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Data Logging SeminarFrom configuring and programming data acquisition systems
to organizing and reporting measurement data
Winter/Spring 2007
National Instruments Eastern Europe
Tvr kz 2. A7 p. 2. em.,2040 Budars, Hungary
Offices
Hungary +36 23 501 580, Czech Republic & Slovakia +420 224 235 774,Poland +48 22 33 90 150, Slovenia (including Croatia, Macedonia, Bosnia
& Herzegovina, Serbia & Montenegro) +386 3 425 4200
Worldwide Technical Support and Product Information
ni.com
Agenda
Introduction to National Instruments
General Introduction to Data Logging
NI Hardware for Data Logging PC based Systems
Distributed Systems
High Channel Density Systems
NI Software for Data Logging LabVIEW Graphical Programming
LabVIEW SignalExpress
Organize and Report Large Amounts of Data
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Profile
Leaders in Computer-BasedMeasurement and Automation
Long-Term Track Record ofGrowth and Profitability
$572M Revenue in 2005
More than 4 000 employees
Operations in 40+ countries
Fortunes 100 Best Companiesto Work For Eighth ConsecutiveYear
$0$50
$100$150$200$250$300
$350$400
$450$500$550$600$650
' 77 ' 79 ' 81 ' 83 ' 85 ' 87 ' 89 ' 91 ' 93 ' 95 ' 97 ' 99 ' 01 ' 03 ' 05
NetRevenueinMillions
48, %
31, %
21, %
Americas
Europe
Asia
Virtual Instrumentation
High-SpeedDigitisers
High-ResolutionDigitisers and DMMs
MultifunctionDAQ
DynamicSignal Acquisition
Digital I/OInstrumentControl
Counter/Timers
MachineVision
MotionControl
Distributed I/OandEmbedded Control
Laptop PC PDADesktop PCPXI Modular Instrumentation
Signal Conditioningand Switching
Unit Under Test
Higher PerformanceCut test time by 50%.
Lucent
Lower CostReduced test equipment cost by 66%.
Australian Military
Benefits of Virtual Instrumentation
Faster Time to MarketSaved 44 weeks of development time.
Parker Hannifan
Improved QualityReduced the time to move peoplethrough airport security checkpointsby 50%.
Milestone Technology
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Virtual Instrumentation EverywhereMore than 25,000 companies, including
>90% of Fortune 500 manufacturing companies
Application Area of Data Logging Systems
Designand
systemvalidation
Environmentmonitoring
SCADAsystems
Data logging onthe test bench
Qualityassurance
Complexity
Samplerate
Evolution of Data Logging Systems
Stand-alone dataloggers
1990 2004 1970 1900
High performance
stand-alonesystems
Paper and
pencil
Strip ChartRecorder
PC-based
systems
Easy to-use
USB data
logging
2006
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Structure of Data Logging Systems
Offline analysisVisualization
Data AcquisitionOnline-Analysis
PresentationData
managementReport
Signal
AcquisitionSensorOnlineanalysis
Presentation
Offlineanalysis
Storage
PC-Based Data Logging System
Advantages of PC-Based Data Logging
Integrate traditional logging tasks: Acquisition
Logging
Display
Provides new capabilities: Multiple measurement types and locations
Custom analysis
Reporting
Network integration
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Data Logger Hardware Considerations
What types of sensors do you have?
How many channels do you need?
What accuracy and resolution are required?
How fast do you need to log?
Do you need end-to-end calibration?
Will you need to expand in the future?
Would you like to control any outputs?s
.
