1Dual E1

MAN-22060-US002 Rev A

Dual E1 Modulefor the MTT and xDSL

Family of Products

User’s ManualSSMTT-27M

302 Enzo Drive San Jose, CA 95138

Tel: 1-408-363-8000 Fax: 1-408-363-8313

Sunrise Telecom... a step ahead

2 SSMTT-27

Copyright 2003

Sunrise Telecom Incorporated

This device uses software either developed by Sunrise or licensedby Sunrise from third parties. The software is confidential andproprietary. The software is protected by copyright and containstrade secrets of Sunrise or Sunrise's licensors. The purchaser ofthis device agrees that it has received a license solely to use thesoftware as embedded in the device, and the purchaser is prohib-ited from copying, reverse engineering, decompiling, or disassem-bling the software.

Cautions!

Do not remove or insert the module while the test set ison. Inserting or removing a module with the power on

may damage the module.

Do not remove or insert the software cartridge while thetest set is on. Otherwise, damage could occur to the

cartridge.

Warning!

Using the supplied equipment in a manner not specifiedby Sunrise Telecom may impair the protection provided

by the equipment.

!

3Dual E1

Dual E1Table of Contents

1 Dual E1 Module (SSMTT-27) ..............................................5

1.1 Dual E1 LEDs ...................................................................5

1.2 Dual E1 Connector Panels ................................................8

2 Menus .................................................................................9

2.1 Test Configuration ........................................................... 102.1.1 E1 Single Configuration ............................................... 102.1.2 E1 Dual Configuration .................................................. 15

2.2 Test Pattern ..................................................................... 20

2.3 Measurement Result ....................................................... 252.3.1 Measurement Results and General Definitions ............ 28

2.4 Other Measurement ........................................................ 362.4.1 View Received Data..................................................... 362.4.2 View FAS Words .......................................................... 372.4.3 View MFAS Words ....................................................... 392.4.4 Pulse Mask Analysis ................................................... 402.4.4.1 Start New Analysis ................................................... 402.4.4.2 View Last Pulse Shape ............................................. 412.4.5 C-Bit Analysis .............................................................. 422.4.6 Histogram Analysis ..................................................... 442.4.6.1 Format SRAM ........................................................... 442.4.6.2 Current Histogram..................................................... 452.4.6.3 Saved Histogram ...................................................... 472.4.7 Propagation Delay ....................................................... 482.4.8 Channel Loopback ....................................................... 49

2.5 VF Channel Access ........................................................ 502.5.1 VF & Noise Measurement ............................................ 502.5.2 View Line CAS ............................................................. 542.5.3 Call Analysis ................................................................ 552.5.3.1 Digit Analysis ............................................................ 582.5.4 Call Emulator ............................................................... 602.5.4.1 Standard Emulations ................................................ 602.5.4.2 Place a Call .............................................................. 612.5.4.3 Receive a Call .......................................................... 632.5.4.4 User Emulation ......................................................... 652.5.5 Supervision Setup ....................................................... 692.5.6 Dial Parameters ........................................................... 712.5.7 Signal Meanings .......................................................... 732.5.8 View/Store/Print ........................................................... 782.5.8.1 Saving a Test ............................................................ 792.5.8.2 Viewing a Stored Test ............................................... 802.5.8.3 Printing a Stored Test ............................................... 802.5.8.4 Deleting a Stored Test ............................................... 80

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2.5.8.5 Locking & Unlocking a Stored Test ........................... 802.5.8.6 Renaming a Stored Test ............................................ 80

2.6 Other Features ................................................................ 812.6.1 Error Injection .............................................................. 812.6.2 Alarm Generation ......................................................... 832.6.3 View Results Records .................................................. 842.6.4 Send Frame Words ...................................................... 85

2.7 System Parameters ........................................................ 872.7.1 Measurement Configuration .......................................... 872.7.2 Self Test ...................................................................... 91

3 Applications ..................................................................... 92

3.1 Connecting the Cords ..................................................... 92

3.2 Basic Applications .......................................................... 943.2.1 Accept a New Circuit ................................................... 943.2.2 In-Service Circuit Monitoring ........................................ 953.2.3 Checking for Frequency Synchronization ..................... 973.2.4 Measuring Signal Level ............................................... 993.2.5 V.54 Channel Loopback Test ...................................... 1013.2.6 Running a Timed Test ................................................ 1023.2.6.1 Manual Start ........................................................... 1023.2.6.2 Auto Start ............................................................... 1023.2.7 Observing Network Codes or Channel Data ............... 1033.2.8 Monitoring a Voice Frequency Channel ...................... 1053.2.9 Simple Talk/Listen ..................................................... 1063.2.10 Send a Tone ............................................................. 1073.2.11 Nx64 kbit/s Testing .................................................. 108

3.3 Advanced Applications ................................................. 1103.3.1 In-Service Dual Drop & Insert THRU Testing .............. 110

4 Reference-E1 Technology Overview ............................. 113

4.1 Technical Standards ..................................................... 113

4.2 Basic Definitions ........................................................... 113

4.3 Converting a Voice Signal ............................................. 114

4.4 2.048 Mbit/s Data Rate ................................................. 115

4.5 Line Coding ................................................................... 115

4.6 Signal Levels ................................................................ 117

4.7 2.048 Mbit/s Framing .................................................... 118

4.8 MFR2/DTMF/DP Technology ........................................ 124

Index .................................................................................... 127

5Dual E1

1 Dual E1 Module (SSMTT-27)

1.1 Dual E1 LEDsThe LEDs provide valuable information on the test set’s currenttest mode. In module mode, the MODULE/xDSL LED is green.

Figure 1 shows SSMTT LED panels. Figure 2 shows SSxDSLLED panels. The definitions and functions of the LEDs are thesame.

Figure 1 SSMTT LEDs

Figure 2 SSxDSL LEDs

The LEDs described here are used by the Dual E1 module. Not allLEDs on the test set are used by the Dual E1 module.

MODULE (SSMTT) or xDSL (SSxDSL)• Green: This indicates that the test set is in the module mode.

SIGNAL (SSMTT) or T1/E1 SIG (SSxDSL)This LED is active when in Dual E1 mode.

• Green: The test set is receiving an E1 signal on the lineselected in the Test Configuration/LED panel.

• Red: The test set is NOT receiving an E1 signal as expected.

6 SSMTT-27

FRAMEThis LED is active when the Dual E1 module is in a framed testmode. This LED is active for one line only. In E1DUAL mode thisline is selected in TEST CONFIGURATION-LED PANEL line: ei-ther LINE 1 or 2 can be selected. When the TEST MODE is E1SINGL, the FRAME LED default is LINE 1 and cannot be changed.

• Green: The test set has achieved frame synchronization andthe framing found on the received signal of the selected linematches the framing set in TEST CONFIGURATION-FRAM-ING.

• Red: The configured framing type is not found on the receivedsignal of the line selected in TEST CONFIGURATION-FRAM-ING. This could indicate either a loss of framing on the receivedsignal or a framing mismatch.

PAT SYNCThis LED is active for the Dual E1 module when performing aBERT test with a known test pattern.

• Red: No pattern synchronization or if synchronization has beenlost.

• Green: The test set has achieved pattern synchronization. Thishappens when the receiver of the line selected in TESTCONFIGURATION-RxDROP is receiving the same pattern asthe one transmitted by the test set.

• Inactive: The test set is in VF Channel Testing.

BIT ERRThis LED is active for the Dual E1 module when performing aBERT test with a known test pattern.

• Red: The test set is currently detecting a bit error on thereceiver of the line selected in TEST CONFIGURATION-RxDROP.

• Blinking Red: The test set has previously detected bit errors onthe receiver of the line selected in TEST CONFIGURATION-RxDROP, but currently, there are none . Press HISTORY toclear this flashing LED.

The following LEDs are active for one line only. In E1DUAL modethis line is selected in TEST CONFIGURATION-LED PANEL: ei-ther LINE 1 or 2 can be selected. When the TEST MODE isE1SINGL, the default is LINE 1, and cannot be changed.

7Dual E1

AIS• Red: The test set is currently detecting an AIS (all 1 signal

without framing).• Blinking Red: The test set previously detected an AIS on the

line, but currently, there are none. Press HISTORY to clear thisflashing LED.

ALARM• Red: The test set is currently detecting an alarm condition.• Blinking Red: The test set previously detected an alarm

condition, but currently, there are none. Press HISTORY toclear this flashing LED.

ERRORS• Red: The test set is currently detecting an error. This can be a

framing bit, CRC-6 or other errors other than BPV or bit error.• Blinking Red: The test set has previously detected errors, but

currently, there are none. Press HISTORY to clear this flashingLED.

BPV/CODE• Red: The test set is currently detecting a Bipolar Violation

(BPV) or code error.• Blinking Red: The test set has previously detected a Bipolar

Violation (BPV) or code error, but currently, there are none.Press HISTORY to clear this flashing LED.

8 SSMTT-27

1.2 Dual E1 Connector PanelsThe Dual E1 module connector panels are shown in Figure 3.

Figure 3 Dual E1 Connector Panels

HEAD PHONEConnect any stereo head set with a 3 conductor mini connector.

E1-RX2 & E2-TX2These jacks are used when E1DUAL is selected in TEST CON-FIGURATION. The L2-RX jack port can also be used as the refer-ence frequency input in E1SINGL mode.

E1-TX1 & E1-RX2These jacks are used both for E1SINGL and E1DUAL accessmodes.

9Dual E1

2 MenusThe menu tree (Figure 4) outlines the major functions of the E1Dual module.

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Figure 4 Menu Tree

10 SSMTT-27

2.1 Test ConfigurationA circuit is accessed by:

1. Configuring the TEST CONFIGURATION menu to correspondto the circuit under test.

2. Connecting the test set to the circuit.

The Dual E1 module can be configured to automatically detectincoming framing and test pattern by pressing AUTO.

Note: Configuration is the most important part of the entire testprocedure. If the test configuration items are configured incor-rectly, all measurement results will be meaningless.

To configure the test set, use the following procedure:

1. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION.

2. With TEST MODE highlighted, choose E1SINGL (F1) orE1DUAL (F2).

3. Refer to the following two sections for configuration details.

2.1.1 E1 Single Configuration

Figure 5 E1 Single Test Configuration

Tx SOURCEOptions: LOOP (F1), TESTPAT (F2)

• LOOP: Use for full duplex drop and insert testing on an in-service line. In this case, the signal received on the Rx jack willbe transmitted out the Tx jack for Line 1.

• TESTPAT: Use for out-of-service bit error rate testing. In thiscase, a test pattern will be transmitted on the selected Transmitjack. During Nx64 or VF CHANNEL ACCESS testing, an idlecode will be inserted on the unused channels.

11Dual E1

FRAMINGOptions: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)

Choose the appropriate framing for the circuit.

• PCM-30: This means the test set will synchronize on bothFrame Alignment Signal (FAS) and MultiFrame AlignmentSignal (MFAS).

• PCM-31: This means the test set will synchronize only onFrame Alignment Signal (FAS).

Notes:• If you are unsure of the proper framing, push AUTO. Use the

combination which synchronizes properly and/or allows errorfree measurement results.

• If the framing and CRC-4 state of the received signal do notexactly match the framing and CRC-4 settings, the test set willdisplay Loss of Frame condition and may display loss of CRCDET.

• AMI is the default line code. The line code can be configuredfor AMI or HDB3 in: E1 MODULE MAIN MENU > SYSTEMPARAMETERS > MEAS CONFIGURATION.

CRC-4Options: YES (F1), NO (F2)

• Choosing YES allows the test set to measure CRC-4 errors onthe incoming signal and also to transmit the CRC-4 bits on theoutgoing signal. CRC-4 works with PCM-31 and PCM-30framing only.

• If UNFRAME has been selected for framing, the test set willforce the CRC-4 configuration to NO.

TEST RATEOptions: 2.048M (F1), Nx64K (F2)

• 2.048M: This configures the test set for full rate testing. If youare not certain about which one to choose, select this for fullrate testing.

• Nx64: This configures the test set for fractional testing. Uponpressing, you will immediately enter the SELECT TIMESLOT,screen. Select each timeslot to test, these can be selectedautomatically, or manually. A sample screen is shown in Figure6.

12 SSMTT-27

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Figure 6 Fractional E1

To Manually Select the Timeslots:1. Use the keypad arrow keys to choose the timeslot and then

press SELECT (F2).2. Repeat until you have selected all the necessary timeslots.

Selected timeslots remain highlighted, as shown in Figure 6.• Press UN-SEL (F3) to deselect a timeslot.• Press CLR-ALL (F4) to clear all selections and to start over.

To Automatically Select the Timeslots:1. Press AUTO (F1).• If you are receiving a signal which is already formatted in the

N (or M) x64 kbit/s fractional E1 format, the quickest methodfor selecting timeslots is to press AUTO (F1).

2. Press ENTER to set your choices, and return to TESTCONFIGURATION.

• In AUTO, the test set will automatically configure the timeslotsby looking for active data. It will configure the transmit side tobe the same as the active timeslots on the receive side. Thetest set determines which timeslots are active by first determin-ing which timeslots are idle. Any timeslot that is not idle isassumed to be active. The test set determines that a timeslotis idle when it finds the line's idle code. This is specified inSYSTEM PARAMETERS > MEAS CONFIGURATION-IDLECHNL CODE.

Notes:

• In PCM-31 framing, timeslots 1-31 correspond to channels 1-31. In PCM-30 framing, timeslots 1-15 correspond to channels1-15, and timeslots 17-31 correspond to channels 16-30. In

13Dual E1

PCM-30, timeslot 16 is used for the multiframe alignmentsignal. Fractional E1 is not offered with unframed signals,because framing is required to determine the location oftimeslots.

• The timeslots specified for transmit and receive need not be thesame. The number of selected timeslots can differ from the Txside to the Rx side. The test set will assume that all incomingdata is received byte by byte in ascending channel order.

L1-Rx PORTOptions: TERM (F1), BRIDGE (F2), MONITOR (F3)

Configures the Line 1 2.048 Mbit/s receiver.

These settings let the test set electrically decode a 2.048 Mbit/ssignal under a wide range of resistive cable losses. They also de-termine which electrical load will be placed on the circuit by the testset. These settings have no effect on the transmitters. On a 2.048Mbit/s circuit, there must always be exactly one receiver that ap-plies the low impedance (75/120Ω) termination. There should neverbe two or more receivers applying a low impedance termination.

Caution!

If you are uncertain, select BRIDGE, this will protect the 2.048Mbit/s signal.

• TERM mode terminates the received signal with a 75 or 120Ωimpedance termination. The tested signal has been transmittedover real cable at a level between approximately +6 and -43 dB.Using TERM mode will disrupt the circuit.

• In BRIDGE mode, the test set applies high-impedance isola-tion resistors to the circuit. This isolation circuit will protect thesignal from any possible disruption. The tested signal has beentransmitted over regular cable at a level of approximately +6and -43 dB.

• MONITOR mode should be used when a measurement is madeat a protected monitoring point, at a level between -15 and -30dB. The signal is provided from the protected MONITOR jackof a network equipment.- In MONITOR mode, if a 0 dB signal is received, the CODE

ERR LED will light red. This often happens when the test setis plugged into an OUT jack. In this case, choose TERMinstead. If you are uncertain if a jack is bridged or protected,try BRIDGE first.

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TX CLOCKOptions: L1-RX (F1), INTERN (F2), L2-RX (F3), OFFSET (more,F1), TTL-L2 (more, F2)

This is used to time the transmit signal.

• L1-Rx: Choose L1-Rx, and the test set uses the timing from thesignal received on Line 1 as the clock source.

• INTERN: This uses the internal timing of the test set. Thistiming is not synchronized to the network. You should useinternal timing in loopback testing where synchronization is notrequired.

• L2-Rx: In this mode, timing is received from the signal receivedon Line 2.

• OFFSET: The test set uses a digital synthesizer to shift thetransmit frequency in 1, 10, 100, or 1000 Hz steps. Shift up to+/- 50,000 Hz (25K ppm) and the screen shown in Figure 7 isdisplayed.

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Figure 7 DDS Shift

1. Set the DDS SHIFT between 0 and 50,000 Hz by using INC (F1)and DEC (F2).

2. Set the SCALE of the shift by using INC (F1) and DEC (F2).Choose among 1, 10, 100, and 1000 (i.e., a shift of 3 Hz witha SCALE of 10 would shift the frequency 13 Hz).

• TTL-L2: In this mode the test set uses a G.703 sinusoidal clockplugged into Line 2 RX as its timing source.

15Dual E1

2.1.2 E1 Dual Configuration

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Figure 8 E1 Dual Test Configuration

Tx/INSERTOptions: L1-TX (F1), L2-TX (F2)

Select the 2.048 Mbit/s test line onto which to insert the test signal.

Determines where the 2.048 Mbit/s test pattern, Nx64 kbit/s testpattern, Nx64 kbit/s multiplexed signal, or voice frequency chan-nel will be inserted (i.e., if Tx/INSERT is L2-Tx and you are talk-ing on the test set, then your voice will be inserted on line 2).

Rx/DROPOptions: L1-RX (F1), L2-RX (F2)

Select the received test signal from either L1-Rx or L2-Rx.

Configures bit error rate, 2.048 Mbit/s line frequency, E-bit errormeasurements, M.2100/550 measurements, voice channel fre-quency, voice channel level, voice channel Rx ABCD, view re-ceived data, view FAS words, view MFAS words, etc. (i.e., if youare doing a bit error rate test on the received signal from line 1,then you should select Rx/DROP as L1-Rx).

Tx SOURCEOptions: LOOP (F1), TESTPAT (F2)

• LOOP is used for full duplex drop and insert testing on an in-serviceline. In this case the signal received on the Rx jack will be transmittedout the Tx jack for Line 1 and Line 2. You will be inserting a signal onone or more channels on the line you chose in Tx/INSERT. Thechannels and corresponding ABCD bits on that line that are not beingused will be passed through the test set unchanged from Rx to Tx.

16 SSMTT-27

• TESTPAT is used for out-of-service bit error rate testing. In thiscase, a test pattern will be transmitted on the selected Tx/INSERT jack. During Nx64 or VF CHANNEL ACCESS testing,an idle code will be inserted on the unused channels. On the linethat is not selected, the channels and ABCD bits are passedthrough the test set unchanged from Rx to Tx.

FRAMINGOptions: PCM-30 (F1), PCM-31 (F2), UNFRAME (F3)

Choose the framing that is appropriate for the circuit.

• PCM-30 means the test set will synchronize on both FrameAlignment Signal (FAS) and MultiFrame Alignment Signal(MFAS).

• PCM-31 means that the test set will synchronize only on FrameAlignment Signal (FAS).

Notes:• If framing and CRC-4 state of the received signal do not exactly

match the framing and CRC-4 settings, the test set will displayLoss of Frame condition and may display loss of CRC DET.

• AMI is the default line code. The line code can be configuredfor AMI or HDB3 in: E1 MODULE MAIN MENU > SYSTEMPARAMETERS > MEAS CONFIGURATION.

• If you are unsure of the proper framing, push AUTO. Use thecombination which synchronizes properly and/or allows errorfree measurement results.

