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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Detection and diagnosis of plant-wide disturbancesNina F. Thornhill
Professor of Control Systems
Department of Electronic and Electrical Engineering,
University College London, WC1E 7JE.
www.ee.ucl.ac.uk/~nina
A UCL Member of the Imperial College/UCL Centre A UCL Member of the Imperial College/UCL Centre for Process Systems Engineeringfor Process Systems Engineering
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
UCLUCLIs in the heart of London Is in the heart of London ––postcode is postcode is WC1WC1;;
Was the first English Was the first English University to open its doors University to open its doors to all, regardless of race, to all, regardless of race, religion or political belief religion or political belief (provided they could pay (provided they could pay the fees).the fees).
University College London (UCL)University College London (UCL)
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
UCL UCL E&EE&E EngEngThe The thermionicthermionic valve, valve, which made radio and which made radio and modern electronics modern electronics possible, was invented in possible, was invented in E&EE&E Engineering.Engineering.
Views courtesy of Paul Views courtesy of Paul Brennan and Kevin LeeBrennan and Kevin Lee
University College London (UCL)University College London (UCL)
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Layout of the presentationLayout of the presentation
PPlantlant--wide disturbanceswide disturbancesExamplesExamples
Detection and characterizationDetection and characterizationMultiple oscillation detectionMultiple oscillation detectionClustering methodsClustering methods
Isolation and diagnosis of the root causeIsolation and diagnosis of the root causeNonNon--linearity testslinearity testsCause and effect analysisCause and effect analysisSingle loop testsSingle loop testsOpen issues in diagnosisOpen issues in diagnosis
Tools for usersTools for usersUseful literatureUseful literature
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Distributed plantDistributed plant--wide disturbanceswide disturbances
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Distributed disturbancesDistributed disturbances
analyser
off gas
air
temperature
steam flow
0 2000 4000
ste
am
flo
w
time/s
tem
pe
ratu
rea
na
lyse
r
time trends
0.001 0.01frequency/Hz
spectra
harmonic
ExampleExampleFaulty steam flow sensorFaulty steam flow sensor
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Distributed disturbancesDistributed disturbancesExample (Eastman Chemical Company)Example (Eastman Chemical Company)
Sticking valveSticking valve
0 8 16 24 32 40 48
TI6FC6TC1TI4TI5
FC4PI1
FC2FC1FI1
LC1TI2TI1
FC3PC1 1
23456789101112131415
time/hours0 8 16 24 32 40 48
FC7FI3PI2TI7TI8
TC2FI4
FC8LC2TI3FI5
FC5FI2
LC3PC2 16
1718192021222324252627282930
time/hours
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
oscillating measurementoscillating measurement
Distributed disturbancesDistributed disturbances
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Distributed disturbancesDistributed disturbances
0 100 200 300 400 500
PCJ1TIJ1AIJ1
FI1FC11FC10
FC9FC8FC7FC6FC5FC4FC3FC2FC1AI4AI3AI2AI1
LC7LC6LC5LC4LC3LC2LC1PI1
PC5PC4PC3PC2PC1TC5TC4TC3TC2TC1 1
2345678910111213141516171819202122232425262728293031323334353637
time/sample interval
Example (SE Asia data)Example (SE Asia data)Valve problemValve problem
Temperature (36) Density (35) Fuel gas flow (26)
Pressure (37)
Feed vaporizer/ superheat
PSA unit
Reformer
Reformerfeed
pre-heatProcess gas
Process gas
Process steam flow (27)
Process gas flow (29)
Fuel gas flow (30)
Off gas flow (34)
Outlet temperature (3)
Off gas flow (34)
Product (11)
Process gasInlet temperature
CO Analyzer (19)
CH4 Analyzer (20)
Reformed gas
Feed Process gasLPG/propane flow (23)
Tail gas flow (25)
Light naphtha
Combustion air flow (31)
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Distributed disturbancesDistributed disturbances
LC1
TI1
DPI1
TI3
TI2
TC2
Column 1 Column 2
TC1
FC1
LI2
50 100 150 200 250 300 350 400 450 500
TI3TI2TI1
TC2TC1
DPI1LI2
LC1FC1 -
2.43 -1.51 -1.392.13 - -
ti / li i t l
N
Example (BP)Example (BP)foamingfoaming
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Why is it important?Why is it important?Chemical plants make most money when they are Chemical plants make most money when they are running steadily without disturbance (Shunta,1995);running steadily without disturbance (Shunta,1995);
But diagnosing and rectifying the source of a But diagnosing and rectifying the source of a disturbance has costs;disturbance has costs;
Therefore methods are needed to aid detection and Therefore methods are needed to aid detection and diagnosis of the root cause during normal running.diagnosis of the root cause during normal running.
