, 22, F2,

E2, 04, 8C, 4C, CC, 2C, AC, 6C, EC, 1C, 9C, 0C, B0, 50.

QRSS: Industry-standard Quasi Random Signal is formed from a

20 stage shift register and is zero-constrained for a maximum of

14 consecutive zeros. When transmitted in a framed signal, up to

15 consecutive zeros will occur in accordance with AMI minimum

density requirements.

1-4: The one-in-four pattern is used for stress testing circuits. It is

frame aligned. The pattern is 0100.

16 SSMTT-27L

1-8: Industry-standard 1 in 8 pattern used for stress testing AMI

and B8ZS lines. It is also called 1:7. The pattern is frame aligned

(‘f’ is the framing bit) as shown in its binary form: f 0100 0000.

3-24: Industry-standard 3 in 24 pattern used for stress testing AMI

lines. The pattern is frame aligned (‘f’ is the framing bit) as shown

in its binary form: f 0100 0100 0000 0000 0000 0100.

User Test Patterns

In addition to the standard

patterns, a custom pattern can

be setup by pressing USER (F1)

in the TEST PATTERN screen

(Figure 9). The screen to the right

is displayed listing any stored

patterns. Use this screen to

create, edit, view, send, or delete

a pattern.Figure 9 User Test PatternSelection Screen

Sending a User Test Pattern

1. In TEST PATTERN, press USER (F1).

2. The test set will present a list of stored USER patterns. Use

the up/down arrow keys to select the desired pattern.

3. Press ENTER to send the selected pattern.

Viewing a User Test Pattern

1. From USER TEST PATTERN, move the cursor to the desired

pattern and press VIEW (F1).

2. You will see your selected pattern on the screen (in binary).

3. When nished, press ESC.

Creating User-Defined Patterns

1. In USER TEST PATTERN

selection screen, select a

blank line, and press CREATE

(F1). A screen like the one to

the right will be displayed

with the cursor at LABEL.

2. Press TOGGLE (F3) and the

“A” will be selected as in the

screen to the right.Figure 10 User Test Pattern

Character Screen

17E1 Module

3. Use to select the desired character, then p ress SE-

LECT (F4). The character appears next to LABEL. Repeat until

finished.

4. Press TOGGLE (F3) and press to move to “No”.

5. Press SHIFT and use the numeric keypad to enter the pattern

up to 24 bits long. When nished, press SHIFT.

• If a mistake is made, use INSERT (F1) or DELETE (F2).

6. Press ENTER to store the pattern and to return to the TEST

PATTERN screen with the new pattern label displayed.

Editing a User Test Pattern Label

1. From the TEST PATTERN screen, press USER (F1) to move

into USER TEST PATTERN.

2. Select the desired pattern label and press EDIT (F2).

3. With cursor on LABEL, use to select a character and

press:

DELETE (F2), then press TOGGLE (F3) and select the desired

character; the character will be inserted in place of the deleted

character in the label, or

INSERT (F1), then press TOGGLE (F3) and select the desired

character; the character will be inserted to the left of selected

character in the label, or

TYPOVER, then press TOGGLE (F3) and select the desired

character; the character will be inserted in place of the selected

character in the label.

Correcting a Mistake in the Pattern

1. While entering the 1s and 0s, an incorrect digit is noticed.

Press SHIFT to remove the ‘SHFT’ indicator.

2. Select the incorrect digit with and press SHIFT to display

the ‘SHFT’ indicator.

3. Enter the correct digit.

4. Press the SHIFT key to remove the ‘SHFT’ indicator.

5. Move the cursor with to the end of the line.

6. Press SHIFT again to display the ‘SHFT’ indicator.

7. Enter in the rest of the digits.

8. Press ENTER to store the pattern.

• Edit the code’s label using the same procedure.

Deleting a User Test Pattern

1. From the TEST PATTERN screen, press USER (F1) to enter

the USER TEST PATTERN screen.

2. Select the entry to delete and press DELETE (F3).

3. Press ESC to return to the TEST PATTERN screen.

18 SSMTT-27L

2.3 Measurement Result

To observe results:

1. Select MEASUREMENT RESULT from the E1 MAIN MENU

and press START (F3).

2. Scroll through screens via PAGE-UP (F1) or PAGE-DN (F2).

3. Press ESC when nished.

The test set continuously performs measurements on a received

signal. While a measurement is being made, a MEAS status indica-

tor is displayed. When the measurement is stopped, the indicator

will no longer be displayed.

Results are stored when STOP (F3) is pressed and PRINT RESULT

is set to LAST in SYSTEM PARAMETERS > MEAS CONFIGU-

RATION, or when a TIMED measurement nishes. They are also

stored when PRINT EVENT is ENABLED, in MEAS CONFIGURA-

TION.

The screens do not need to be accessed for results to be compiled.

Measurements are automatically restarted every time the con-

guration is signicantly changed. The screens allow for viewing

the accumulated measurements and restarting the measurement

process.

Measurements often have a count number displayed on the left

hand side, and the corresponding rate or percentage displayed

on the right hand side of the same line. For example, in Figure 11,

CODE appears on the left and RATE on the right.

A key concept is availability. A circuit is available for use only when

the bit error rate is low enough that the signal can get through and

be understood. A circuit is said to be unavailable at the beginning of

10 consecutive severely errored seconds. Errors, errored seconds,

and severely errored seconds are not accumulated when the circuit

is unavailable. Therefore, if you start continuously injecting errors

from the test set at a 2x10-3 error rate, you will see increasing bit

errors, errored seconds, and severely errored seconds for the first

9 seconds. At the tenth second, all the counts will decrease back

to the values they had before the error injection was started, and

the unavailable counter will increase by 10.

Once a circuit is unavailable, it becomes available only after 10 con-

secutive seconds without severe errors. To continue the previous

example, if you turn the severe error injection off, and then insert 1 or

2 errors during the next 5 seconds, you will observe that the unavail-

able second counter continues to increase for the first 9 seconds

while the error counter does not change. Then at the tenth second,

the unavailable second counter suddenly decreases by 10 and the

19E1 Module

error counter increases by the 1 or 2 errors that you inserted.

Measurement Result screen F-key

PAGE-UP (F1), PAGE-DN (F2): Use to view all screens.

STOP / START (F3): Use to stop and start the measurement.

HOLDSCR / CONTINU (more, F1): Hold Screen freezes all of the

measurement displays so they may be easily observed. The mea-

surement count is still proceeding, but the counts are updated only

in memory. You may now read the previous counts clearly. When

nished, press CONTINU to view updated measurement results.

LOCK / UNLOCK (more, F2): Press LOCK to disable the keypad.

The measurement process continues as usual, but keypad strokes

have no effect on the test set. This is useful if you are running a

long-term test and don’t wish to have the test disturbed. Press

UNLOCK to enable the test set’s keypad. Using this feature will

not disturb any measurement results.

In addition to the actual measurement data, the following informa-

tion is displayed in the upper portion of these screens:

Current Time: The time of day is displayed in the upper right-hand

corner of the screen (for the SSxDSL, on the left for the SSMTT.

ET: Elapsed Time is the time that has passed since the test was

started or restarted.

RT: Remaining Time is the time that remains until the end of test-

ing. The factory default condition is that the test runs continuously

until you stop it. CONTINU is displayed in the RT eld to denote

a continuous test. However, in SYSTEM PARAMETERS > MEAS

CONFIGURATION, you may specify the length of test time. In

this case, the remaining time will count down to zero during the

measurement.

FRM: Transmitted framing

TxCK: Transmit clock source

PATT: Transmitted test pattern

RATE: Test rate

2.3.1 General Definitions and Result Screens

These screens contain several pages of data. Screen 1, which

appears when rst selecting MEASUREMENT RESULT, is the

STATUS screen. It displays the status of the E1 Line. In large font,

a status message is displayed for the line. These messages (eg,

NO ERRORS, FRM LOSS, SIG LOSS, ERROR DET) represent

the condition of the line during testing. Remember to press START

(F3) to begin taking measurements.

20 SSMTT-27L

Measurement Result Definitions

The following measurements are displayed within the results

screens. The definitions are listed in alphabetical order.

Note: Each measurement is proprietary to its screen; i.e., ‘error’

refers to E-Bit errors in the E-BIT screen, and to all Summary

errors in the SUMMARY screen, etcetera.

AISS: Count of the number of Alarm Indication Signal Seconds.

AS: Count of Available Seconds since the start of the test. It equals

the length of the total test time minus any Unavailable Seconds.

%AS: Percentage of Available Seconds since the start of the test.

BIT: Count of Bit errors since the start of the test. Bit errors are

not counted during unavailable time.

BER: Bit Error Rate is the total number of bit errors divided by the total

number of bits during available time since the start of the test.

CLK SLIP: Number of Clock Slips since the start of the test.

CODE: Count of the number of line Code errors (Bipolar Viola-

tions that violate the coding rules) since the start of the test. In

HDB3 coding, a Code Error is a bipolar violation that is not part

of a valid HDB3 substitution.

(CODE) RATE: Average Bipolar Violation error rate since the

start of the test

CRC: Count of the number of CRC-4 block errors since the start

of the test. This measurement is reported as N/A when the test

set is not synchronized on a received CRC-4 check sequence.

(CRC) RATE: Average CRC-4 block error rate since the start of

the test. This measurement is reported as N/A when the test set

is not synchronized on a received FAS or MFAS signal.

DGRM: Count of Degraded Minutes since the start of the test. A

DGRM occurs when there is a 10 -6 bit error rate during 60 avail-

able, non-severely bit errored seconds.

%DGRM: Percentage of summary Degraded Minutes since the

start of the test.

EBIT: Number of E-bit errors since the start of the test.

EBER: Average E-bit error rate since the start of the test.

EFS: Number of Error Free Seconds since the start of the test.

%EFS: Percentage of summary Error Free Seconds since the start

of the test. A summary Error Free Second is a second in which the

signal is properly synchronized and no errors or defects occur.

ES: Count of the number of Errored Seconds since the start of

the test. An ES is any second with at least one BPV, bit error,

FBE, errored block, or CRC-4 error. An ES is not counted during

an Unavailable Second.

%ES: Percentage of errored seconds since the start of the test.

21E1 Module

FALM: Frame Alarm seconds is a count of seconds that have had

far end frame alarm (FAS Remote Alarm Indication, RAI) since

the start of the test.

FE: Count of the number of Frame bit Errors since the start of

the test. This measurement is reported as N/A when the test

set has not synchronized on a known framing pattern within the

received signal.

Hz/PPM: The Hertz/Part Per Million count records any variance

from 2.048 Mbit/s in the received frequency.

LOFS: Loss Of Frame Seconds is a count of seconds since the

start of the test that have experienced a loss of frame.

LOSS: Loss Of Signal Seconds is a count of the number of sec-

onds during which the signal has been lost during the test.

+LVL: Positive Level is the level of positive pulses being received

by the test set. Measurements are displayed in decibels variance

from G.703 specied level (dB).

-LVL: Negative Level is the level of negative pulses being received

by the test set. Measurements are displayed in decibels variance

from G.703 specied level (dB).

Lpp: Level Peak-to-Peak is the peak-to-peak level of negative and

positive pulses being received by the test set. Measurements are

displayed in decibels variance from DSX level (dB).

MAX Hz: Maximum frequency since the start of the test.

MIN Hz: Minimum frequency since the start of the test.

MFAL: Multiframe Alarm seconds is a count of seconds that have

had far end multiframe alarm (MFAS Remote Alarm Indication,

RAI) since the start of the test.

RxCLK: Received clocking frequency.

+/- RxLVL: Positive or negative level of pulses received.

RCV Hz: Frequency measured during the last second.

SES: Count of Severely Errored Seconds since the start of the

test. A severely errored second has an error rate of >10-3. SES is

not counted during unavailable time.

%SES: Percentage of seconds since the start of the test that are

Severely Errored Seconds.

SLIP: Count of Bit Slips that occur when the synchronized pattern

either loses a bit or has an extra bit stuffed into it.

UAS: Count of Unavailable Seconds that have occurred since

the start of the test. Unavailable time begins at the onset of 10

consecutive severely errored seconds. The displayed value of

UAS updates after the tenth consecutive severely errored second

occurs. Unavailable time also begins at a LOS or LOF.

22 SSMTT-27L

%UAS: Percentage of unavailable seconds since start of test.

+WANDR: Total positive phase difference between the measured

frequency and the reference frequency since the start of the test.

The +WANDR value increases whenever the measured frequency

is larger than the reference frequency.

-WANDR: Total negative phase difference between the measured

frequency and the reference frequency since the start of the test.

The -WANDR increases whenever the measured frequency is

less than the reference frequency.

The following subsections describe the results screens.

Line Summary Screen

Meas 8:21:36

ET : 000:24:37 RT : CONTINU

FRM : PCM-30/C TxCk: INTERN

PATT: 2e23 RATE: 2.048M

SUMMARY

CODE: 0 RATE: 0.00E-09

BIT : 0 RATE: 0.00E-09

CRC : 0 RATE: 0.00E-06

EBIT: 0 RATE: 0.00E-06

FE : 0 RATE: 0.00E-06

RxCLK: 2048000 +RxLVL:-0.22 dB

HZ/PPM:-0.488 -RXLVL:-0.22 dB

PAGE-UP PAGE-DN STOP MORE

This SUMMARY screen contains

summary results for the E1 Line. It

presents the most significant

measurement results. It contains

data related to the specific types

of impairments, like code errors,

CRC-4 block errors, framing, and

multiframe bit errors. See

Measurement Result Definitions in

this section for screen definitions.Figure 11 Summary Screen

Frequency Screen

Meas 8:21:36




FREQUENCY

NEG 0 POS

051 <<<<<

RCV/Hz: 2047999 CKSLIP: 51

MAX/Hz: 2047999 +WANDR: 0

MIN/Hz: 2047999 -WANDR: 51


The FREQUENCY screen reports

relevant line frequency information

via a bar graph to indicate how

fast the signal is slipping in

relation to the reference clock.

The bar graph slips most rapidly

at the center position and then

gradually slows down as the

length of the bar increases. Figure 12 Frequency

Screen

A count of the number of slips is kept at the end of the bar and

at 256 clock slips it resets itself.