CRC-4Options: YES (F1), NO (F2)

• Choosing YES allows the test set to measure CRC-4 errors onthe incoming signal and to transmit the CRC-4 bits on theoutgoing signal. CRC-4 works with PCM-31 and PCM-30framing only.

• If UNFRAME has been selected for framing, the test set willforce the CRC-4 configuration to NO.

TEST RATEOptions: 2.048 (F1), Nx64K (F2)

• 2.048M configures the test set for full rate testing. If you areunsure which one to choose, select 2.048 Mbit/s.

• Nx64K configures the test set for fractional testing. Uponselection, the SELECT TIMESLOT screen is displayed. In thisscreen, choose each timeslot for testing. See TEST RATE inSection 2.1.1 for the procedure.

17Dual E1

L1-Rx Port and L2-Rx PortOptions: TERM (F1), BRIDGE (F2), MONITOR (F3)

Configures the two 2.048 Mbit/s receivers.

• These settings let the test set electrically decode a 2.048 Mbit/ssignal under a wide range of resistive or cable losses. Thesesettings also determine which electrical load will be placed on thecircuit by the test set. These settings have no effect on thetransmitters. On a 2.048 Mbit/s circuit, there must always beexactly one receiver that applies the low impedance (75/120Ω)termination. There should never be two or more receivers applyinga low impedance termination.

• See L1-Rx PORT in Section 2.1.1 for a description of each ofthese choices.

TX CLOCKOptions: RECEIVE (F1), INTERN (F2), SHIFT (F3)

This is used to time the transmit signal.

• RECEIVE: Choose this, and the test set uses the timing fromthe signal received on the line set as RX/DROP above as theclock source for both TX lines.

The next three figures portray three different timing scenariospossible when RECEIVE is selected. Figure 9 represents slavetiming. Here, Tx CLOCK=L1-Rx, but the signal received on L1-Rxis timed off of the L1-Tx source. Thus, there is no true clocksource. In this case, the transmit signal may die.

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Figure 9 Slave to Slave Timing

18 SSMTT-27

Figure 10 depicts loop or slave timing. Tx/INSERT and TX CLOCK areset for the same line. Loop timing is necessary when transmitting to-ward an exchange or other network element that requires synchronoussignals. This network element must be configured to be a master tim-ing source in relation to your signal, lest you have slave-to-slave timing.

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Figure 10 Loop/Slave Timing

Figure 11 depicts external timing. External timing uses an exter-nal clock source to time the Tx/INSERT signal. The external clocksource should be configured for the opposite line from the Rx/DROP selection. In this case, Rx/DROP and Tx/INSERT are setfor Line 2. Therefore, Tx CLOCK is set for Line 1 (L1-Rx).

Note: In Figures 9-11, Tx SOURCE has always been set forTESTPAT. The Tx CLOCK setting is ignored if Tx SOURCE is setfor LOOP. In LOOP, both Lines 1 and 2 pass timing from Rx to Tx.

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Figure 11 External Timing

19Dual E1

• INTERN: This setting uses the internal timing of the test set. Thistiming is not synchronized to the network. You should use internaltiming in loopback testing where synchronization is not required.If you set Tx/INSERT as L1-Tx, and choose INTERN, the L1-Txsignal will use the internal timing of the test set. In E1DUAL mode,the L2-Tx signal will use the timing recovered from L2-Rx.

• SHIFT: The test set uses a digital synthesizer to shift the transmitfrequency in 1, 10, 100, or 1000 Hz steps. Shift up to +/- 50,000hz (25K ppm) and the screen shown in Figure 12 is displayed.

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Figure 12 DDS Shift

1. Set the DDS SHIFT between 0 and 50,000 Hz by using INC (F1)and DEC (F2).

2. Set the SCALE of the shift by using INC (F1) and DEC (F2).Choose among 1, 10, 100, and 1000. For example, a shift of 3Hz with a SCALE of 10 would shift the frequency 13 Hz.

LED SOURCEOptions: LINE 1 (F1), LINE 2 (F2)

Select Line 1 or 2 to be displayed on the test set’s LED panel.This selection does not apply to PAT SYNC and BIT ERR LEDs.

20 SSMTT-27

2.2 Test Pattern

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Figure 13 Send Test Pattern

Standard Test PatternsTo send one of the standard patterns:

1. Use the arrow keys to highlight the desired pattern.• As each pattern is highlighted, the test set begins transmitting

that pattern.

2. Press INVERT (F2) to send the pattern with an inverted polarity(1s and 0s reversed). Press NORMAL (F2) to send the patternwith a normal polarity.

3. At the MEASURE MODE line in SYSTEM PARAMETERS >MEAS CONFIGURATION, you have the option of selectingBER (F1) to have the test set look for a BERT pattern, or LIVE(F2), where the test set does not look for a pattern, and testslive traffic. If LIVE is selected, the PAT SYNC LED will turn off.

The long patterns are written in hexadecimal notation, also knownas ‘hex’. You can tell if a pattern is written in hex because it will bewritten with pairs of numbers separated by commas. Hex is a 16digit number system consisting of the digits 0, 1, 2, 3, 4, 5, 6, 7,8, 9, A, B, C, D, E, F. The hex pattern 15 FA translates to thebinary pattern 0001 0101 1111 1010, where the left most bit istransmitted first.

The following test patterns appear in Figure 13:

2e23: This is the industry-standard 2e23-1 pseudo random bit se-quence. This signal is formed from a 23 stage shift register and isnot zero-constrained. This pattern contains up to 22 zeros in arow and violates standards for consecutive zeros in AMI-codedtransmission.

21Dual E1

2e20: This is the industry-standard 2e20-1 pseudo random bit se-quence. This signal is formed from a 20 stage shift register and isnot zero-constrained. This pattern contains up to 19 zeros in arow and violates standards for consecutive zeros in AMI-codedtransmission. The QRS pattern is derived from the 2e20 pattern.

2e15: This is the industry-standard 2e15-1 pseudo random bit se-quence. This signal is formed from a 15 stage shift register and isnot zero-constrained. This pattern contains up to 14 zeros in arow and does not violate standards for consecutive zeros in AMI-coded transmission.

20ITU: 20ITU is the 2e20-1 pseudo random bit sequence. This sig-nal is formed from a 20 stage shift register and is not zero-con-strained. This pattern conforms to the ITU O.153 technical stan-dard. This pattern is not identical to 2e20, because different feed-back mechanisms are used when the patterns are produced bymeans of shift registers. 20ITU suppresses consecutive sequencesof more than 18 zeros, as opposed to 14 zeros in 2e20.

2047: This is the industry-standard 2047 bit code used for DDSapplications.

511, 127, 63: These are industry-standard bit codes used for DDSapplications.

1111: The industry-standard all ones pattern is used for stresstesting E1 AMI and B8ZS lines. If the pattern is sent unframed, itwill be interpreted as an AIS (Alarm Indication Signal). This is thepattern in its binary form: 1111.

1010: This is the industry-standard alternating ones and zerospattern. The pattern is frame aligned with ‘f’ showing the locationof the framing bit. The pattern is: f 0101 0101.

0000: This is the industry-standard all zeros pattern. This patternis often used to make sure that clear-channel lines have beenproperly provisioned for B8ZS during circuit turn-up. If a portion ofthe circuit is AMI, then pattern synch and/or signal will be lost.The pattern is: 0000.

FOX: The industry-standard FOX pattern is used in data commu-nications applications. The ASCII translation of the pattern is the‘Quick brown fox ....’ sentence. The pattern is frame aligned toensure proper ASCII translation of the bits. It is recommendedthat the pattern be sent with framed signals, otherwise ASCIItranslation is not possible. This is the pattern: 2A, 12, A2, 04, 8A,AA, 92, C2, D2, 04, 42, 4A, F2, EA, 72, 04, 62, F2, 1A, 04, 52,AA, B2, 0A, CA, 04, F2, 6A, A2, 4A, 04, 2A, 12, A2, 04, 32, 82,5A, 9A, 04, 22, F2, E2, 04, 8C, 4C, CC, 2C, AC, 6C, EC, 1C, 9C,0C, B0, 50.

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QRSS: This is the industry-standard Quasi Random Signal. Thissignal is formed from a 20 stage shift register and is zero-con-strained for a maximum of 14 consecutive zeros. When transmit-ted in a framed signal, up to 15 consecutive zeros will occur inaccordance with AMI minimum density requirements.

1-4: The one-in-four pattern is used for stress testing circuits. It isframe aligned. The pattern is 0100.

1-8: The industry-standard 1 in 8 pattern is used for stress testingAMI and B8ZS lines. The pattern is also called 1:7 in older litera-ture. The pattern is frame aligned (‘f’ is the framing bit) as shownin its binary form: f 0100 0000.

3-24: The industry-standard 3 in 24 pattern is used for stress test-ing AMI lines. The pattern is frame aligned (‘f’ is the framing bit)as shown in its binary form: f 0100 0100 0000 0000 0000 0100.

User Test PatternsIn addition to the standard patterns, you may program and send auser pattern. To access, press USER (F1) in the TEST PATTERNscreen (Figure 13). The USER TEST PATTERN screen appearslisting any stored patterns (Figure 14). In this screen you cancreate, edit, view, send, or delete a pattern.

!"#

Figure 14 User Test Pattern Screen

Sending a User Test Pattern1. In TEST PATTERN, press USER (F1).2. The test set will present a list of stored USER patterns. Use the

up/down arrow keys to select the desired pattern.3. Press ENTER to send the selected pattern.

23Dual E1

Viewing a User Test Pattern1. From USER TEST PATTERN, move the cursor to the desired

pattern and press VIEW (F1).2. You will see your selected pattern on the screen (in binary).3. When finished, press ESC to return to USER TEST PATTERN.

Creating User-Defined Patterns1. In TEST PATTERN, press USER (F1) to enter USER TEST

PATTERN.2. Select a blank position on the list.3. Press CREATE (F1). The cursor appears at LABEL.4. Press TOGGLE (F3). The letter ‘A’ will be highlighted in the

character grid as shown in Figure 15.5. Use the arrow keys to move the cursor to the desired character.6. Press SELECT (F4) and the character appears next to LABEL.

Repeat until the label is done.7. Press TOGGLE (F3) to move out of the character grid and back

to LABEL.

+%, *$-'./(

+

Figure 15 User Test Pattern Screen

8. Press the down arrow key to move to ‘No’.9. Press the SHIFT key and use the keypad to enter the pattern.• You may enter up to 24 bits to make the desired pattern.• Use INSERT (F1) and DELETE (F2) if you need to make

corrections to the pattern.

11.Press SHIFT when finished. Verify that the ‘SHFT’ indicator isno longer displayed.

12.Press ENTER to store the pattern and to return to the TESTPATTERN screen. The new pattern label will now be displayedin the menu.

24 SSMTT-27

Editing a User Test Pattern Label1. From TEST PATTERN, press USER (F1) to move into USER

TEST PATTERN.2. Select the pattern label that you want and press EDIT (F2).3. When the cursor is on LABEL, with the keypad arrow keys

select the desired character and:A. Press DELETE (F2), press TOGGLE (F3) and select the

desired character, the character will be inserted in place ofthe deleted character in the label, or

B. Press INSERT (F1), press TOGGLE (F3) and select thedesired character, the character will be inserted to the leftof selected character in the label, or

C. Press TYPOVER, press TOGGLE (F3) and select thedesired character, the character will be inserted in place ofthe selected character in the label.

Correcting a Mistake in the Pattern1. While entering the 1s and 0s, you notice an incorrect digit.

Press SHIFT to remove the ‘SHFT’ indicator.2. Select the incorrect digit with the keypad arrow keys and press

SHIFT to display the ‘SHFT’ indicator.3. Enter the correct digit.4. Press the SHIFT key to remove the ‘SHFT’ indicator.5. Move the cursor with the keypad arrow keys to the end of the

line.6. Press SHIFT again to display the ‘SHFT’ indicator.7. Enter in the rest of the digits.8. Press ENTER to store the pattern.• You can edit the code's label using the same procedure.

Deleting a User Test Pattern1. From TEST PATTERN, press USER (F1) to enter USER TEST

PATTERN.2. Select the entry you want to delete and press DELETE (F3).

The entry is deleted.3. Press ESC to return to TEST PATTERN.

25Dual E1

2.3 Measurement ResultTo observe results:

1. Select MEASUREMENT RESULT from the E1 MODULEMAIN MENU and press START (F3).

2. Scroll through screens using PAGE-UP (F1) or PAGE-DN (F2).3. Press ESC when finished.

The test set continuously performs measurements on receivedsignal(s). While a measurement is being made, the MEAS statusindicator is displayed at the top of the screen. When the measure-ment is stopped, the indicator will disappear.

Results are stored when your press STOP (F3) and when PRINTRESULT is set to LAST in SYSTEM PARAMETERS > MEASCONFIGURATION, or when a TIMED measurement finishes.Events are also stored when PRINT EVENT is ENABLED, inMEAS CONFIGURATION.

You do not need to access MEASUREMENT RESULT for resultsto be compiled. Measurements are automatically restarted everytime the configuration is significantly changed. The MEASURE-MENT RESULT screens allow you to view the accumulated mea-surements and restart the measurement process.

The actual screens and the values displayed depend upon theTEST MODE selected in TEST CONFIGURATION. There are,however, some common features in all screens (see Figure 16).

" (0)

. ++ %1(

##&$2+$2+

)34

Figure 16 Measurement Results Screen

26 SSMTT-27

Measurements often have a count number displayed on the lefthand side and the corresponding rate or percentage displayed onthe right hand side of the same line. For example, in Figure 16,CODE appears on the left and RATE on the right.

A key concept is availability. A circuit is available for use onlywhen the bit error rate is low enough that the signal can get throughand be understood. A circuit is said to be unavailable at the begin-ning of 10 consecutive severely errored seconds. Errors, erroredseconds, and severely errored seconds are not accumulated whenthe circuit is unavailable. Therefore, if you start continuously in-jecting errors to the test set at a 2x10-3 error rate, you will seeincreasing bit errors, errored seconds, and severely errored sec-onds for the first 9 seconds. At the tenth second, all the countswill decrease back to the values they had before the error injec-tion was started, and the unavailable counter will increase by 10.

Once a circuit is unavailable, it becomes available only after 10consecutive seconds without severe errors. To continue the previousexample, if you turn the severe error injection off, and then insert 1or 2 errors during the next 5 seconds, you will observe that the un-available second counter continues to increase for the first 9 sec-onds while the error counter does not change. Then at the tenthsecond, the unavailable second counter suddenly decreases by 10and the error counter increases by the 1 or 2 errors that you inserted.

The following F-keys are shared by all screens:

PAGE-UP (F1), PAGE-DN (F2): These allow viewing of all avail-able screens.

STOP/START (F3): Press STOP to halt the test. Pressing START,restarts the measurement process from within this menu.

HOLDSCR/CONTINU (more, F1): Hold Screen freezes all of themeasurement displays so they may be easily observed. The mea-surement count is still proceeding, but the counts are updatedonly in memory. You may now read the previous counts clearly.When you have finished viewing the screen, press CONTINU toview updated measurement results.

LOCK/UNLOCK (more, F2): Press LOCK to disable the keypad.The measurement process continues as usual, but keypad strokeshave no effect on the test set. This is useful if you are running along-term test and do not wish to have the test disturbed. PressUNLOCK to enable the test set’s keypad. Using this feature will notdisturb any measurement results.

27Dual E1

In addition to the actual measurement data, the following informa-tion is displayed in the upper portion of these screens:

Current Time: The time of day is displayed in the upper right-hand corner of the screen on the SunSet xDSL, and on the upperleft on the SunSet MTT.

ET: Elapsed Time is the time that has passed since the test wasstarted or restarted.

RT: Remaining Time is the time that remains until the end of test-ing. The factory default condition is that the test runs continu-ously until the user stops it. CONTINU is displayed in the RT fieldto denote a continuous test. However, in SYSTEM PARAMETERS> MEAS CONFIGURATION, you may specify the length of testtime. In this case, the remaining time will count down to zeroduring the measurement.

FRM: Transmitted framing

TxCK: Transmit clock source

PATT: Transmitted test pattern

RATE: Test rate

28 SSMTT-27

2.3.1 Measurement Results and General Definitions

These screens contain several pages of data. Which screens aredisplayed depend on the mode the test set is in, E1SINGL orE1DUAL. Screen 1, which appears when you first enter MEA-SUREMENT RESULT, is the STATUS screen. It displays the sta-tus of each line in use. In large font, a status message is dis-played for both lines 1 and 2. These messages (i.e., NO ER-RORS, FRM LOSS, SIG LOSS, ERROR DET) represent the con-dition of the line during testing. Remember to press START (F3)to begin taking measurements.

Measurement Result DefinitionsThe following measurements are displayed within the resultsscreens. The definitions are listed in alphabetical order.

Note: Each measurement is proprietary to its screen; i.e., ‘error’refers to E-Bit errors in the E-BIT screen, and to all Summaryerrors in the SUMMARY screen, etcetera.

AISS: Alarm Indication Signal Seconds is a count of the numberof seconds in which AIS was detected.

AS: This is the count of Available Seconds since the start of thetest. AS equals the length of the total test time minus any Un-available Seconds.

%AS: This is the percentage of Available Seconds since the startof the test.

BIT: This is a count of bit errors that have occurred since the startof the test. Bit errors are not counted during unavailable time.

BER: Bit Error Rate is the total number of bit errors divided by thetotal number of bits during available time since the start of the test.

CLK SLIP: This is the number of Clock Slips that have occurredsince the start of the test.

CODE: This is a count of the number of line Code Errors (BipolarViolations that violate the coding rules) that have occurred sincethe start of the test. In HDB3 coding, a Code Error is a bipolarviolation that is not part of a valid HDB3 substitution.

(CODE) RATE: This is the average Bipolar Violation error rate sincethe start of the test.

CRC: This is a count of the number of CRC-4 block errors thathave occurred since the start of the test. This measurement isreported as N/A when the test set is not synchronized on a re-ceived CRC-4 check sequence.

(CRC) RATE: This is the average CRC-4 block error rate since thestart of the test. This measurement is reported as N/A when the testset is not synchronized on a received FAS or MFAS signal.

29Dual E1

DGRM: This is the count of degraded minutes since the start ofthe test. A DGRM occurs when there is a 10-6 bit error rate during60 available, non-severely bit errored seconds.

%DGRM: This is the percentage of summary Degraded Minutessince the start of the test.

EBIT: This count shows the number of E-bit errors since the startof the test.

EBER: This is the average E-bit error rate since the start of the test.

EFS: This is a count of number of Error Free Seconds since thestart of the test.

%EFS: This is the percentage of summary Error Free Secondssince the start of the test. A summary Error Free Second is asecond in which the signal is properly synchronized and no errorsor defects occur.

ES: This is a count of the number of Errored Seconds that haveoccurred since the start of the test. An ES is any second with atleast one BPV, bit error, FBE, errored block, or CRC-4 error. AnES is not counted during an Unavailable Second.

%ES: This is the percentage of errored seconds that have oc-curred since the start of the test.

FALM: Frame Alarm seconds is a count of seconds that have hadfar end frame alarm (FAS Remote Alarm Indication, RAI) sincethe start of the test.

