Datalogging Seminar q1 2007

7/29/2019 Datalogging Seminar q1 2007

1/24

Data Logging SeminarFrom configuring and programming data acquisition systems

to organizing and reporting measurement data

Winter/Spring 2007

National Instruments Eastern Europe

Tvr kz 2. A7 p. 2. em.,2040 Budars, Hungary

Offices

Hungary +36 23 501 580, Czech Republic & Slovakia +420 224 235 774,Poland +48 22 33 90 150, Slovenia (including Croatia, Macedonia, Bosnia

& Herzegovina, Serbia & Montenegro) +386 3 425 4200

Worldwide Technical Support and Product Information

ni.com

Agenda

Introduction to National Instruments

General Introduction to Data Logging

NI Hardware for Data Logging PC based Systems

Distributed Systems

High Channel Density Systems

NI Software for Data Logging LabVIEW Graphical Programming

LabVIEW SignalExpress

Organize and Report Large Amounts of Data


2/24

Profile

Leaders in Computer-BasedMeasurement and Automation

Long-Term Track Record ofGrowth and Profitability

$572M Revenue in 2005

More than 4 000 employees

Operations in 40+ countries

Fortunes 100 Best Companiesto Work For Eighth ConsecutiveYear

$0$50

$100$150$200$250$300

$350$400

$450$500$550$600$650

' 77 ' 79 ' 81 ' 83 ' 85 ' 87 ' 89 ' 91 ' 93 ' 95 ' 97 ' 99 ' 01 ' 03 ' 05

NetRevenueinMillions

48, %

31, %

21, %

Americas

Europe

Asia

Virtual Instrumentation

High-SpeedDigitisers

High-ResolutionDigitisers and DMMs

MultifunctionDAQ

DynamicSignal Acquisition

Digital I/OInstrumentControl

Counter/Timers

MachineVision

MotionControl

Distributed I/OandEmbedded Control

Laptop PC PDADesktop PCPXI Modular Instrumentation

Signal Conditioningand Switching

Unit Under Test

Higher PerformanceCut test time by 50%.

Lucent

Lower CostReduced test equipment cost by 66%.

Australian Military

Benefits of Virtual Instrumentation

Faster Time to MarketSaved 44 weeks of development time.

Parker Hannifan

Improved QualityReduced the time to move peoplethrough airport security checkpointsby 50%.

Milestone Technology


3/24

Virtual Instrumentation EverywhereMore than 25,000 companies, including

>90% of Fortune 500 manufacturing companies

Application Area of Data Logging Systems

Designand

systemvalidation

Environmentmonitoring

SCADAsystems

Data logging onthe test bench

Qualityassurance

Complexity

Samplerate

Evolution of Data Logging Systems

Stand-alone dataloggers

1990 2004 1970 1900

High performance

stand-alonesystems

Paper and

pencil

Strip ChartRecorder

PC-based

systems

Easy to-use

USB data

logging

2006


4/24

Structure of Data Logging Systems

Offline analysisVisualization

Data AcquisitionOnline-Analysis

PresentationData

managementReport

Signal

AcquisitionSensorOnlineanalysis

Presentation

Offlineanalysis

Storage

PC-Based Data Logging System

Advantages of PC-Based Data Logging

Integrate traditional logging tasks: Acquisition

Logging

Display

Provides new capabilities: Multiple measurement types and locations

Custom analysis

Reporting

Network integration


5/24

Data Logger Hardware Considerations

What types of sensors do you have?

How many channels do you need?

What accuracy and resolution are required?

How fast do you need to log?

Do you need end-to-end calibration?

Will you need to expand in the future?

Would you like to control any outputs?s

.