Analog Signal(bridge, IEPE, mV, etc.)Sensor
IEEE P1451.4
Sensor manufacturer Model number Serial number Measurement range
Transfer function Calibration info User Info (location) And more
TEDS(EEPROM)
TEDS(EEPROM)
Transducer ElectronicData Sheet (TEDS)
Digital(extra line, or switched w/
analog)
Smart TEDS Sensor Legacy Sensor
SensorAnalog Signal
Virtual TEDS
TEDS
Database
WWW
Virtual TEDSfile
Plug & Play Sensors
Number of bits ADC uses to represent a signal
Higher resolution smaller voltage changes can be detected
100 200150500
Time (ms)
0
1.25
5.00
2.50
3.75
6.25
7.50
8.75
10.00
Amplitude
(volts)
16-Bit Versus 3-Bit Resolution
(5kHz Sine Wave)
16-bit
3-bit
000
001
010
011
100
101
110
111
| ||||
Resolution
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Measurement Accuracy and Inaccuracy
Measurement accuracy or measurement uncertainty or fault defines the range by which an experimentalvalue can deviate from the real value
Accuracy = Measurement value +/-gain error +/- offset error +/-noise
Measurement inaccuracies result from measuring physical values. Measurements scatter around the realvalue.
Statistical errorcaused by noise
Systematic errorcaused by deviation of an instrument
Averaging
Calibration
Measurement Chain Measurement Inaccuracy
+/- 0.0077%
M Series
+/-0.1%
Signal
conditioningSensor
+/- 1%
Vinput =
Vmeasurementvalue
100 mV
M Series = 100 2.15 mVE Series = 100 10.2 mV
Inaccuracy results from the inaccuracies in single steps according to therules of error propagation
Precise hardware for signal conditioning and DAQ can reduce themeasurement inaccuracy significantly
Systematic error
Sampling Speed
Under sampling may result in the measured signal beingmisrepresented (aliasing)
Once a signal is aliased, it is impossible to reconstructoriginal signal
Sample at least twice as fast as the highest frequencysignal being measured
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One Platform Many Data Logging Solutions
Storage
NI TDMLVM
VI LoggerLabVIEWDSC
SQL/ODBCASAM-ODS
CustomFile Formats
ASCIIEXCEL
Data Acquisition & Online-Analysis
USB PortableSystems
PCI cFP cRIO
PC Based Systems Distributed Solutions
LabVIEW
Navigation
Analysis
Report
Inspection
DIAdem
PXI
Offline
Management
Analysis
Reporting
LabVIEWSignalExpress
USB
Desktop PC
PXI, PXIe
Industrial PCPortable
HW Platforms for Data Logging
PCI, PCIe
Ethernet,Wireless,
CAN, Fieldbusand serial
Distributed
PC Based Data Logging SystemsUSB Based, Simple & Complete
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Advantages of USB
Portable data logging systems without a specific powersupply for the measurement hardware
Plug and Play operation without system reboot;measurement hardware can be used flexibly on
different computers Driver supports several operating systems (Windows,Mac OS X, Linux)
1
10
100
1000
10000
100000
198
6
198
8
199
0
199
2
199
4
199
6
199
8
200
0
200
2
200
4
200
6
USB
Ethernet
PC Buses
Speed(Mbits/S
Year
10 Mbit Ethernet
100 Mbit Ethernet
Gigabit Ethernet
USB 1.1
USB 2.0ISA
PCI 32/33
PCI Express
Data Throughput of USB 2.0
Hi-Speed USB 2.0 = 480 Mb/s
Sample configurations: 32 channels of 24-bit data at 50 kS/s/ch
256 channels through a single USB connection
40X
USB Product Overview
INTEGRATED SIGNAL CONDITIONING
HIGH PERFORMANCE
DAQPad-6259
SCXI-1600
USB-9211
USB-9215
USB-6008
USB-6009
LOW-COST
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Convenience and
Performance of
USB
Introducing NI CompactDAQ
Flexible,
Easy-to-Use
Software
Advanced ADCs
and Isolators
Modularity with
Direct Connectivity
Analog I/O, Digital I/O and Sensors
National Instruments USB Technology
USB STC-2
Timing and
Triggering
High-Speed
Parallel Signal
Streaming
Module
Auto-Detection
and Control
CompactDAQ Chassis Backplane
Analog-to-Digital Converter Performance & Price
Increasing ADC Performance
24-bit resolution
Up to 102 dB dynamic range
Integrated anti-aliasing filters
Simultaneous samplingarchitectures with multiple
ADCs
Decreasing Price of ADCs
16-bit ADCs cost 85% lessthan 10 years ago
$0
$10
$20
$30
$40
$50
$60
1990 1992 1994 1996 1998 2000 2002 2004
Year
Pricein
USD
12-bi t A DC 16-b it AD C 18-bi t A DC N I Pr ice/ IO Ch