FE: This is a count of the number of Frame bit Errors that haveoccurred since the start of the test. This measurement is reportedas N/A when the test set has not synchronized on a known fram-ing pattern within the received signal.

Hz/PPM: The Hertz/Part Per Million count records any variancefrom 2.048 Mbit/s in the received frequency.

LOFS: Loss Of Frame Seconds is a count of seconds since thestart of the test that have experienced a loss of frame.

LOSS: Loss Of Signal Seconds is a count of the number of sec-onds during which the signal has been lost during the test.

+LVL: Positive Level is the level of positive pulses being receivedby the test set. Measurements are displayed in decibels variancefrom G.703 specified level (dB).

-LVL: Negative Level is the level of negative pulses being re-ceived by the test set. Measurements are displayed in decibelsvariance from G.703 specified level (dB).

Lpp: Level Peak-to-Peak is the peak-to-peak level of negativeand positive pulses being received by the test set. Measurementsare displayed in decibels variance from DSX level (dB).

30 SSMTT-27

MAX Hz: This is the maximum frequency measured since thestart of the test.

MIN Hz: This is the minimum frequency measured since the startof the test.

MFAL: Multiframe Alarm seconds is a count of seconds that havehad far end multiframe alarm (MFAS Remote Alarm Indication,RAI) since the start of the test.

RxCLK: This is the received clocking frequency.

+/- RxLVL: This is the positive or negative level of pulses beingreceived by the test set.

RCV Hz: This is the current frequency measured during the lastsecond.

SES: This is the count of Severely Errored Seconds since thestart of the test. A severely errored second has an error rate of>10-3. SES is not counted during unavailable time.

%SES: This is the percentage of seconds since the start of thetest that are Severely Errored Seconds.

SLIP: This is the count of Bit Slips. SLIP occurs when the synchro-nized pattern either loses a bit or has an extra bit stuffed into it.

UAS: This is the count of Unavailable Seconds that have occurredsince the start of the test. Unavailable time begins at the onset of10 consecutive severely errored seconds. The displayed value ofUAS updates after the tenth consecutive severely errored secondoccurs. Unavailable time also begins at a LOS or LOF.

%UAS: This is the percentage of unavailable seconds since thestart of the test.

+WANDR: This is the total positive phase difference between themeasured frequency and the reference frequency since the startof the test. The +WANDR value increases whenever the mea-sured frequency is larger than the reference frequency.

-WANDR: This is the total negative phase difference between themeasured frequency and the reference frequency since the startof the test. The -WANDR increases whenever the measured fre-quency is less than the reference frequency.

The following sections describe the available results screens.

31Dual E1

Line 1 and Line 2 SUMMARY ScreensScreens 2 and 3 contain the summary results for Lines 1 and 2,respectively, if both lines are in use. Figure 17 displays the SUM-MARY screen for Line 1.

These screens present the most significant measurement results.They contain data related to the specific types of impairments,like code errors, CRC-4 block errors, framing, and multiframingbit errors. Refer to previous Measurement Result Definitions inthis section for definitions.

" (0)

. ++ %1(

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Figure 17 Line 1 Summary Screen (E1 Mode)

FREQUENCY ScreenThe next screen shows relevant frequency information.

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! :::::

)34

Figure 18 Line Frequency Screen (E1 Mode)

32 SSMTT-27

• The bar graph indicates how fast the signal is slipping in relationto the reference clock. In TEST CONFIGURATION, RxDROPdetermines which line the measurements are taken on. Theother (not selected) line is the reference clock. For example, ifRxDROP is L1-Rx, L1 will be measured, and the referenceclock will be derived from the L2-Rx signal.

• It is important to know the source of the reference clock, tomeaningfully interpret the graph results.

• Note that the bar graph slips most rapidly at the center positionand then gradually slows down as the length of the barincreases.

• A count of the number of clock slips is kept at the end of the bar.• At 256 clock slips the graph resets itself.• One clock slip occurs when the measured frequency deviates

from the reference frequency by one unit interval. A unit intervalis equal to 488 nano seconds, for E1 lines.

• The bar graph is only valid when both L1-Rx and L2-Rx havevalid signals. If L2-Rx has no signal it will show a NO LINE 2REF SIGNAL, and no graph will be shown (Figure 19).

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)34

Figure 19 Line Frequency/No Ref Signal

Note: When no reference clock signal is present, the test set willdefault to its internal clock, for the measurement of MAX, MIN,and current RCV bit rates of the selected signal.

33Dual E1

Line 1 and Line 2 G.821 ScreensThese screens present the measurement parameters specified inITU G.821. Note that these screens will only appear if the G.821line in SYSTEM PARAMETERS > MEAS CONFIG is set to ON.The same applies specifically to the DGRM measurement. Figure20 provides a sample screen. Refer to previous Measurement ResultDefinitions in this section for definitions.

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)34

Figure 20 G.821 Logical Screen

Line 1 and Line 2 ALM/SIG ScreensThis screen presents alarm and measurement parameters relat-ing to the E1 signal. Refer to previous Measurement Result Defi-nitions in this section for definitions.

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)34

Figure 21 ALM/SIG Screen (E1 Mode)

34 SSMTT-27

Line 1 and Line 2 M.2100/550 ScreensThis screen provides pass/fail measurements in accordance withITU M.2100/550 specifications. This specification is used wherea 2.048 Mbit/s circuit passes through international boundaries. Itallocates a certain allowable error rate to each nation that carriesthe circuit. You need only enter the appropriate percentage that isto be allowed for the line under test. The test set makes theM.2100/550 calculations and reports whether the line passed orfailed. Refer to Figure 22. The following definitions pertain to thisscreen.

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)34

Figure 22 Line 1- M.2100/550 screen (E1 Mode)

PERIOD: Identifies the date and time interval of each of the re-ported pass or fail results. The period interval used in Figure 22 is2 minutes. You may change this interval in the SYSTEM PARAM-ETERS > MEAS CONFIGURATION, page 2. Valid entries mayrange from 00 to 99 minutes.

P/F: This shows whether the test result passed or failed duringthe test period.

%ES: This is the percentage of M.2100 Errored Seconds sincethe start of the test. An errored second is any second with aCode, Bit, Frame, Multiframe or CRC error.

%SES: This is the percentage of Severely Errored Seconds sincethe start of the test. An M.2100 Severely Errored Second is anysecond with >10-3 bit error rate, 10-3 code error, excessive frame,multiframe or CRC bit errors, loss of frame, loss of pattern, syn-chronization, or loss of signal.

35Dual E1

LINE 1 and Line 2 G.826 ScreensThe following screen shows G.826 results. Refer to Figure 23.

+++

5+5++5555###

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)34

Figure 23 Line 1- G.826 Screen (E1 Mode)

Note: You must turn on G.826 measurements in SYSTEM PA-RAMETERS > MEAS CONFIGURATION. This ITU standard, speci-fies required performance characteristics of 2.048 Mbit/s lines.The parameter definitions given in G.826 are block-based. Thismakes in-service measurement convenient.

The following definitions are specific to this screen:

BBE: A Background Block Error is an errored block not occurringas part of a SES (Severely Errored Second).

%BBE: The percentage of errored blocks since the start of thetest, excluding all blocks during SES and unavailable time.

EB: An Errored Block is a block containing one or more bit errors.

%EB: This is the percentage of errored blocks since the start ofthe test.

SES: A Severely Errored Second is a one second period whichcontains greater or equal to 30% errored blocks.

%SES: This is the percentage of Severely Errored Seconds sincethe start of the test.

36 SSMTT-27

2.4 Other MeasurementThis menu can contain the following depending on orderedoptions:

• VIEW RECEIVED DATA• VIEW FAS WORDS• VIEW MFAS WORDS• PULSE MASK ANALYSIS• X.50 ANALYSIS• HISTOGRAM ANALYSIS• PROPAGATION DELAY• V.110 ANALYSIS• CHANNEL LOOPBACK

2.4.1 View Received Data

Figure 24 shows a typical screen. This display refers to the Rx/DROP setting in TEST CONFIGURATION.

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)34

Figure 24 View Received Data

To view this screen, use the following procedure:

1. From E1 MODULE MAIN MENU, select OTHER MEASURE-MENT > VIEW RECEIVED DATA.

• Press PAUSE (F3) to trap the current data on the E1 line.• Press PRINT (F4) to send the data to the serial port for printing.• Press PAGE-UP (F1) or PAGE-DN (F2) to view more data.

Note the PAGE number in the upper left-hand portion of thescreen. 64 pages of data are available; which is equal to 16frames or one multiframe.

2. When finished, press ESC.

37Dual E1

The following information is displayed:

PAGE: Indicates which of the available 64 pages of data is cur-rently being displayed.

T/S: Specifies the Time Slot being viewed.

BINARY: This column shows the binary data actually being re-ceived on the line. Each line represents the 8-bit timeslot.

HEX: This column shows the hexadecimal representation of the 8bits being transmitted in each timeslot.

ASCII: This column displays the ASCII representation of the 8-bitbinary framing word which has been received.

• The character displayed to the left of the parentheses repre-sents the 8-bit framing words translated in their present order.

• The character displayed within the parentheses represents the8 bits translated in reverse order.

2.4.2 View FAS Words

This allows viewing of the live presentation of E1 framing binary words.Timeslots 0 of frames 0-15 are displayed in this screen (Figure 25).The presented data refers to the Rx/DROP selection in TEST CON-FIGURATION. See Section 4 for further information.

Notes:• Valid framing is required to select this screen.• Press PAUSE (F1) to freeze the presentation of data; press

RESUME (F1) to return to a live FAS word display.• PRINT (F2) will become available when this screen is paused;

press PRINT to send the screen to the serial port for printing.

!"!"=>344444!"#!

- )34

Figure 25 FAS Frame Words

38 SSMTT-27

The even frames, 0-14, contain the FAS, Frame Alignment Sig-nal, in bits 2-8. As shown in Figure 25, FAS is represented by0011011.

The odd frames do not contain the frame alignment signal. The toprow of these frames in Figure 25 shows the allocation of bits 1-8 inthese frames. The figure represents an undisturbed condition.

When the framing is set for PCM-30 Multiframe, there is a slightvariation in the odd framing bits, those not containing the framealignment signal. Bit 1 is used to transmit the 6-Bit CRC-4multiframe alignment signal and 2 CRC-4 error indication bits. TheCRC-4 multiframe alignment signal has the form 001011. Figure26 shows the FAS frame words seen when the framing is set forPCM-30.

-

!"!"=>?344444!"#!

)34

Figure 26 FAS Frame Words-PCM30

In Figure 26, the first bits of frames 1-11 (odd) send the pattern001011, the CRC-4 multiframe alignment signal.

39Dual E1

2.4.3 View MFAS Words

This allows viewing of the live presentation of Timeslot 16, Frames0-15. Select PCM-30 framing in TEST CONFIGURATION to ac-cess this screen. The data comes from the Rx/DROP selection inTEST CONFIGURATION.

• Press PAUSE (F1) to freeze the presentation of data; pressRESUME (F1) to return to a live MFAS word display.

• PRINT (F2) will become available when this screen is paused;press PRINT to send the screen to the serial port for printing.

!"!"@+3A=2!"#!

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)34

Figure 27 MFAS Frame Words

In the Multiframe, timeslot 16 is used for either common channelor channel associated signalling, as required. Please note that inFigure 27, the template for the even frames (0000xyxx) appliesonly to Frame 0. All other frames follow the template shown abovethe odd frames (ABCDabcd). As seen in Figure 27, in frame 0,MFAS is 0000. The rest of the frames contain signalling channelsdesignated a, b, c, and d. Frame 1 contains channels 1 and 16,frame 2 contains channels 2 and 17, and so forth until frame 15,which contains channels 15 and 30.

40 SSMTT-27

2.4.4 Pulse Mask Analysis

This option enables you to measure the quality of an E1 wave-form. The results compare favorably with pulse shape measure-ments obtained from testing with a digital oscilloscope.

• The analysis is performed for any received test pattern or livesignal, and line interface mode.

• The signal shape is displayed on the test set’s screen.• The ITU G.703 pulse mask can be superimposed for fast

inspection.• The test set will store the present pulse shape for later viewing.• Note that if you start analysis while measurements are running,

the test set will stop the measurements. When the analysis iscomplete, the test set will restart the measurements.

The menu contains two items:

• START NEW ANALYSIS• VIEW LAST PULSE SHAPE

2.4.4.1 Start New Analysis

Figure 28 provides a sample screen.

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Figure 28 Pulse Shape Analysis

In a few seconds, the captured pulse shape will be displayed. APASS/FAIL message will appear at the top of the screen, when aG.703 mask has been imposed on the received pulse. If the pulsemeets the G.703 criteria, it passes. Otherwise, it fails. In thisscreen, there are three F-keys:

41Dual E1

G.703 (F1): Displays the ITU G.703 mask with the captured sig-nal. This F-key then becomes NO-MASK; press to remove theG.703 mask.

RESTART (F2): Starts a new pulse shape capture and analysis.

PRINT (F3): Press to send the screen to the serial port for printing.

Definitions for this screen are:

Width:Pulse Width, in nano seconds

Rise Time: in nano seconds

Fall Time: in nano seconds

Ovr Shoot: Percentage of over shoot

Und Shoot: Percentage of undershoot

Level: Signal level, in dB

2.4.4.2 View Last Pulse Shape

View the last pulse shape captured by the test set. You may viewthis pulse shape at any time, even after the test set has beenturned off for an extended period of time.

• The last pulse shape will be displayed on the screen, along withthe G.703 and PRINT F-keys.

• See Section 2.4.4.1 for the results definitions.

42 SSMTT-27

2.4.5 C-Bit Analysis

This allows you to send and receive C-Bit frames.

• C-bits can be received on both Line 1 and Line 2, but they canbe transmitted on only one line. This will be the line set for Tx/INSERT in TEST CONFIGURATION.

+.

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Figure 29 C-Bit Analysis

Note: The test set will transmit an IDLE pattern upon entering thisscreen.

The following programmable fields are available:

L1-Tx T/SOptions: 1-15, 17-31

Select the transmit timeslot on which to send C-bits.

• Press NEXT (F1) or PREVIUS (F2) as necessary.• To send C-bits on Line 2 (and thus, this item changes to L2-Tx

T/S), set Tx/INSERT to L2-Tx in the TEST CONFIGURATIONscreen.

• As PCM-30 framing is required for this C-bit analysis, you maynot select timeslot 16.

TRANSMITOptions; USER (F1), IDLE (F2)

This setting determines bit 2.

• IDLE: This sends logic 1 as bit 2. When 1 is placed in this spot,C-bit framing will be ignored.

• USER: This activates the C-bit framing and sets the program-mable bits. To program the bits use the following procedure:

43Dual E1

1. Select SEND bits.2. At each bit, press SHIFT and enter either 0 or 1 with the numeric

keypad. The cursor automatically moves one spot to the rightonce a bit is entered. When the cursor highlights a specific bit,information about this C-bit is displayed.

L1-RxOptions: 1-15, 17-31

Select the Line receive timeslot on which to receive C-bits.

• Press NEXT (F1), or PREVIUS (F2) as needed.• Because PCM-30, MFAS, framing is required, you may not

select timeslot 16.

This screen also shows the received C-bits for both Lines 1 & 2.If C-bits are not found on a line, a ‘C-BIT NOT FOUND’ messagewill be displayed for that line.

Definitions of C-bits 2-15 are shown in Table 1.

B it # A ss ig n m en t

2 E S C A P E 0 -C -F ram e A ctive 1 -C -F ram e Ig no re d

3 2M b Lo op s 0 -S ub scrib e r 1 -N e tw ork

4 Lo op 2 o r Lo op 3 0 -S ub scrib e r 1 -N e tw ork

5 Lo op 2 In s tru c tion 0 -A c tive 1 -N on-a ctive

6 Lo op 3 In s tru c tion 0 -A c tive 1 -N on-a ctive

7 H D B 3 C o m m and 0 -A c tive 1 -N on-a ctive

8 Lo op A ckn ow ledg e 0 -A ckn ow ledg e 1 -N o A ckno w ledge m en t

9 N o t D e fine d

10 L oca l F a u lt 0 -A c tive 1 -N on-a ctive

11 R e m ote /L ine F au lt 0 -A c tive 1 -N on-a ctive

12 C F ra m e L oss 0 -A c tive 1 -N on-a ctive

13 -15 S p a re

Table 1 C-bit Definitions

44 SSMTT-27

2.4.6 Histogram Analysis

This menu contains three items

• CURRENT HISTOGRAM• SAVED HISTOGRAM• FORMAT SRAM

Notes• Histogram analysis automaticity starts when E1 measurement

starts.• You will not be able to access this menu without a SRAM

memory card installed in the test set.• Interrupting a timed measurement to view results will cause a

new analysis to start when you return to measuring.

2.4.6.1 Format SRAM

Before using a new SRAM memory card, it must be formatted foruse with the test set. To do so follow the on-screen instructions.Press ESC to cancel the formatting.

Note: SRAM cards have mechanical erase protection, turn theprotection off to erase and format the card.

45Dual E1

2.4.6.2 Current Histogram

This screen contains the following features and functions.

• The start and stop date and time is displayed, as depicted inFigure 30.

• The CURRENT date and time correspond to the last time youentered MEASUREMENT RESULTS.

Press VIEW (F1) to view the current histogram. Figure 31 showsa sample screen.

• Pressing STORE (F2) will erase any previously stored data.• Your CURRENT histogram data is also stored, but it will be

erased the next time you enter MEASUREMENT RESULTS.• If you do not want to save the current file and erase the one

already saved, press ESC instead of ENTER at the warningmessage screen.

#

%

#

##

$-

)34

Figure 30 Current Histogram Info Screen

(. /

#)34

% .+F+##

%

Figure 31 View Current Histogram

46 SSMTT-27

The following F-keys are available:

TYPE (F1): Press to select from the following measurement types.

• The following error types are available:- EBIT, CRC, FAS, MFAS, CODE: See Measurement Result

Definitions in Section 2.3.1.- LOS: Loss of Signal- LOF: Loss of Frame- AIS: Alarm Indication Signal- FASRAI: FAS Remote Alarm Indication- MFASRAI: MFAS Remote Alarm Indication- BERT_LOPS: Loss of Pattern Synchronization- BERT_BIT: Bit errors

• For all error types:- The history of each error type is displayed individually.- The error type is specified in the upper portion of the screen.- Pressing TYPE automatically changes the type options

displayed.

• In Figure 31, BERT_BIT error was selected as the error type.

LINE 1/2 (F2): Selects the parameters of either E1 Line 1 or E1Line 2, depending on the setup.

ZOOM (F3): Changes the resolution to the next lower time periodat the cursor location. Highlight the error before pressing ZOOM.

• Select a minute, hour, or day interval as your time period

JUMP (MORE, F1): Moves the display cursor by 10 steps in thedisplay period.

• Use the left or right arrow keys on the keypad to move thecursor one period at a time

PRINT (MORE, F2): Press to send the results to the serial port.

