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Dan Wehnes, Loren Schwappach, Tom Thede EE600: Modern Solid State Devices Colorado Technical University 15 September 2011 1

Ee600 lab3 hal9000_grp

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  • 1. Dan Wehnes, Loren Schwappach, Tom Thede EE600: Modern Solid State Devices Colorado Technical University15 September 20111

2. Presentation Overview HAL 9000 System Description Input / Output Requirements Performance Requirements Test Procedures / System Responses Analysis of HAL 9000 Inverters Critical Characteristics Schematic DC Analysis Frequency Analysis Propagation & Time Delays Comparison Conclusion 2 3. System Description HAL 9000 Computer 3 4. System Description HAL (H)euristically Programmed(AL)gorithmic Computer (Robot Hall of Fame, 2003) Brain of the Space Ship Discovery in 2001: ASpace Odyssey (Robot Hall of Fame, 2003) Robot that Controls/Uses Mechanical,Sensing, and Information Systems of theSpaceship (Robot Hall of Fame, 2003) Capabilities (Robot Hall of Fame, 2003): Controls/Communicates with All Systems onboardSpaceship Discovery Speech Output and Speech Recognition Natural Language Understanding Lip reading Thinking Faster and Better than Humans4 5. Primary Input / OutputRequirementsInputsOutputsAuditory EM WavesCapable of Life-Like Human Speech (Allows Speech Recognition) Visual EM Waves Visual Identification / Recognition(Allows Visual Recognition and Lip of Crew / Discoverys Systems and Reading) Exterior Objects. Uses: Red Camera EyeDiscoverys Interior (Environmental) Controls all of Discoverys ConditionsEnvironmental and Life SupportSystems Discoverys Exterior (Space-Time) Can Control all MechanicalConditionsSystems/Vehicles that are part ofDiscovery Discoverys System Outputs Controls All of SpaceshipDiscoverys Functions to Include Electronics and Navigation 5 6. Performance Requirements Ensure Missions Success At Any Cost Perform Advanced Artificial Intelligence (AI)Functions (Such as Decision Making andEmotional Awareness) Operate in a Variety of Environments Process Information at High Speeds Control all Interior/Exterior Spaceship Functions6 7. Test Procedures / System Responses Set Up Scenario-Based Testing at System Level MissionSuccess Defined Component Level Power and Grounding Requirements, Electro-StaticDischarge (ESD) Protection Lab Environment with Extreme Temperatures (space) Durability Shake, Rattle and Roll (Launch Simulation) Action System Level Reaction to Anomalous Situations(asteroid belt) Component Level - Switch Control Signals andEvaluate7 8. Test Procedures / System Responses Reaction System Level - Response to All Inputs from Spacecraft & Humans Component Level - Correct Outputs Based on Inputs Pass/Fail Criteria System Supportive of Humans and Their Directions Clock Speed Measurements Response Times to Inputs Operating Region Evaluation Controlled/Non-ControlledEnvironment Environmental Testing Entire Range of Launch and SpaceEnvironment Failure Modes and Effects Triple Redundancy for Human SpaceFlight Power Usage Evaluation Total vs. Allocated per Component Use of Allocated Space and Weight on Discovery Spacecraft8 9. 9 10. Inverter Selection CriticalCharacteristicsCritical Factors (Importance From Greatest toLeast): Performance: Clock Speed Fast Switching Speeds (GHz / THz) Noise Immunity-NM Minimum Power Usage Reliability: Resistance to Electrostatic Discharge (Ionization effects) Minimal Repair Capability and Human Space FlightRated NASA and AFIT Certified Robustness: Maximum Durability 10 11. Schematic0 00Vdd1Vdd2 Vdd35Vdc5Vdc 5VdcCMOS Circuit BiCMOS Circuit TTL Circuit R1 R2 R4PMOSPMOS24k 1.6k 130MbreakpPMOS MbreakpPMOSW = 14u W = 14uL = 1uL = 1uQ1Q5Q2N3904 Q2N3904 CMOS_OutBiCMOS_Out Q4 Q2N3904 D1Q3 D1N4002NMOSC1NMOS2 Q2N3904MbreaknNMOS 90p MbreaknNMOS C2TTL_OutW = 24u W = 24u 90pL = 1uL = 1uC3Q2Q690pQ2N3904 Q2N3904R31k0 Vin Shared 0VdcInput Source11 12. DC Analysis Output Slope Using Slope =-1 Points CMOS