One clock slip occurs when the measured frequency deviates

from the reference frequency by one unit interval. A unit interval

is equal to 488 nano seconds, for E1 lines.

The bar graph is only valid when the EXT CLOCK and RX input

has valid signals. If no signal is present, “NO REF SIGNAL” is

displayed in place of the graph.

23E1 Module

A reference clock is selected via TEST CONFIGURATION-Tx

CLOCK. It is important to know the source of the reference clock,

to meaningfully interpret the graph results.

Note: When no reference clock signal is present, the test set will

default to its internal clock, for the measurement of MAX, MIN,

and current RCV bit rates of the signal.

G.821 Screen

The G.821 screen reports the

measurement parameters speci-

fied in ITU G.821. This screen will

only be displayed if the G.821 is

ON in SYSTEM PARAMETERS >

MEAS CONFIG. The same applies

specifically to the DGRM

measurement. See Measurement

Result Definitions in this section

for screen definitions.

Meas 08:21:36


FRM : PCM-30/C TxCK: INTERN


G.821

BIT : 0 BER : 0.0e-10

ES : 0 %ES : 00.00

SES : 0 %SES : 00.00

EFS : 3021 %EFS : 100.00

AS : 3021 %AS : 100.00

UAS : 0 %UAS : 00.00

SLIP: 0

DGRM: 0 %DGRM : 0.00


Figure 13 G.821 Logical

Screen

Alarm/Signal Screen

Meas 8:21:36




ALM/SIG

LOSS: 0 +LVL : -0.59 dB

AISS: 0 -LVL : -0.59 dB

LOFS: 0 +Lpp : 4.73 dB

FALM: 0

MFAL: 0


The ALM/SIG screen reports

alarm and measurement param-

eters relating to the E1 signal.

See Measurement Result Defini-

tions in this section for screen

definitions.

Figure 14 ALM/SIG Screen

M.2100/550 Screen

Meas 8:21:36




M2100/550

PERIOD P/F %ES %SES

01-01 00:27/00:29 P 0.0 0.0

01-01 00:29/00:31 P 0.0 0.0

01-01 00:31/00:33 P 0.0 0.0

01-01 00:33/00:35 P 0.0 0.0


The M2100/550 screen provides

pass/fail measurements in

accordance with ITU M.2100/550

specifications. The specification is

used where a 2.048 Mbit/s circuit

crosses international boundaries.

It allocates a certain allowable

error rate for each boundary that

carries the circuit. You need only

enter the appropriate percentage

that is to be allowed for the line under test. The test set makes

calculation and reports whether the line passed or failed.

Figure 15 M.2100/550 Screen

24 SSMTT-27L

The following denitions pertain to the M.2100/550 screen:

PERIOD: Identies the date and time interval of each of the re-

ported pass or fail results. The period interval used in Figure 15

is 2 minutes. Change this interval in the SYSTEM PARAMETERS

> MEAS CONFIGURATION, screen 2. Valid entries may range

from 00 to 99 minutes.

P/F: Indicates whether the test result Passed or Failed.

%ES: Percentage of M.2100 Errored Seconds since the start of

the test. An errored second is any second with a Code, Bit, Frame,

Multiframe or CRC errors.

%SES: Percentage of M.2100 Severely Errored Seconds since

the start of the test. An M.2100 Severely Errored Second is any

second with >10-3 bit error rate, 10-3 code error, excessive frame,

multiframe or CRC bit errors, loss of frame, loss of pattern, syn-

chronization, or loss of signal.

See Measurement Result Definitions in this section for screen

definitions not mentioned.

G.826 Screen

The ITU standard specifies

required performance character-

istics of 2.048 Mbit/s lines. The

parameter definitions given in

G.826 are block-based. This

allows for convenient in-service

measurement. The G.826 screen

is displayed only if G.826 is ON

in SYSTEM PARAMETERS >

MEAS CONFIGURATION.

Meas 08:21:36


FRM : PCM-30/C TxCK: INTERN


G.821

EB : 4 %EB : 01.11

BBE : 4 %BBE : 00.04

ES : 4 %ES : 00.04

SES : 0 %SES : 00.00

UAS : 0 %UAS : 00.00

EFS : 1001 %EFS : 99.93


Figure 16 G.826 Screen

The following denitions are specic to the G.826 screen:

BBE: A Background Block Error is an errored block not occurring

as part of a SES (Severely Errored Second).

%BBE: Percentage of Background Block Errors since the start of

the test, excluding all blocks during SES and unavailable time.

EB: Errored Block is a block containing 1 or more bit errors.

%EB: Percentage of Errored Blocks since the start of the test.

SES: Severely Errored Second is a 1 second period which con-

tains greater or equal to 30% errored blocks.

%SES: Percentage of Severely Errored Seconds since the start

of the test.

See Measurement Result Definitions in this section for screen

definitions not mentioned.

25E1 Module

2.4 Other Measurement

This menu can contain the following, depending on ordered

options:

• VIEW RECEIVED DATA

• VIEW CURRENT EVENT

• VIEW FAS WORDS

• VIEW MFAS WORDS

• PULSE MASK ANALYSIS

• C-BIT ANALYSIS

• HISTOGRAM ANALYSIS

• PROPAGATION DELAY

• CHANNEL LOOPBACK

2.4.1 View Received Data

VIEW RECEIVED DATA F-keys

PAGE-UP (F1), PAGE-DN (F2):

Use to view all data. Note the

PAGE number in the upper

left-hand portion of the screen.

64 pages of data are available;

which is equal to 16 frames or

one multiframe.

PAUSE (F3): Trap the current

data on the E1 line.

PRINT (F4): Send the data to

the serial port for printing.

Figure 17 View Received

Data Screen

The following is reported:

PAGE: Indicates which of the available 64 pages of data is cur -

rently being displayed.

T/S: Species the Time Slot being viewed.

BINARY: This column shows the binary data actually being re-

ceived on the line. Each line represents the 8-bit timeslot.

HEX: This column shows the hexadecimal representation of the

8 bits being transmitted in each timeslot.

ASCII: Displays the ASCII representation of the 8-bit binary fram-

ing word which has been received.

• The character displayed to the left of the parentheses repre-

sents the 8-bit framing words translated in order.

• The character displayed within the parentheses represents

the 8 bits translated in reverse order.

26 SSMTT-27L

2.4.2 View Current Event

PAGE-UP PAGE-DN REFRESH more

Meas 8:21:36

EVENT RECORD

1. 2007-04-03 09:29:38

MEASUREMENT START

2. 2007-04-03 09:29:48

BERT BIT: 1

3. 2007-04-03 10:10:51

BERT BIT: 2

4.

The EVENT RECORD screen

reports on all events; date, time,

type, and count of events that

occur during measurements.

This screen can also be

accessed by pressing EVENT

(more, F3) in the Measurement

Results screens.

This feature is active when

PRINT EVENT is enabled in

SYSTEM PARAMETERS > MEAS

CONFIGURATION.

EVENT RECORD F-keys

PAGE-UP (F1), PAGE-DN (F2): Use to view all records

REFRESH (F3): Use to refresh the screen.

PRINT (more, F1): Send the data to the serial port for printing.

SAVE (F4): Save the report records. See Section 2.8.

Figure 18 Event RecordScreen

2.4.3 View FAS Words

View the live presentation of E1 framing binary words. Timeslots

0 of frames 0-15 are displayed in Figure 19.

FAS FRAME WORDS F-keys

PAUSE/RESUME (F1): Press to freeze the presentation of data;

press again to return to a live FAS word display.

PRINT (F2): This is available when this screen is paused; press

to send the screen to the serial port for printing.

PCM-30PCM-31

Figure 19 FAS Frame Words Screens

The even frames, 0-14, contain the FAS in bits 2-8. In the left

screen of Figure 19, FAS is represented by 0011011.

27E1 Module

The odd frames do not contain FAS. The top row of these frames

shown in the left screen of Figure 19 show the allocation of bits

1-8 in these frames. The figure represents an undisturbed condi-

tion.

When the framing is set for PCM-30 Multiframe (right screen in

Figure 19), there is a slight variation in the odd framing bits, those

not containing the frame alignment signal.

Bit 1 is used to transmit the 6-Bit CRC-4 multiframe alignment

signal and 2 CRC-4 error indication bits. The CRC-4 multiframe

alignment signal has the form of 001011.

The screen shows the FAS frame words when framing is set

for PCM-30. The rst bits of frames 1-11 (odd) send the pattern

001011, the CRC-4 multiframe alignment signal.

2.4.4 View MFAS Words

The screen to the right allows

viewing of the live presentation

of Timeslot 16, Frames 0-15.

Select PCM-30 framing in TEST

CONFIGURATION to access this

screen.

Figure 20 MFAS Frame

Words Screen

MFAS FRAME WORDS F-keys

PAUSE/RESUME (F1): Press to freeze the presentation of data;

press again to return o a live MFAS word display.

PRINT (F2): This is available when this screen is paused; press

to send the screen to the serial port for printing.

In the Multiframe, timeslot 16 is used for either common channel

or channel associated signalling, as required. Note that in Figure

20, the template for the even frames (0000xyxx) applies only to

Frame 0. All other frames follow the template shown above the

odd frames (ABCDabcd). As seen in Figure 20, in frame 0, MFAS

is 0000. The rest of the frames contain signalling channels desig-

nated a, b, c, and d. Frame 1 contains channels 1 and 16, frame

2 contains channels 2 and 17, and so forth until frame 15, which

contains channels 15 and 30.

28 SSMTT-27L

2.4.5 Pulse Mask Analysis

This option enables you to measure the quality of an E1 waveform.

The results compare favorably with pulse shape measurements

obtained from testing with a digital oscil loscope.

The analysis is performed for any received test pattern or live

signal, and line interface mode. The signal shape is displayed

on the test set’s screen. The ITU G.703 pulse mask can be su-

perimposed for fast inspection. The test set will store the current

pulse for later viewing.

Note that if you start analysis while measurements are running, the

test set will stop the measurements. When the analysis is complete,

the test set will restart the measurements.

The menu contains:

• START NEW ANALYSIS

• VIEW LAST PULSE SHAPE

2.4.5.1 Start New Analysis

In a few seconds, the captured

pulse shape is displayed. A

PASS/FAIL message will be

displayed, when a G.703 mask

has been imposed on the

received pulse. If the pulse

meets the G.703 criteria, it

passes. Otherwise, it fails.

Figure 21

Pulse Shape Analysis Screen

Pulse Shape Analysis F-keys

G.703/NO-MASK (F1): Displays the ITU G.703 mask with the

captured signal; press again to remove the G.703 mask.

RESTART (F2): Starts a new pulse shape capture and analy-

sis.

PRINT (F3): Press to print the screen.

Definitions for this screen are:

Width: Pulse Width, in nanoseconds

Rise Time: in nano seconds

Fall Time: in nano seconds

Ovr Shoot: Percentage of overshoot

Und Shoot: Percentage of undershoot

Level: Signal level, in dB

29E1 Module

2.4.5.2 View Last Pulse Shape

View the last pulse shape captured by the test set. The pulse

shape can be viewed at any time, even after the test set has

been turned off.

The last pulse shape will be displayed on the screen, along with

the G.703 and PRINT F-keys.

See Section 2.4.5.1 for the results definitions.

2.4.6 C-Bit Analysis

Send and receive C-Bit frames

with this screen.

Note: The test set will transmit

an IDLE pattern upon entering

this screen.

Figure 22 C-Bit AnalysisScreen

Congure the following:

Tx T/S

Options: 1-15, 17-31

Select the transmit timeslot on which to send C-bits by pressing

NEXT (F1) or PREVIUS (F2). Since PCM-30 framing is required

for this C-bit analysis, timeslot 16 can’t be selected.

TRANSMIT

Options; USER (F1), IDLE (F2)

This setting determines bit 2.

• USER: This activates the C-bit framing and sets the program-

mable bits. To program the bits:

1. Select SEND bits.

2. At each bit, press SHIFT and use the numeric keypad to enter

either 0 or 1. The cursor automatically moves one spot to the

right once a bit is entered. When the cursor highlights a specic

bit, information about this C-bit is displayed.

Rx

Options: 1-15, 17-31

Select the Line receive timeslot on which to receive C-bits by

pressing NEXT (F1), or PREVIUS (F2). Since PCM-30, MFAS,

framing is required, timeslot 16 can’t be selected.

30 SSMTT-27L

This screen also shows the received C-bits for Lines 1 and 2. If

C-bits are not found on a line, “C-BIT NOT FOUND” is displayed

for that line.

Denitions of C-bits 2-15 are shown in Table 2.

Bit # Assignment

2 ESCAPE 0-C-Frame Active

1-C-Frame Ignored

3 2 Mb Loops 0-Subscriber

1-Network

4 Loop 2 or Loop 3 0-Subscriber

1-Network

5 Loop 2 Instruction 0-Active

1-Non-active

6 Loop 3 Instruction 0-Active

1-Non-active

7 HDB3 Command 0-Active

1-Non-active

8 Loop Acknowledge 0-Acknowledge

1-No Acknowledgement

9 Not Defined

10 Local Fault 0-Active

1-Non-active

11 Remote/Line Fault 0-Active

1-Non-active

12 C Frame Loss 0-Active

1-Non-active

13-15 Spare

Table 2 C-bit Definitions

31E1 Module

2.4.7 Histogram Analysis

This menu screen contains the following:

• CURRENT HISTOGRAM

• SAVED HISTOGRAM

• FORMAT SRAM

Notes

• Histogram analysis automaticity starts when E1 measurement

starts.

• A SRAM memory card must be installed in the test set.

• Interrupting a timed measurement to view results will cause

a new analysis to start when returning to measuring.

2.4.7.1 Format SRAM

Before using a new SRAM memory card, it must be formatted for

use with the test set. To do so, follow the on-screen instructions.

Press ESC to cancel the formatting.

Note: SRAM cards have mechanical erase protection; turn the

protection off to erase and format the card.

2.4.7.2 Current Histogram

This screen contains the

following:

The start and stop date and

time is displayed.

The CURRENT date and time

correspond to the last time

MEASUREMENT RESULTS

was entered.