Notes:• The screen will display either the current or saved results.• Each time MEASUREMENTS RESULT is selected, the test

set will replace the file in the CURRENT HISTOGRAM data.• For each file, the feature will store the most recent 24 hours of

data with a display resolution (PERIOD) of 1 minute.• For each file, the screen will store both the present 60 hours and

the previous 60 days of histogram data with a resolution(PERIOD) of one hour.

47Dual E1

2.4.6.3 Saved Histogram

Select this to view, print, or give a label to a saved analysis. Ifyou attempt to enter SAVED HISTOGRAM without an extramemory card, you will see a warning message. See Section 2.4.6.2for an explanation of the data. See Figure 32 for a sample screen:

"!$%

>?)>1) )DE3>? +(##

!

$-

)34

Figure 32 Saved Histogram Screen

F-keys available on this screen are:

VIEW (F1): Press to enter the selected record.

PAGE-UP/PAGE-DN (F2): Press to scroll through the availablescreens of saved histograms.

DELETE (MORE, F1): Press to delete the highlighted histogram.

LOCK/UNLOCK (MORE, F2): Press LOCK to lock the record, sothat it may not be deleted or otherwise changed. Press UNLOCKto unlock the record.

LABEL (MORE, F3): Press to enter a screen where you can givethe histogram a name.

1. Press TOGGLE (F3) to access the characters, then select thecharacters by useing the keypad arrow keys. Press SELECT(F4) to enter the character into the LABEL line.

• Use INSERT (F1) and DELETE (F2) when you need to add orremove a character.

2. Press TOGGLE (F3) when you are done.3. Press ENTER, and you will return to the SAVED HISTOGRAM

screen, where the new label will be on the record, under theLABEL heading.

CLR-ALL (MORE, F1): Press to delete all unlocked histograms.

48 SSMTT-27

2.4.7 Propagation Delay

This screen allows for viewing the propagation delay of a loopback signal (Figure 33).

• You may enter this screen in a full-rate or Nx64 mode.• The test set measures the number of unit intervals it takes for the

signal to return. A unit interval is the amount of time it takes totransmit one bit (488 ns for a E1 signal). This number is translatedinto an exact number of microseconds of round trip delay.

.

.

G

3C3?@4>4=D6?))2

"!

+

)34

Figure 33 Propagation Delay Screen

• Press CALIB (F2) if you have more than one piece of loopedequipment on the line, and want to re-calibrate the measure-ment to see the propagation delay between two devices, notincluding the test set. Observe the OFFSET to see the delaybetween only the two pieces of equipment (taking the test setto Equipment 1 measurement out of the delay measurement).Continue as necessary to press CALIB to take measurementsfurther down the line.

• Press RESTART (F1) to stop and restart a propagation delaytest.

• The display will be for the Rx/DROP selection in TESTCONFIGURATION.

49Dual E1

2.4.8 Channel Loopback

With the test set’s E1 V.54 channel loopback feature, you can getdetailed information for the maintenance or troubleshooting of V.54datacom circuits. The V.54 channel loopback can locate the faultsin the circuit by setting up a loop in the far end modem, whichallows for local or remote measurements. The test set can acti-vate or deactivate the near end device by sending the activationand deactivation code. V.54 channel loopback uses the T1 E1.2/94-003 standard.

!

$

Figure 34 V.54 Application

$!% +

)34

Figure 35 V.54 Channel Loopback Screen

Use the F-keys to send the LOOP-UP (F1) or LOOP-DN (F2)codes as needed.

50 SSMTT-27

2.5 VF Channel AccessThis menu performs a variety of talk/listen functions.

Note: Do not attempt to enter VF CHANNEL ACCESS if the FRAMELED is not green. A green LED indicates that the framing foundon the received signal matches the framing selected in TESTCONFIGURATION. It is impossible to talk, listen, or perform otherchannelized functions in the absence of frame synchronization,since channels can be identified only within a framed signal.

The VF CHANNEL ACCESS menu contains the following items:

• VF & NOISE MEASUREMENT• VIEW LINE CAS• CALL EMULATOR• SUPERVISION SETUP• DIAL PARAMETERS• SIGNAL MEANINGS• VIEW/PRINT TRACE RESULTS

Note: During VF CHANNEL ACCESS, when TEST CONFIGURA-TION-TxSOURCE is set to TESTPAT, idle channel code and sig-nalling (A/B/C/D bits) will be inserted into the unselected channels.The idle channel code and signal can be programmed from: E1MODULE MAIN MENU > SYSTEM PARAMETERS > MEAS CON-FIGURATION-IDLE CHNL CODE and IDLE CHNL A/B/C/D lines.

2.5.1 VF & Noise Measurement

This screen lets you choose:

• which channel to test for both transmitting and receiving• whether to talk, send a tone, or place quiet termination on the

transmit signal• the transmitted frequency and level• which signalling bits to send• to listen on both or either line

It also tells you:

• the received signalling bits• the received 8-bit data• the received frequency and level• noise measurements on the received frequency

Note: There are some differences in setting up for E1SINGL orE1DUAL mode.

51Dual E1

$H

((+( (

*I I&72+D8I I&"("+II(72+8I 72+D8I 72+D8I#!72+D8I#

$'

)34

*$72+D8 &

Figure 36 VF Measurements E1 Dual Setup Screen

Figure 36 is an example of an E1DUAL configuration. Tx-1 is setfor timeslot 01. Tx is Line 1, since Tx/INSERT was set for Line 1in TEST CONFIGURATION. To insert on Line 2 (and consequentlysee Tx-2 on this screen), select Tx/INSERT: L2-TX in TEST CON-FIGURATION. Tx of the other line will be in loop mode.

Rx-1/2 shows the selected receive timeslot for each line. TheMEASUREMENT RESULTS come from the IN/DROP selectionfurther down this menu.

Tx-T/S (E1SINGL) or Tx-1 (E1DUAL)Options: 1-31

Choose the transmit timeslot.• Press NEXT (F1) or PREVIUS (F2) as needed.• Tx-1 normally should be the same as the Rx-1, but you do have

the option to set them for different channels.• Upon selecting a timeslot, approximately three seconds pass

before actually inserting on the timeslot.

Rx-1 (E1SINGL) or Rx-1/2 T/S (E1DUAL)Options: 1-31

Choose the receive timeslot for E1 Line 1 (E1SINGL mode) or E1Lines 1 and 2 (E1DUAL mode).

• Use NEXT (F1) or PREVIUS (F2) as needed• To receive on Line 2, select L2-Rx for the DROP item.

TxABCDOptions: IDLE (F1), SEIZE (F2), manually set

Change the signalling bits transmitted with the associated trans-

52 SSMTT-27

mit channel. These bits will be transmitted only if the test set isusing MFAS (PCM-30) framing.

• Pressing IDLE (F1) or SEIZE (F2) will place that signal onto theA/B/C/D position. Program the IDLE or SEIZE signal in VFCHANNEL ACCESS > SUPERVISION SETUP.

To change these bits manually:1. Press SHIFT and use the 1 and 0 keys to enter the signalling bits.2. Press ENTER to send the ABCD bits.

IN/DROP (E1DUAL)Options: L1 (F1), L2 (F2)

Determine on which line to Insert and Drop the signal.• Insert determines the line onto which you insert the test signal.• Drop determines which line will report Measurement Results.

TxModeOptions: THRU (F1), TALK (F2), QUIET (F3), TONE (F4)• Press THRU to pass all of the received channels out on the

transmit signal.• Press TALK to talk on the selected transmit channel; the test

set will transmit speech from the microphone.• Press QUIET to place a quiet termination on the transmit signal.• Press TONE to insert a tone on the selected transmit channel.

If you select TONE, use the next two settings to set the tonefrequency and level.

TxFREQOptions: 50 Hz-3950 Hz

If TONE is selected for TxMode, choose the tone frequency bypressing SHIFT and entering the value from the keypad.

TxLVLOptions: -60 to 3 dBm

If TONE is selected for TxMode, choose the transmit tone levelby pressing SHIFT and entering the value from the keypad. Youmay select any value from -60 to +3 dBm. Press MINUS (F1) toachieve negative values.

Speaker (E1DUAL)Options: L1 (F1), L2 (F2), L1+L2 (F3)

Select the line you want to hear on the speaker.

• Press L1 to listen on Line 1.• Press L2 to listen on Line 2.• Press L1+L2 to listen on both lines.

53Dual E1

Measurement ResultsThe last five items pertain to received data. As the equals signindicates, they are for viewing only, and may be neither edited norchanged.

RxFREQView the received frequency of the selected channel in Hz.

Rx(dBm)View the received level in dBm.

RxABCDView the received Channel Associated Signalling System (CAS) bits.

Note: These bits are meaningful only if the FRAME LED is green.Ignore these bits if this LED is not green.

S/N (dB)Observe the Signal to Noise measurement, in decibels. This mea-surement is updated every second.

3K (dBm)Observe the Noise 3-K Flat measurement, in dBm. This measure-ment is updated every second.

OFFSETObserve the coder offset.

PEAKObserve the coder peak from +127 to -127, using A-law.

RxDATAView the live 8-bit channel data as it is received from the selected line.

PSOP (dBm)Observe the Noise Psophometric* measurement in dBm. Thismeasurement is updated every second.

*A noise weighting method established by the ITU-T, designatedas CCIF-1951 weighting, for use in a noise measuring set orpsophometer.

1010 (dBm)Observe the Noise 1010 Hz measurement, in dBm. This mea-surement is updated every second.

54 SSMTT-27

2.5.2 View Line CAS

This screen allows:

• Viewing of the signalling bits for all 30 channels for either Line1 (E1SINGL) or Lines 1 and 2 (E1DUAL).

In order to do this:

• You must select PCM-30 framing in TEST CONFIGURATION.• The FRAMING LED must be green in order for the signalling

bits to be displayed.

Timeslots 1-5 are shown on the first line, 6-10 are shown in thesecond line, etc. Figure 37 is a sample screen.

(+++++""(+++++""

Figure 37 View Line 1 & 2 CAS

Press STATUS (F1) to see a decode of each ABCD state. Infor-mation will be displayed when a match of state for forward/back-ward conditions are met, as specified in the SUPERVISIONSETUP screen. Here are the definitions:

IDLE= IDLESEIZ= SEIZEACKW= SEIZE ACKNOWLEDGMENTANSW= ANSWERCLRB= CLEAR BACKCLFR= CLEAR FORWARDBLCK= BLOCK????= UNKNOWN; no state or no match detected

Note: Some states will change too quickly for the test set to dis-play and detect. Therefore, only constant states which are de-tected when the screen is refreshed will be displayed.

Press ABCD (F1) to return to the ABCD information.

55Dual E1

2.5.3 Call Analysis

This feature allows the test set to monitor the digits and statessent between two pieces of equipment. To use this feature:

• The test set must be configured for E1DUAL mode, using PCM-30 or PCN-31 framing.

• Supervision setup must be precisely setup for the analysis.• The test set must see a Seize and a Seize Acknowledgment

before it will capture digits.• The memory storage card will be reformatted upon entering this

feature if the card is not formatted for test set usage.

6)4443

!

.

. ((

Figure 38 Call Analysis Setup Screen

Configure the following:

TYPEOptions: MFR1SS5 (F1), MFR2 (F2), DTMF (F3), PULSE (F4)

Select the type of signal you will be analyzing.

• MFR1SS5: to analyze SS5 signalling.• MFR2: to analyze MFR2 and MFR2 compelled signalling.• DTMF: to analyze DTMF signalling.• PULSE: to analyze Pulse signalling.

Rx-1 T/SOptions: 1-31, or AUTO (F3)-MFR2, DTMF or PULSE only

Select the Line 1 timeslot to receive the signal on.

• Use NEXT (F1) and PREVIUS (F2) to select the timeslot.• If AUTO is selected, the test set scans all channels for the

TRIGGER event (line 4). You will also be presented with twoadditional choices; TRIGGER and SUPERVISION/ABCD.

56 SSMTT-27

Rx-2 T/SOptions: 1-31, or AUTO (F3)-MFR2, DTMF or PULSE only

Select the Line 2 timeslot to receive the signal on.

• Use NEXT (F1) and PREVIUS (F2) to select the timeslot.• If you select AUTO, the test set will scan for the Line 2 receive

timeslot. You will also be presented with two additional choices;TRIGGER and SUPERVISION/ABCD.

TRIGGER (available if RX T/S set to AUTO)Options: CAS (F1), STATE (F2)

• Select CAS (F1) to have the test set start capturing after itdetects specific CAS bits.1. An ABCD line will appear in place of SUPERVISION. Use

the SHIFT and number keys to enter the bits you want thetest set to match.

2. When the test set sees the set ABCD bits, the screen willdisplay them.

• Select STATE (F2) to have the test set begin capturinginformation after it sees the selected state.

6)4443

/ -

.

. ( ( $ /

Figure 39 Call Analysis Setup Screen with Trigger

SUPERVISION (STATE only)Options: IDLE (F1), SEIZE (F2), ACKW (F3), ANSW (MORE, (F2),CLR-BK (MORE, (F2), CLR-FW (MORE, (F2), BLOCK (MORE, F1)

Determine what signal trigger state must be met for the test set tostart capturing.

• IDLE looks for an idle signal.• SEIZE looks for a seizure.• ACKW looks for a backward seize acknowledgment.• ANSW looks for an answer signal.

57Dual E1

• CLR-BK looks for a Clear-Back signal.• CLR-FW looks for a Clear-Forward signal.• BLOCK looks for a Block signal.

When you have determined the settings, press ENTER to ob-serve the real-time analysis.

The following F-keys are available:

STOP/RESTART (F1): Press to stop the analysis, press again torestart.

ABSOLUT (F2): Shows timestamps in absolute mode; the abso-lute time since start.

RELATIV (F3): Shows timestamps in relative mode; the time rela-tive to the last change.

Figure 40 shows a DTMF analysis screen.

>D)(43A)?"2?) )>1) )>1)=0! >J> >J>>J>! >J>! >J>>J> >J>

+ $

.

Figure 40 DTMF Call Analysis Sample Screen

Figure 41 shows a MFR2 analysis screen.

>D)(43A)?2?)! )>1) )>1)=0! >J> >J> >J>! >J>! >J>>J> >J>

+ $

.

Figure 41 MFR2 Call Analysis Sample Screen

58 SSMTT-27

The following F-keys are available after pressing STOP (F1):

PAGE-UP (F1)/PAGE-DN (F2): Page up/down one page.

ANALYZE (F3): Analyzes the digits; see Section 2.5.3.1.

RESTART (MORE, F1): Restarts CALL ANALYSIS.

ABSOLUT (MORE, F2): Shows timestamps in Absolute mode;the absolute time since start.

RELATIV (MORE, F2): Shows timestamps in Relative mode; thetime relative to the last change. Toggle between the ABSOLUTand RELATIV modes to see the timestamp for each.

PRINT (MORE, F1): Print your results through the serial port, seeSection 2.5.8.

SAVE (MORE, F1): Save your results, see Section 2.5.8.

Notes:• When SS5 is selected (MFR1SS5), the SS5 tones will be

detected. The Label decode will be supplied automatically.• When MFR2 is selected, MFR2 tones will be detected, and the

choices will appear. Line 1 Rx is always in the Forwarddirection, and Line 2 Rx is in the backward direction.

• To differentiate between CAS line signalling and PULSE digitsin the PULSE CALL ANALYSIS, PULSE will be displayedbefore a detected pulse digit sequence of IDLE/SEIZE.

2.5.3.1 Digit Analysis

To access this function, press STOP (F1) in CALL ANALYSIS,then press ANALYZE (F3). The analysis screen is presented, asin Figures 42 and 43.

• Digit Analysis will record the last 32 digits for analysis when theanalysis is stopped.

• If a TRIGGER is set (in CALL ANALYSIS), then up to 32 digitsfrom the stopping point back to the trigger points will be storedand analyzed.

The following items are displayed in Figure 42:

H/L Hz: The high and low frequencies of the digit, in Hz.

dBm: The dBm level.

INTD: Interdigit period–the time between digits.

PERD: The dial Period.

TWIST: The difference between the two frequencies is called Twist.

59Dual E1

.>C)KK!D4%(%1#"("D42+D"(-#

KD4%(%1##(D42+D"(!-

KD4%(%1""(#D42+D"(#-"

Figure 42 DTMF Digit Analysis Screen

>C)K5+ !!!!!!"!!!!#!"!

.

Figure 43 Pulse Digit Analysis Screen

The Pulse Digit Analysis screen (Figure 43) definitions also in-clude:

PPS: Pulses per second

PPRD: Pulse Period

The Pulse Digit Analysis screen (Figure 43) also has additional F-keys:

LINE-1/2 (F3): Press to toggle between the lines.

RETURN (F4): Press to return to the CALL ANALYSIS screen.

60 SSMTT-27

2.5.4 Call Emulator

This function allows placing and receiving calls. Select one of the10 predefined sequences, or input a user defined sequence.

Notes:• To run the user call emulator, press START (F4) in USER CALL

EMULATOR. If you escape from the menu to CALL EMULA-TOR, then press START (F4), you will be running the Q.441specification instead of the one you defined.

• When you edit your own sequence, no default Q.441 timervalue will be provided for PERD (periodic timer). You need toenter a value according to the Q.441 specification or any otherdesired value to make the sequence work.

2.5.4.1 Standard Emulations

In this screen select a standard emulation to use.

*$**K!$*K!!$"$#$

$-

Figure 44 Call Emulator List

The following F-keys are available:

USER (F1): Press to enter USER CALL EMULATOR where youmay create, edit, or use a User emulation sequence. See Section2.5.4.4.

VIEW (F2): Press to enter a screen which shows a sample se-quence of the selected emulation. Figure 45 shows sample DTMFsequence screen. Note that for DTMF RECEIVE, you will emu-late the RECEIVE side only.

START (F4): Press to start the highlighted emulation. Refer toFigure 45.

61Dual E1

$+I(+I(+I(/LM+I( ILILIL

Figure 45 DTMF Receive Sequence

2.5.4.2 Place a Call

For CALL emulation, you will enter a screen where you setup andplace a call. Here is a sample screen:

*

%++

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I(+IIIII!

%

Figure 46 Q.441 MFCR2 Call Emulation Setup Screen

Use this procedure to setup the call:

1. CHANNEL: Choose the timeslot to place the call on. Selectfrom 1-15, 17-31; use NEXT (F1) and PREVIUS (F2) to selectthe channel.

2. CALL NUMBER: Use the SHIFT and number keys to enter thedigits for the number you want to call. The A-F keys, corre-sponding to the digits, are also available.

• For some emulation sequences the following items will also beavailable to configure:

62 SSMTT-27

3. CALLING NUMBER: This is the number you are dialing from.• Use the SHIFT and number keys to enter the digits.

4. CALLING PARTY’S CATEGORY: This deals with the categoryof the calling party as defined by Q.441 (or user defined by theSignal Meanings) Forward Group II, i.e. the user can be asubscriber without priority II-1, subscriber with priority II-2, etc.

• Use SHIFT and keypad number keys to enter the digits.