timetime
qualityquality
customer spec.customer spec.
Distributed disturbancesDistributed disturbances
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Detection of distributed disturbances:Detection of distributed disturbances:Oscillation detectionOscillation detectionHägglund, T., 1995, A control-loop performance monitor, Control Engineering Practice, 3, 1543-1551.Thornhill, N.F., Huang, B., and Zhang, H., 2003, Journal of Process Control, 13, 91-100.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Oscillation detectionOscillation detection
The original zero crossings method The original zero crossings method was by Tore Hwas by Tore Häägglund (1995)gglund (1995)
Zero crossing detection;Zero crossing detection;
Calculation of integrated absolute Calculation of integrated absolute error (error (IAEIAE););
Comparison with a threshold to Comparison with a threshold to make a decision;make a decision;
Can be used onCan be used on--line.line.
0 100 200-2
-1
0
1
2time trend
0 100 2000
1
2
3
4normalised IAE
time/sample intervals
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Oscillation detectionOscillation detection
Original zero crossings methodOriginal zero crossings method
ItIt’’s not so suitable for quantifying s not so suitable for quantifying the oscillation parameters;the oscillation parameters;
Regular zeroRegular zero--crossings suggest crossings suggest an oscillation;an oscillation;
But noisy time domain has But noisy time domain has spurious zero crossings;spurious zero crossings;
One possibility is to set threshold One possibility is to set threshold higher;higher;or …..
0 500 1000-10
-5
0
5
10time trend
0 500 10000
1
2
3
4normalised IAE
time/sample intervals
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
PlantPlant--wide oscillation detectionwide oscillation detection
Use detection of zero crossings of autocovariance Use detection of zero crossings of autocovariance functions functions –– autocovariance is much smoother:autocovariance is much smoother:
The ACF method is suitable for use with historical data The ACF method is suitable for use with historical data because the calculation uses a batch of data. because the calculation uses a batch of data.
( ) ( ) ( )τ
τ ττ = +
= × −− + ∑
1
1( )
1
N
i
ACF y i y iN
−where y is mean centered and scaled
Oscillation detectionOscillation detection
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
PlantPlant--wide oscillation detectionwide oscillation detectionFind the mean (Find the mean (TTpp) and standard deviation () and standard deviation (σσ∆∆TTpp) of ) of intervals between zero crossings; intervals between zero crossings;
Oscillation index is:Oscillation index is:
Random zero crossings have exponential distribution: Random zero crossings have exponential distribution:
So So OIOI >1 is a 3>1 is a 3--sigma rejection of the null hypothesis of sigma rejection of the null hypothesis of random zero crossings. random zero crossings.
Oscillation detectionOscillation detection
∆=
σ.