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New digital isolators replace analog optocouplers with chip-scale transformers:
Increased data rates and bandwidth
Smaller size
Lower power consumption
Lower cost
Digital Isolation Lowers Cost, Improved Performance
2300 Vrms Transient
Built-In Signal Conditioning and Connectivity
Strain (bridge completion)
Accelerometers µphones
Temperature
Voltage
Force
Pressure
Flow
Hot Swappable and Auto-detectable
Different I/O Modules for CompactDAQ
$35
$30
$12
$30
$75
$100
$30
$25
$325
$250
$55Price/Ch
4 Ch Relay
10 MHz8 Ch PWM/pulse
10 kHz8 Ch 24V DIO
10 MHz8 Ch 5V TTL
16-bit100 kS/s/ch4 Ch 10V output
16-bit100 kS/s/ch4 Ch 10V SS
16-bit250 kS/s32 Ch 10V (600V iso)
16-bit250 kS/s32 Ch 10V
24-bit50 kS/s/ch4 Ch Accel/Mic
24-bit50 kS/s/ch4 Ch Bridge/Strain
24-bit15 S/s4 Ch ThermocoupleResolutionSpeedDescription
a
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NI-DAQmx and LabVIEW 8.20
LabVIEW 8
Configuration
Manager
DAQ Assistant
API
Driver Engine
CompactDAQ
Application Programming
LabVIEW 8.20
LabWindows/CVI
Measurement Studio, VB, C
High Level DAQmx Driver
Code Generation
DAQ Assistant
Scaling, configuration, andsystem test
Distributed Data Logging Systems
NI CompactFieldPoint (cFP)
Robust, reliable I/O
Integrated isolation and signalconditioning
Industrial Communication Interfaces
Runs embedded LabVIEW for realtime applications
Built-in Web server
Distributed supervisory-, control-and data logging applications
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Solid Metal Backplane50 G shock, 5 G vibration
Solid Mounting OptionsPanel, DIN rail, rack
Strain ReliefStrain bars and wire tie rings
Redundant Power InputsBackup power supply
or battery
Real-Time OSReliable operation
Industrially hardened Components25 to 60 C operation temp range
Heavy Industrial EMC rating
NI CompactFieldPoint Programmable Automation Controller
Select the 4 or 8 slot
BackplaneSolidly Mounts the
I/O Modules, Controllerand Connector Blocks
Compact FieldPoint Components
Compact FieldPoint Components
Select the ControllerPerforms EmbeddedControl and Ethernet
Communication
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Compact FieldPoint Components
Select the I/OI/O Modules perform
Digitization,Signal Conditioning,Scaling, Filtering, and
Linearization
Compact FieldPoint Components
Select the ConnectivityIntegrated Connector Blocks
or External Connectivity Options
Compact FieldPoint, Processor Functionality
4 serial ports3 RS-232, 1 RS-485
Communication with serial devices
Floating Point ProcessorAnalog control
Custom algorithms
64/128 MB DRAMComplex Control Routines
Removable Compact FlashData Logging
Easily upgrade embedded program
512 MB Built-in MemoryNon-volatile memory for
Program storage(no battery needed)
10/100 MBPS EthernetCommunication over the network
Built-in Web InterfaceWeb ServerFTP Server
E-mail capability
Industrial Grade: -40 to 70 C,
50G shock, 5G vibration
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NI Compact RIO (cRIO)
Small size, low power consumption11 to 30 VDC, max. 17 W (on average 7 10 W)
Reconfigurable FPGADeveloping faster and more complexalgorithms
Extremely robustOperating temperature from -40 to 70 C
Shock proof up to 50 GVibration resistant up to 5 G
Real-time OSEquivalent to 200 MHz Pentium
Isolated Industrial I/OSignal conditioning from 80 mV up to 250 VIntegrated connector panelettes
Compact RIO Reconfigurable Embedded System
New platform for PAC and Embedded controls
Connectorpanelettes ADC
Signalconditioning a
I/O
I/O
I/O I/O
I/OI/O
Real-Time
Controller
Programmable Automation Controller
NI Compact RIO
DSA Modules - NI cRIO-4408 24-bit resolution 102 dB input dynamic range 50,0/33,3 kS/s sample rate (4/8 channels) 8 simultaneous inputs BNC IEPE inputs for accelerometers and microphones 10/100 Ethernet Anti-alias filter Application range: NVH, In-vehicle test, Structural
analysis, Machine condition monitoring
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PXI - High Channel Density, Synchronization
Data acquisition and control:
Multifunction I/O
Reconfigurable I/Os(FPGA-based)
Digital I/O
Analog in-/output
Machine visionand motion
Counter/Timer
Modular Instruments:
Oscilloscopes