5. Press CALL (F4) when ready to place the call. The appropriateCALL screen is then displayed (Figure 47).

KK>D)(4)C2)=E3A)?!2?)#)>1))>1)#"!!+!!!+"#!!+

*

+ $ %

Figure 47 Q.441 MFCR2 Call Emulation

Here is the information on this screen:

Time/s: Time sent; the time the digits were sent.

Send: The CAS or Register signalling sent

Recv: The CAS or Register signalling received.

Label: Sent or received CAS or Register signalling meanings, asdefined by Supervision Setup or Signal Meanings.

The following F-keys are available:

STOP/RESTART (F1): Stops and restarts the CALL or RECEIVE.

ABSOLUT (F2): Displays Time stamp in absolute mode.

RELATIVE (F3): Displays Time stamp relative to initial event.

HANG-UP (F4): Releases the call in progress.

Keypad FunctionalityWhen a MFCR2 or MFR2 call has been established, enable key-pad DTMF dialing by pressing SHIFT. DTMF tones will then besent when you press the 0-9 digits. This is especially useful forverifying credit card functionality.

63Dual E1

2.5.4.3 Receive a Call

For RECEIVE emulation, a setup screen to receive a call is dis-played. Here is a sample screen:

*$

. $

%'"* * ..

Figure 48 Q.441 MFCR2 Receive Setup

Configure the following:

CHANNEL• Use the NEXT (F1) and PREVIUS (F2) keys to select from 1-

15, 17-31 for the receive channel.

No. DIGITS EXPECTED• Use the SHIFT and number keys to enter the number of digits

you expect the test set to see and capture. The range is from1-20 digits.

Some receive emulations will include the following items toconfigure:

REQUEST CALLER IDOptions; NO (F1), YES (F2)

• Select NO to not request the CALLER ID be sent to the test set.• Select YES to request the CALLER ID be sent to the test set.

When received, the CALLER ID will show up in the messages.Used between central offices for tracking and billing purposes.

REQUEST CATEGORYOptions; NO (F1), YES (F2)

• Select NO to not request the REQUEST CATEGORY (such as2, Subscriber with Priority, or 6, Data Transmission) be sent tothe test set.

64 SSMTT-27

• Select YES to request the REQUEST CATEGORY be sent tothe test set. When received, the category will show up in thereceive messages.

Press RECEIVE (F4) when you are ready to receive a call. Thetest set will display the RECEIVE screens, where you can seethe call trace. Here is a sample screen:

+ %$

*$KK

>D)(4)C2)=E3A)?OOOO"!#"2?)""")>1)""!)>1)=

Figure 49 Q.441 MFCR2 Receive Sample Screen

The information presented and F-keys available are the same asthat for the CALL screen in Section 2.5.4.2.

65Dual E1

2.5.4.4 User Emulation

Select this screen to create, edit, or use a user emulation se-quence. Follow this procedure:

1. In the CALL EMULATION screen, press USER (F1) and theUSER CALL EMULATOR screen is displayed. This screenfeatures a list of any stored user emulations and allows creatinga new sequence.

!"#

Figure 50 User Call Emulator Screen

The User Call Emulator Screen has the following F-keys:

EDIT (F1): Press to edit your sequence.

DELETE (F2): Press to delete the highlighted sequence.

RENAME (F3): Press to bring up the CALL EMULATOR PRO-FILES screen, where you may rename the selected sequence.Use the Label procedure further in this section.

START (F4): Press to start the selected emulator sequence.

2. Press EDIT (F1) and the Edit Emulator screen is displayed.The cursor will be on the first line; LABEL.

3. Press EDIT (F1) again to display the CALL EMULATORPROFILES screen, where you give your call sequence a label(name).

66 SSMTT-27

"

+

+%, *$-'./(

Figure 51 Call Emulator Profiles

Follow this procedure to give the sequence a label:

A. Press TOGGLE (F3) to display the character screen.B. Use the keypad arrow keys to move the flashing cursor to

the desired character and press SELECT (F4).C. Continue steps A and B until you have completed the label.

When finished, press TOGGLE (F3) to escape from thecharacter screen.

• You may also use the SHIFT and the alphanumeric keys forentering the label.

D. If you make a mistake while entering the letters, highlightthe character with the cursor, then press DELETE (F2).

F. When the label is complete, press ENTER to return to theEDIT EMULATOR screen (Figure 52).

+%

$. . LMLMLM+

"

Figure 52 Edit Emulator

67Dual E1

4. Use the keypad arrow keys to select CHANNEL.• Press NEXT (F1) and PREVIUS (F2) to select the timeslot to

use (both Rx and Tx) during emulation, in the 1-15, 17-31 range.

SEND SideThe Send side refers to the Line or Register signalling which willbe sent by the test set on whichever line has been selected asTx/INSERT in TEST CONFIGURATION. Three items are avail-able for sending:

TYPEOptions: NONE (F1), CAS (F2), DTMF (F3), MF-F (more, F1),MF-B (more, F2), DP (more, F3)

Determines the type of signalling used.

• NONE: No signalling• CAS: Channel Associated Signalling• DTMF: Dual Tone Multi-Frequency• MF-F: Multi-frequency-forward• MF-B: Multi-frequency-backward• DP: Dial Pulse

CODEOptions: any keypad alphanumeric digits; four digits maximumfor CAS. 20 digits maximum for all other types.

These are the actual bits to be transmitted by the test set.

• Press the SHIFT key and enter the desired signalling bits

PERDOptions: up to 999 ms

PERD determines the elapsed time before proceeding to the nextstep in the emulation.

RECEIVE SideThe receive side refers to the Line or Register signalling which yourequire to be received by the test set, before progressing to thenext step. Three items are available for the receive side. Note thatTYPE and CODE work in the same manner as in the send side.

TOUTOptions: NONE (F1), up to 999 ms

TOUT refers to Time Out. This determines the length of time whichthe test set will wait for its received digits/CAS before abortingthe signalling sequence.

68 SSMTT-27

To select a time limit:

A. Press SHIFT and enter the desired number digits up to 999(ms). Press SHIFT when done.

B. Press ENTER to exit the editor screen and save thesettings.

5. To begin an emulation sequence, select the sequence youwant to use in the USER CALL EMULATOR Screen and pressSTART (F4). The screen shown in Figure 53 is displayed.

6. Observe the time digits are sent or received, and their label.

KK>D)(4)C2)=E3A)?)=E 0#"#)=E 0"#!!""#!"#!""#

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+ $

Figure 53 Start User Emulation

The Start User Emulation screen contains the following F-keys:

STOP/RESTART (F1): Stops and restarts the CALL or RECEIVE.

ABSOLUT (F2): Presents time stamps in absolute mode (view atTime/s line)

RELATIV (F3): Presents time stamps in relative mode (view atTime/s line)

69Dual E1

2.5.5 Supervision Setup

In this screen define the IDLE, SEIZE, ACKNOWLEDGMENT,CLEAR BACKWARD and CLEAR FORWARD VF Supervision bitsmanually, or use the ITU Q.422 standard. These definitions areused in CALL ANALYSIS.

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Figure 54 Supervision Setup Screen

NameOptions: Q.422 (F1), USER1 (F2), USER2 (F3), USER3 (F4)

Select standard ITU Q.422 or User-defined signalling.

• Select Q.422, and the test set will use the ITU Q.422 standardsignal definitions. You may view them on the screen.- Press ENTER to invoke the settings.

• Select a USER option, and enter the supervision bits manually.1. Use the SHIFT and number keys to make each entry.2. Use the keypad arrow keys to move between line items.3. When the entries are complete, press ENTER. The settings

will be saved and invoked.

The supervision definitions:

DIR: Direction; Forward or Backward

ABCD (F): Forward ABCD signalling bits

ABCD (B): Backward ABCD signalling bits

IDLE F/B: Idle Forward or Backward bits:• In the idle state the outgoing end (forward) sends af=1, bf=0.

The incoming end (backward) replies with af=1, af=0, if idle.• These four supervision bits will be placed on the CAS bits for

the timeslot being transmitted when IDLE (F1) is selected inCALL ANALYSIS.

70 SSMTT-27

SEIZE F: Forward seizure signal transmitted at the beginning of acall to initiate circuit operation.

SEIZE ACK B: Backward acknowledgment of a seizure signal.

ANSWER B: The answered state must be established on the pre-ceding link immediately after it is recognized.

CLEAR BACK B: Clear Back is an idle condition from the calledsubscriber’s line telling the incoming switch to release the call.

CLEAR FORW1F/CLEAR FORW2F: Clear Forward sends acleared condition from the calling subscriber’s line, or it is therelease from the calling switching equipment. Note that there aretwo conditions.

BLOCK F/B: Block an idle circuit from outgoing and incomingcalls.

71Dual E1

2.5.6 Dial Parameters

This is used to setup VF dialing parameters. Refer to Figure 55.

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Figure 55 Dial Parameters Screen

DIAL PERIODOptions: 1 ms to 999 ms

Specify the dial period in milliseconds used for DTMF and MFdialing. The default value is 100 ms.

• Press SHIFT and enter the desired value from the keypad.

SILENT PERIODOptions: 1 ms to 999 ms

Specify the silent period in milliseconds used for MFR2, DTMFand MF dialing. The default value is 100 ms.

• Press SHIFT and enter the desired value from the keypad.

INTERDIGIT PRDOptions: 1 ms to 999 ms

Select the interdigit period for pulse dialing.

• Press SHIFT and enter the desired value from the keypad.

TONE LEVEL dbmOptions: -20 to -5 dbm

Select the tone level.

• Press MINUS (F1) to attain a negative value, then use theSHIFT and numeric keys to enter the value.

72 SSMTT-27

B-BITOptions: YES (F1), NO (F2)

B-Bit dialing applies to pulse calls. When B-bit dialing is enabledand a call is placed, the B supervision bit of the selected timeslottoggles between 0 and 1.

• Before calling, change the transmit CAS bits to the seizurecondition. When dialing, the test set will pulse the B-bitaccording to the timing selected in %BREAK and INTERDIGITperiod. When the dialing is complete, the test set remains in theseizure condition.

PULSE (10pps)Dial pulse is set to 10 pps and cannot be changed.

% BREAKOptions: 40% (F1), 50% (F2), 60% (F3)

Select the desired BREAK percentage.

• Percent break is the ratio of the break (IDLE) interval to the totalpulse cycle interval. It is used in Pulse dialing.

73Dual E1

2.5.7 Signal Meanings

Use the ITU-T Q.441 (F1) standard signal definitions for Groups I,II, A and B or set your own under one of the three USER (F2, F3,F4) labels. Upon pressing a USER F-key a setup screen is dis-played, where you can make selections.

To set a signal, press the F-key corresponding to your choice,from Digit 1-Digit 9, and Code 10-Code 15, or to the appropriatelabel definitions; for example, on the Group II Forward screen,SubWOP corresponds to the Group II Forward labels item Sub-scriber without Priority.

As different countries may have slight differences in their defini-tions and/or use of digits, this feature allows you to define yourown digits.

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Figure 56 Signal Meanings Screen

The following tables and screens present the screens and theircorresponding Label tables.

74 SSMTT-27

Figure 57 Group 1 Forward Signals

I-1 Digit 1 I-9 Digit 9 I-2 Digit 2 I-10 Digit 0 I-3 Digit 3 I-11 Code 11 I-4 Digit 4 I-12 Code 12 I-5 Digit 5 I-13 Code 13 I-6 Digit 6 I-14 Code 14 I-7 Digit 7 I-15 Code 15 I-8 Digit 8

Table 2 Group 1 Forward Labels

75Dual E1

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Figure 58 Group II Forward Signals

Signal Label Meaning II-1 Sub w/o p Subscriber without priority II-2 Sub w pri Subscriber with priority II-3 Maint Eqp Maintenance equipment II-4 Spare Spare II-5 Operator Operator II-6 Data Tran Data Transmission

II-7 Sub woft Subscriber (or operator without forward transfer facility)

II-8 Data Tran Data Transmission II-9 Sub w pri Subscriber with priority

II-10 Opr wftf Operator with forward transfer facility II-11 Spare Spare II-12 Spare Spare II-13 Spare Spare II-14 Spare Spare II-15 Spare Spare

Table 3 Group II Forward Labels

76 SSMTT-27

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Figure 59 Group A Backward Signals Screen

Signal Label Meaning A-1 Send (n+1) Send next digit (n+1) A-2 Send (n-1) Send last but one digit (n-1)

A-3 Adr cmp B Address-complete, changeover to reception of Group B signals

A-4 Cong Nat Congestion in the national network A-5 Send CPG Send calling party’s category

A-6 Adr cmp S Address-complete, charge, set-up speech conditions

A-7 Send (n-2) Send last but two digits (n-2) A-8 Send (n-3) Send last but three digits (n-3) A-9 Spare Spare

A-10 Spare Spare A-11 Send CCI Send country code indicator A-12 Send LoDD Send language or discriminating digit A-13 Send NOC Send nature of circuit

A-14 Req. info Request for information on use of an echo suppressor

A-15 Cong Int Congestion in an international exchange or at its output

Table 4 Group A Backward Signal Labels

77Dual E1

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Figure 60 Group B Backwards Signals Screen

Signal Label Meaning B-1 Spare Spare B-2 Send SIT Send special information tone B-3 Sub LB Subscriber line busy B-4 Congestion Congestion B-5 Unalloc# Unallocated number B-6 Sub LFC Subscriber line free, charge B-7 Sub LFNC Subscriber line free, no charge B-8 Sub LOOO Subscriber line out of order B-9 Spare Spare

B-10 Spare Spare B-11 Spare Spare B-12 Spare Spare B-13 Spare Spare B-14 Spare Spare B-15 Spare Spare

Table 5 Group B Backward Labels

78 SSMTT-27

2.5.8 View/Store/Print

You may store up to 50 different results to view or print at a latertime. To store results, use the procedure in Section 2.5.8.1.

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Figure 61 View/Store/Print Screen

The following F-keys are available in this screen.

VIEW (F1): Allows viewing of a selected file, see Section 2.5.8.2.

SAVE (F2): Allows saving a file, see Section 2.5.8.1.

PRINT (F3): Allows printing of a selected file, see Section 2.5.8.3.

RENAME (more, F1): Allows renaming a selected file, see Sec-tion 2.5.8.6.

UN/LOCK (more, F2): Allows locking and unlocking a file, seeSection 2.5.8.5.

DELETE (more, F3): Allows deleting a file, unless locked, seeSection 2.5.8.4.

79Dual E1

2.5.8.1 Saving a Test

1. From any screen with a STORE F-key, press it and refer toFigure 61.

2. Use the keypad up/down arrow keys to move the cursor to anempty line.

3. Press SAVE (F2), this displays the file name character screen,shown in Figure 62.

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Figure 62 Filename Character Screen

4. Press INPUT (F3). Note that the ‘A’ character is highlighted andthe INPUT F-key has changed to STOP.

5. Use the keypad arrow keys to move the cursor to the desiredcharacter.

6. Press ENTER to place the desired character in the FILENAMEline. Continue this process until the FILENAME is complete.You may enter up to 15 characters.

• If you make a mistake in the entry:A. Press STOP (F3).B. Move the FILENAME cursor to the incorrect character.C. Press DELETE (F2) to delete the character or, press

INSERT (F1) to insert a character.D. Press INPUT (F3) to select a character. Press ENTER to

insert the new character to the left of the cursor.

7. Press SAVE (F4) to save and return to the View/Store/PrintScreen shown in Figure 61.

80 SSMTT-27

2.5.8.2 Viewing a Stored Test

1. From VF CHANNEL ACCESS, select VIEW/STORE/PRINT.2. Select the desired file with the keypad up/down arrow keys.3. Press VIEW (F1) and the stored result will appear.4. Use the keypad up/down arrow keys to scroll through the

available screens.5. When finished, press ESC to return to the VIEW/STORE/

PRINT screen.

2.5.8.3 Printing a Stored Test

1. Connect a SunSet printer to the serial port of the test set.

• For other types of printers or for more information, refer to theStoring and Printing chapter in the test set user’s manual.

2. From VF CHANNEL ACCESS, select VIEW/STORE/PRINT.3. Select the desired file with the keypad up/down arrow keys.4. Press PRINT (F3) and the file will begin printing.5. When finished, press ESC to return to the VIEW/STORE/

PRINT screen.

2.5.8.4 Deleting a Stored Test

1. From VF CHANNEL ACCESS, select VIEW/STORE/PRINT.2. Select the desired file with the keypad up/down arrow keys.3. Press DELETE (more, F3) and the file is deleted if the file is

unlocked.

2.5.8.5 Locking & Unlocking a Stored Test

1. From VF CHANNEL ACCESS, select VIEW/STORE/PRINT.2. Select the desired file with the keypad up/down arrow keys.3. Press UN/LOCK (more, F2) and the file is locked or unlocked

as indicated to the right of the file name. Refer to the lock iconshown in Figure 61.

2.5.8.6 Renaming a Stored Test

1. From VF CHANNEL ACCESS, select VIEW/STORE/PRINT.2. Select the desired file with the keypad up/down arrow keys.

A. Press UN/LOCK (more, F2) if the file is locked as indicatedby the lock icon.

3. Press RENAME (more, F2) and the character screen shown inFigure 62 is displayed

4. Follow the procedure in Section 2.5.8.1 , steps 4-7.

81Dual E1

2.6 Other FeaturesThis menu contains the following:

• ERROR INJECTION• ALARM GENERATION• VIEW RESULTS RECORDS• SEND FRAME WORDS

2.6.1 Error Injection

Figure 63 shows the ERROR INJECTION screen.

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Figure 63 Error Injection Screen

To start error injection, press the ERR INJ key. The test set willinsert errors as you specify. If the error injection is set to RATEmode, an ERR-INJ indicator will be displayed on the screen.

TYPEOptions: CODE (F1), BIT (F2), BIT + CODE (F3), CRC-4 (MORE,F2), FRAME (MORE, F2), E-BIT (MORE, F3)

This item specifies the type of errors to be inserted.

MODEOptions: BURST (F1), RATE (F2)

This item specifies the mode of error injection.

• RATE mode applies only to CODE and BIT errors. Errors areinjected at a constant rate.

• Other types of errors may be inserted one at a time underBURST mode, which injects a set number of errors.

82 SSMTT-27

COUNTOptions: 1 to 9999 or 1e-9 to 2e-3

For BURST MODE, choose the COUNT of errors to be inserted.For RATE MODE, choose the error RATE number and exponent

• For BURST, press SHIFT, then use the keypad to enter anynumber between 1 and 9999. The errors will be inserted inapproximately 1 second or less, and will cause from 1 to 3errored seconds.

• Applies only to BIT and CODE errors. All other errors will beinjected singly.

• For RATE, the errors will be inserted at a continuous rate asspecified in this entry, and a ERR-INJ display will appear at thetop of the screen.