Figure 23 Current Histo-

gram Selection Screen

Press VIEW (F1) to view the current histogram. Figure 24 shows

a sample screen.

• Pressing STORE (F2) will erase any previously stored data.

• The CURRENT histogram data is also stored, but it will be erased

the next time MEASUREMENT RESULTS is entered.

• If you do not want to save the current le and erase the one

already saved, press ESC instead of ENTER at the warning

message screen.

32 SSMTT-27L

Figure 24 Current Histogram Screen

CURRENT HISTOGRAM F-keys

TYPE (F1): Press to select a measurement type.

• The following error types are available:

- EBIT, CRC, FAS, MFAS, CODE: See Section 2.3.1.

- LOS: Loss of Signal

- LOF: Loss of Frame

- AIS: Alarm Indication Signal

- FASRAI: FAS Remote Alarm Indication

- MFASRAI: MFAS Remote Alarm Indication

- BERT_LOPS: Loss of Pattern Synchronization

- BERT_BIT: Bit errors

• For all error types:

- The history of each error type is displayed individually.

- The error type is specified in the upper portion of the

screen.

- Pressing TYPE automatically changes the type options

displayed. In Figure 24, BERT_BIT error was selected.

LINE 1/2 (F2): Selects the parameters of either E1 Line 1 or E1

Line 2, depending on the setup.

ZOOM (F3): Changes the resolution to the next lower time period

at the cursor location. Select the error before pressing ZOOM.

• Select a minute, hour, or day interval as your time period

JUMP (MORE, F1): Moves the display cursor 10 steps.

• Use to move the cursor one step at a time.

PRINT (MORE, F2): Press to print the results.

33E1 Module

Notes:

• The screen will display either the current or saved results.

• Each time MEASUREMENTS RESULT is selected, the test

set will replace the le in the CURRENT HISTOGRAM data.

• For each le, the feature will store the most recent 24 hours

of data with a display resolution (PERIOD) of 1 minute.

• For each le, the screen will store both the present 60 hours

and the previous 60 days of histogram data with a resolution

(PERIOD) of one hour.

2.4.7.3 Saved Histogram

Select this screen to view, print,

or give a label to a saved

analysis. See Section 2.4.7.2

for an explanation of the data.

Figure 25 Saved HistogramSelection Screen

SAVED HISTOGRAM F-keys

VIEW (F1): Press to enter the selected record.

PAGE-UP / PAGE-DN (F2): Press to view the available histo-

grams.

DELETE (MORE, F1): Press to delete a selected histogram.

LOCK / UNLOCK (MORE, F2): Press to lock the record, so that it

may not be deleted. Press again to unlock it.

LABEL (MORE, F3): Press rename, and use the character entry

screen with this procedure:

1. Press TOGGLE (F3), then select the characters by using

. Press SELECT (F4) to enter the character into the

LABEL line.

• Use INSERT (F1) and DELETE (F2) to add or remove a char-

acter.

2. Press TOGGLE (F3) when done.

3. Press ENTER, and you will return to the SAVED HISTOGRAM

screen, where the new label will be displayed.

CLR-ALL (MORE, F1): Press to delete all unlocked records.

34 SSMTT-27L

2.4.8 Propagation Delay

This screen allows for viewing

the propagation delay of a loop

back signal at a full or Nx64 rate.

The test set measures the

number of unit intervals it takes

for the signal to return. A unit

interval is the amount of time it

takes to transmit one bit (488 ns

for a E1 signal). This number is

translated into the number of

microseconds

of

round

trip

delay.

Figure 26 Propagation De-lay Screen

PROPAGATION DELAY F-keys

CALIB (F2): Press if more than one piece of looped equipment

is on the line, and the test set will recalibrate to allow viewing the

propagation delay between two devices, without including the

test set. OFFSET indicates the delay between the two pieces of

equipment (removing the test set to Equipment 1 measurement).

Press again to take measurements further down the line.

RESTART (F1): Press to stop and restart the test.

2.4.9 Channel Loopback

Use this screen to set up a far

end loop to perform measure-

ments of V.54 datacom circuits. A

loopback can locate the faults in

the circuit by setting the far end

modem to loop, that allows for

measurements. The test set can

activate or deactivate the near

end device by sending the proper

standard T1 E1.2/94-003 code.Figure 27 V.54 Channel

Loopback Screen

Figure 28 V.54 Setup

Use LOOP-UP (F1) or LOOP-DN (F2) to send codes.

35E1 Module

2.5 VF Channel Access

Access a variety of talk/listen functions.

Note: Do not attempt to enter this menu if the FRAME LED is not

green. A green LED indicates that the framing found on the re-

ceived signal matches the framing selected in TEST CONFIGURA-

TION. It is impossible to talk, listen, or perform other channelized

functions in the absence of frame synchronization, since channels

can be identied only within a framed signal.

This menu contains the following:

• VF & NOISE MEASUREMENT• VIEW LINE CAS

• CALL EMULATOR• DIAL PARAMETERS

• VIEW/STORE/PRINT (see Section 2.8 )

Note: During VF CHANNEL ACCESS, when TEST CONFIGU -

RATION-TxSOURCE is set to TESTPAT, idle channel code and

signalling (A/B/C/D bits) will be inserted into the unselected chan-

nels. The idle channel code and signal can be programmed from:

E1 MAIN MENU > SYSTEM PARAMETERS > MEAS CONFIGU-

RATION-IDLE CHNL CODE and IDLE CHNL A/B/C/D lines.

2.5.1 VF & Noise Measurement

This screen lets you choose:

• which channel to test for both transmitting and receiving.

• whether to talk, send a tone, or place quiet termination on thetransmit signal.

• the transmitted frequency and level.• which signalling bits to send.

• to listen to the line.

It also tells you:

• the received signalling bits.• the received 8-bit data.

• the received frequency and level.

• noise measurements on the received frequency.

The screen to the right is an

configuration example. Tx-T/S

is set for timeslot 01. Rx-T/S

shows the selected receive

timeslot.

NEXT PREVIUS

Meas 8:21:36

VF & NOISE MEASUREMENTS MEASUREMENT SETUPTx-T/S: 01 TxMODE :TONERx-T/S: 01 TxFREQ :1020TxABCD: 1001 TxLVL(dBm):3

MEASUREMENT RESULTS RxFREQ =800 OFFSET=+10 Rx(dBm)=01 PEAK =+127/-127 RxABCD =0101 RxDATA=10011001 S/N(dB)=-9.5 PSOP(dBm)=-33.5 3K(dBm)=-9.5 1010(dBm)=-68.9

Figure 29 VF Measure-ments Setup Screen

36 SSMTT-27L

Tx-T/S

Options: 1-31

Choose a transmit timeslot by pressing NEXT (F1) or PREVIUS

(F2). Tx-T/S normally should be the same as the Rx-T/S, but

they can be set for different channels. Upon selecting a timeslot,

approximately three seconds pass before the signal is actually

inserted into the timeslot.

Rx-T/S

Options: 1-31

Select the receive timeslot via NEXT (F1) or PREVIUS (F2).

TxABCD

Options: IDLE (F1), SEIZE (F2), manually set

Change the signalling bits transmitted with the associated transmit

channel. These bits will be transmitted only if the test set is using

MFAS (PCM-30) framing.

• Pressing IDLE (F1) or SEIZE (F2) will place that signal onto

the A/B/C/D position. Program the IDLE or SEIZE signal in VF

CHANNEL ACCESS > SUPERVISION SETUP.

• To change these bits manually:

1. Press SHIFT and use 1 and 0 to enter the signalling bits.

2. Press ENTER to send the ABCD bits.

TxMODE

Options: THRU (F1), TALK (F2), QUIET (F3), TONE (F4)

• THRU passes all received channels onto the transmit signal.

• TALK puts speech on the selected transmit channel; the test

set will transmit speech from the microphone.

• QUIET places a quiet termination on the transmit signal.

• TONE inserts a tone on the selected transmit channel. If se-

lected, use the next two settings:

TxFREQ

Options: 50 Hz-3950 Hz

If TONE is selected for TxMODE, choose the tone frequency by

pressing SHIFT and entering the value from the keypad.

TxLVL

Options: -60 to 3 dBm

If TONE is selected for TxMode, choose the transmit tone level

by pressing SHIFT and entering the value from the keypad. You

may select any value from -60 to +3 dBm. Press MINUS (F1) to

achieve negative values.

37E1 Module

Measurement Results

The rest is received data. As the equals sign indicates, they are

for viewing only, and may not be edited or changed.

RxFREQ

View the received frequency of the selected channel in Hz.

Rx(dBm)

View the received level in dBm.

RxABCD

View the received CAS bits. These bits are meaningful only if the

FRAME LED is green. Ignore these bits if the LED is not green.

S/N (dB)

Observe the Signal-to-Noise measurement, in decibels. This

measurement is updated every second.

3K (dBm)

Observe the Noise 3-K Flat measurement, in dBm. This measure-

ment is updated every second.

OFFSET

Observe the coder offset.

PEAK

Observe the coder peak from +127 to -127, using A-law.

RxDATA

View live 8-bit channel data received from the selected line.

PSOP (dBm)

Observe the Noise Psophometric* measurement in dBm. This

measurement is updated every second.

*A noise weighting method established by the ITU-T, designated

as CCIF-1951 weighting, for use in a noise measuring set or

psophometer.

1010 (dBm)

Observe the Noise 1010 Hz measurement, in dBm. This measure-

ment is updated every second.

38 SSMTT-27L

2.5.2 View Line CAS

This screen allows viewing of the signalling bits for all 30 channels

of a line. In order to do this:

• Select PCM-30 framing in TEST CONFIGURATION.

• The FRAMING LED must be green in order for the signalling

bits to be displayed.

Timeslots 1-5 are shown on the rst line, 6-10 are shown in the

second line, etc. Figure 30 is a sample screen.

Figure 30 View Line CAS Screen

Press STATUS (F1) to see a decode of each ABCD state. Informa-

tion will be displayed when a match of state for forward/backward

conditions are met, as specied in the SUPERVISION SETUP

screen. Here are the definitions:

IDLE= IDLE

SEIZ= SEIZE

ACKW= SEIZE ACKNOWLEDGMENT

ANSW= ANSWER

CLRB= CLEAR BACK

CLFR= CLEAR FORWARD

BLCK= BLOCK

????= UNKNOWN; no state or no match detected

Note: Some states will change too quickly for the test set to display

and detect. Therefore, only constant states which are detected

when the screen is refreshed will be displayed.

Press ABCD (F1) to return to the ABCD information.

39E1 Module

2.5.3 Call Emulator

Use this feature to place and receive calls. Select one of the 10

predefined sequences, or input a user defined sequence.

Notes:

• To run the user call emulator, press START (F4) in USER CALL

EMULATOR. If you escape from the menu to CALL EMULA-

TOR, then press START (F4), you will be running the Q.441

specification instead of the one you defined.

• When you edit your own sequence, no default Q.441 timer

value will be provided for PERD (periodic timer). You need to

enter a value according to the Q.441 specication or any other

desired value to make the sequence work.

2.5.3.1 Standard Emulations

Use the CALL EMULATOR

screen to select a standard

emulation to place a call.

Figure 31 Call Emulator

List Screen

CALL EMULATOR F-keys

USER (F1): Select the USER CALL EMULATOR screen to create,

edit, or use a User emulation sequence. See Section 2.5.4.4 .

VIEW (F2): View a screen that

shows a sample sequence of

the selected emulation. Figure

45 shows a DTMF sequence.

Note that for DTMF RECEIVE,

the RECEIVE side is only

emulated.

START (F4): Start the selected

emulation as shown in the

screen to the right.Figure 32 DTMF Receive

Sequence Screen

40 SSMTT-27L

2.5.3.2 Place a Call

For call emulation, use the

screen shown to the right to

setup and place a call.

Figure 33 Q.441 MFCR2

Call Setup Screen

Use this procedure to setup the call:

1. CHANNEL: Choose a timeslot to place the call on. Select from

1-15, 17-31 by using NEXT (F1) and PREVIUS (F2).

2. CALL NUMBER: Press SHIFT and use the numeric keypad

to enter the digits for the number to call. The A-F keys, cor-

responding to the digits, are also available.

• For some emulation sequences the following items will also

be available to configure:

3. CALLING NUMBER: This is the number you are dialing from.

Use the SHIFT and number keys to enter the digits.

4. CALLING PARTY’S CATEGORY: This deals with the category

of the calling party as dened by Q.441 (or user dened by

the Signal Meanings) Forward Group II, i.e. the user can be

a subscriber without priority II-1, subscriber with priority II-2,

etc. Use SHIFT and keypad number keys to enter the digits.

5. Press CALL (F4) when ready to place the call. The appropriate

CALL screen is then displayed as in Figure 34.

The following is reported:

Time/s: Time sent; the time the

digits were sent.

Send: The CAS or Register

signalling sent.

Recv: The CAS or Register

signalling received.

Label: Sent or received CAS or

Register signalling meanings,

as defined by Supervision

Setup or Signal Meanings.


Call Emulation Screen

Q.441 MFCR2 Call F-keys

STOP / RESTART (F1): Stop or restart the CALL or RECEIVE.

ABSOLUT (F2): Display the time stamp in absolute mode.

41E1 Module

RELATIVE (F3): Display the time stamp relative to initial event.

HANG-UP (F4): Release the call in progress.

Keypad Functionality

When a MFCR2 or MFR2 call has been established, enable

keypad DTMF dialing by pressing SHIFT. DTMF tones will then

be sent when you press the 0-9 digits. This is especially useful

for verifying credit card functionality.

2.5.3.3 Receive a Call

Use this setup screen to

receive a call.

Figure 35 Q.441 MFCR2Receive Setup Screen

Congure the following:

CHANNEL

Press NEXT (F1) and PREVIUS (F2) to select from 1-15, 17-31

for the receive channel.

No. DIGITS EXPECTED

Press SHIFT and use the numeric keypad to enter the number

of digits you expect the test set to see and capture. The range is

from 1-20 digits.

Some receive emulations will include the following items:

REQUEST CALLER ID

Options; NO (F1), YES (F2)

• NO: Caller ID will not be sent to the test set.

• YES: Caller ID will not sent to the test set. When received, the

CALLER ID will show up in the messages.

