Background: VLSI Courses at Lafayette ECE 425 - VLSI Circuit Design
Original form: “tall thin designer” VLSI Processing CMOS Transistor Characteristics Parasitic Effects Custom Layout Standard-Cell ASICs
(Application-Specific Integrated Circuits) ASIC Design using Hardware Description
Languages (HDLs) and CAD Tools
Student design project: “Tiny Chip” Complete 2.2mm X 2.2mm chip Fabrication by MOSIS (MOS implementation
Service) Educational Program
ECE 426 VLSI System Design Follow-on to ECE 425 More coverage of HDL-based System Design Testing of fabricated MOSIS chips
Extending ECE 425 New focus on Data Conversion
Digital / Analog Conversion Comparators Analog / Digital Conversion
Continued focus on Design Basic cell analysis and layout ASIC-style HDL-based design Full chip design (mixed analog & digital)
Lecture Topic LaboratoryCMOS ProcessingDevice Physics; MOS Transistor Characteristics
Schematic Editing / Simulation
Parasitic ComponentsLayout and Design Rules
Basic Gate Layout
Extraction, Simulation, and Layout VerificationHierarchical Layout
Extraction/Simulation/LVS
Voltage-Scaling D/A ConversionASIC Layout Styles: Std. Cells, Gate Arrays, FPGAsCombinational Logic: Gate Design and LayoutComb. delay and power dissipation; testing
Layout Mini-Project:4-bit Voltage Scaling DAC
Comb. Design with HDLs & Logic SynthesisSequential Logic: Latch & Flip-Flop DesignSequential Circuits and Clocking Schemes
HDL Design (Combinational)
Sequential Design with HDLs & Logic SynthesisSequential Testing & Design for Test
HDL Design (Sequential)
Successive-Approximation A/D ConversionClocked “Auto-Centering” ComparatorsDigital VLSI System DesignAnalog VLSI Overview
Final Project: 4-bit SuccessiveApproximation ADC
New Design Projects D/A Converter
Voltage Scaling design Hierarchical Layout
A/D Converter Successive Approximation circuit:
designed using HDL / standard cells D/A Converter used as building block Uses dynamic analog comparator
supplied by instructor Assembled to complete chip
Introduction and Overview
Motivation - The Digital Paradox Digital VLSI chips & applications are pervasive in:
Computer Systems Telecommunications Consumer Electronics Automotive Electronics
BUT analog concerns more important than ever! Must connect digital chips to an analog world Many chips now combine analog and digital circuits Designers must consider analog effects in digital circuits
Bottom Line: Undergraduate VLSI students need exposure to both analog and digital concerns
Objectives Add analog to “broaden” a digital course Teach concepts as extension of digital analysis and
design methods Focus on data conversion - useful to both
analog and digital designers Maintain strong digital design focus Lay foundation for further study in analog
Mixed-Signal Design Activities
Voltage-Scaling D/A Converter
rs3’
rs3
rs2’
rs2
rs1’
rs1
rs0’
rs0
rs3’
rs3
rs2’
rs2
rs1’
rs1
rs0’
rs0
rs3’
rs3
rs2’
rs2
rs1’
rs1
rs0’
rs0
rs3’
rs3
rs2’
rs2
rs1’
rs1
rs0’
rs0
cs1’cs1cs2’cs2cs3’cs3 cs0’cs0
Analog Output
d3
d2
d1
d0
2-4Binary
Decode r
cs3’
cs3
cs2’
cs2
cs1’
cs1
cs0’
cs0
2-4Binary
Decode r
rs3’
rs3
rs2’
rs2
rs1’
rs1
rs0’
rs0
VRplus
VRminus
Comparator Design (provided by instructors)
ø1
/ø1
/ø1
ø1ø2
/ø2
D Q
V1
V2
OUTø2C
Successive Approximation A/D Converter
SAREstimation
Circuit
D/AConverter
Comparator
Estimate V E
Input VI
VE GT VIRDY
START
+
-
Comparator
Clock Generator Logic
S
R
Q
S
R
Q
S
R
Q
S
R
Q
E[3:0]
E3
E2
E1
E0
SetB3
ClrB3
SetB2
ClrB2
SetB1
ClrB1
SetB0
ClrB0
GT
CLK
FromComparator
SAR FSM
START / SetB3 ClrB2 ClrB1 ClrB0
GT / ClrB3
START’
GT’
INITRDY
TST3SetB2
TST2SetB1
TST1SetB0
TST0GT /ClrB0
GT / ClrB2
GT’
GT / ClrB1
GT’ GT’
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
1111
Vin
Vest
Results and Conclusions
Final Chip Layout
Fabrication & Testing Results - Fall 2001 15 students completed 8 student chip designs 7 submitted for fabrication to MOSIS 7 chips worked as desgined
Conclusions Successfully integrated analog concerns
in previously “all-digital” course Students created working mixed signal (A/D)
chips
Future Work Additional analog coverage Better integration of testing and
design-for test
More Information Available at:http://foghorn.cadlab.lafayette.edu/ece425