Programming a Burst of 10 Errors1. Select ERROR INJECTION.2. Press CODE (F1) to select the error type.3. The cursor automatically moves to MODE. Press BURST (F1).4. The cursor automatically moves to COUNT. Press SHIFT to

display the ‘SHFT’ indicator.5. Enter 10 using the keypad. COUNT should show 10.6. Press the SHIFT key to turn off the ‘SHFT’ indicator.7. Press ENTER; you have just programmed the test set to inject

10 CODE errors each time you press the ERR INJ key.

Programming a 10-6 Bit Error Rate1. Select ERROR INJECTION.2. Press BIT (F2) to select the error type.3. The cursor automatically moves to MODE. Press RATE (F2).4. The cursor automatically moves to COUNT. Press SHIFT5. Press 1 on the keypad. The multiplier position shows 1. The

cursor moves to the exponent position.6. Press 6 on the keypad.7. Press SHIFT key to remove the ‘SHFT’ indicator.8. Press ENTER. You have just programmed the test set to inject

Bit errors at 1x10-6 rate each time the ERR INJ key is pressed.• To turn off the error rate injection, press ERR INJ once, then

verify that the ERR INJ indicator has turned off.

83Dual E1

2.6.2 Alarm Generation

Figure 64 depicts the ALARM GENERATION screen.

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Figure 64 Alarm Generation Screen

In this screen you can view a listing of the alarms you may trans-mit. These alarms allow you to test the response of various net-work equipment to alarms, and thus ensure that the network isperforming as expected.

To Invoke an Alarm:Select the desired alarm and press ENABLE (F1).

• Some alarms conflict with the transmission of other alarms orselected framing.

• The test set will transmit the enabled alarm after exitingALARM GENERATION.

• You can continue to transmit alarms while making measure-ments, viewing data, performing talk/listen, etc.

• If you do not intend to transmit alarms when you exit thisscreen, be sure to DISABLE (F2) all alarms.

Notes on the Alarms:FAS DISTANT• The test set transmits a 1 in every third bit of each timeslot 0

frame that does not contain frame alignment signal.• FAS DISTANT alarm may be transmitted only with PCM 30 or

PCM 31 framing.

84 SSMTT-27

MFAS DISTANT• The test set transmits a 1 in the sixth bit of each time slot 16

in the zero frame.• The MFAS distant alarm may be transmitted only with PCM

framing.

AIS• The test set transmits all ones in an unframed signal.• This alarm overrides the framing set in TEST CONFIGURA-

TION. For instance, even though you have selected MFASframing, generating an AIS alarm will cause the test set totransmit an unframed signal (all ones).

T/S-16 AIS• The test set transmits all ones in timeslot 16 of all frames.• T/S-16 AIS overwrites the MFAS, Multi Frame Alignment Signal.• A test set or network equipment that receives this alarm will

lose PCM-30 framing.• This alarm should be transmitted only when the test set is

configured for FAS framing.• Voice frequency signalling bits can’t be transmitted while

sending this alarm, because the T/S-16 AIS signal overwritesall the channel associated signalling (CAS) information.

2.6.3 View Results Records

Refer to Section 2.5.8.

85Dual E1

2.6.4 Send Frame Words

In the Send Frame Words Screen you:

• Manually specify the E and Sa bit states, and the MFAS ABCD.• Transmit the desired FAS and MFAS framing information.

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Figure 65 Send Frame Words Screen

• You can only select items that can be changed.• Use the left/right arrow keys to move the cursor to the desired

location. Reenter the left-hand side of the screen by pressingthe left arrow key.

• DEFAULT (F3) sets the bits to the default settings.• AUTO (F4) is only displayed for E-bit selections.• The bits will be sent as soon as a F-key is pressed.

The following information is shown on this screen:

CRCView the CRC option chosen in TEST CONFIGURATION. Thisline is for viewing only.

• Change the CRC option in the TEST CONFIGURATION screen.

E-BITOptions: SET=0 (F1), SET=1 (F2), DEFAULT (F3), AUTO (F4)

• E-bit may be changed only if CRC is activated in TESTCONFIGURATION, and consequently, YES is displayed in theCRC slot in this screen.

• If E-bit is set to AUTO, the E-bits will be transmitted on the Tx/INSERT side anytime a CRC error is received on the Tx/INSERT side Rx (Figure 66).

86 SSMTT-27

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Figure 66 Automatic E-Bit Transmission

To Manually Transmit the E-bits:Use SET=0 (F1) and SET=1 (F2) to enter the two bits.

• 11 is used for no E-bit errors, this is the default setting.• 10 or 01 for 500 E-bit errors per second.• 00 for 1000 E-bit errors per second.

FAS WORDThis displays the FAS (Frame Alignment Signal-0011011) Words.This line is for viewing only.

MFAS WORDSet bits 5-8 to any combination.

• Bits 5-8 have the pattern xyxx, where x represents spare bits;they should be set to 1 when not used.

• Y is used for the MFAS remote alarm; it should be set to 1 ifMFAS synchronization is lost.

MFAS ABCDThese are the default ABCD bits used for channels 1-30 in PCM-30 Framing.

• ABCD bits are transmitted in timeslot 16 of frames 2-16 of theMFAS.

• Avoid using 0000 which will cause false framing for PCM-30.

NFAS WORDSThese are the Non Frame Alignment Signal words.

Press ENTER to send your selections.

87Dual E1

2.7 System ParametersThis menu contains the following:

• MEAS CONFIGURATION• SELF TEST

2.7.1 Measurement Configuration

There are two Measurement Configuration screens that you mayadjust. Refer to Figures 67 and 68.

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Figure 67 Measurement Configuration Screen 1

MEAS DURATIONOptions: TIMED (F1), CONTINU (F2)

Set the Measurement Duration.

• A timed measurement will stop when the specified amount oftime has elapsed. This is useful for making measurements ofa specified length. When a timed test is in progress, theRemaining Time (RT) counter shows how much time is leftbefore the end of the test.

• If you select TIMED, press SHIFT to display the ‘SHFT’indicator. Then enter a number between 1 min to 999 hr usingthe keypad.

• A continuous test will run indefinitely until you press RE-START, or until you change some other setting on the test setthat restarts the test.

88 SSMTT-27

STARTOptions: PROGRAM (F1), MANUAL (F2)

Select the method to begin your test measurements.

• PROGRAM: This allows you to program a specified time in thefuture to begin taking measurements. Once you have selectedPROGRAM, enter the desired time in the next two items.

• MANUAL: In this mode you must manually begin the testmeasurements at the desired time.

PROG DATE YMDApplies if you have selected PROGRAM for START above.

• Enter the Year, Month, and Day to begin measurements, usingthe SHIFT and keypad numeric keys.

PROG TIME HMSApplies if you have selected PROGRAM for START

• Specify the Hour, Minute, and Seconds to begin measure-ments, using the SHIFT and keypad numeric keys.

CODE CONFIGUROptions: HDB3 (F1), AMI (F2)

Select the line coding. HDB3 line coding is used almost every-where throughout the world in 2.048M transmission. An explana-tion of the related technology is located in Section 4.

MEASURE MODEOptions: BER (F1), LIVE (F2), AUTO (F3)

• BER: Use to search for the test pattern, and make bit errormeasurements with all other measurements.

• LIVE: Use to ignore the test pattern and make all measure-ments, except for bit error measurement.

• AUTO: The test set will try to detect the data pattern as in BERmode, then if the data pattern cannot be detected, the test setwill turn to LIVE mode.

Notes:• Most technicians leave the test set in BER mode, even when

they are monitoring live, in-service circuits. In this case, theyexpect the PAT SYNC light to remain RED, because there isno pattern synchronization. The bit error measurements willalso show 100% UAS.

• If LIVE is selected, the PAT SYNC LED is turned OFF and thebit error measurement screen is not displayed in MEASURE-MENT RESULTS.

89Dual E1

BLOCK SIZEOptions: 1000 (F1), 2e15-1 (F2), 2e11-1 (F3), 2e9-1 (MORE, F1),2e6-1 (MORE, F2)

Determines the block size used in the Block Error Ratio measure-ment. One block is typically 1000 bits long.

• BLER (Block Error Ratio) is the fraction of blocks in error (thenumber of blocks received with one or more bit errors dividedby the total number of blocks transmitted).

PRINT RESULTOptions: TIMED (F1), LAST (F2)

• TIMED: Use to have the test results printed every minute to 999hours and 59 minutes. Press SHIFT, then enter the number ofminutes (between 1 minute and 999 hours) using the keypad.

• LAST: The test results are printed only at the end of a timedtest, or a continuous test that has ended due to a RESTART.

PRINT EVENTOptions: ENABLE (F1), DISABLE (F2)

• ENABLE: Use to print out a time and date-stamped errormessage every second that one or more errors occur.

• DISABLE: Use if you do not want to print out a result each time.

Select the second screen by pushing the keypad down arrow key(‘more’ with up/down arrows indicate additional screens). Thisscreen relates to ITU standards for 2.048 Mbit/s transmission,G.821, G.826, and M.2100.

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Figure 68 Measurement Configuration Screen 2

90 SSMTT-27

The next four items relate to ITU standards on measurementsand performance characteristics for 2.048 Mbit/s.

G.821Options: ON (F1), OFF (F2)

When the G.821 Measurement is ON, the LINE 1 BIT ERRORscreen is shown in Measurement Results. This Bit Error screenpresents the measurement parameters specified in ITU G.821.

DGRMOptions: ON (F1), OFF (F2)

When the Degraded Minutes measurement is ON, DGRM is shownin MEASUREMENT RESULTS, G.821.

G.826Options: ON (F1), OFF (F2)

When the G.826 Measurement is ON, the G.826 screen is dis-played in MEASUREMENT RESULTS. This G.826 screen pre-sents the measurement parameters defined in G.826.

M.2100Options: ON (F1), OFF (F2)

When the M.2100 is ON, the M.2100 screen is shown in MEA-SUREMENT RESULTS. This section refers to ITU specificationsused when a 2.048 Mbit/s circuit passes through internationalboundaries. It allocates a certain allowable error rate to each na-tion that carries the circuit. The technician needs to enter theappropriate percentage allowed for the line. The test set makesthe M.2100/550 calculations and reports pass/fail in MEASURE-MENT RESULTS, M.2100/550.

The next two settings refer to the M.2100/550 measurements:

MEAS PERIODOptions: 01-99 min.

This setting controls how often a new result is displayed in MEA-SUREMENT RESULTS, LINE 1(2)–M.2100/550.

• Use the SHIFT key and the numeric keys to set the period.

HRP MODEL %Options: .1 to 99.9 %

Refer to M.2100, or to the older M.550, for information on how toselect the Hypothetical Reference Performance model percent(HRP %).

91Dual E1

IDLE CHNL CODEOptions: Any 8-bit pattern

Program the idle code to be any 8-bit pattern.

• This code is used during VF channel access operations, whenthe TxSource is set to the TESTPAT mode.

• The idle code is also used in fractional E1 testing to fill up theunused channels.

IDLE CHNL A/B/C/DOptions: Any 4-bit pattern

Program the idle channel signalling bits of channels 1-30 in theMFAS framing mode.

• These signalling bits are found in time slot 16 of frames 1-15.• The default, 1101, is set in accordance with ITU G.704.

2.7.2 Self Test

This feature is unavailable at this time.

92 SSMTT-27

3 Applications

3.1 Connecting the CordsCaution!

Plugging into a live E1 circuit may cause a loss of service for mul-tiple customers. Be sure you are properly trained before proceeding.

For BRIDGE access, do not plug into the circuit until you have pre-selected the L1/2-Rx Port: BRIDGE level. The test set will not placeisolation resistors on the line unless this Rx Port is specified.

The next three figures show various ways in which to connect thetest set to the circuit.

Figure 69 Term Mode Connection

Figure 70 Monitor Mode Connection

93Dual E1

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Figure 71 Thru Mode Connection

94 SSMTT-27

3.2 Basic Applications3.2.1 Accept a New Circuit

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Figure 72 Accept a New Span

1. Verify that the span is not in service. This acceptance test willdisrupt service. There must be a loopback device at the far end.

2. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048ML1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

3. From the E1 MODULE MAIN MENU, select TEST PATTERN.4. Select the desired test pattern and press ENTER.5. Connect the test set to the circuit as shown in Figure 72.6. Press HISTORY to acknowledge any history LEDs . Verify that

the PAT SYNC LED is green.7. From the E1 MODULE MAIN MENU, select MEASUREMENT

RESULTS and press START (F3).8. Verify that the circuit performs to your company’s requirements

for the service delivered. Use PAGE-UP (F1) and PAGE-DN(F2) to access each of the individual measurement screens.

9. When done, press ESC to return to the E1 MODULE MAINMENU. Remove the loop at the far end of the circuit.

95Dual E1

3.2.2 In-Service Circuit Monitoring

1. This test may be performed while the span is carrying livecustomer traffic.

2. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1DUALTx/INSERT: LINE 1 or 2, as neededRx/DROP: LINE 1 or 2, as neededTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx PORT: MONITOR or BRIDGEL2-Rx PORT: MONITOR or BRIDGETX CLOCK: INTERNLED SOURCE: LINE 1 or 2 as neededPress ENTER when configured.

Note: If you are not sure what RX Port level to use, then useBRIDGE. MONITOR should be used when you have a ProtectedMonitoring Point (PMP) access.

3. Connect the test set to the circuit as shown in Figure 73 or 74.4. Press HISTORY to acknowledge any history LEDs.

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Figure 73 In-Service Circuit Monitoring-Monitor Mode

96 SSMTT-27

Figure 74 In-Service Circuit Monitoring-Bridge Mode

5. Examine the LEDs for both lines for information about thecircuit under test:

• The SIGNAL LED should be green, red indicates no signal.• A valid framing type should be indicated.• A steady ERROR or CODE LED indicates that the circuit is

working but is experiencing trouble.• An ALARM indication will show a problem on the other side of

the circuit.• AIS may indicate a trouble condition where a network element

transmitting to the test set has lost its incoming signal and hasreplaced it with the AIS signal.

6. From the E1 MODULE MAIN MENU, select MEASUREMENTRESULT, and press START (F3).

7. Verify that the span performs to your company's requirementsfor the service delivered.

97Dual E1

3.2.3 Checking for Frequency Synchronization

Frequency synchronization can be a problem when:

• the customer purchases a channelized E1 circuit.• the customer’s circuit passes through a synchronous network

element such as an exchange, PBX, or a digital cross-connect.• the E1 circuit passes through more than one carrier.

Frequency synchronization problems result in bit slips, a majorsource of service impairment. Refer to Figure 69 for the setup anduse this procedure to identify frequency synchronization problems.

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Figure 75 Frequency Synchronization

1. This test may be performed while carrying live customer traffic.2. Obtain a 2.048 Mbit/s reference frequency source. On a 2.048

Mbit/s circuit, one side will usually be known to generate asynchronized signal. This side can be used as the reference.The other side can be measured for frequency synchronization.

3. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx PORT: MONITORTX CLOCK: L2-RxPress ENTER when configured.

98 SSMTT-27

4 Refer to Figure 75 and plug the reference E1 signal into the Line2 RX jack, this is usually the MONITOR jack of the knownsynchronized signal.

5. Plug the Line 1 RX jack into the MONITOR jack of the side tobe tested.

6 Press HISTORY to acknowledge any history LEDs.7. From the E1 MODULE MAIN MENU , select MEASUREMENT

RESULTS and press START (F3).8. Press PAGE-DN (F2) until the FREQUENCY screen is dis-

played.• Observe if the frequency value varies from the 2.048 MHz

reference frequency. You will see >>> or <<< indicating the rateof frequency slippage.

• Note the (+/-) WNDR values in the LINE 1 FREQUENCYscreen. This will provide an indication of any low-frequencyvariation in the E1 signal's frequency.

99Dual E1

3.2.4 Measuring Signal Level

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Figure 76 Measuring Signal Level

A signal level measurement can be performed by itself or in con-junction with one of the other tests.

1. Select the E1-RX1 Port level you want to use.• You can make the measurement in TERM, MONITOR, or

BRIDGE modes.• A 1111 pattern in L1-Rx Port TERM and BRIDGE provides the

most accurate results.• MONITOR may be the most convenient mode. MONITOR

measurement should generally show a result of about -20 dB or-30 dB.

• TERM will disrupt service.• A BRIDGE measurement result may be degraded by a low-

quality termination at the network element terminating the E1line.

100 SSMTT-27

2. The rest of this procedure will use the TERM mode forillustrative purposes. Verify that the span is not in service.

3. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048ML1-Rx PORT: TERMTX CLOCK : INTERNPress ENTER when configured.

4. Plug the test set into the circuit as shown in Figure 76.5. Press HISTORY to acknowledge any blinking LEDs.6. From the E1 MODULE MAIN MENU, select MEASUREMENT

RESULTS and press START (F3).7 Press PAGE-DN (F2) until the LINE 1-ALM/SIG screen is

displayed8. Read the signal level. Note that separate readings are given for

the positive and negative signals so that you can get moreaccurate information on a faulty regenerator.

101Dual E1

3.2.5 V.54 Channel Loopback Test

1. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1SINGL/ E1DUALTx/INSERT and Tx/DROP: L1/L2 (as required)Tx SOURCE: TESTPATTEST RATE: Nx64/2.048M (as required)LED SORUCE: (if E1DUAL is used) LINE 1 or 2 as neededPress ENTER when configured.

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Figure 77 V.54 Application

2. From the E1 MODULE MAIN MENU, select OTHER MEA-SUREMENT > CHANNEL LOOPBACK and select MODE:LOOP UP.

• If the loop up is successful, you will see ‘LOOP UP OK!’message, if not, you will see ‘LOOP UP ERROR’.

3. From the E1MODULE MAIN MENU, select MEASUREMENTRESULT and run a BERT.

4. Stop the test.5. From the E1 MODULE MAIN MENU, select OTHER MEA-

SUREMENT > CHANNEL LOOPBACK and select MODE:LOOP DOWN.

• A ‘LOOP DOWN OK’ message is displayed when the loop downhas completed.

102 SSMTT-27

3.2.6 Running a Timed Test

Many network tests require the use of an exact time period suchas 15 minutes, 1 hour, or 24 hours over which to conduct a test. Inthis section you will configure the timer for one of these tests.Use the following procedures.

3.2.6.1 Manual Start

1. Use a desired application for your test.2. Select from the E1 MODULE MAIN MENU, select SYSTEM

PARAMETERS > MEAS CONFIGURATION.3. At the MEAS DURATION line press TIMED (F1).4. Press SHIFT to display the ‘SHFT’ indicator.5. Enter in the number of hours and minutes that you want the test

to run by using the keypad, press SHIFT when done.6. Select the START line and press MANUAL (F2).7. Press ESC until the E1 MODULE MAIN MENU is displayed.8. Proceed with the desired application for your test.• The test will now be timed when MEASUREMENT RESULT is

performed.• Observe the remaining time by viewing the RT (Remaining

Time) indicator in the upper right-hand portion of the screen.

3.2.6.2 Auto Start

To program the test set to begin measuring at a future date andtime, use the following procedure:

1. In MEAS CONFIGURATION, at the MEAS DURATION line,press TIMED (F1).

2. Press SHIFT to display the ‘SHFT’ indicator.3. Enter in the number of hours and minutes that you want the test

to run by using the keypad, press SHIFT when done.4. Select the START line and press PROGRAM (F1).5. Select the PROG DATE YMD line. Use the SHIFT and number

keys to enter the Year, Month, and Day you wish the timed testto begin, press SHIFT when done.

6. Select the PROG TIME HMS line. Use the SHIFT and numberkeys to enter the Hour, Minute, and Second you wish the test tobegin, press SHIFT when done.