REQUEST CATEGORY

Options; NO (F1), YES (F2)

• NO: REQUEST CATEGORY (such as 2, Subscriber with Prior -

ity, or 6, Data Transmission) will not be sent to the test set.

• YES: REQUEST CATEGORY will be sent to the test set. When

received, the category will show up in the receive messages.

42 SSMTT-27L

Press RECEIVE (F4) when

ready to receive a call. The test

set will display the RECEIVE

screens, where the call trace

can be viewed, as in the screen

to the right.


Receive Screen

The information presented and F-keys available are the same as

that for the CALL screen in Section 2.5.3.2.

2.5.3.4 User Emulation

Use this screen to create, edit, or use a user emulation sequence

using this procedure:

1. In the CALL EMULATION

screen, press USER (F1)

and the USER CALL EMU-

LATOR screen is displayed.

This screen features a list of

stored emulations and

allows for creating new

sequences.

Figure 37 User Call Emula-tor Screen

The following F-keys are available:

EDIT (F1): Edit a sequence.

DELETE (F2): Delete a selected sequence.

RENAME (F3): Display the CALL EMULATOR PROFILES

screen, where the selected sequence may be renamed. Use

the Label procedure further in this section.

START (F4): Start a selected emulator sequence.

2. Press EDIT (F1) and the Edit Emulator screen is displayed.

The cursor will be on the rst line; LABEL.

43E1 Module

3. Press EDIT (F1) again to

display the CALL EMULA-

TOR PROFILE screen,

where you give your call

sequence a label (name).

4 Follow this procedure to

give the sequence a label:

Figure 38 Call Emulator

Profiles Screen

A. Press TOGGLE (F3) to display the character screen.B. Use to move the cursor to the desired character,

and press SELECT (F4).

C. Continue steps A and B until the label is completed. Whennished, press TOGGLE (F3) to escape.

• If a mistake is made while entering characters, select the

character with the cursor, then press DELETE (F2).

D. When the label is com-

plete, press ENTER to

return to the EDIT EMU-

LATOR screen.

5. Use to select

CHANNEL and press NEXT

(F1) or PREVIUS (F2) to select

the timeslot to use (both Rx

and Tx) during emulation, in

the 1-15, 17-31 range.Figure 39 Edit Emulator

Screen

SEND Side

The Send side refers to the Line or Register signalling which is

sent by the test set on whichever line has been selected as Tx/

INSERT in TEST CONFIGURATION. Three items are available:

TYPE

Options: NONE (F1), CAS (F2), DTMF (F3), MF-F (more, F1),

MF-B (more, F2), DP (more, F3)

Determines the type of signalling used.

• NONE: No signalling• CAS: Channel Associated Signalling

• DTMF: Dual Tone Multi-Frequency• MF-F: Multi-frequency-forward

• MF-B: Multi-frequency-backward• DP: Dial Pulse

44 SSMTT-27L

CODE

Options: Any keypad alphanumeric digits; four digits maximum

for CAS. 20 digits maximum for all other types.

These bits will be transmitted by the test set. Press SHIFT and

use the numeric keypad enter the desired signalling bits.

PERD

Options: up to 999 ms

PERD determines the elapsed time before proceeding to the next

step in the emulation.

RECEIVE Side

The receive side refers to the Line or Register signalling which you

require to be received by the test set, before progressing to the next

step. Three items are available for the receive side. Note that TYPE

and CODE work in the same manner as in the send side.

TOUT

Options: NONE (F1), up to 999 ms

TOUT refers to Time Out. This determines the length of time which

the test set will wait for its received digits/CAS before aborting the

signalling sequence. To select a time limit:

A. Press SHIFT and enter the desired number digits up to 999

(ms). Press SHIFT when done.

B. Press ENTER to exit and save the settings.

6. To begin an emulation sequence, select the sequence you

want to use in the USER CALL EMULATOR Screen and press

START (F4). The screen shown in Figure 40 is displayed.

7 Observe the time digits are sent or received, and their label.

The following F-keys are avail-

able in the screen to the right:

STOP/RESTART (F1): Stops and

restarts the CALL or RECEIVE.

ABSOLUT (F2): Presents time

stamps in absolute mode (view

at Time/s line).

RELATIV (F3): Presents time

stamps in relative mode (view at

Time/s line).

Figure 40 Start User

Emulation Screen

45E1 Module

2.5.4 Dial Parameters

Use the DIAL PARAMETERS

screen to setup the following

VF dialing parameters.

Note: To enter number in this

screen, press SHIFT and use

the numeric keypad.

Figure 41 Dial ParametersScreen

DIAL PERIOD

Options: 1 ms to 999 ms (default is 100 ms)

Set the dial period in milliseconds used for DTMF and MF dialing.

SILENT PERIOD

Options: 1 ms to 999 ms (default is 100 ms)

Set the silent period in milliseconds used for MFR2, DTMF and

MF dialing.

INTERDIGIT PRD

Options: 1 ms to 999 ms

Set the interdigit period for pulse dialing.

TONE LEVEL dbm

Options: -20 to -5 dbm

Set the tone level. Press MINUS (F1) to attain a negative value.

B-BIT

Options: YES (F1), NO (F2)

B-Bit dialing applies to pulse calls. When B-bit dialing is enabled

and a call is placed, the B supervision bit of the selected timeslot

toggles between 0 and 1.

Before calling, change the transmit CAS bits to the seizure condi-

tion. When dialing, the test set will pulse the B-bit according to the

timing selected in %BREAK and INTERDIGIT period. When the

dialing is complete, the test set remains in the seizure condition.

PULSE (10pps)

Dial pulse is set to 10 pps and cannot be changed.

% BREAK

Options: 40% (F1), 50% (F2), 60% (F3)

Set the desired BREAK percentage used for pulse dialing. Percent

break is the ratio of the break (IDLE) interval to the total pulse

cycle interval.

46 SSMTT-27L

2.6 Other Features

This menu contains the following:

• ERROR INJECTION

• ALARM GENERATION

• SEND FRAME WORDS

2.6.1 Error Injection

To start error injection, press

ERR INJ. The test set will insert

errors as specified. If the error

injection is set to RATE mode,

an ERR-INJ indicator will be

displayed.

Configure the following:

Figure 42 Error Injection

Screen

TYPE

Options: CODE (F1), BIT (F2), BIT + CODE (F3), CRC-4 (MORE,

F2), FRAME (MORE, F2), E-BIT (MORE, F3)

Specify the type of errors to be inserted.

MODE

Options: BURST (F1), RATE (F2)

Specify the mode of error injection.

• RATE: Applies only to CODE and BIT errors. Errors are injected

at a constant rate.

• BURST: Inject a set number of errors in a burst.

COUNT/RATE

Options: 1 to 9999 or 1e-9 to 2e-3

For BURST MODE, choose the COUNT of errors to be inserted.

For RATE MODE, choose the error RATE number and exponent.

• For BURST, press SHIFT, then use the numeric keypad to enter

any number between 1 and 9999. The errors will be inserted

in approximately 1 second or less, and will cause from 1 to 3

errored seconds.

• Applies only to BIT and CODE errors. All other errors will be

injected singly.

• For RATE, the errors will be inserted at a continuous rate as

specied in this entry. “ERR-INJ” also be displayed.

47E1 Module

Programming a Burst of 10 Errors

1. Select ERROR INJECTION.

2. Press CODE (F1) to select the error type and the cursor au-

tomatically moves to MODE.

3. Press BURST (F1) and the cursor automatically moves to

COUNT

4. Press SHIFT and use the numeric keypad to enter 10. COUNT

should show 10.

5. When nished, press SHIFT.

6. Press ENTER; you have just programmed the test set to inject

10 CODE errors each time ERR INJ is pressed.

Programming a 10-6 Bit Error Rate

1. Select ERROR INJECTION.

2. Press BIT (F2) to select the error type. The cursor automati-

cally moves to MODE.

3. Press RATE (F2) and the cursor automatically moves to

COUNT

4. Press SHIFT and use the numeric keypad to enter 1. The

multiplier position shows 1. The cursor moves to the exponent

position.

5. Press 6.

6. When nished, press SHIFT.

7. Press ENTER and the test set is programmed to inject Bit

errors at 1x10-6 rate each time ERR INJ is pressed.

• To turn off the error rate injection, press ERR INJ once, then

verify that the ERR INJ indicator has turned off.

48 SSMTT-27L

2.6.2 Alarm Generation

This screen presents a list of

the alarms that can be trans-

mitted. Send alarms to test

various network equipment,

and thus ensure that the

network is performing as

expected.

Figure 43 Alarm Genera-

tion Screen

To Invoke an Alarm

Select the desired alarm and press ENABLE (F1) and the test set

will transmit the enabled alarm after exiting ALARM GENERA-

TION. To stop transmitting press DISABLE (F2).

Some alarms conict with the transmission of other alarms or

selected framing.

Alarms can be transmitted while making measurements, viewing

data, performing talk/listen, etc.

The following alarms are available:

FAS DISTANT: The test set transmits a 1 in every third bit of

each timeslot 0 frame that does not contain frame alignment

signal. This alarm may be transmitted only with PCM 30 or PCM

31 framing.

MFAS DISTANT: The test set transmits a 1 in the sixth bit of each

time slot 16 in the zero frame. This alarm may be transmitted only

with PCM framing.

AIS: The test set transmits all ones in an unframed signal. This

alarm overrides the framing set in TEST CONFIGURATION. For

instance, even though MFAS framing was selected, generating an

AIS alarm will cause the test set to transmit an unframed signal.

T/S-16 AIS: The test set transmits all ones in timeslot 16 of all

frames. T/S-16 AIS overwrites the MFAS (Multi Frame Alignment

Signal). A test set or network equipment that receives this alarm

will lose PCM-30 framing.

This alarm should only be used when the test set is congured

for FAS framing.

Voice frequency signalling bits can’t be transmitted while send-

ing this alarm, because the T/S-16 AIS signal overwrites all the

channel associated signalling (CAS) information.

49E1 Module

2.6.3 Send Frame Words

Use this screen to manually

specify the E and Sa bit states,

and the MFAS ABCD. Then use

it to transmit the desired FAS

and MFAS framing information.

Figure 44 Send Frame

Words Screen

• Items that can be selected can be changed.

• Use to move the cursor to the desired location. Reenter

the left-hand side of the screen by pressing .

• DEFAULT (F3) sets the bits to the default settings.

• AUTO (F4) is only displayed for E-bit selections.

• The bits are sent as soon as a F-key is pressed.

The following information is shown:

CRC

View the CRC option chosen in TEST CONFIGURATION. Change

the CRC option in the TEST CONFIGURATION screen.

E-BIT

Options: SET=0 (F1), SET=1 (F2), DEFAULT (F3), AUTO (F4)

• E-bit may be changed only if CRC is activated in TEST CON-

FIGURATION, and consequently, YES is displayed in the CRC

slot in this screen.

• If E-bit is set to AUTO, the E-bits will be transmitted on the

Tx/INSERT side anytime a CRC error is received on the Tx/

INSERT side Rx as in Figure 45.

• If E-bit is set to AUTO, the E-bits will be transmitted on the TX

(Transmit) side anytime a CRC error is received on the RX

(Receive) side, as in Figure 48.

Figure 45 Automatic E-Bit Transmission Setup

50 SSMTT-27L

To Manually Transmit the E-bits

Use SET=0 (F1) and SET=1 (F2) to enter the two bits.

• 11 is used for no E-bit errors, this is the default setting.

• 10 or 01 for 500 E-bit errors per second.

• 00 for 1000 E-bit errors per second.

FAS WORD

Displays the FAS (Frame Alignment Signal-0011011) Words.

MFAS WORD

Set bits 5-8 to any combination.

• Bits 5-8 have the pattern xyxx, where x represents spare bits;

they should be set to 1 when not used.

• Y is used for the MFAS remote alarm; it should be set to 1 if

MFAS synchronization is lost.

MFAS ABCD

These are the default ABCD bits used for channels 1-30 in PCM-

30 Framing.

• ABCD bits are transmitted in timeslot 16 of frames 2-16 of the

MFAS.

• Avoid using 0000 which causes false framing for PCM-30.

NFAS WORDS

These are the Non Frame Alignment Signal words.

When ready, press ENTER to send the selections.

51E1 Module

2.7 System Parameters

This menu screen contains the following:

• MEAS CONFIGURATION

2.7.1 Measurement Configuration

12:01:09

MEAS CONFIGURATION G.821 : ON

DGRM : ON G.826 : ON M.2100 : ON

M.2100/550 PARAMETERS

MEAS PERIOD : 15 min HRP MODEL % : 040.0

IDLE CHNL CODE : 11010101 IDLE CHNL A/B/C/D: 1001

more ON OFF

12:01:09

MEAS CONFIGURATION

MEAS DURATION : CONTINU START : MANUAL

PROG DATE YMD : ----:--:-- PROG TIME HMS : --:--:--

PRINT RESULT : LAST PRINT EVENT : DISABLE CODE CONFIGUR : HDB3

MEASURE MODE : BER AUDIBLE ALARM : DISABLE

more

TIMED CONTINU

Figure 46 Measurement Configuration Screens

Congure the following from the left screen in Figure 46:

MEAS DURATION

Options: TIMED (F1), CONTINU (F2)

Set the Measurement Duration.

• A timed measurement will stop when the specied amount

of time has elapsed. This is useful for making measurements

of a specied length. When a timed test is in progress, the

Remaining Time (RT) counter shows how much time is left

before the end of the test.

• If TIMED was selected, press SHIFT and use the numeric

keypad to enter a number between 1 minute to 999 hour.

• A continuous test will run indenitely until RESTART is pressed,

or a setting is changed that restarts the test.

START

Options: PROGRAM (F1), MANUAL (F2)

Select the method to begin a test.

• PROGRAM: This allows you to program a specied time in the

future to begin taking measurements. Once you have selected

PROGRAM, enter the desired time in the next two items.

• MANUAL: In this mode you must manually begin the test

measurements at the desired time.

PROG DATE YMD

Applies if PROGRAM for START was selected. Press SHIFT and

use the numeric keypad to enter the year, month, and date to

begin measurements.

