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1 IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027 Signal Cancellation Techniques for Testing High-end Digital-to-Analog Converters Dr. Fang XU Teradyne, Inc [email protected]

Signal cancellation techniques for testing high end digital-to-analog converters

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Page 1: Signal cancellation techniques for testing high end digital-to-analog converters

1IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Signal Cancellation Techniques for Testing High-end Digital-to-Analog Converters

Dr. Fang XU

Teradyne, Inc

[email protected]

Page 2: Signal cancellation techniques for testing high end digital-to-analog converters

2IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Abstract

Constant improvement in converter performance results in requirement of higher precision instrument at increasing sampling speed. Therefore, building digitizer directly using existing cutting edge ADC technology will not satisfy current and future DAC testing needs. Development of new test techniques could help to fill this technology gap. This paper explores signal cancellation technique and proposes a robust algorithm to optimize signal cancellation.

Page 3: Signal cancellation techniques for testing high end digital-to-analog converters

4IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Testing tomorrow’s device with yesterday’s device

Year

Performance

State o

f art d

evice

perform

ance

State o

f art d

evice

used to

build in

strumen

t

Built from old device

Want to test future device

Technology improvement

Performance gap

Instrument architecture will fill the gap

A change for testing since this profession existed

Page 4: Signal cancellation techniques for testing high end digital-to-analog converters

5IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Signal Cancellation Principle

Signal Under

Test

cancellation signal

Device noise and distortion

Dynamic rangebefore cancellation =

Dynamic rangeafter cancellation =

Page 5: Signal cancellation techniques for testing high end digital-to-analog converters

6IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Signal Cancellation Challenge

Phase uncertainty

Signal Under

Test

Cancellation Signal

Device noise and distortion

Amplitude

uncertainty

Instrument architecture must offer accurate amplitude and phase control and repeatability for maximum cancellation

CSSUTR +=

Signal cancellation =

),cos(2 R22

CSSUTCSSUTCSSUT •−+=

Amplitude Phase

+= )),cos(-(12 10Log 20

2

2

CSSUTCS

SUT

CS

SUT

CS

RLog

Page 6: Signal cancellation techniques for testing high end digital-to-analog converters

7IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Signal Cancellation Glossary

Glossary:SUT: Signal Under TestCS: cancellation signal, Signal of well defined characteristics used to remove the biggest part of energy from the SUTSRC: Initial signal to create CSG: Complex gain of the instrument to generate CS. It could be measured and characterized

Residue: Remaining signal after SUT and CS are combined

Signal Under

Test

Cancellation SignalR

esid

ual

SRCGCS •=

CSSUTR +=All signals must be treated as vectors

DUT

SRC G

Residue

SUT

CS

Page 7: Signal cancellation techniques for testing high end digital-to-analog converters

8IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Signal Cancellation Algorithm

SUTRCS −=

00

1

RSUT

SUT

Source

Source

−=

SUTRSRCG −=• 00

For the first iteration, we have:

At the next iteration, we want the residual be as small as possible:

SUTSRCG −=• 1

Thus, we get:

From the previous slide:1. Capture SUT: Before turn on the

cancellation source, capture DUT

signal only through the power

combiner.

2. Turn on the cancellation source

with a first guess Source0,

Capture R0

3. Change the cancellation

waveform to Source1 according

to formula.

4. Capture R1

* Step 1 and 2 could be in any order

CSSUTR +=

Page 8: Signal cancellation techniques for testing high end digital-to-analog converters

9IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Signal Cancellation Test Setup

DUT

BPF

50dB10bit

digitizer

TP TP

Page 9: Signal cancellation techniques for testing high end digital-to-analog converters

10IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

DUT Output Signal (SUT)

DUT

BPF

50dB

TP TP

10bitdigitizer

Page 10: Signal cancellation techniques for testing high end digital-to-analog converters

11IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

After Signal Cancellation

DUT

TP TP

10bitdigitizer

BPF

50dB

Page 11: Signal cancellation techniques for testing high end digital-to-analog converters

12IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Amplified Residual Signal

DUT

TP TP

10bitdigitizer

50dB

BPF

Page 12: Signal cancellation techniques for testing high end digital-to-analog converters

13IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Digitized Residual Signal

DUT

TP TP

10bitdigitizer

50dB

BPF

Page 13: Signal cancellation techniques for testing high end digital-to-analog converters

14IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

Cancellation Result

40dB

Cancellation of 40dBTHD sensitivity improves 10dBSFDR sensitivity improves 15dBSNR sensitivity improves 18dB

Page 14: Signal cancellation techniques for testing high end digital-to-analog converters

15IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

General Signal Cancellation

tTime domain arbitrary waveform

Fourier transform

SUT(t)

SUT(f)

We can apply the same signal cancellation algorithm on each component

Page 15: Signal cancellation techniques for testing high end digital-to-analog converters

16IMTC2007 Warsaw, Poland Dr. Fang Xu Paper 7027

High-end DAC Tested at 1kHz

SFDR > 124dB