Analog Signal(bridge, IEPE, mV, etc.)Sensor

IEEE P1451.4

Sensor manufacturer Model number Serial number Measurement range

Transfer function Calibration info User Info (location) And more

TEDS(EEPROM)

TEDS(EEPROM)

Transducer ElectronicData Sheet (TEDS)

Digital(extra line, or switched w/

analog)

Smart TEDS Sensor Legacy Sensor

SensorAnalog Signal

Virtual TEDS

TEDS

Database

WWW

Virtual TEDSfile

Plug & Play Sensors

Number of bits ADC uses to represent a signal

Higher resolution smaller voltage changes can be detected

100 200150500

Time (ms)

0

1.25

5.00

2.50

3.75

6.25

7.50

8.75

10.00

Amplitude

(volts)

16-Bit Versus 3-Bit Resolution

(5kHz Sine Wave)

16-bit

3-bit

000

001

010

011

100

101

110

111

| ||||

Resolution


6/24

Measurement Accuracy and Inaccuracy

Measurement accuracy or measurement uncertainty or fault defines the range by which an experimentalvalue can deviate from the real value

Accuracy = Measurement value +/-gain error +/- offset error +/-noise

Measurement inaccuracies result from measuring physical values. Measurements scatter around the realvalue.

Statistical errorcaused by noise

Systematic errorcaused by deviation of an instrument

Averaging

Calibration

Measurement Chain Measurement Inaccuracy

+/- 0.0077%

M Series

+/-0.1%

Signal

conditioningSensor

+/- 1%

Vinput =

Vmeasurementvalue

100 mV

M Series = 100 2.15 mVE Series = 100 10.2 mV

Inaccuracy results from the inaccuracies in single steps according to therules of error propagation

Precise hardware for signal conditioning and DAQ can reduce themeasurement inaccuracy significantly

Systematic error

Sampling Speed

Under sampling may result in the measured signal beingmisrepresented (aliasing)

Once a signal is aliased, it is impossible to reconstructoriginal signal

Sample at least twice as fast as the highest frequencysignal being measured


7/24

One Platform Many Data Logging Solutions

Storage

NI TDMLVM

VI LoggerLabVIEWDSC

SQL/ODBCASAM-ODS

CustomFile Formats

ASCIIEXCEL

Data Acquisition & Online-Analysis

USB PortableSystems

PCI cFP cRIO

PC Based Systems Distributed Solutions

LabVIEW

Navigation

Analysis

Report

Inspection

DIAdem

PXI

Offline

Management

Analysis

Reporting

LabVIEWSignalExpress

USB

Desktop PC

PXI, PXIe

Industrial PCPortable

HW Platforms for Data Logging

PCI, PCIe

Ethernet,Wireless,

CAN, Fieldbusand serial

Distributed

PC Based Data Logging SystemsUSB Based, Simple & Complete


8/24

Advantages of USB

Portable data logging systems without a specific powersupply for the measurement hardware

Plug and Play operation without system reboot;measurement hardware can be used flexibly on

different computers Driver supports several operating systems (Windows,Mac OS X, Linux)

1

10

100

1000

10000

100000

198

6

198

8

199

0

199

2

199

4

199

6

199

8

200

0

200

2

200

4

200

6

USB

Ethernet

PC Buses

Speed(Mbits/S

Year

10 Mbit Ethernet

100 Mbit Ethernet

Gigabit Ethernet

USB 1.1

USB 2.0ISA

PCI 32/33

PCI Express

Data Throughput of USB 2.0

Hi-Speed USB 2.0 = 480 Mb/s

Sample configurations: 32 channels of 24-bit data at 50 kS/s/ch

256 channels through a single USB connection

40X

USB Product Overview

INTEGRATED SIGNAL CONDITIONING

HIGH PERFORMANCE

DAQPad-6259

SCXI-1600

USB-9211

USB-9215

USB-6008

USB-6009

LOW-COST


9/24

Convenience and

Performance of

USB

Introducing NI CompactDAQ

Flexible,

Easy-to-Use

Software

Advanced ADCs

and Isolators

Modularity with

Direct Connectivity

Analog I/O, Digital I/O and Sensors

National Instruments USB Technology

USB STC-2

Timing and

Triggering

High-Speed

Parallel Signal

Streaming

Module

Auto-Detection

and Control

CompactDAQ Chassis Backplane

Analog-to-Digital Converter Performance & Price

Increasing ADC Performance

24-bit resolution

Up to 102 dB dynamic range

Integrated anti-aliasing filters

Simultaneous samplingarchitectures with multiple

ADCs

Decreasing Price of ADCs

16-bit ADCs cost 85% lessthan 10 years ago

$0

$10

$20

$30

$40

$50

$60

1990 1992 1994 1996 1998 2000 2002 2004

Year

Pricein

USD

12-bi t A DC 16-b it AD C 18-bi t A DC N I Pr ice/ IO Ch


10/24

New digital isolators replace analog optocouplers with chip-scale transformers:

Increased data rates and bandwidth

Smaller size

Lower power consumption

Lower cost

Digital Isolation Lowers Cost, Improved Performance

2300 Vrms Transient

Built-In Signal Conditioning and Connectivity

Strain (bridge completion)

Accelerometers &microphones

Temperature

Voltage

Force

Pressure

Flow

Hot Swappable and Auto-detectable

Different I/O Modules for CompactDAQ

$35

$30

$12

$30

$75

$100

$30

$25

$325

$250

$55Price/Ch

4 Ch Relay

10 MHz8 Ch PWM/pulse

10 kHz8 Ch 24V DIO

10 MHz8 Ch 5V TTL

16-bit100 kS/s/ch4 Ch 10V output

16-bit100 kS/s/ch4 Ch 10V SS

16-bit250 kS/s32 Ch 10V (600V iso)

16-bit250 kS/s32 Ch 10V

24-bit50 kS/s/ch4 Ch Accel/Mic

24-bit50 kS/s/ch4 Ch Bridge/Strain

24-bit15 S/s4 Ch ThermocoupleResolutionSpeedDescription

a


11/24

NI-DAQmx and LabVIEW 8.20

LabVIEW 8

Configuration

Manager

DAQ Assistant

API

Driver Engine

CompactDAQ

Application Programming

LabVIEW 8.20

LabWindows/CVI

Measurement Studio, VB, C

High Level DAQmx Driver

Code Generation

DAQ Assistant

Scaling, configuration, andsystem test

Distributed Data Logging Systems

NI CompactFieldPoint (cFP)

Robust, reliable I/O

Integrated isolation and signalconditioning

Industrial Communication Interfaces

Runs embedded LabVIEW for realtime applications

Built-in Web server

Distributed supervisory-, control-and data logging applications


12/24

Solid Metal Backplane50 G shock, 5 G vibration

Solid Mounting OptionsPanel, DIN rail, rack

Strain ReliefStrain bars and wire tie rings

Redundant Power InputsBackup power supply

or battery

Real-Time OSReliable operation

Industrially hardened Components25 to 60 C operation temp range

Heavy Industrial EMC rating

NI CompactFieldPoint Programmable Automation Controller

Select the 4 or 8 slot

BackplaneSolidly Mounts the

I/O Modules, Controllerand Connector Blocks

Compact FieldPoint Components


Select the ControllerPerforms EmbeddedControl and Ethernet

Communication


13/24


Select the I/OI/O Modules perform

Digitization,Signal Conditioning,Scaling, Filtering, and

Linearization


Select the ConnectivityIntegrated Connector Blocks

or External Connectivity Options

Compact FieldPoint, Processor Functionality

4 serial ports3 RS-232, 1 RS-485

Communication with serial devices

Floating Point ProcessorAnalog control

Custom algorithms

64/128 MB DRAMComplex Control Routines

Removable Compact FlashData Logging

Easily upgrade embedded program

512 MB Built-in MemoryNon-volatile memory for

Program storage(no battery needed)

10/100 MBPS EthernetCommunication over the network

Built-in Web InterfaceWeb ServerFTP Server

E-mail capability

Industrial Grade: -40 to 70 C,

50G shock, 5G vibration


14/24

NI Compact RIO (cRIO)

Small size, low power consumption11 to 30 VDC, max. 17 W (on average 7 10 W)

Reconfigurable FPGADeveloping faster and more complexalgorithms

Extremely robustOperating temperature from -40 to 70 C

Shock proof up to 50 GVibration resistant up to 5 G

Real-time OSEquivalent to 200 MHz Pentium

Isolated Industrial I/OSignal conditioning from 80 mV up to 250 VIntegrated connector panelettes