7. Connect the test set to the circuit and configure as needed.8. Leave the test set in module mode and the it will begin

measuring at your programmed date and time.

103Dual E1

3.2.7 Observing Network Codes or Channel Data

Observe live data:

• Binary• Hexadecimal• ASCII translations• Decode E1 network control codes that are in use• Verify the content of individual channels

Refer to Figure 78.

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Figure 78 View Received Data

Use this procedure:

1. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure the interface (L1-Rx, L2-Rx Port-de-pending on the TEST MODE configuration) using the followingguidelines:• If in-service use BRIDGE or MONITOR• If out-of-service use TERM

Specify the other TEST CONFIGURATION settings as re-quired. The test set must detect valid framing on the receivedsignal.

2. Connect the test set to the circuit as shown in Figure 73 or 74.3. Press HISTORY to acknowledge any blinking LEDs.4. Press ESC to display the E1 MODULE MAIN MENU and select

OTHER MEASUREMENT >VIEW RECEIVED DATA.• You will now receive a live display of the E1 data.• Scroll down through 64 pages of information• Observe the changes which have occurred over time

104 SSMTT-27

6. Review the live data as it is displayed.A. When the codes that you are interested in appear, press

PAUSE (F3) to trap 64 pages of data.B. Press PAGE-DN (F2) to scroll through the data.• The data is presented as it appears in the E1 bit stream and

is broken out into timeslots.• View control information in time slot 00 for FAS framing.• View control information in time slots 00 and 16 for MFAS

framing.• All other channels (time slots) should contain actual voice/

data signals (or your the received test pattern).

105Dual E1

3.2.8 Monitoring a Voice Frequency Channel

This is a procedure for monitoring a voice frequency channel withinan E1 circuit.

1. This test may be performed while the span is carrying livetraffic.

2. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1SINGL or E1DUALTx SOURCE: TESTPATFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048ML1-Rx Port: MONITOR or BRIDGETX CLOCK: INTERNPress ENTER when configured.

4. Plug the test set into the circuit as shown in Figure 73 or 74.5. Press HISTORY to acknowledge any blinking LEDs.6. Verify that the FRAMING LED is green.7. Press ESC until the E1 MODULE MAIN MENU is reached and

select VF CHANNEL ACCESS > VF & NOISE MEASURE-MENTS.

8. Enter the desired transmit and receive timeslots.• The channel number will bypass any time slots containing the

E1 framing information.• In FAS framing, no access is granted to time slot 00• In MFAS framing, access to time slots 00 and 16 is denied.

10.Use either TALK or TONE for TxMODE and L1 for the IN/DROPitems (if you are in E1DUAL mode).

11.Adjust the volume to the desired level by pressing VOLUME,then use UP (F1) or DOWN (F2).

Note: If you are not able to monitor the channel:• Verify that the AUTO framing of the test set was able to synch

on a recognized framing pattern• Press the AUTO key to restart the auto framer if a valid frame

pattern is not shown.• If this doesn't work, try unplugging and re-plugging the receive

cord. This will positively verify that there is no recognizableframing at this moment.

106 SSMTT-27

3.2.9 Simple Talk/Listen

This is the simplest procedure for talking and listening on an E1circuit. The setup is illustrated in Figure 72. However, instead ofhaving a loopback at the far end of the circuit, your setup mayhave another test set, a channel bank, a switch, or other E1 ter-minating network element. Use this procedure:

1. Verify that the span is not in service. This test will disruptservice for all of the channels you are not using. If a hitless dropinsert is required, read Section 3.3.1.

2. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE : E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

Note: It is not possible to perform talk and listen on an unframedsignal.

3. Connect the test set to the circuit as shown in Figure 72.4. Press LED to acknowledge any blinking history LEDs. The

FRAMING LED must be green for this procedure to work.5. Press ESC to reach the E1 MODULE MAIN MENU and select

VF CHANNEL ACCESS > VF & NOISE MEASUREMENTS.6. Select the receive (listen) and transmit (talk) channels (they are

usually the same channel number).7. Select TALK for the TxMODE. You can now talk and listen on

the channel which you have selected. Adjust the volume to thedesired level by using the volume key.

107Dual E1

3.2.10 Send a Tone

1. This is an intrusive test. Be sure the E1 line is not carryingtraffic or that it will be able to withstand any hits that thisprocedure will introduce. If a hitless drop insert is required, readSection 3.3.1.

2. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1SINGL or E1DUALTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: 2.048ML1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

4. Connect the test set to the circuit as in Figure 69.5. Press HISTORY to acknowledge any blinking LEDs.6. Press ESC until you reach the E1 MODULE MAIN MENU and

select VF CHANNEL ACCESS > VF & NOISE MEASURE-MENTS.

7. Use NEXT (F1) or PREVIUS (F2) to set up the receive andtransmit channels (timeslots). Select the rest of the menuitems as follows:Tx A/B/C/D: as requiredTxMODE: TONETONE FREQ : enter the desired frequencyTx LVL (dBm): enter the desired tone levelLISTEN SIDE: L1+L2 (if in E1Dual Mode)

• You are now transmitting a tone on the selected channel.• View the received Frequency and noise measurements.

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3.2.11 Nx64 kbit/s Testing

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Figure 79 Fractional E1 Testing

Fractional E1 circuits are circuits of data rate Nx64 kbit/s, where Ncan be anywhere from 1 to 31 channels. N channels of the E1 lineare dedicated to the fractional E1 circuit, and the remaining chan-nels of the E1 line are either filled with an idle code, other revenuetraffic or framing information. Use the following procedure:

1. Verify that the fractional circuit is not in service. This test willdisrupt service. If a hitless drop insert is required, read Section3.3.1.

2. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1SINGLTx SOURCE: TESTPATFRAMING: as specified by the span designCRC-4: as specified by the span designTEST RATE: Nx64K, the fractional SELECT TIME SLOTscreen is displayed. Manually configure the timeslots or useAUTO configure. If needed see Section 2.1.1 for the procedure.L1-Rx Port: TERMTX CLOCK: INTERNPress ENTER when configured.

Note: AUTO configuration may not yield the proper channels if:• Any of the active channels are transmitting an idle code• The idle code (set up in the SYSTEM PARAMETERS > MEAS

CONFIGURATION page 2 > IDLE CHNL CODE) item is not thesame as the idle code of the circuit being tested.

109Dual E1

3. Connect the test set to the circuit as shown in Figure 79.4. Ensure that a loop is in place at the far end of the circuit.5. Press HISTORY to acknowledge any blinking LEDs.6. Select MEASUREMENT RESULTS and press START (F3) to

perform the acceptance test.7. Verify the fractional service performs to your company’s

requirements for the service delivered.

To Observe the Idle and Active Channels:1. In TEST CONFIGURATION, use the settings given in step 2 of

Nx64 kbit/s Testing, except set TEST RATE to 2.048 Mbit/s.1. Plug-in the test set as shown in Figure 79.2. From the E1 MODULE MAIN MENU, select OTHER MEA-

SUREMENTS > VIEW RECEIVED DATA, this will allow doublechecking the information being transmitted on a channel-by-channel basis.

110 SSMTT-27

3.3 Advanced Applications3.3.1 In-Service Dual Drop & Insert THRU Testing

To conduct a dual drop and insert THRU mode test on a line thatis in service, make sure all connections are made in accordancewith the numbering procedure in Figure 80 to ensure the leastamount of interruption on the live circuits.

Caution!Only experienced technicians should do this procedure. Any mis-takes will disrupt service.

Use the following procedure. If performed properly, this test shoulddisrupt the service for a duration of few hundred milliseconds.

1. From the E1 MODULE MAIN MENU, select TEST CONFIGU-RATION and configure as follows:TEST MODE: E1DUALTx/INSERT: L1-TxRx/DROP: L2-RxTx SOURCE: THRUFRAMING: as specified by the circuit designCRC-4: as specified by the circuit designTEST RATE: 2.048M or Nx64KL1-Rx Port: MONITOR, BRIDGEL2-Rx Port: MONITOR, BRIDGETX CLOCK: L1-Rx

2. Connect the test set to the circuit as shown in one of the nexttwo figures. Figure 80 provides a BNC diagram, while Figure 81shows Bantam diagram.

• This mode allows an in-service 2.048 Mbit/s circuit to passthrough the test set.

A. Plug in cords 1-6. Be sure to plug in the cords in the ordershown.

B. Verify that the test set’s LEDs show proper framing, coding,and no errors for both Line 1 and 2. Note you will need tochange LED SOURCE in TEST CONFIGURATION tocheck both lines.

C. Plug in cords 7 and 8. Be sure to plug in the cords in the ordershown.

111Dual E1

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Figure 80 Dual Drop & Insert THRU Mode Test (BNC)

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Figure 81 In Service Dual Drop & Insert THRU (Bantam)

112 SSMTT-27

Note: The circuit will be disrupted for two or more seconds whilethe cords are moved.

3. Depending on the test application you may wish to do thefollowing:

• For Talk and Listen:A. Press ESC to return to the E1 MODULE MAIN MENU and

select VF CHANNEL ACCESS >VF & NOISE MEASURE-MENTS.

B. Select the receive (listen) and transmit (talk) channels (theyare usually the same channel number).

C. Select TALK for the TxMODE and L1 (or L1+L2) for theSPEAKER. You can now talk and listen on the channel youhave selected.

• To Send and Receive a Tone:A. Press ESC to return to the E1 MODULE MAIN MENU and

select VF CHANNEL ACCESS >VF & NOISE MEASURE-MENTS.

B. Use NEXT (F1) or PREVIUS (F2) to set up the receive andtransmit channels.

C. Select the rest of the menu items as follows:TxMODE: TONETx FREQ: enter desired tone frequencyTxLVL (dbm): enter desired tone levelTx ABCD: pick or enter desired supervision bitsSPEAKER: L1+L2• You are now transmitting a tone on the selected channel.• You can also view the received Level, Frequency, and

noise measurements.

• To Test Nx64 kbit/s, Fractional E1:A. From the E1 MODULE MAIN MENU, select TEST CON-

FIGURATION and confirm that TEST RATE is set forNx64K.

B. Press ESC to get to the E1 MODULE MAIN MENU andselect MEASUREMENT RESULTS and press START (F4)to perform your acceptance test.

C. Verify that the fractional E1 service performs to yourcompany’s requirements for the service delivered.

113Dual E1

4 Reference-E1 Technology OverviewThis E1 Technology Overview covers the fundamental conceptsin 2.048 Mbit/s technology: sampling a signal, converting thisinformation into a bitstream, and dividing the bitstream into seg-ments (channels). This section also touches upon the basics ofsignalling technologies like MFR2 and CAS.

4.1 Technical StandardsE1 transmission technology is defined by a number of technologystandards. Such standards allow equipment designers and ser-vice providers to ensure that various pieces of equipment arecompatible and that networks operate in a predictable, reliablemanner.

The following standards cover many of the important aspects ofE1 transmission technology:

• ITU G.703: Physical/electrical characteristics of interfaces• ITU G.704: Synchronous frame structures• ITU G.706: Frame alignment and CRC• ITU G.821: Error performance of an international connection• ITU G.826: Error performance parameters for international

constant bit rate service at or above the primary rate.• ITU M.550/M.2100 Bringing an international connection into

service.• Q.140: Definition and function of signals in SS5.• Q.400: Definition and function of signals in R2.

Consult these standards when you need detailed information onparticular aspects of E1 transmission technology.

4.2 Basic DefinitionsBinary Data: A signal which has been converted into a format of0s and 1s.

Bit Stream: Binary Data which has been placed in a sequence ata fixed rate.

Channel: A single portion of the bit stream which is available forbidirectional communication.

114 SSMTT-27

4.3 Converting a Voice SignalTo transmit voice in a digital medium, such as a 2.048 Mbit/s line,we first need to encode the analog voice signal in a binary format.Then it must be converted to a bit stream suitable for digital trans-mission. This conversion can be achieved through Pulse CodeModulation. Refer to Figure 82.

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Figure 82 Converting a Voice Signal

The Nyquist theorem requires that the signal be sampled at twice thesignal's maximum frequency in order for the signal to be reproducedwithout a loss of information. For voice signals, the maximum fre-quency is approximately 4000 Hz. This provides adequate clarity whileconserving transmission bandwidth. Thus, we must sample our 4000Hz voice signal at a frequency of 8000 Hz (8000 samples/second).

The amplitude of the analog voice signal is sampled 8000 timesper second. Each amplitude value is expressed as an 8-bit code‘word’. These 8-bit words occurring 8000 times per second form a64 kbit/s digital bit stream.

The 8-bit code word is formed by comparing the amplitude of theanalog sample to a ‘companding characteristic’. The compandingcharacteristic is a formula which translates the amplitudes of thesamples into the 8-bit code words. Internationally, a compandingcharacteristic known as ‘A-law’ is used. The purpose of A-law is toprovide optimum signal to noise performance over a wide rangerof transmission levels. Linear encoding provides a poorer signalto noise ratio at the -20 dB level typical of speech. In NorthAmerica, the encoding is done according to the µ-Law. Therefore,the companding law used for encoding the voice signal must matchthat for decoding, for distortion-free transmission.

115Dual E1

4.4 2.048 Mbit/s Data RateThe E1 signal (bitstream) is transmitted at a rate of 2.048 Mbit/s(2 048 000 bits per second). This transmission rate is achieved bycombining 32 individual 64 kbit/s bitstreams:

64 (kbit/s /Channel) x 32 (Channels) = 2048 kbit/s = 2.048 Mbit/s

This 2.048 Mbit/s signal is the overall E1 transmission rate.

4.5 Line CodingTwo common types of line coding are defined for use in a E1network: AMI or HDB3.

Note: This voltage is over a 75 unbalanced connection

AMI LineCoding

2.37V

0V

-2.37V

time

HDB3 LineCoding

2.37V

0V

-2.37V

time

1 1 10 0 0 0 0 0

Figure 83 AMI & HDB3 Line Codings

AMI: This is the simplest of the two line coding formats. AMIstands for Alternate Mark Inversion, and is used to represent suc-cessive 1 values in a bitstream with alternating positive and nega-tive pulses. Figure 83 depicts these alternating pulses. AMI is notused in most 2.048 Mbit/s transmission because synchronizationloss occurs during long strings of data zeros.

HDB3 :The HDB3 line coding format was adopted in order to elimi-nate these synchronization problems occurring with AMI. In theHDB3 format, a string of four consecutive zeros is replaced with asubstitute string of pulses containing an intentional bipolar viola-

116 SSMTT-27

tion. As the far end equipment receives the E1 signal, it examinesthe bit stream for these intentional bipolar code violations. It thenextracts the code and reconstruct the original data. The HDB3 codesubstitutions provide high pulse density so that the receiving equip-ment is always able to maintain synchronization with the receivedsignal. For example, in the code 1000 0000, HDB3 coding substi-tutes bipolar violations for the string of zeros.

General rules apply to the substitutions. The particular substitu-tion made is governed by the polarity of the last inserted bit, aswell as the number of pulses following the previous violation bit. Ifthere is an odd number of pulses, 000V is substituted; the polarityof V is the same as that of the bit immediately preceding it. Ifthere is an even number of pulses, B00V is inserted; the polarityof B is opposite to that of the bit immediately preceding it and thepolarity of V is the same as that of B. Refer to Figure 84 to see thetypes of HDB3 zero substitution codes.

Numberof pulses(since last

substitution)

Even(substitute

B00V)

Odd(substitute

000V)

Polarity of Previous Pulse

1 0 0 1 1 0 0 1

0 0 0 1 0 0 0 1

Figure 84 HDB3 Encoding

The E1 module is can be configured to detect the one of the twotypes of HDB3 substitution codes, even if they are not matchedto the proper number of pulses since the last substitution.

117Dual E1

4.6 Signal LevelsOnce a signal has been encoded into a binary format and as-sembled into a bit stream, the pulses in the bit stream are thenconverted to actual voltage levels suitable for E1 transmission.

Referring to Figure 83, you can see that a typical signal level foran E1 pulse with 75Ω impedance is either +/- 2.37 volts (for abinary ‘1’ value) or 0 volts (for a binary ‘0’ value). Real-world signalvalues would typically be +/- 10%.

Ideally, each pulse transmitted would be perfectly symmetrical.However, in a real-world situation, each pulse becomes slightlydistorted when it is generated and when it travels down the E1line. Refer to Figure 85 for the shape of an ‘ideal’ pulse vs. anactual pulse that would be encountered on an E1 line.

An E1 pulse may be required to conform to a standardized pulseshape. This is often determined by comparing it to a specified‘mask’. A common pulse mask is given by the ITU-T G.703 rec-ommendation.

Note: For an E1 pulse with 120Ω impedance, the signal level iseither +/- 3 volts (for a binary ‘1’ value) or 0 volts (for a binary ‘0’value) with real world values typically be +/- 10%.

G.703 Mask

Actual PulseIdeal Pulse

Figure 85 Pulse Shape

118 SSMTT-27

4.7 2.048 Mbit/s FramingE1 transmission utilizes two main types of framing: Frame Align-ment Signal (FAS) and MultiFrame Alignment Signal (MFAS). Fram-ing is necessary so that the equipment receiving the E1 signal isable to identify and extract the individual channels. PCM-31 usesFAS framing and PCM-30 uses MFAS framing with FAS framing.

Frame Alignment Signal (FAS)The 2.048 Mbit/s frame consists of 32 individual time slots (num-bered 0-31). As described previously, each time slot consists ofan individual 64 kbit/s channel of data. PCM-31 uses FAS.

In the FAS format, time slot 0 of every other frame is reserved for theframe alignment signal (FAS) pattern. Alternate frames contain theFAS Distant Alarm indication bit and other bits reserved for Nationaland International use. Hence, there are 31 time slots into which wecan place data (Figure 86).

Even Frame: Contains Frame Alignment Signal (FAS)

BITS

Time Slot 0 31...1

One 2.048 Mbit/s Frame

1 2 3 4 5 6 7 8

E 0 0 1 1 0 1 1

E 1 A Sa Sa Sa Sa Sa

Notes

Sa: This bit is reserved for national use

E: This is the error indication bit

Odd Frame: No Frame Alignment Signal (NFAS)

A: This is remote alarm indication bit (FAS)

0011011: Frame Alignment Signal

8 bits per timeslot x 8000 frames per second = 2.048 Mbps

Figure 86 FAS Framing Format

119Dual E1

The FAS format does not accommodate voice channel signalling.

The first bit (c or Si) of these frames is reserved for international use.It can be used for the CRC-4, Cyclic Redundancy Check-4, whenenhanced performance monitoring is required. Therefore, when CRCis enabled in the TEST CONFIGURATION screen, these bits de-pend upon the CRC calculation and should continually change be-tween 0 and 1. When CRC-4 is not enabled, these bits are set to 1.

In FAS framing, the odd frames do not contain the frame align-ment signal. The bits are defined as follows:

• When CRC is enabled, bit 1 is used for the Cyclic RedundancyCheck-4 performance monitoring. When CRC is enabled, thisbit may not be changed here. It may be changed when CRC isdisabled.

