The top documents tagged [sematech slide]

Metrology Roadmap 2000 Update EuropeAlec Reader (Philips) Wilfried Vandervorst (IMEC) Rudolf Laubmeier (Infineon) Rudolf Laubmeier (Infineon) JapanFumio
Documents Metrology Roadmap 2000 Update EuropeAlec Reader (Philips) Wilfried Vandervorst (IMEC) Rudolf Laubmeier (Infineon) Rudolf Laubmeier (Infineon) JapanFumio

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Metrology Roadmap 2001 Update EuropeAlain Deleporte (ST) Ulrich Mantz (Infineon) Vincent Vachellerie (ST) Vincent Vachellerie (ST)JapanKorea Taiwan Henry
Documents Metrology Roadmap 2001 Update EuropeAlain Deleporte (ST) Ulrich Mantz (Infineon) Vincent Vachellerie (ST) Vincent Vachellerie (ST)JapanKorea Taiwan Henry

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International Technology Roadmap for Semiconductors Metrology Roadmap 2001 Update EuropeAlain Deleporte (ST)4/01 Alec Reader (Philips Analytical) Vincent
Documents International Technology Roadmap for Semiconductors Metrology Roadmap 2001 Update EuropeAlain Deleporte (ST)4/01 Alec Reader (Philips Analytical) Vincent

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24 July 2002 Work In Progress – Not for Publication Metrology Roadmap 2002 Update EuropeUlrich Mantz (Infineon) Alec Reader (Philips Analytical) Mauro
Documents 24 July 2002 Work In Progress – Not for Publication Metrology Roadmap 2002 Update EuropeUlrich Mantz (Infineon) Alec Reader (Philips Analytical) Mauro

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Moores Law Dynamics of a Technological Revolution Thomas J. Misa Charles Babbage Institute
Documents Moores Law Dynamics of a Technological Revolution Thomas J. Misa Charles Babbage Institute

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Electrical Characterization and Reliability Group Evaluation of Charge Trapping Measurements and Their Application to High- Gate Stack Evaluation IEEE
Documents Electrical Characterization and Reliability Group Evaluation of Charge Trapping Measurements and Their Application to High- Gate Stack Evaluation IEEE

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AMD Decision to Locate in Luther Forest Technology Park Quarterly Management Meeting September 13, 2006
Documents AMD Decision to Locate in Luther Forest Technology Park Quarterly Management Meeting September 13, 2006

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CANDE Panel on EDA R&D Rajesh Gupta UC San Diego
Documents CANDE Panel on EDA R&D Rajesh Gupta UC San Diego

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Hybrid Pipeline Structure for Self-Organizing Learning Array Yinyin Liu 1, Ding Mingwei 2, Janusz A. Starzyk 1, 1 School of Electrical Engineering & Computer
Documents Hybrid Pipeline Structure for Self-Organizing Learning Array Yinyin Liu 1, Ding Mingwei 2, Janusz A. Starzyk 1, 1 School of Electrical Engineering & Computer

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AVS 2002 Nov 3 - Nov 8, 2002 Denver, Colorado INTEGRATED MODELING OF ETCHING, CLEANING AND BARRIER COATING PVD FOR POROUS AND CONVENTIONAL SIO 2 IN FLUOROCARBON
Documents AVS 2002 Nov 3 - Nov 8, 2002 Denver, Colorado INTEGRATED MODELING OF ETCHING, CLEANING AND BARRIER COATING PVD FOR POROUS AND CONVENTIONAL SIO 2 IN FLUOROCARBON

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NUMERICAL TECHNOLOGIES, INC. Sub-wavelength Lithography: An Impact of Photo Mask Errors on Circuit Performance L. Karklin, S. Mazor, D.Joshi 1, A. Balasinski
Documents NUMERICAL TECHNOLOGIES, INC. Sub-wavelength Lithography: An Impact of Photo Mask Errors on Circuit Performance L. Karklin, S. Mazor, D.Joshi 1, A. Balasinski

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