52 SSMTT-27L

PROG TIME HMS

Applies PROGRAM for START was selected. Press SHIFT and

use the numeric keypad to enter the hour, minute, and seconds

to begin measurements.

PRINT RESULT

Options: TIMED (F1), LAST (F2)

• TIMED: Use to have the test results printed every minute to

999 hours and 59 minutes. Press SHIFT and use the numeric

keypad to enter the time from 1 minute to 999 hours.

• LAST: The test results are printed only at the end of a timed

test, or a continuous test that has ended due to a RESTART.

PRINT EVENT

Options: ENABLE (F1), DISABLE (F2)

• ENABLE: Use to print out a time and date-stamped error mes-

sage every second that one or more errors occur.

• DISABLE: Use if you don’t want to print each event.

CODE CONFIGUR

Options: HDB3 (F1), AMI (F2)

Select the line coding. HDB3 line coding is used almost every-

where throughout the world in 2.048M transmission. An explana-

tion of the related technology is located in Section 4.1.5 .

MEASURE MODE

Options: BER (F1), LIVE (F2), AUTO (F3)

• BER: Use to search for the test pattern, and make bit error

measurements with all other measurements.

• LIVE: Use to ignore the test pattern and make all measure-

ments, except for bit error measurement.

• AUTO: The test set will try to detect the data pattern as in BER

mode, then if the data pattern cannot be detected, the test set

will turn to LIVE mode.

Notes:

• Most technicians leave the test set in BER mode, even when

they are monitoring l ive, in-service circuits. In this case, they

expect the PAT SYNC light to remain RED, because there is

no pattern synchronization. The bit error measurements will

also show 100% UAS.

• If LIVE is selected, the PAT SYNC LED is turned OFF and the

bit error measurement screen is not displayed in MEASURE-

MENT RESULTS.

53E1 Module

AUDIBLE ALARM

Options: ENABLE (F1), DISABLE (F2)

Choose if the test set will sound a beep when it is receiving alarms

or errors. Note that the number of audible beeps is not equal to

the number of received errors.

Select the right screen in Figure 46 by pressing (‘more’ with up/

down arrows indicate additional screens).

This screen relates to ITU standards for 2.048 Mbit/s transmission,

G.821, G.826, and M.2100.

The next four items relate to ITU standards on measurements

and performance characteristics for 2.048 Mbit/s.

G.821

Options: ON (F1), OFF (F2)

• ON: The LINE 1 BIT ERROR screen is shown in MEASURE-

MENT RESULTS. This Bit Error screen presents the measure-

ment parameters specied in ITU G.821.

DGRM


• ON: DGRM (Degraded Minutes) is shown in MEASUREMENT

RESULTS, G.821.

G.826


• ON: The G.826 screen is displayed in MEASUREMENT

RESULTS. This G.826 screen presents the measurement

parameters defined in G.826.

M.2100


• ON: The M.2100 screen is shown in MEASUREMENT RE-

SULTS. This section refers to ITU specications used when a

2.048 Mbit/s circuit passes through international boundaries.

It allocates a certain allowable error rate to each nation that

carries the circuit. The technician needs to enter the appropri-

ate percentage allowed for the line. The test set makes the

M.2100/550 calculations and reports pass/fail in MEASURE-

MENT RESULTS, M.2100/550.

The next settings refer to M.2100/550 measurements:

54 SSMTT-27L

MEAS PERIOD

Options: 01-99 minutes

This setting controls how often a new result is displayed in MEA-

SUREMENT RESULTS, LINE 1(2)–M.2100/550. Use the SHIFT

key and the numeric keys to set the period.

HRP MODEL %

Options: .1 to 99.9 %

Refer to M.2100, or to the older M.550, for information on how to

select the Hypothetical Reference Performance model percent

(HRP %).

IDLE CHNL CODE

Options: Any 8-bit pattern

Program the idle code to be any 8-bit pattern, It is used during

VF channel access operations, when the TxSOURCE is set to

TESTPAT. The idle code is also used in fractional E1 testing to

fill up unused channels.

IDLE CHNL A/B/C/D

Options: Any 4-bit pattern

Program the idle channel signalling bits of channels 1-30 in the

MFAS framing mode. These signalling bits are found in time slot

16 of frames 1-15. The default, 1101, is set in accordance with

ITU G.704.

55E1 Module

2.8 View/Store/Print

You may store up to 50 different results to view or print at a later

time. To store results, use the procedure in Section 2.8.1.

VIEW PRINT more

DELETE moreRENAME UN/LOCK

Figure 47 View/Store/Print Screen

VIEW/STORE/PRINT F-keys

VIEW (F1): View a selected le, see Section 2.8.2.

PRINT (F3): Print a selected le, see Section 2.8.3.

RENAME (more, F1): Rename a selected file, see Section

2.8.6.

UN/LOCK (more, F2): Lock and unlock a selected le, see Sec-

tion 2.8.5.

DELETE (more, F3): Delete a selected le, unless locked, see

Section 2.8.4 .

56 SSMTT-27L

2.8.1 Saving a Test

1. From any screen with a STORE F-key, press it and a, CSV

file is created as indicated on screen. Press any key to return

to the previous screen.

2.8.2 Viewing a Stored Test

1. From the E1 MAIN MENU, select VIEW/STORE/PRINT.

2. Select the desired le with the keypad up/down arrow keys.

3. Press VIEW (F1) and the stored result will appear.

4. Use the keypad up/down arrow keys to scroll through the

available screens.

5. When nished, press ESC to return to the VIEW/STORE/

PRINT screen.

2.8.3 Printing a Stored Test

1. Connect a SunSet printer to the serial port of the test set.

• For other types of printers or for more information, refer to the

Storing and Printing chapter in the test set user’s manual.



4. Press PRINT (F3) and the le will begin printing.

5. When nished, press ESC to return to the VIEW/STORE/

PRINT screen.

2.8.4 Deleting a Stored Test



3. Press DELETE (more, F3) and the le is deleted if the le is

unlocked.

2.8.5 Locking and Unlocking a Stored Test



3. Press UN/LOCK (more, F2) and the le is locked or unlocked

as indicated to the right of the file name. Refer to the lock icon

shown in Figure 47.

57E1 Module

2.8.6 Renaming a Stored Test


2. Select the desired file using .

• Press UN/LOCK (more, F2) if the le is locked as indicated by

the lock icon.

3. Press RENAME (more, F2) and the character screen shown

in Figure 48 is displayed

4. Press INPUT (F3). Note that the ‘A’ character is highlighted

and the INPUT F-key has changed to STOP.

Figure 48 Character Entry Screen

5. Use to move the cursor to the desired character.

6. Press ENTER to place the desired character in the FILENAME

line. Continue this process until the FILENAME is complete.

You may enter up to 15 characters.

• If a mistake is made in the entry:

A. Press STOP (F3).

B. Move the FILENAME cursor to the incorrect character.

C. Press DELETE (F2) to delete the character or, press IN-

SERT (F1) to insert a character.

D. Press INPUT (F3) to select a character. Press ENTER to

insert the new character to the left of the cursor.

7. Press SAVE (F4) to save and return to the View/Store/Print

Screen shown in Figure 47.

58 SSMTT-27L

2.9 Profiles

Use the Profile function to store commonly used module configu-

ration settings.

The following screen contains a DEFAULT prole. This prole is

based on the factory standard configuration of this module. To

create other profiles, change the configuration settings in any

available screens. Once all conguration screens are changed

as desired, select PROFILES from the modules main menu and

select a blank line. Press F2 and the settings are saved with a

generic filename. Use this screen to manage profiles. The screen

and its functions are as follows:

Note: The DEFAULT file can’t

be deleted or unlocked.

LOAD STORE RENAME more

8:21:36

PROFILE LIST Free space: 113729 kbyte FILENAME LOADED MODULE LOCK 1.DEFAULT NO DE1 2.P00001 NO DE1 3.SANTA ROSE YES DE1 4. 5. 6. 7. 8. 9.10.

DELETE LOCK more

Figure 49 Profile List Screen

PROFILE LIST F-keys

LOAD (F1): Press to change all conguration settings of the mod-

ule to match the selected prole. The LOADED column changes

from NO to YES.

STORE (F2): Press to save all current conguration screens with

a generic filename. Currently 10 profiles can be saved. The type

of module is indicated in the MODULE column.

RENAME (F3): Select a lename and press F3 to change its

name. A character entry screen is displayed. Use the procedure

in Section 2.8.6 to edit the name from step 4.

DELETE (more, F1): Press to delete a selected unlocked pro-

file.

LOCK/UNLOCK (more, F2): Press to lock or unlock a selected

file. Lock a profile to prevent changes. The files status is indicated

by a lock icon in the LOCK column. In Figure 49, DEFAULT is

locked.

59E1 Module

3 Applications

3.1 Connecting the Cords

CAUTIONS!

• Plugging into a live E1 circuit may cause a loss of service for

multiple customers. Be sure you are properly trained before

proceeding.

• For BRIDGE access, do not plug into the circuit until you have

pre-selected the Rx Port: BRIDGE level. The test set will not

place isolation resistors in the line unless this is specified.

Figures 50 and 51 show various ways in which to connect the

test set to the circuit.

RX

TX

Figure 50 Term Mode Setup

RX

Figure 51 Monitor Mode Setup

60 SSMTT-27L

3.2 Accept a New Circuit

TX

RX

Figure 52 Accept a New Span

1. Verify that the span is not in service. This test will disrupt

service. There must be a loopback device at the far end.

2. From the E1 MAIN MENU, select TEST CONFIGURATION

and congure as follows:

Tx SOURCE: TESTPAT

FRAMING: as specied by the circuit design

CRC-4: as specified by the circuit design

TEST RATE: 2.048M

Rx Port: TERM

TX CLOCK: INTERN

When nished, press ENTER.

3. From the E1 MAIN MENU, select TEST PATTERN.

4. Select the desired test pattern and press ENTER.

5. Connect the test set to the circuit as shown in Figure 52.

6. Press HISTORY to acknowledge any history LEDs . Verify that

the PAT SYNC LED is green.

7. From the E1 MAIN MENU, select MEASUREMENT RESULTS

and press START (F3).

8. Verify that the circuit performs to your company’s requirements

for the service delivered. Use PAGE-UP (F1) and PAGE-DN

(F2) to access each of the individual measurement screens.

9. When done, press ESC to return to the E1 MAIN MENU. Re-

move the loop at the far end of the circuit.

61E1 Module

3.3 In-Service Circuit Monitoring

1. This test may be performed while the line in service.

2. From the E1 MAIN MENU, select TEST CONFIGURATION

and congure as follows:

Tx SOURCE: TESTPAT

FRAMING: as specied by the span design

CRC-4: as specified by the span design

TEST RATE: 2.048M

Rx PORT: MONITOR or BRIDGE

L2-Rx PORT: MONITOR or BRIDGE

TX CLOCK: INTERN

When nished, press ENTER.

Note: If unsure of what RX PORT level to use, then use BRIDGE.

MONITOR is used with a PMP (Protected Monitoring Point).

3. Connect to the circuit as in Figure 53 using either method.

4. Press HISTORY to acknowledge any history LEDs.

Bridge ModeRx

Monitor ModeRx

OUT

IN

MON

OUT

IN

MON

Line

Figure 53 In-Service Circuit Monitoring Setup

5. Examine the LEDs for information about the tested circuit:

• SIGNAL should be green, red indicates no signal.

• A valid framing type should be indicated.

• A steady ERROR or CODE indicates that the circuit is working

but is experiencing trouble.

• An ALARM indicates a problem on the far end of the circuit.

• AIS may indicate a trouble condition where a network element

transmitting to the test set has lost its incoming signal and has

replaced it with the AIS signal.

6. From the E1 MAIN MENU, select MEASUREMENT RESULT,

press START (F3).

7. Verify that the span performs to your company’s requirements

for the service delivered.

62 SSMTT-27L

3.4 Checking for Frequency Synchronization

Frequency synchronization can be a problem when:

• The customer purchases a channelized E1 circuit.

• The customer’s circuit passes through a synchronous networkelement, i.e., exchange, PBX, or a digital cross-connect.

• The E1 circuit passes through more than one carrier.

Frequency synchronization problems result in bit slips, a major

source of service impairment. See Figure 54 for the setup and use

this procedure to identify frequency synchronization problems.

EXT CLOCK

OUT

IN

MON

OUT

IN

MON

RX

Figure 54 Frequency Synchronization Setup

1. This test may be performed while carrying live trafc, it also

requires a 2.048 Mbit/s reference frequency source. On a 2.048

Mbit/s circuit, one side will usually provide a synchronized

signal. This side can be used as the reference. The other side

can be measured for frequency synchronization.

2. From the E1 MODULE main menu, select TEST CONFIGURA-

TION and congure as follows:

Tx SOURCE: TESTPATFRAMING: as specied by the circuit design.

CRC-4: as specified by the circuit design.TEST RATE: 2.048M

Rx PORT: MONITOR

TX CLOCK: REF CLK

Press ENTER when congured.

3 Plug into the E1 signal as shown in Figure 54 and press HIS-

TORY to acknowledge any blinking LEDs.

4. From the E1 MODULE MAIN MENU , select MEASUREMENT

RESULTS and press START (F3).

5. Press PAGE-DN (F2) until the FREQUENCY screen is dis-

played and observe if frequency varies from the 2.048 MHz

reference frequency. Frequency slippage rate is indicated by

>>> or <<<. To view (+/-) WNDR values, use this screen to

provide an indication of any low-frequency variation in the E1

signal’s frequency.

63E1 Module

3.5 Measuring Signal Level

MON

Equipment

TX

RX

S U

N R I S

E

RX

Equipment

TX

RX

MON

Figure 55 Measuring Signal Level Setup

A signal level measurement can be performed by itself or in con-

junction with one of the other tests.

1. Select the Rx PORT level you want to use.

• You can make the measurement in TERM, MONITOR, or

BRIDGE modes.

• A 1111 pattern in Rx PORT TERM and BRIDGE provides the

most accurate results.

• MONITOR is a convenient mode, it generally shows a result

of about -20 or -30 dB.

• TERM will disrupt service.

• BRIDGE: Measurement may be degraded by a low-quality

termination at the network element terminating the E1 line.