Digital waveform generators/analyzers
Digital multimeters
Arbitrary waveformgenerators
Switches
RF signal generationand analysis
Interfaces:
GPIB
SCSI + EnetFireWire
CAN + DeviceNET
RS-232/RS-485VXI/VME
ARINC/MIL-STD-1553
Periphery:
Hard drive
Prototypingboard
PC Card carrier
Power supply units
BoundaryScan/JTAG
MXI interfaces
Over 880 different modules from more than 55 manufacturers
Synchronization Single PXI Chassis
NI 4472 in slot 2, controlling 13 other modules
Total of 14 modules, 112 channels
Low phase mismatch of < 0.1 at 1 kHz between anytwo channels in the chassis
Synchronization Multiple PXI Chassis
NI PXI-6653 in each slot 2,sharing clocks and triggers
Low phase mismatch of
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Data Logging Software
Software Used Most for DAQ and Instrument Control
Survey: 2005 Global Product Awareness Tracking Study. Thinking of data acquisition and instrument control software, which of thefollowing software packages do you use the most? Responses receiving lessthan 4%of mentions are not reported in the chart above. Other and none are not reported in the chart above. Total respondents=1006, Margin of error +/-2.59%.
NI - LabVIEW
Microsoft - Visual Basic
Microsoft - Visual C++
The MathWorks, Inc. -
MATLAB
NI - LabWindows CVI
Agilent - VEE
Measurement & Automation Explorer (MAX)
Device
configuration
and connection
management
Built-in test
panel windowsTask andchannel
creation
Signal connection
diagrams
Simulated
DAQmx devices
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NI LabVIEW Graphical Development Environment
Compiler-based graphical development environment
Reduction of development time by 4 to 10 times
Toolkits for data acquisition, analysis and presentation
Rapid development with Express VIs
NI LabVIEWGraphical Programming
1 Start ofData Flow
2VIs execute once allinputs are available
Choose Your Approach
Configuration
OrientedTextual Math
Standard VIsExpress VIs LabVIEW MathScript
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Process and Analyze Data with LabVIEW
Measurement-oriented analysis libraries
Application-specific toolkits
Over 600 built-in functions for
signal processing, analysis and math:
Signal synthesis
Curve fitting and interpolation
FFT-based frequency analysis
Mathematics
Probability and statistics
Time-and frequency-domain analysis Digital signal processing
Waveform alignment and resampling
Much more
LabVIEW Everywhere
Platforms Desktop
Windows, Macintosh, Linux
Industrial Real-Time OS PACs (IPCs, PXI, Cfp, CRIO, etc)
Industrial displays / touchpanels
Mobile Windows Mobile, Windows CE
Embedded FPGAs, Microprocessors, DSPs
Portable PCs FPGAs on
NI RIO
Embedded
Controllers
Desktop PCsHandheld
Devices
PXI Industrial
Controllers
Vision
SystemsProgrammable Automation
Controllers
DSPs
LabVIEW Toolkits
Sound & Vibration - NVH
RF & Communications
Digital Filter Design
Database Connectivity
Reporting interface to MS Office
And many more
Productivity enhancing functionality found in severaltoolkits including
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What LabVIEW Users are Saying
This type of testing would have been a difficult task without
LabVIEW, which simplified data collection and analysis, decreased
test time, and reduced the amount of operator interruption.Amy S. Pomaybo, Advanced Development Engineering, Medrad, Inc.Measuring Medical Pump Accuracy with LabVIEW
Before using LabVIEW, I used C and VC++, which took, on
average, three months to finish a project. I recently completed a
VGA signal generator project in just one month using LabVIEW...In-Seung Yang Samsung Electronics
Organize, Analyses and Report
Large Amounts of Data
The Data Problem
It is easy to collect complex data at tremendous rates, the real
challenge is quickly converting it into usable information
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NI Technical Data Management (TDM) Vision
How? By providing Flexible data model for storing technical data
Robust APIs for reading and writing data
Self-configuring data management tools to aid in accessing data
Reduce time LabVIEW programmers spend on
file I/O while increasing the value the stored
data brings to their organizations.