Vin(low) = 1.364 V Vin(high) = 2.078 VBiCMOS Vin(low) = 1.922 V Vin(high) = 2.494 V TTL Vin(low) = 606 mV Vin(high) = 1.437 V 12 13. DC Analysis Threshold Voltage Using Slope =1 (line)CMOSVThreshold = 1.854 V BiCMOSVThreshold = 2.316 VTTLVThreshold = 1.393 V 13 14. DC Analysis Noise MarginsNoise Margins Results CMOSNMH = 2.759 VNML = 1.018 VBiCMOSNMH = 1.734 VNML = 990 mV TTLNMH = 3.305 VNML = 583 mV 14 15. DC Analysis Power UsedPower UsedResultsCMOS At Vin=0V: 25 pW At Vin=5V: 25 pW At Vin=1.88V: 216 uW BiCMOSAt Vin=0V: 453 pWAt Vin=5V: 453 pW At Vin=2.34V: 17.5 mWTTLAt Vin=0V: 5.38 mWAt Vin=5V: 16.8 mW At Vin=1.43V: 165 mW 15 16. Frequency Analysis Corner Frequency Results (f3dB)CMOS 6.09 kHz BiCMOS68.55 kHz TTL 5.86 MHz16 17. Propagation & Time Delays CMOS Propagation Delays tPLH = t3-t1 = 1.232 ustPHL = t7-t5 = 230 nstP = tPLH + tPHL = 1.462 us Rise & Fall TimestR = t4-t2 = 2.869 us tF = t8-t6 = 565 ns Max FrequencyFmax = 1/(TR+TF) = 291.2 kHz 17 18. Propagation & Time DelaysBiCMOSPropagation Delays tPLH = t3-t1 = 74 ns tPHL = t7-t5 = 23 nstP = tPLH + tPHL = 97 nsRise & Fall Times tR = t4-t2 = 212 nstF = t8-t6 = 46 nsMax FrequencyFmax = 1/(TR+TF) = 3.876 MHz 18 19. Propagation & Time DelaysTTLPropagation Delays tPLH = t3-t1 = 268 nstPHL = t7-t5 = 3 ns tP = tPLH + tPHL = 271Rise & Fall TimestR = t4-t2 = 35 ns tF = t8-t6 = 5 nsMax FrequencyFmax = 1/(TR+TF) = 25 MHz 19 20. Comparison of CMOS, BiCMOS, TTL EvaluationIdeal CMOS BiCMOSLab 2d Parameter Procedure Inverter Inverter InverterTTLTransfer VThreshold 2.5 V 1.854 V 2.316 V 1.393 VCharacteristicNMH 2.5 V 2.759 V 1.734 V 3.305 VNoise Margins NML2.5 V 1.018 V 990 mV 582 mV P @ Vin = 0 V 0W25 pW 453 pW 5.38 mW Power UsedP @ Vin = 5 V 0W25 pW 453 pW 16.8 mW PMax0W 216 uW 17.5 mW 165 mW tPDHL 0s230 ns23 ns3 ns Propagation tPDLH 0s 1.232 us 74 ns268 ns Delays tP0s 1.462 us 97 ns271 nsRise TimetR0s 2.869 us 212 ns35 nsFall TimetF0s565 ns46 ns5 ns 3dB Corner f3dBinf. 6.09 kHz 68.6 kHz 5.86 MHz FrequencyMax FrequencyfMaxinf. 291 kHz 3.88 MHz25 MHz20 21. ConclusionsAnalysis Results: Performance: Clock Speed Fast Switching Speeds (GHz / THz) WINNER: TTL Noise Immunity WINNER: CMOS Minimum Power Usage WINNER: CMOS Reliability: Resistance to Electrostatic Discharge (Ionization effects) WINNER: TTL Robustness: Maximum Durability WINNER: TTLOur Conclusion: Although TTL Won the Majority of CriticalRequirements We Will Need to Analyze Additional TechnologiesBefore Making a Final Decision 21 22. Questions22 23. ReferencesNeamen, D. (2007). Microelectronics: Circuit Analysis and Design (3rd ed.). New York, NY: McGraw-Hill.Robot Hall of Fame. (2003). 2003 Inductees: HAL 9000. Retrieved September 15, 2011 from: http://www.robothalloffame.org/hal.html2001 Space Sounds. (2003). 2001 A Space Odyssey Internet Resource Archive.Retrieved September 15, 2011 from: http://www.palantir.net/2001/sounds.htmlMovie Sounds. (2003). 2001: A Space Odyssey. Retrieved September 15, 2011 from: http://www.moviesounds.com/2001.html[Illustration of a HAL 9000]. (n.d.). Retrieved September 15, 2011, from: http://bugtraq.ru/library/underground/.keep/compscifi.hal9000.jpg[Picture of Dave, 2001 A Space Odyssey]. (n.d.). Retrieved September 15, 2011, from: http://www.google.com/imgres?q=2001+a+space+odyssey&hl=en&biw=1020& bih=891&tbs=isz:l&tbm=isch&tbnid=aV_lO0M1jkRAFM:&imgrefurl=http://proverbs ofhell.tumblr.com/post/1982878211/inspcollection-2001-a-space-odyssey- dave&docid=Rh2O6pBSIEt57M&w=1920&h=1080&ei=CVtyTvenD7KmsQLrtITfCQ &zoom=1 23 24. References[Illustration of a Pilot at Console of Discovery Spaceship]. (n.d.). Retrieved September 15, 2011, from: http://4.bp.blogspot.com/_7J_WGI7Jygw/S45l1Tq6wPI/AAAAAAAAEtk/gddgrGL NXKw/s1600/2001%2BA%2BSpace%2BOdyssey%2BPic%2B046.jpg[Illustration of a Man in Discovery Spaceships HAL Memory Array]. (n.d.). Retrieved September 15, 2011, from: http://wodumedia.com/wp-content/uploads/HAL- 9000-is-about-to-get-his-hard-drive-fried-by-a-seriously-pissed-off-Dave.jpg 24