2. The rest of this procedure will use the TERM mode for illustra-

tive purposes. Verify that the span is not in service.



Tx SOURCE: TESTPAT

FRAMING: As specied by the circuit design.

CRC-4: As specified by the circuit design.

TEST RATE: 2.048M

Rx PORT: TERM

TX CLOCK : INTERN


4. Plug the test set into the circuit as shown in Figure 55.

5. Press HISTORY to acknowledge any blinking LEDs.

6. From the E1 MODULE MAIN MENU, select MEASUREMENT

RESULTS and press START (F3).

7 Press PAGE-DN (F2) until the ALM/SIG screen is displayed.

8. Read the signal level. Note that separate readings are given

for the positive and negative signals so that you can get more

accurate information on a faulty regenerator.

64 SSMTT-27L

3.6 V.54 Channel Loopback Test



Tx SOURCE: TESTPAT

TEST RATE: Nx64/2.048M (as required)


2. Connect to the circuit as shown in Figure 5:

Figure 56 V.54 Setup

3. From the E1 MODULE main menu, select OTHER MEASURE-

MENT > CHANNEL LOOPBACK and at MODE select LOOP

UP. If successful, a “LOOP UP OK!” message is displayed, if

not, “LOOP UP ERROR” is displayed.

4. From the E1 MODULE main menu, select MEASUREMENT

RESULT and run a BERT.

5. Stop the test.


MENT > CHANNEL LOOPBACK and at MODE select LOOP

DOWN. When the loopdown is complete “LOOP DOWN OK”

is displayed.

65E1 Module

3.7 Running a Timed Test

Many network tests require the use of an exact time period such

as 15 minutes, 1 hour, or 24 hours over which to conduct a test.

In this section, you will congure the timer for one of these tests.

Use the following procedures.

3.7.1 Manual Start

1. Use a desired application for your test.

2. From the E1 MODULE main menu, select SYSTEM PARAM-

ETERS > MEAS CONFIGURATION.

3. At the MEAS DURATION line press TIMED (F1).

4. Press SHIFT to display the ‘SHFT’ indicator.

5. Enter in the number of hours and minutes that you want the

test to run by using the keypad, press SHIFT when done.

6. Select the START line and press MANUAL (F2).

7. Press ESC until the E1 MODULE main menu is displayed.

8. Proceed with the desired application for your test.

• The test will now be timed when MEASUREMENT RESULT

is performed.

• Observe the remaining time by viewing the RT (Remaining

Time) indicator in the upper right-hand portion of the screen.

3.7.2 Auto Start

To program the test set to begin measuring at a future date and

time, use the following procedure:

1. In MEAS CONFIGURATION, at the MEAS DURATION line,

press TIMED (F1).

2. Press SHIFT to display the ‘SHFT’ indicator.

3. Enter in the number of hours and minutes that you want the

test to run by using the keypad, press SHIFT when done.

4. Select the START line and press PROGRAM (F1).

5. Select the PROG DATE YMD line. Use the SHIFT and number

keys to enter the Year, Month, and Day you wish the timed test

to begin, press SHIFT when done.

6. Select the PROG TIME HMS line. Use the SHIFT and number

keys to enter the Hour, Minute, and Second you wish the test

to begin, press SHIFT when done.

7. Connect the test set to the circuit and configure as needed.

8. Leave the test set in module mode and it will begin measuring

at your programmed date and time.

66 SSMTT-27L

3.8 Observing Network Codes or Channel Data

Observe in the screen to the

right live data (binary or hexa-

decimal) with ASCII transla-

tions, It can also decode E1

network control codes that are

in use and verify the content of

individual channels.

Use the following procedure:

Figure 57 View ReceivedData Screen


TION and congure using the following guidelines:

• If in-service use BRIDGE or MONITOR.

• If out-of-service use TERM.

• Specify the other TEST CONFIGURATION settings as required.

The test set must detect valid framing.

2. Connect to the circuit using an approbate method to make the

connection shown in Figure 53.


4. Press ESC to display the E1 MODULE main menu and select

OTHER MEASUREMENT >VIEW RECEIVED DATA.

• You will now receive a live display of the E1 data.

• Scroll down through 64 pages of information.

• Observe the changes which have occurred over time.

5. Review the live data as it is displayed. When the codes that you

are interested in appear, press PAUSE (F3) to trap 64 pages

of data. Press PAGE-DN (F2) to scroll through the data.

• The data is presented as it appears in the E1 bit stream and

is broken out into timeslots.

• View control information in timeslot 00 for FAS framing.

• View control information in timeslots 00 and 16 for MFAS

framing.

• All other channels (time slots) should contain actual voice/data

signals (or your the received test pattern).

67E1 Module

3.9 Monitoring a Voice Frequency Channel

This is a procedure for monitoring a voice frequency channel

within an E1 circuit. This test may be performed while the span

is in-service.



Tx SOURCE: TESTPAT



TEST RATE: 2.048M

Rx PORT: MONITOR or BRIDGE

TX CLOCK: INTERN


2. Connect to the circuit using an approbate method to make the

connection shown in Figure 53.


4. Verify that FRAME is green.

5. Press ESC to reach E1 MODULE main menu and select VF

CHANNEL ACCESS > VF & NOISE MEASUREMENTS.

6. Enter the desired transmit and receive timeslots.

• The channel number will bypass any timeslots containing the

E1 framing information.

• In FAS framing, no access is granted to timeslot 00.

• In MFAS framing, access to timeslots 00 and 16 is denied.

7. Use either TALK or TONE for TxMODE.

8. Adjust the volume to the desired level by pressing VOLUME,

then use UP (F1) or DOWN (F2).

Note: If you are not able to monitor the channel:

- Verify that the AUTO framing of the test set was able to

synch on a recognized framing pattern.

- Press the AUTO key to restart the auto framer if a valid

frame pattern is not shown.

- If this doesn’t work, try unplugging and re-plugging the

receive cord. This will positively verify that there is no rec-

ognizable framing at this moment.

68 SSMTT-27L

3.10 Simple Talk/Listen

This is the simplest procedure for talking and listening on an E1

circuit. The setup is illustrated in Figure 52. However, instead of

having a loopback at the far end of the circuit, the setup may have

another test set, a channel bank, a switch, or other E1 terminating

network element.

Use this procedure:

1. Verify that the span is not in service. This test will disrupt

service for all of the channels you are not using.

2. Connect to the circuit using method shown in Figure 52.



Tx SOURCE: TESTPAT



TEST RATE: 2.048M

Rx PORT: TERM

TX CLOCK: INTERN


Note: An unframed signal can’t support Talk/Listen. The FRAME

LED must be green for this procedure to work.

4. Press HISTORY to acknowledge any blinking history LEDs.

5. Press ESC to reach the E1 MODULE main menu and select

VF CHANNEL ACCESS > VF & NOISE MEASUREMENTS.

6. Select the receive (listen) and transmit (talk) channels (they

are usually the same channel number).

7. Select TALK for the TxMODE and talk/listen on the selected

channel.

8. Adjust the volume to the desired level by pressing VOLUME

and UP (F1) or DOWN (F2). When nished, press EXIT (F3)

to exit from the VOLUME CONTROL screen.

69E1 Module

3.11 Send a Tone

This is an intrusive test. Be sure the E1 line is not carrying traffic

or that it will be able to withstand any hits that this procedure will

introduce.



Tx SOURCE: TESTPAT



TEST RATE: 2.048M

Rx PORT: TERM

TX CLOCK: INTERN


2. Connect the test set to the circuit as in Figure 50.


4. Press ESC to reach the E1 MODULE main menu and select

VF CHANNEL ACCESS > VF & NOISE MEASUREMENTS.

5. Use NEXT (F1) or PREVIUS (F2) to set up the receive and

transmit channels (timeslots). Select the rest of the menu items

as follows:

Tx A/B/C/D: as required

TxMODE: TONE

TONE FREQ : enter the desired frequency

Tx LVL (dBm): enter the desired tone level

• The test set is now transmitting a tone on the selected chan-

nel.

• In the VF & NOISE MEASUREMENTS screen, view the re-

ceived frequency and noise measurements.

70 SSMTT-27L

3.12 Nx64 kbit/s Testing

Equipment

MON

OUT

IN

Figure 58 Fractional E1 Testing Setup

Fractional E1 circuits are circuits of data rate Nx64 kbit/s, where

N can be anywhere from 1—31 channels. N channels of the E1

line are dedicated to the fractional E1 circuit, and the remaining

channels of the E1 line are either lled with idle code, other rev-

enue traffic or framing information.

Use the following procedure:

1. This test will disrupt service, Verify that it is not in service.



Tx SOURCE: TESTPAT



TEST RATE: Nx64K, the fractional SELECT TIME SLOT screen

is displayed. Manually congure the timeslots or use AUTO

congure. If needed, refer to Section 2.1 for the procedure.

Rx PORT: TERM

TX CLOCK: INTERN


• AUTO conguration may not yield proper channels if:

- any of the active channels are transmitting an idle code.

- the idle code (set in SYSTEM PARAMETERS > MEAS

CONFIGURATION page 2 > IDLE CHNL CODE) is not the

same as the idle code of the circuit being tested.

3. Connect the test set to the circuit as shown in Figure 58.

4. Ensure that a loop is in place at the far end of the circuit.


6. Select MEASUREMENT RESULTS and press START (F3) to

perform the acceptance test.

7. Verify the fractional service performs to your company’s re-

quirements for the service delivered.

71E1 Module

Observing Idle and Active Channels:

1. In TEST CONFIGURATION, use the settings given in step 2 of

Nx64 kbit/s Testing, except set TEST RATE to 2.048 Mbit/s.

1. Connect the test set as shown in Figure 58.


MENTS > VIEW RECEIVED DATA, this will allow double check-

ing the information being transmitted on a channel-by-channel

basis.

72 SSMTT-27L

73E1 Module

4 Reference

4.1 E1 Technology Overview

This E1 Technology Overview covers the fundamental concepts

in 2.048 Mbit/s technology: sampling a signal, converting this

information into a bitstream, and dividing the bitstream into seg-

ments (channels). This section also touches upon the basics of

signalling technologies like MFR2 and CAS.

4.1.1 Technical Standards

E1 transmission technology is defined by a number of technol-

ogy standards. Such standards allow equipment designers and

service providers to ensure that various pieces of equipment are

compatible and that networks operate in a predictable, reliable

manner.

The following standards cover many of the important aspects of

E1 transmission technology:

• ITU G.703: Physical/electrical characteristics of interfaces.

• ITU G.704: Synchronous frame structures.

• ITU G.706: Frame alignment and CRC.

• ITU G.821: Error performance of a international connection.

• ITU G.826: Error performance and transmission quality control.

• ITU M.550/M.2100 Getting an international connection into

service.

• Q.140: Concerns redundant copies from subrate channels.

• Q.400: Concerns CAS (Channel Associated Signaling).

Consult these standards when you need detailed information on

particular aspects of E1 transmission technology.

4.1.2 Basic Definitions

Binary Data: A signal which has been converted into a format

of 0s and 1s.

Bit Stream: Binary Data which has been placed in a sequence

at a fixed rate.

Channel: A single portion of the bit stream which is available for

bidirectional communication.

4.1.3 Converting a Voice Signal

To transmit voice over a digital medium, like a 2.048 Mbit/s line.

We rst need to encode the analog voice signal into a binary for-

mat. Then it must be converted to a bit stream suitable for digital

transmission. This conversion can be achieved through Pulse

Code Modulation as shown in Figure 59.

74 SSMTT-27L

Figure 59 Converting a Voice Signal

The Nyquist theorem requires that the signal be sampled at

twice the signal’s maximum frequency in order for the signal to

be reproduced without a loss of information. For voice signals,

the maximum frequency is approximately 4000 Hz. This provides

adequate clarity for voice transmission bandwidth. Thus, we must

sample our 4000 Hz voice signal at a frequency of 8000 Hz (8000

samples/second).

The amplitude of the analog voice signal is sampled 8000 times

per second. Each amplitude value is expressed as an 8-bit code

‘word’. These 8-bit words occurring 8000 times per second form

a 64 kbit/s digital bit stream.

The 8-bit code word is formed by comparing the amplitude of the

analog sample to a companding characteristic. This characteristic

is a formula which translates the amplitudes of the samples into

the 8-bit code words. Internationally, a companding characteris-

tic known as ‘A-law’ is used. The purpose of A-law is to provide

optimum signal-to-noise performance over a wide ranger of trans-

mission levels. Linear encoding provides a poorer signal-to-noise

ratio at the -20 dB level typical of speech. In North America, the

encoding is done according to the Mu-Law. Therefore, the com-

panding law used for encoding the voice signal must match that

for decoding, for distortion-free transmission.

4.1.4 2.048 Mbit/s Data Rate

The E1 signal (bitstream) is transmitted at a rate of 2.048 Mbit/s

(2 048 000 bits per second). This transmission rate is achieved

by combining 32 individual 64 kbit/s bitstreams:

64 (kbit/s /Channel) x 32 (Channels) = 2048 kbit/s = 2.048 Mbit/s

This 2048 Mbit/s signal is the overall E1 transmission rate.

75E1 Module

4.1.5 Line Coding

Two common E1 line coding types are shown in Figure 60:

AMI Line

Coding

2.37V

0V

-2.37V

time

HDB3 Line

Coding

2.37V

0V

-2.37V

time

1 1 10 0 0 0 0 0

Note: This voltage is seen from a 75 Ω unbalanced connection.

Figure 60 AMI and HDB3 Line Codings

AMI: This is the simplest of the two line coding formats. AMI stands

for Alternate Mark Inversion, and is used to represent successive 1

values in a bitstream with alternating positive and negative pulses.

Figure 60 depicts these alternating pulses. AMI is not used in most

2.048 Mbit/s transmission because synchronization loss occurs

during long strings of data zeros.

HDB3: This line coding format was adopted in order to eliminate

synchronization problems occurring with AMI. With HDB3 coding,

a string of four consecutive zeros is replaced with a substitute

string of pulses containing an intentional bipolar violation. As

the far end equipment receives the E1 signal, it examines the

bit stream for these intentional bipolar code violations. It then

extracts the code and reconstruct the original data. The HDB3

code substitutions provide high pulse density so that the receiv-

ing equipment is always able to maintain synchronization with

the received signal. For example, in the code 1000 0000, HDB3

coding substitutes bipolar violations for the string of zeros.