From the End User Perspective
Where is my data?
How do I read this file?
Can I load the data into Excel?
Was this a good test? If not why?
What were the test conditions?
Did we run similar tests with these
conditions?
Well Documented Data
Test
Spec.
Fixture
Setup
Test
Req.
DAQ
Config.
Test
Results
Test
Notes
Bulk
Measurement
Data
Very similar benefits to well documentedLabVIEW code
The more test related information youstore in the file the less likely the end
user will come back to you with questions
However, using traditional LabVIEW file
I/O this is a lot of work to program andmaintain
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NI Core TDM Components
TDM Data Model & File
LabVIEW Storage VIs
DataPlugins
DIAdem DataFinder
In this second half of the presentation well investigate how youuse TDM to address your data management challenges
TDM Files are Self Describing
Where do you find the Storage VIs
DescriptionTitleAuthoretc
UUTProcedureetc
NameCommentUnitMax & Min
Sensor Infoetc
Binary (*.TDX)
XML (*.TDM)
The LabVIEW Storage VIs
Read and Write TDM files
Standard functions for open, write, close
Advanced functions for selective data loading
Advanced functions for structuring data
Storage VIs access and define the TDM data model
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The Storage VIs
LabVIEW API to the TDMdata model
Configuration oriented
Read and write TDM datamodel properties
Provide analogousfunctions for reading andwriting
Channels
File
Groups
How Do End Users Find The Data?
Having well documented data is only half the battle, how canyou help your end users find what they are looking for?
Lets see how the new DIAdem DataFinder Technology helps
Test Station 1 Test Station 2 Computer 1N
The DIAdem DataFinder Technology
Is one of the many features available inDIAdem, NIs application for off-lineanalysis and reporting
Automatically creates a Data Indexbehind the scenes that contains all theattributes of each data file
Enables you to locate data byperforming searches on properties atthe file, group and channel levels
Lets learn more about the Data Index
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DIAdem Report Generation
Design interactivelyreusable, multi pagereport templates
Integrate 2D, 3Dgraphs and tables,
graphics, text,variables andcommands
Export as Graphic,HTML page or PDFdocument
NI TDM Technology Summary
DIAdem DataFinder + DataPlugins
Data mining access to TDM & legacy data files
Self-configuring data management system
LabVIEW Storage VIs
Writing & Reading Search-Ready TDM files
DIAdem
Integrated data mining, analysisand reporting
Summary
LabVIEW Graphical Development - One Platform,Many Data Logging solutions
CompactDAQ: USB based, measurements in minutes
PXI: I/O variety, high channel count, synchronization
Compact FieldPoint: Real-time control, small food print,harsh environments
CompactRIO: High speed, low level customization
TDM: Integrated data mining, analysis and report generation
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After the Seminar
Schedule a visit with your local field engineer to
discuss your application!
Hungary: +36 23 501 580
Poland: +48 22 33 90 150
Czech Republic & Slovakia: +420 224 235 774
Slovenia, Croatia & Yugoslavia: +386 3 425 4200
Also visit
ni.com/datalogger
ni.com/labview
ni.com/trylabview
ni.com/webevents