• The second bit is always set to 1 to avoid FAS signalsimulations.

• Bit A is used for the Remote (FAS) Distant Alarm. Set this bitto 1 to indicate an alarm condition. For undisturbed operation,this bit is set to 0.

• (bits 4-8): Spare bits; they should be set to 1 for crossing aninternational border, when not in use, as defined by ITU-T G.704.

The first bits of frames 13 and 15 transmit the two E-bits, whichare CRC-4 error indication bits. A zero in this bit denotes receivederrored sub-multiframes; a one represents received frames freeof errors.

120 SSMTT-27

MultiFrame Alignment Signal (MFAS)MFAS framing provides Channel-Associated Signalling (CAS) totransmit A/B/C/D bit supervision information for each channel.This method uses the 32 timeslot frame format including timeslot0 for the FAS. This method also uses timeslot 16 for the MultiFrameAlignment signal and the Channel Associated Signalling. It takes16 frames to make up a MultiFrame.

When the MFAS frame is transmitted, all of the individual FASframes and framing information intact is left intact. The 16 FASframes are assembled together, dedicating timeslot 16 of the firstframe to MFAS framing information, then dedicating timeslot 16of the remaining 15 frames to A/B/C/D bits (Figure 87).

BITS

1 2 3 4 5 6 7 8

B C A B C DA D

Ch 1 (TS-1) Ch 16 (TS-17)

BITS

1 2 3 4 5 6 7 8

B C A B C DA D

Ch 15 (TS-15) Ch 30 (TS-31)

TS 31TS 0 -------- TS 16 --------TS 31TS 0 -------- TS 16 --------TS 31TS 0 -------- TS 16 --------

FRM 15FRM 0 FRM 3FRM 1 FRM 2 ---------

BITS

1 2 3 4 5 6 7 8

0 0 X Y X X0 0

Notes

NMFAS=XYXXX=spare bits (=1 if not used)Y=MFAS remote alarm (=1 if MFAS synchronization is lost)

MFAS multiframe consists of 16 frames

Frame 0, timeslot 16: 8-bit MFAS signal

Frames 1-15, timeslot 16:

(4 signalling bits/channel)(30 Chs)

(8 signalling bits/frame timeslot 16)= 15 frames of timeslot

16 signalling

Frame 0 TS 16 bits: MFAS=0000

Frames are transmitted with 30 voice channels intimeslots 1-15 and 17-31

Timeslot 16 (TS16) contains A/B/C/D bits for signalling(CAS)

Figure 87 MFAS Framing Format

121Dual E1

CRC-4 Error Checking in a MultiFrame Format

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Figure 88 CRC-4 Multiframe Format

Cyclic Redundancy Check-4 (CRC-4) is often used in E1 trans-mission to identify possible bit errors. CRC-4 allows the detectionof errors within the 2.048 Mbit/s signal while it is in service.

CRC-4 is based on a mathematical calculation performed on eachsubmultiframe of data. The equipment which originates the E1 datacalculates the CRC-4 bits for one submultiframe. Next it insertsthe CRC-4 bits in the CRC-4 positions in the next submultiframe.

122 SSMTT-27

The receiving equipment performs the reverse mathematical com-putation on the submultiframe. It examines the CRC-4 bits whichwere transmitted in the next submultiframe, then it compares thetransmitted CRC-4 bits to the calculated value. If there is a dis-crepancy in the two values, a CRC-4 error is reported.

There are two things to remember when using CRC-4 errors todetermine the performance of an E1 circuit. Each individual CRC-4 error does not necessarily correspond to a single bit error. Mul-tiple bit errors within the same submultiframe will lead to only oneCRC-4 error for the block. Also, it is possible that errors couldoccur such that the new CRC-4 bits are calculated to be the sameas the original CRC-4 bits.

CRC-4 error checking provides a convenient method of identifyingbit errors within an in-service system. On an in-service system, itis generally not possible to measure the actual bit errors becausethere is no pattern synch. Bit error measurement is used on an out-of-service system because the results are slightly more precise.

CRC-4 also uses a multiframe structure consisting of 16 frames,as shown in Figure 88. However, the CRC-4 multiframe is notnecessarily aligned with the MFAS multiframe. Each CRC-4 mul-tiframe can be divided into 2 sub multiframes (SMF). These arelabeled SMF#1 and SMF#2 and consist of 8 frames apiece. Fourbits of CRC information are associated with each submultiframe.

The CRC-4 bits are calculated for each submultiframe, buffered,and inserted into the following submultiframe to be transmittedacross the E1 span.

When the terminating equipment calculates an error using CRC-4, it should transmit an E-bit to the far end, thus informing the farend equipment of the error.

123Dual E1

E-bit Performance MonitoringWhen the terminal equipment of a 2.048 circuit is optioned forCRC-4 transmission, E-bit transmission may also be enabled. E-bit performance monitoring of the circuit is now possible. The ter-minating equipment transmits an E-bit error on the 2.048 Mbpsline, when it receives a CRC-4 error. However, E-bit error trans-mission is a relatively new feature in 2.048 transmission. There-fore, it is likely that the embedded equipment does not transmitthe E-bit error information correctly. You should check the specifi-cations of your network. Refer to Figure 89.

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Figure 89 In-service E-bit Performance Monitoring

When this type of terminal equipment detects an incoming CRC-4error, it will respond by transmitting an E-bit error toward the otherterminal. Test set 2, shown in Figure 89, will be able to see the E-biterrors by plugging into a protected monitoring point. Note that thetest set can not see the actual code errors, framing bit errors andCRC errors introduced at the trouble point. The test set can see onlythe E-bit errors transmitted by Terminal B. Thus, E-bit error trans-mission allows a 2.048 Mbps in-service circuit to be reliably moni-tored for transmission performance from any point on the circuit.

Without E-bit error transmission, only a complete circuit failurecan be reliably determined at any point on the circuit. With a com-plete circuit failure, the test set will see either loss of signal, alarmindication signal, or remote alarm indication.

124 SSMTT-27

4.8 MFR2/DTMF/DP TechnologyThere are a number of signalling methods used by public tele-phone networks. The methods are divided between the local loopand interoffice signalling. Referring to Figure 90, the signallingapplied for each environment is as follows:

LOCAL LOOP:• Pulse• DTMF (Dual Tone Multi-Frequency)• ISDN (Integrated Services Digital Network)

INTEROFFICE:• MFR2 (Multi-Frequency)• MFC (Multi-Frequency Compelled)• SS7 (Signalling System #7)

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Figure 90 Local Loop & Interoffice Signalling Method

Local LoopIn the local loop environment, a common signalling method isDTMF. It uses two tones, a high and a low, to represent a digit.The frequencies used are shown in Figure 91.

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Figure 91 DTMF Frequency Keypad

125Dual E1

For example, if 5 is pressed, two frequencies are generated; 1336Hz and 770 Hz. DTMF registers, converters, or receivers thenrecognize these tones as representing the digit 5 and translatethem into digital signals.

Pulse signalling is older than DTMF, and was originally used forrotary phone sets. When a number is dialled, a series of shortIDLE/SEIZURE signals are created with specific timing, usually10 pulses per second. If a number 3 is dialed, the wheel will send3 IDLE/SEIZURE signals with a specific inter-digit timing betweenthe digits. The switch will interpret the number of IDLE/SEIZUREsignals, and the inter-digit duration to determine the digit that hasbeen dialled.

B-bit dialing is used to toggle the B-bit when seizing the line. Inthe seizure state, the B supervision bit is toggled (ABCD ABCD).If the number 463 is dialled, the B bit will flash 4 times, then restfor approximately one second, toggle six times, rest again, andtoggle 3 times.

ISDN provides digital services to end users with regular phonelines.

Interoffice SignallingMFR2 is a common signalling method used in the interoffice envi-ronment. Similar to DTMF, MFR2 uses two tones for each digitbeing dialled. However, these tones are selected from a group ofonly six frequencies. A and B bit signalling is used to seize andacknowledge the line. These can be found in:

• ITU Q.441 Tables 5-9

MFC (Multi Frequency Compelled) dialling allows the two ex-changes to send digits to each other in both the forward and back-ward direction. This helps ensure accurate transmission of thedigits in a noisy environment.

126 SSMTT-27

127Dual E1

IndexAABCD bits, default; 86AIS; 84Alarm Generation; 83AlarmsAIS; 84FAS DISTANT; 83MFAS DISTANT; 84T/S-16 AIS; 84

ALM/SIG Screen; 33AMI; 88ApplicationsAccept a New Circuit; 94Checking for Frequency Synchronization; 97In Service Dual Drop & Insert THRU Testing; 110In-Service Circuit Monitoring; 95Measuring Signal Level; 99Monitoring a Voice Frequency Channel; 105Nx64 kbit/s Testing; 108Observing Network Codes or Channel Data; 103Running a Timed Test; 102Send a Tone; 107Simple Talk/Listen; 106V.54 Channel Loopback Test; 101

ASCII; 37Availability; 26

BBargraph; 32BINARY; 37BLOCK; 70Block Error Ratio, Block Size; 89BREAK percentage; 72

CC-Bit Definitions; 43CALIB; 48Call Analysis; 55Call Emulation; 60Receive a Call; 63Standard; 60User; 65

CAS; 53, 69Channel Data; 53Channel Loopback; 49Channel Loopback Setup; 49Clear Back; 70

128 SSMTT-27

Clear Forward; 70Clock Slips; 32CoderOffset; 53Peak; 53

Coding; 88Connecting the CordsMonitor Mode; 92Term Mode; 92Thru Mode; 93

Connector Panel; 8CONTINU; 26CRCDET; 11Send Frame Words; 85

CRC-4; 11, 16, 38, 121Current Histogram; 44, 45, 47

DDial Parameters; 71% BREAK; 72B-BIT; 72DIAL PERIOD; 71Dial pulse; 72INTERDIGIT PRD; 71SILENT PERIOD; 71TONE LEVEL dbm; 71

Digit Analysis; 58DTMF; 55Dialing; 62

EE-BitPerformance Monitoring; 123Send Frame Words; 85

E1CRC-4; 11Fractional; 112Pulse Quality; 40

Edit EmulatorReceive Side; 67Send Side; 67

Error Injectionconfiguration; 81Programming Burst of 10 Errors; 82

ET; 27External Timing; 18

129Dual E1

FFASDISTANT; 83Words, View; 37

Figures01 SSMTT LEDs; 502 SSxDSL LEDs; 503 Dual E1 Connector Panels; 804 Menu Tree; 905 E1 Single Test Configuration; 1006 Fractional E1; 1207 DDS Shift; 1408 E1 Dual Test Configuration; 1509 Slave to Slave Timing; 1710 Loop/Slave Timing; 1811 External Timing; 1812 DDS Shift; 1913 Send Test Pattern; 2014 User Test Pattern Screen; 2215 User Test Pattern Screen; 2316 Measurement Results Screen; 2517 Line 1 Summary Screen (E1 Mode); 3118 Line Frequency Screen (E1 Mode); 3119 Line Frequency/No Ref Signal; 3220 G.821 Logical Screen; 3321 ALM/SIG Screen (E1 Mode); 3322 Line 1- M.2100/550 screen (E1 Mode); 3423 Line 1- G.826 Screen (E1 Mode); 3524 View Received Data; 3625 FAS Frame Words; 3726 FAS Frame Words-PCM30; 3827 MFAS Frame Words; 3928 Pulse Shape Analysis; 4029 C-Bit Analysis; 4230 Current Histogram Info Screen; 4531 View Current Histogram; 4532 Saved Histogram Screen; 4733 Propagation Delay Screen; 4834 V.54 Application; 4935 V.54 Channel Loopback Screen; 4936 VF Measurements E1 Dual Setup Screen; 5137 View Line 1 & 2 CAS; 5438 Call Analysis Setup Screen; 5539 Call Analysis Setup Screen with Trigger; 5640 DTMF Call Analysis Sample Screen; 5741 MFR2 Call Analysis Sample Screen; 57

130 SSMTT-27

42 DTMF Digit Analysis Screen; 5943 Pulse Digit Analysis Screen; 5944 Call Emulator List; 6045 DTMF Receive Sequence; 6146 Q.441 MFCR2 Call Emulation Setup Screen; 6147 Q.441 MFCR2 Call Emulation; 6248 Q.441 MFCR2 Receive Setup; 6349 Q.441 MFCR2 Receive Sample Screen; 6450 User Call Emulator Screen; 6551 Call Emulator Profiles; 6652 Edit Emulator; 6653 Start User Emulation; 6854 Supervision Setup Screen; 6955 Dial Parameters Screen; 7156 Signal Meanings Screen; 7357 Group 1 Forward Signals; 7458 Group II Forward Signals; 7559 Group A Backward Signals Screen; 7660 Group B Backwards Signals Screen; 7761 View/Store/Print Screen; 7862 Filename Character Screen; 7963 Error Injection Screen; 8164 Alarm Generation Screen; 8365 Send Frame Words Screen; 8566 Automatic E-Bit Transmission; 8667 Measurement Configuration Screen 1; 8768 Measurement Configuration Screen 2; 8969 Term Mode Connection; 9270 Monitor Mode Connection; 9271 Thru Mode Connection; 9372 Accept a New Span; 9473 In-Service Circuit Monitoring-Monitor Mode; 9574 In-Service Circuit Monitoring-Bridge Mode; 9675 Frequency Synchronization; 9776 Measuring Signal Level; 9977 V.54 Application; 10178 View Received Data; 10379 Fractional E1 Testing; 10880 Dual Drop & Insert THRU Mode Test (BNC); 11181 In Service Dual Drop & Insert THRU (Bantam); 11182 Converting a Voice Signal; 11483 AMI & HDB3 Line Codings; 11584 HDB3 Encoding; 11685 Pulse Shape; 11787 FAS Framing Format; 118

Figures continued

131Dual E1

87 MFAS Framing Format; 12088 CRC-4 Multiframe Format; 12189 In-service E-bit Performance Monitoring; 12390 Local Loop & Interoffice Signalling Method; 12491 DTMF Frequency Keypad; 124

Frame Alignment Signal; 38Frame Words, Send; 85Framing; 11, 16FRM; 27Multiframe; 39PCM-30; 12PCM-31; 12VF Analysis; 50

Frequency Screen-Meas. Results; 31

GG.703; 40, 113Pulse Mask; 41

G.704; 113G.706; 113G.821; 33, 113Measurement Results; 33

G.826%BBE; 35BBE; 35EB; 35Measurement Results; 35SES; 35

HHDB3; 88HEX; 37Histogram Analysis; 44Current Histogram; 45, 47

HOLDSCR; 26HRP MODEL % Configuration; 90

IIdle; 69Channel Signalling; 91Code; 91Signal; 50

Interdigit Period; 71Internal Timing; 14, 19ITU-T Q.441; 73

Figures continued

132 SSMTT-27

LL1+L2; 52L1-Rx; 14PORT; 13

L2-Rx; 14LEDsAIS; 7ALARM; 7BIT ERR; 6BPV/CODE; 7MODULE or xDSL; 5PAT SYNC; 6SIGNAL (SSMTT) or T1/E1 SIG (SSxDSL); 5

Line CodingAMI; 115HDB3; 115

Local Loop; 124LOCK/UNLOCK; 26Loss of Frame; 11

MM.2100; 113M.2100/550; 34M.550; 113M2100/500 Screen; 34%ES; 34%SES; 34P/F; 34PERIOD; 34

MEAS ConfigurationBLOCK SIZE; 89CODE CONFIGUR; 88DGRM; 90G.821; 90G.826; 90IDLE CHNL A/B/C/D; 91IDLE CHNL CODE; 91M.2100; 90MEAS DURATION; 87MEASURE MODE; 88PRINT EVENT; 89PRINT RESULT; 89

Measurement Result Definitions%AS; 28%DGRM; 29%EFS; 29%ES; 29

133Dual E1

%SES; 30%UAS; 30(CODE) RATE; 28(CRC) RATE; 28+/- RxLVL; 30+LVL; 29+WANDR; 30-LVL; 29-WANDR; 30AISS; 28AS; 28BER; 28BIT; 28CLK SLIP; 28CODE; 28CRC; 28DGRM; 29EBER; 29EBIT; 29EFS; 29ES; 29FALM; 29FE; 29Hz/PPM; 29LOFS; 29LOSS; 29Lpp; 29MAX Hz; 30MFAL; 30MFE; 30MIN Hz; 30RCV Hz; 30RxCLK; 30SES; 30SLIP; 30UAS; 30

MeasurementsDuration of; 87Start; 88

Menu Tree; 9MFASDISTANT; 84DISTANT Alarm; 84Framing Bits; 39WORD, Send Frame Words; 86

Measurement Result Definitions continued

134 SSMTT-27

Words, View; 39MFR2; 55, 62

NNFAS WORDS-Send Frame Words; 86Noise 1010 Hz Measurement; 53Noise Psophometric Measurement; 53

OOFFSET; 14Other Features; 81

PPCM-31; 118Propagation Delay; 48Pulse; 72Pulse Digit Analysis; 59Pulse Mask Analysis; 40View Last Pulse Shape; 41

Pulse Signalling; 55

QQ.422; 69

RReceiver; 13Receivers; 17Reference Clock; 32RT; 27Rx/DROP; 15

SSeizure; 70Select Timeslot Screen; 11, 16Send and Receive a Tone; 112Send Frame Words; 85Signal Meanings; 73Signal-to-Noise measurement; 53Signalling; 54, 69Slave Timing; 17SS#5; 55Summary Screens; 31Supervision; 69

TT/S; 37Tables01 C-bit Definitions; 4302 Group 1 Forward Labels; 7403 Group II Forward Labels; 75

MFAS continued

135Dual E1

04 Group A Backward Signal Labels; 7605 Group B Backward Labels; 77

Technical Standards; 113Test Patterns, Standard0000; 211-4; 221-8; 221010; 211111; 212047; 2120ITU; 212e15; 212e20; 212e23; 203-24; 22511, 127, 63; 21FOX; 21QRSS; 22

Test Rate; 11, 16Timing; 17Tone Level; 71TOUT; 67TTL-L2; 14TX CLOCK; 14TX CLOCK, E1 DUAL; 17Tx SOURCE; 10, 15

UUnit Interval (UI); 48User Emulation; 65User Test PatternsCorrecting a Mistake in the Pattern; 24Creating; 23Deleting; 24Editing a Label; 24Sending; 22Viewing; 23

VV.54; 49VF Channel AccessView CAS; 54

VF Digit AnalysisdBm; 58H/L Hz; 58INTD; 58PERD; 58

Tables continued

136 SSMTT-27

PPRD; 59PPS; 59TWIST; 58

VF Measurement Results1010 (dBm); 533-K Flat; 533K (dBm); 53frequency; 53level; 53OFFSET; 53PEAK; 53PSOP (dBm); 53RxABCD; 53RxDATA; 53S/N (dB); 53

View Received Data; 36View Results Records; 84View/Store/PrintDeleting a Stored Test; 80Locking & Unlocking a Stored Test; 80Printing a Stored Test; 80Renaming a Stored Test; 80Saving a Test; 79Viewing a Stored Test; 80

WWarnings; 13

XXMT CLOCKINTERN; 19

VF Digit Analysis continued