General rules apply to the substitutions. The particular substitution

made is governed by the polarity of the last inserted bit, as well as

the number of pulses following the previous violation bit. If there

is an odd number of pulses, 000V is substituted; the polarity of V

is the same as that of the bit immediately preceding it. If there is

an even number of pulses, B00V is inserted; the polarity of B is

opposite to that of the bit immediately preceding it and the polarity

of V is the same as that of B. See Figure 61 to see the types of

HDB3 zero substitution codes.

76 SSMTT-27L

Even

(substitute

B00V)

Odd

(substitute

000V)

Polarity of Previous Pulse

1 0 0 1 1 0 0 1

0 0 0 1 0 0 0 1

Number ofpulses

(since lastsubstitution).

Figure 61 HDB3 Encoding

The E1 module can be congured to detect the one of the two

types of HDB3 substitution codes, even if they are not matched

to the proper number of pulses since the last substitution.

4.1.6 Signal Levels

Once a signal has been encoded into a binary format and as -

sembled into a bit stream, the pulses in the bit stream are then

converted to actual voltage levels suitable for E1 transmission.

In Figure 62, a typical signal level for an E1 pulse with 75Ω im-

pedance is either ± 2.37 volts (for a binary 1 value) or 0 volts (for

a binary 0 value). Real-world values are typically ± 10%. Ideally,

each pulse transmitted would be perfectly symmetrical. However,

in the real-world, each pulse is slightly distorted when generated

and more so when it travels down the line. In Figure 62 the shape

of an ideal pulse is compared to an actual pulse.

An E1 pulse might need to conform to a standardized pulse shape.

This is often determined by comparing it to a specified ‘mask’. A

commonly used pulse mask is dened by ITU-T G.703, it is shown

in the G.703 Mask illustration in Figure 62.

Note: For an E1 pulse with 120Ω impedance, the signal level

is either ± 3 volts (for a binary 1 value) or 0 volts (for a binary 0

value) with real world values typically be ± 10%.

G.703 MaskActual PulseIdeal Pulse

Figure 62 Pulse Shape

77E1 Module

4.1.7 2.048 Mbit/s Framing

E1 transmission utilizes two types of framing: FAS (Frame Align-

ment Signal) and MFAS (MultiFrame Alignment Signal). Framing

is necessary so that the equipment receiving the E1 signal is able

to identify and extract the individual channels. PCM-31 uses FAS

framing and PCM-30 uses MFAS with FAS framing.

FAS (Frame Alignment Signal)

The 2.048 Mbit/s frame consists of 32 individual time slots (num-

bered 0-31). As described previously, each time slot consists of

an individual 64 kbit/s channel of data.

In the FAS format, time slot 0 of every other frame is reserved for

the FAS pattern. Alternate frames contain the FAS Distant Alarm

indication bit and other bits reserved for National and International

use. Hence, there are 31 time slots into which data can be placed

as in Figure 63.

Time Slot 0 31...1

One 2.048 Mbit/s Frame

BITS

1 2 3 4 5 6 7 8

E 0 0 1 1 0 1 1

E 1 A Sa Sa Sa Sa Sa

Notes:

• Even Frame: Contains FAS.• Odd Frame: Contains NFAS.• Sa: This bit is reserved for national use.• E: Error indicator bit.• A: Remote alarm indicator bit.• 0011011: Frame alignment signal.• (8 bits per timeslot)(8000 frames per second) = 2.048 Mbps

Figure 63 FAS Framing Format

FAS does not accommodate voice channel signalling. The first

bit (c or Si) of these frames is reserved for international use. It

can be used for the CRC-4, Cyclic Redundancy Check-4, when

enhanced performance monitoring is required. Therefore, when

CRC is enabled in TEST CONFIGURATION, these bits depend

upon the CRC calculation and should continually change between

0 and 1. When CRC-4 is not enabled, these bits are set to 1.

In FAS framing, the odd frames do not contain the frame align -

ment signal. The bits are dened as follows:

78 SSMTT-27L

• When CRC is enabled, bit 1 is used for the Cyclic Redundancy

Check-4 performance monitoring. When CRC is enabled, this

bit may only be changed when CRC is disabled.

• The second bit is set to 1 to avoid FAS signal confusion.

• Bit A is used for the Remote (FAS) Distant Alarm. This bit is

set to 1 to indicate an alarm. It is set to 0 for no alarm.

• Spare bits (4-8): Are set to 1 for crossing an international border.

When unused, their settings are dened by ITU-T G.704.

The rst bits of frames 13 and 15 transmit the two E-bits, which are

used to indicate CRC-4 errors. A 0 in this bit denotes received errored

sub-multiframes; a 1 represents errorless received frames.

MFAS (MultiFrame Alignment Signal)

BITS

1 2 3 4 5 6 7 8

B C A B C DA D

Ch 1 (TS-1) Ch 16 (TS-17)

BITS

1 2 3 4 5 6 7 8

B C A B C DA D

Ch 15 (TS-15) Ch 30 (TS-31)

TS 31TS 0 -------- TS 16 --------TS 31TS 0 -------- TS 16 --------

TS 31TS 0 -------- TS 16 --------

FRM 15FRM 0 FRM 3FRM 1 FRM 2 ---------

BITS

1 2 3 4 5 6 7 8

0 0 X Y X X0 0

Notes:

• Frame 0, timeslot 16: 8 bit MFAS signal.• Frames 1-15, time slot 16:

(4 signalling bits per channel)(30 channels) /(8 signalling bits per frame timeslot 16) =15 frames of timeslot, 16 signalling.

• Frame 0 TS 16 bits: MFAS = 0000• NMFAS = XYXX, where X is spare bits. If this is not used,

then this is 1). Y is the MFAS remote alarm. If MFAS synch islost, then this is 1.

• Frames are transmitted with 30 voice channels in time slots 1through 15, and 17 through 31.

• Timeslot 16 (TS16) contains A/B/C/D bits for signalling (CAS).• MFAS multiframe consistes of 16 frames.

Figure 64 MFAS Framing Format

MFAS framing provides CAS (Channel-Associated Signalling) to

transmit A/B/C/D bit supervision information for each channel. This

method uses the 32 timeslot frame format including timeslot 0 for

the FAS. This method also uses timeslot 16 for the MFAS and the

CAS. It takes 16 frames to make up a MultiFrame.

When the MFAS frame is transmitted, all of the individual FAS

frames and framing information intact is left intact. The 16 FAS

frames are assembled together, dedicating timeslot 16 of the first

frame to MFAS framing information, then dedicating timeslot 16

of the remaining 15 frames to A/B/C/D bits as in Figure 64.

79E1 Module

CRC-4 Error Checking in a MultiFrame Format

Notes:

• SMF-FRM+1: Sub-Multiframe #1.

• Sa: Spare bit reserved for national use.

• A: Remote Alarm (FAS: Remote Alarm Indication).

• Frame Alignment Signal Pattern: 0011011

• CRC-4 Frame Alignment Signal: 001011

• CRC multiframe is not aligned with MFAS timeslot 16 multiframe.• SM-FRM 2: Sub-Multiframe 2

• E: E-bit Errors.

• c1, c2, c3, c4: CRC bits

M-

FRM

1

2

Bits

FRM

0

1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

Bit 1

c1

0

c2

0

c3

1

c4

0

c1

1

c2

1

c3

E

c4

E

Bit 2

0

1

0

1

0

1

0

1

0

1

0

1

0

1

0

1

Bit 3

0

A

0

A

0

A

0

A

0

A

0

A

0

A

0

A

Bit 4

1

Sa4

1

Sa4

1

Sa4

1

Sa4

1

Sa4

1

Sa4

1

Sa4

1

Sa4

Bit 5

1

Sa5

1

Sa5

1

Sa5

1

Sa5

1

Sa5

1

Sa5

1

Sa5

1

Sa5

Bit 6

0

Sa6

0

Sa6

0

Sa6

0

Sa6

0

Sa6

0

Sa6

0

Sa6

0

Sa6

Bit 7

1

Sa7

1

Sa7

1

Sa7

1

Sa7

1

Sa7

1

Sa7

1

Sa7

1

Sa7

Bit 8

1

Sa8

1

Sa8

1

Sa8

1

Sa8

1

Sa8

1

Sa8

1

Sa8

1

Sa8

SM-

FRM

TIME SLOT 0

Figure 65 CRC-4 Multiframe Format

Cyclic Redundancy Check-4 (CRC-4) is often used in E1 transmis-

sion to identify possible bit errors. CRC-4 allows the detection of

errors within the 2.048 Mbit/s signal while it is in service.

CRC-4 is based on a mathematical calculation performed on each

submultiframe of data. The equipment which originates the E1 data

calculates the CRC-4 bits for one submultiframe. Next it inserts the

CRC-4 bits in the CRC-4 positions in the next submultiframe. The

receiving equipment performs the reverse mathematical computa-

tion on the submultiframe. It examines the CRC-4 bits which were

transmitted in the next submultiframe, then it compares the trans-

mitted CRC-4 bits to the calculated value. If there is a discrepancy

in the two values, a CRC-4 error is reported.

There are two things to remember when using CRC-4 errors

80 SSMTT-27L

to determine the performance of an E1 circuit. Each individual

CRC-4 error does not necessarily correspond to a single bit er-

ror. Multiple bit errors within the same submultiframe will lead to

only one CRC-4 error for the block. Also, it is possible that errors

could occur such that the new CRC-4 bits are calculated to be

the same as the original CRC-4 bits.

CRC-4 error checking provides a convenient method of identifying bit

errors within an in-service system. On an in-service system, it is gen -

erally not possible to measure the actual bit errors because there is

no pattern synch. Bit error measurement is used on an out-of-service

system because the results are slightly more precise.

CRC-4 also uses a multiframe structure consisting of 16 frames, as

shown in Figure 65. However, the CRC-4 multiframe is not neces-

sarily aligned with the MFAS multiframe. Each CRC-4 multiframe

can be divided into 2 sub multiframes (SMF). These are labeled

SMF#1 and SMF#2 and consist of 8 frames apiece. Four bits of

CRC information are associated with each submultiframe.

The CRC-4 bits are calculated for each submultiframe, buffered,

and inserted into the following submultiframe to be transmitted

across the E1 span.

When the terminating equipment calculates an error using CRC-

4, it should transmit an E-bit to the far end, thus informing the far

end equipment of the error.

E-bit Performance Monitoring

T er minal Equipment A

Pr otectedMonitor Point

T er minal Equipment B

Trouble Point

CRC

Error

E-Bit

Error

Test Set 1 Test Set 2

E-Bit

Error

No

Errors

RX RX

Figure 66 In-service E-bit Performance Monitoring

When the terminal equipment of a 2.048 circuit is optioned for

CRC-4 transmission, E-bit transmission may also be enabled.

81E1 Module

E-bit performance monitoring of the circuit is now possible. The

terminating equipment transmits an E-bit error on the 2.048 Mbit/s

line, when it receives a CRC-4 error. However, E-bit error transmis -

sion is a relatively new feature in 2.048 transmission. Therefore, it

is likely that the embedded equipment does not transmit the E-bit

error information correctly. You should check the specications of

your network. Refer to Figure 66.

When this type of terminal equipment detects an incoming CRC-4

error, it will respond by transmitting an E-bit error toward the other

terminal. Test set 2, shown in Figure 66, will be able to see the E-bit

errors by plugging into a protected monitoring point. Note that the test

set can not see the actual code errors, framing bit errors and CRC

errors introduced at the trouble point. The test set can see only the

E-bit errors transmitted by Terminal B. Thus, E-bit error transmission

allows a 2.048 Mbit/s in-service circuit to be reliably monitored for

transmission performance from any point on the circuit.

Without E-bit error transmission, only a complete circuit failure

can be reliably determined at any point on the circuit. With a

complete circuit failure, the test set will see either loss of signal,

alarm indication signal, or remote alarm indication.

4.2 MFR2/DTMF/DP Technology

There are a number of signalling methods used by public tele-

phone networks. The methods are divided between the local loop

and interofce signalling. In Figure 67, the signalling applied for

each environment is as follows:

• LOCAL LOOP:

- Pulse

- DTMF (Dual Tone Multi-Frequency)

- ISDN (Integrated Services Digital Network)

• INTEROFFICE:

- MFR2 (Multi-Frequency)

- MFC (Multi-Frequency Compelled)

- SS7 (Signalling System #7)

C. O.

X X C. O.

X X

MF, MFC, SS7

Interoffice

Pulse

DTMF

ISDN

Local Loop

Pulse

DTMF

ISDN

Local Loop

Figure 67 Local Loop and Interoffice Signalling Method

Local Loop

82 SSMTT-27L

In the local loop environment, a common signalling method is

DTMF. It uses two tones, a high and a low, to represent a digit.

The frequencies used are shown in Figure 68.

Figure 68 DTMF Frequency Keypad

For example, if 5 is pressed, two frequencies are generated; 1336

Hz and 770 Hz. DTMF registers, converters, or receivers then

recognize these tones as representing the digit 5 and translate

them into digital signals.

Pulse signalling is older than DTMF, and was originally used for

rotary phone sets. When a number is dialled, a series of short

IDLE/SEIZURE signals are created with specic timing, usually

10 pulses per second. If a number 3 is dialed, the wheel will send

3 IDLE/SEIZURE signals with a specic inter-digit timing between

the digits. The switch will interpret the number of IDLE/SEIZURE

signals, and the inter-digit duration to determine the dialed digit.

B-bit dialing is used to toggle the B-bit when seizing the line. In

the seizure state, the B supervision bit is toggled (ABCD ABCD).

If the number 463 is dialled, the B bit will ash 4 times, then rest

for approximately one second, toggle six times, rest again, and

toggle 3 times.

ISDN provides digital services via regular phone lines.

Interoffice Signalling

MFR2 is a common signalling method used in the interoffice en-

vironment. Similar to DTMF, MFR2 uses two tones for each digit

being dialled. However, these tones are selected from a group of

only six frequencies. A and B bit signalling is used to seize and

acknowledge the line. These can be found in:

• ITU Q.441 Tables 5-9

MFC (Multi Frequency Compelled) dialling allows the two ex-

changes to send digits to each other in both the forward and

backward direction. This helps ensure accurate transmission of

the digits in a noisy environment.