Compact RIO Reconfigurable Embedded System

New platform for PAC and Embedded controls

Connectorpanelettes ADC

Signalconditioning a

I/O

I/O

I/O I/O

I/OI/O

Real-Time

Controller

Programmable Automation Controller

NI Compact RIO

DSA Modules - NI cRIO-4408 24-bit resolution 102 dB input dynamic range 50,0/33,3 kS/s sample rate (4/8 channels) 8 simultaneous inputs BNC IEPE inputs for accelerometers and microphones 10/100 Ethernet Anti-alias filter Application range: NVH, In-vehicle test, Structural

analysis, Machine condition monitoring


15/24

PXI - High Channel Density, Synchronization

Data acquisition and control:

Multifunction I/O

Reconfigurable I/Os(FPGA-based)

Digital I/O

Analog in-/output

Machine visionand motion

Counter/Timer

Modular Instruments:

Oscilloscopes

Digital waveform generators/analyzers

Digital multimeters

Arbitrary waveformgenerators

Switches

RF signal generationand analysis

Interfaces:

GPIB

SCSI + EnetFireWire

CAN + DeviceNET

RS-232/RS-485VXI/VME

ARINC/MIL-STD-1553

Periphery:

Hard drive

Prototypingboard

PC Card carrier

Power supply units

BoundaryScan/JTAG

MXI interfaces

Over 880 different modules from more than 55 manufacturers

Synchronization Single PXI Chassis

NI 4472 in slot 2, controlling 13 other modules

Total of 14 modules, 112 channels

Low phase mismatch of < 0.1 at 1 kHz between anytwo channels in the chassis

Synchronization Multiple PXI Chassis

NI PXI-6653 in each slot 2,sharing clocks and triggers

Low phase mismatch of


16/24

Data Logging Software

Software Used Most for DAQ and Instrument Control

Survey: 2005 Global Product Awareness Tracking Study. Thinking of data acquisition and instrument control software, which of thefollowing software packages do you use the most? Responses receiving lessthan 4%of mentions are not reported in the chart above. Other and none are not reported in the chart above. Total respondents=1006, Margin of error +/-2.59%.

NI - LabVIEW

Microsoft - Visual Basic

Microsoft - Visual C++

The MathWorks, Inc. -

MATLAB

NI - LabWindows CVI

Agilent - VEE

Measurement & Automation Explorer (MAX)

Device

configuration

and connection

management

Built-in test

panel windowsTask andchannel

creation

Signal connection

diagrams

Simulated

DAQmx devices


17/24

NI LabVIEW Graphical Development Environment

Compiler-based graphical development environment

Reduction of development time by 4 to 10 times

Toolkits for data acquisition, analysis and presentation

Rapid development with Express VIs

NI LabVIEWGraphical Programming

1 Start ofData Flow

2VIs execute once allinputs are available

Choose Your Approach

Configuration

OrientedTextual Math

Standard VIsExpress VIs LabVIEW MathScript


18/24

Process and Analyze Data with LabVIEW

Measurement-oriented analysis libraries

Application-specific toolkits

Over 600 built-in functions for

signal processing, analysis and math:

Signal synthesis

Curve fitting and interpolation

FFT-based frequency analysis

Mathematics

Probability and statistics

Time-and frequency-domain analysis Digital signal processing

Waveform alignment and resampling

Much more

LabVIEW Everywhere

Platforms Desktop

Windows, Macintosh, Linux

Industrial Real-Time OS PACs (IPCs, PXI, Cfp, CRIO, etc)

Industrial displays / touchpanels

Mobile Windows Mobile, Windows CE

Embedded FPGAs, Microprocessors, DSPs

Portable PCs FPGAs on

NI RIO

Embedded

Controllers

Desktop PCsHandheld

Devices

PXI Industrial

Controllers

Vision

SystemsProgrammable Automation

Controllers

DSPs

LabVIEW Toolkits

Sound & Vibration - NVH

RF & Communications

Digital Filter Design

Database Connectivity

Reporting interface to MS Office

And many more

Productivity enhancing functionality found in severaltoolkits including


19/24

What LabVIEW Users are Saying

This type of testing would have been a difficult task without

LabVIEW, which simplified data collection and analysis, decreased

test time, and reduced the amount of operator interruption.Amy S. Pomaybo, Advanced Development Engineering, Medrad, Inc.Measuring Medical Pump Accuracy with LabVIEW