83E1 Module

5 General Information

5.1 Testing and Calibration Statement

Sunrise Telecom certies that this product was manufactured,

tested, and verified according to the applicable Sunrise Telecom

Incorporated manufacturing and test procedure(s). These formal

procedures are designed to assure that the product meets its

required specifications.

This product has no user-adjustable settings. During normal usage,

periodic calibration is not a requirement. However, if the product

fails during the self-verication test, during power up, the product

can be returned to the manufacturer for evaluation and repair.

5.2 Offices

Sunrise Telecom ofces are located around the world:

SUNRISE TELECOM INCORPORATED

302 Enzo Drive San Jose, CA 95138 U.S.A.

Tel: 1-800-701-5208 Fax: 1-408-363-8313

Internet: http://www.sunrisetelecom.com E-mail: support@sun-

risetelecom.com

SUNRISE TELECOM ATLANTA

3075 Northwoods Circle, Norcross, GA 30071, USA

Tel: 770-446-6086, Fax: 770-446-6850

[email protected]

SUNRISE TELECOM CHINA

Room 1503, Tower 3 , No.1, Xizhimenwai Street

Xicheng District, Beijing, 100044, CHINA

Tel: +86-10-5830-2220, Fax: +86-10-5830-2239

[email protected]

SUNRISE TELECOM FRANCE SAS

ZA Courtaboeuf 2 - Immeuble le Ceylan

6 Allée de Londres 91140 Villejust, FRANCE

Tel: +33 (0) 1 6993 8990, Fax: +33 (0) 1 6993 8991

[email protected]

SUNRISE TELECOM GERMANY

Grabenstrasse 1, 72116 Mössingen GERMANY

Tel: +49 7473 378 2400 Fax: +49 7473 378 2424

[email protected]

84 SSMTT-27L

SUNRISE TELECOM TAIWAN

21, Wu Chuan 3rd Road, Wu-Ku Hsiang

Taipei County, 248, Taiwan, R.O.C.

Tel: +886-2-5578-0788, Fax: +886-2-2298-2575

[email protected]

85E1 Module

5.3 Express Limited Warranty

This Sunrise Telecom product is warranted against defects in

materials and workmanship during its warranty period. The war-

ranty period for this product is contained in the warranty page on

http://www.sunrisetelecom.com.

Sunrise Telecom agrees to repair or replace any assembly or

compo nent found to be defective under normal use during this

period. The obligation under this warranty is limited solely to re-

pairing or replacing the product that proves to be defective within

the scope of the warranty when returned to the factory. This war -

ranty does not apply under certain conditions, as set forth on the

warranty page on http://www.sunrisetelecom.com. Please refer

to the website for specic details.

THIS IS A LIMITED WARRANTY AND THE ONLY WARRANTY

MADE BY SUNRISE TELECOM. SUNRISE TELECOM MAKES

NO OTHER WARRANTY, REPRESENTATION OR CONDITION,

EXPRESS OR IMPLIED, AND EXPRESSLY DISCLAIMS THE

IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS

FOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT

OF THIRD PARTY RIGHTS.

86 SSMTT-27L

87E1 Module

Index

AAlarm Generation Screen

AIS; 48FAS DISTANT; 48

MFAS DISTANT; 48T/S-16 AIS; 48To Invoke an Alarm; 48

ApplicationsAccept a New Circuit; 60

Checking for Frequency Synchronization; 62Connecting the Cords; 59

In-Service Circuit Monitoring; 61Measuring Signal Level; 63Monitoring a Voice Frequency Channel; 67

Nx64 kbit/s Testing; 70Observing Idle and Active Channels; 71

Observing Network Codes or Channel Data; 66Send a Tone; 69

Simple Talk/Listen; 68V.54 Channel Loopback Test; 64

CC-Bit Analysis Screen

L1-Rx; 29L1-Tx T/S or L2-Tx T/S; 29

TRANSMITUSER or IDLE; 29

C-bit Definitions; 30Call Emulator

Call Emulator List Screen; 39

Call Emulator Profiles Screen; 43Dial Parameters Screen

% BREAK40%, 50%, or 60%; 45

B-BIT; 45DIAL PERIOD; 45INTERDIGIT PRD; 45

PULSE (10pps); 45SILENT PERIOD; 45

TONE LEVEL dbm; 45DTMF Receive Sequence Screen; 39

Edit Emulator Screen; 43RECEIVE Side-TOUT; 44SEND Side-CODE; 44

88 SSMTT-27L

SEND Side-PERD; 44

SEND Side-TYPENONE, CAS, DTMF, MF-F, MF-B, or DP; 43

Q.441 MFCR2 Call Emulation Screen; 40

Label; 40Recv; 40

Send; 40Time/s; 40

Q.441 MFCR2 Call Setup Screen; 40Q.441 MFCR2 Receive Screen; 42Q.441 MFCR2 Receive Setup Screen

CHANNEL; 41No. DIGITS EXPECTED; 41

REQUEST CALLER ID; 41REQUEST CATEGORY; 41

Start User Emulation Screen; 44User Call Emulator Screen; 42

Cautions; 2,12Channel Loopback; 34Connector Panel Ports; 6

Credit card functionality; 41Current Histogram; 31

E

E1 Connector PanelsEXT CLOCK; 6

E1 Single Test Configuration Screen

CRC-4; 11FRAMING

PCM-30, PCM-31, or UNFRAME; 10Rx PORT

TERM, BRIDGE, or MONITOR; 12TEST RATE

2.048M or Nx64K; 11

TX CLOCKL1-RX, INTERN, L2-RX, OFFSET, or TTL-L2; 13

Tx SOURCELOOP or TESTPAT; 10

E1 Technical StandardsITU G.703; 73ITU G.704; 73

ITU G.706; 73ITU G.821; 73

ITU G.826; 73ITU M.550/M.2100; 73

Q.140; 73Q.400; 73

89E1 Module

E1 Technology

2.048 Mbit/s Data Rate; 74Basic Definitions

Binary Data; 73

Bit Stream; 73Channel; 73

Converting a Voice Signal; 73E-bit Performance Monitoring; 80

Framing2.048 Mbit/s; 77CRC-4 Error Checking in a MultiFrame Format; 79

FAS; 77MFAS; 78

Line CodingAMI; 75

HDB3; 75Signal Levels; 76

Error Injection ScreenCOUNT/RATE

Number or 1e-9 to 2e-3; 46

MODEBURST or RATE; 46

Programming a 10-6 Bit Error Rate; 47Programming a Burst of 10 Errors; 47

TYPECODE, BIT, BIT + CODE, CRC-4, FRAME, or E-BIT; 4 6

Event Report Screen; 26

F

FAS Frame Words Screens; 26Figures

01 Test Set LED Panels; 502 E1 Connector Panels; 603 Status Screen; 7

04 Menu Tree; 905 E1 Test Configuration; 10

06 Select Timeslot Screen; 1107 DDS Shift Screen; 13

08 Send Test Pattern; 1409 User Test Pattern Selection Screen; 1610 User Test Pattern Character Screen; 16

11 Summary Screen; 2212 Frequency Screen; 22

13 G.821 Logical Screen; 2314 ALM/SIG Screen; 23

15 M.2100/550 Screen; 2316 G.826 Screen; 24

90 SSMTT-27L

17 View Received Data Screen; 25

18 Event Report Screen; 2619 FAS Frame Words Screens; 2620 MFAS Frame Words; 27

21 Pulse Shape Analysis Screen; 2822 C-Bit Analysis Screen; 29

23 Current Histogram Selection Screen; 3124 Current Histogram Screen; 32

25 Saved Histogram Selection Screen; 3326 Propagation Delay Screen; 3427 V.54 Channel Loopback Screen; 34

28 V.54 Setup; 3429 VF Measurements E1 Setup Screen; 35

30 View CAS; 3831 Call Emulator List Screen; 39

32 DTMF Receive Sequence Screen; 3933 Q.441 MFCR2 Call Setup Screen; 40

34 Q.441 MFCR2 Call Emulation Screen; 4035 Q.441 MFCR2 Receive Setup Screen; 4136 Q.441 MFCR2 Receive Screen; 42

37 User Call Emulator Screen; 4238 Call Emulator Profiles Screen; 43

39 Edit Emulator Screen; 4340 Start User Emulation Screen; 44

41 Dial Parameters Screen; 4542 Error Injection Screen; 4643 Alarm Generation Screen; 48

44 Send Frame Words Screen; 4945 Automatic E-Bit Transmission Setup; 49

46 Measurement Configuration Screens; 5147 View/Store/Print Screen; 55

48 Character Entry Screen; 5749 Profile List Screen; 5850 Term Mode Setup; 59

51 Monitor Mode Setup; 5952 Accept a New Span; 60

53 In-Service Circuit Monitoring-Monitor Mode; 6154 Frequency Synchronization Setup; 62

55 Measuring Signal Level Setup; 6356 V.54 Application; 6457 View Received Data Screen; 66

58 Fractional E1 Testing; 7059 Converting a Voice Signal; 74

60 AMI and HDB3 Line Codings; 7561 HDB3 Encoding; 76

62 Pulse Shape; 7663 FAS Framing Format; 77

91E1 Module

64 MFAS Framing Format; 78

65 CRC-4 Multiframe Format; 7966 In-service E-bit Performance Monitoring; 8067 Local Loop and Interofce Signalling Method; 81

68 DTMF Frequency Keypad; 82Format SRAM; 31

Fractional E1 ScreenAutomatic Selection of Timeslots; 11

Manual Selection of Timeslots; 11

H

Histogram Analysis; 31Current Histogram Screen; 32

Current Histogram Selection Screen; 31Saved Histogram Selection Screen; 33

M

Measurement Configuration ScreenAUDIBLE ALARM; 53

Measurement Configuration Screens

CODE CONFIGURHDB3 or AMI; 52

DGRM; 53G.821; 53

G.826; 53HRP MODEL %; 54IDLE CHNL A/B/C/D; 54

IDLE CHNL CODE; 54M.2100; 53

MEAS DURATIONTIMED or CONTINU; 51

MEAS PERIOD; 54MEASURE MODE

BER, LIVE, or AUTO; 52

PRINT EVENTENABLE or DISABLE; 52

PRINT RESULTTIMED or LAST; 52

PROG DATE YMD; 51PROG TIME HMS; 52START

PROGRAM or MANUAL; 51Measurement Results Screen-General Definitions

BER; 20Measurement Results Screens

ALM/SIG; 23Frequency; 22G.821; 23

92 SSMTT-27L

G.826

%BBE; 24%EB; 24%SES; 24

BBE; 24EB; 24

SES; 24Line SUMMARY; 22

M2100/500; 23%ES; 24%SES; 24

P/F; 24PERIOD; 24

Measurement Result Definitions%AS; 20

%DGRM; 20%EFS; 20

%ES; 21%SES; 21%UAS; 22

(CODE) RATE; 20(CRC) RATE; 20

+/- RxLVL; 21+LVL; 21

+WANDR; 22-LVL; 21-WANDR; 22

AISS; 20AS; 20

BIT; 20CLK SLIP; 20

CODE; 20CRC; 20Current Time; 19

DGRM; 20EBER; 20

EBIT; 20EFS; 20

ES; 20ET; 19FALM; 21

FE; 21FRM; 19

Hz/PPM; 21LOFS; 21

LOSS; 21Lpp; 21

93E1 Module

MAX Hz; 21

MFAL; 21MIN Hz; 21PATT; 19

RATE; 19RCV Hz; 21

RT; 19RxCLK; 21

SES; 21SLIP; 21TxCK; 19

UAS; 21Measurement Result F-keys

HOLDSCR/CONTINU; 19LOCK/UNLOCK; 19

PAGE-UP, PAGE-DN; 19STOP/START; 19

Menu Tree; 9MFR2/DTMF/DP Technology

Interofce Signalling; 82

Local Loop; 82

OOfces; 83

PProfile List Screen

LOAD, STORE, RENAME, DELETE, and LOCK/UNLOCK; 58Propagation Delay Screen; 34

Pulse Mask Analysis Screen; 28Pulse Shape Analysis Screen

Fall Time; 28Level; 28Ovr Shoot; 28

Rise Time; 28Und Shoot; 28

Width; 28

RRunning a Timed Test

Auto Start; 65

Manual Start; 65

SSaved Histogram; 33

Send Frame Words ScreenAutomatic E-Bit Transmission Setup; 49

CRC; 49E-BIT; 49

94 SSMTT-27L

FAS WORD; 50MFAS ABCD; 50MFAS WORD; 50

NFAS WORDS; 50Standard Test Patterns; 14–16

T

Tables01 Storage Allocation; 802 C-bit Definitions; 30

Test Patterns, UserCorrecting a Mistake in the Pattern; 17

Deleting; 17Editing a Label; 17

Test Set LEDs; 5–6

U

User Test PatternsCreating User-Defined Patterns; 16

Sending a User Test Pattern; 16Viewing a User Test Pattern; 16

User Test Pattern Selection Screen; 16

V

VF Channel AccessView CAS; 38

VF Measurements-SetupRx-T/S; 36

Tx-T/S; 36TxABCD; 36

TxFREQ; 36TxLVL; 36TxMODE; 36

VF Measurement Results1010 (dBm); 37

3K (dBm); 37OFFSET; 37

PEAK; 37PSOP (dBm); 37Rx(dBm); 37

RxABCD; 37RxDATA; 37

RxFREQ; 37S/N (dB); 37

View/Store/Print Screen; 55Deleting a Stored Test; 56Locking and Unlocking a Stored Test; 56

Printing a Stored Test; 56

95E1 Module

Renaming a Stored Test; 57

Saving a Test; 56Viewing a Stored Test; 56

View Current Event; 26

View FAS Words Screens; 26View MFAS Words Screen; 27

View Received Data ScreenASCII; 25

BINARY; 25HEX; 25T/S; 25

W

Warnings; 2Warranty; 85

96 SSMTT-27L

Documents

MAN-22060-US001_D00_SSMTT-27 _Single_E1_MMD