Before using LabVIEW, I used C and VC++, which took, on

average, three months to finish a project. I recently completed a

VGA signal generator project in just one month using LabVIEW...In-Seung Yang Samsung Electronics

Organize, Analyses and Report

Large Amounts of Data

The Data Problem

It is easy to collect complex data at tremendous rates, the real

challenge is quickly converting it into usable information


20/24

NI Technical Data Management (TDM) Vision

How? By providing Flexible data model for storing technical data

Robust APIs for reading and writing data

Self-configuring data management tools to aid in accessing data

Reduce time LabVIEW programmers spend on

file I/O while increasing the value the stored

data brings to their organizations.

From the End User Perspective

Where is my data?

How do I read this file?

Can I load the data into Excel?

Was this a good test? If not why?

What were the test conditions?

Did we run similar tests with these

conditions?

Well Documented Data

Test

Spec.

Fixture

Setup

Test

Req.

DAQ

Config.

Test

Results

Test

Notes

Bulk

Measurement

Data

Very similar benefits to well documentedLabVIEW code

The more test related information youstore in the file the less likely the end

user will come back to you with questions

However, using traditional LabVIEW file

I/O this is a lot of work to program andmaintain


21/24

NI Core TDM Components

TDM Data Model & File

LabVIEW Storage VIs

DataPlugins

DIAdem DataFinder

In this second half of the presentation well investigate how youuse TDM to address your data management challenges

TDM Files are Self Describing

Where do you find the Storage VIs

DescriptionTitleAuthoretc

UUTProcedureetc

NameCommentUnitMax & Min

Sensor Infoetc

Binary (*.TDX)

XML (*.TDM)

The LabVIEW Storage VIs

Read and Write TDM files

Standard functions for open, write, close

Advanced functions for selective data loading

Advanced functions for structuring data

Storage VIs access and define the TDM data model


22/24

The Storage VIs

LabVIEW API to the TDMdata model

Configuration oriented

Read and write TDM datamodel properties

Provide analogousfunctions for reading andwriting

Channels

File

Groups

How Do End Users Find The Data?

Having well documented data is only half the battle, how canyou help your end users find what they are looking for?

Lets see how the new DIAdem DataFinder Technology helps

Test Station 1 Test Station 2 Computer 1N

The DIAdem DataFinder Technology

Is one of the many features available inDIAdem, NIs application for off-lineanalysis and reporting

Automatically creates a Data Indexbehind the scenes that contains all theattributes of each data file

Enables you to locate data byperforming searches on properties atthe file, group and channel levels

Lets learn more about the Data Index


23/24

DIAdem Report Generation

Design interactivelyreusable, multi pagereport templates

Integrate 2D, 3Dgraphs and tables,

graphics, text,variables andcommands

Export as Graphic,HTML page or PDFdocument

NI TDM Technology Summary

DIAdem DataFinder + DataPlugins

Data mining access to TDM & legacy data files

Self-configuring data management system

LabVIEW Storage VIs

Writing & Reading Search-Ready TDM files

DIAdem

Integrated data mining, analysisand reporting

Summary

LabVIEW Graphical Development - One Platform,Many Data Logging solutions

CompactDAQ: USB based, measurements in minutes

PXI: I/O variety, high channel count, synchronization

Compact FieldPoint: Real-time control, small food print,harsh environments

CompactRIO: High speed, low level customization

TDM: Integrated data mining, analysis and report generation


24/24

After the Seminar

Schedule a visit with your local field engineer to

discuss your application!

Hungary: +36 23 501 580

Poland: +48 22 33 90 150

Czech Republic & Slovakia: +420 224 235 774

Slovenia, Croatia & Yugoslavia: +386 3 425 4200

Also visit

ni.com/datalogger

ni.com/labview

ni.com/trylabview

ni.com/webevents

Documents

Datalogging Seminar q1 2007