3pT
pTO I
∆= σpTpT
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Oscillation detectionOscillation detection
Oscillation detection and characterizationOscillation detection and characterization456789101112131415161718192021222324252627282930
0 1000 2000 3000 4000
302928272625242322212019181716151413121110987654321
time/sample interval
normalised time trend
Oscillation detectionOscillation detection
0 500 1000 1500 2000
302928272625242322212019181716151413121110 9 8 7 6 5 4 3 2 1
lag/sample interval
autocovariance functions
0 500 1000 1500 2000
302928272625242322212019181716151413121110 9 8 7 6 5 4 3 2 1 0.6
1.12.40.24.20.13.43.44.90.20.61.61.80.11.01.20.40.52.30.29.73.44.00.69.12.50.50.20.90.3
O.I.
lag/sample interval
zero crossings
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Oscillation detectionOscillation detection
Plant-wide analysisave_period tags involved
17.67 16 15 347.9 25 5 23 7 22 8 26 19 13 121384 2
Oscillation resultsOscillation results
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Detection of distributed disturbances:Detection of distributed disturbances:Spectral principal component analysisSpectral principal component analysisThornhill, N. F., Shah, S.L., Huang, B., and Vishnubhotla, A., 2002, Spectral principal component analysis of dynamic process data, Control Engineering Practice, 10, 833-846.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCAspectra
10-4
10-3
10-2
10-1
100
302928272625242322212019181716151413121110
987654321
frequency/sampling frequency
0 1000 2000 3000 4000
302928272625242322212019181716151413121110987654321
time/sample interval
normalised time trend
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCA
Spectral PCASpectral PCAThe challenge is to automate detection of tags The challenge is to automate detection of tags characterized by similar disturbances;characterized by similar disturbances;
Their spectra will be similar;Their spectra will be similar;
Spectra are invariant to time delays and lags;Spectra are invariant to time delays and lags;
Spectral PCA is better than time domain PCA for Spectral PCA is better than time domain PCA for dynamic data, even if time shifting is used;dynamic data, even if time shifting is used;
Spectral methods canSpectral methods can’’t be used in real time. t be used in real time.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCA
Use FFT to derive power spectra.Use FFT to derive power spectra.
XX is matrix of spectra, 30 rows and 4196 columns.is matrix of spectra, 30 rows and 4196 columns.
MethodMethodDecompose Decompose XX as a sum over basis functions as a sum over basis functions XX = = TT x x PP´́The The TT vectors are the scores. The basis functions are vectors are the scores. The basis functions are the rows of the loadings matrix the rows of the loadings matrix PP´́
30 spectra, one 30 spectra, one for each tagfor each tag
4196 frequencies4196 frequencies
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCA
e.g. For a 3 e.g. For a 3 -- PC modelPC model::
The The nn’’th spectrum has scoresth spectrum has scores ttn,1n,1, , ttn,2n,2 and and ttn,3n,3 . . These are These are
the weights in the summation of the the weights in the summation of the pp´́-- vectors needed to vectors needed to
approximately reconstruct the approximately reconstruct the nn’’th spectrum;th spectrum;
Process tags with similar spectra have similar Process tags with similar spectra have similar tt--values;values;Clusters represent process tags with similar spectra.Clusters represent process tags with similar spectra.
1,1 1,2 1,3
1 2 3
,1 ,2 ,3
... ... ...
m m m
t t t
t t t
′ ′ ′= + + +
X p p p E
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCA
Visual colour coding: Visual colour coding:
t2 t
1
t3
PCA score plot
.001 .01 0.1 1.0 frequency/sampling frequency
normalised spectra
origin {0,0,0} is hereorigin {0,0,0} is here
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCAAnalysis with seven PCs Analysis with seven PCs
The vertical axis is a measure of how unalike the The vertical axis is a measure of how unalike the tt’’ss are; are;
The tree gives more insight than can be seen in 3The tree gives more insight than can be seen in 3--D;D;
Some visual selections were wrong, e.g. 2, 21, 11Some visual selections were wrong, e.g. 2, 21, 11
1 28 2 14 21 27 24 5 7 8 12 13 19 22 26 29 23 25 20 11 10 15 18 16 17 3 9 4 30 60
0.05
0.1
0.15
0.2
0.25
0.3
spec
tal d
issi
mila
rity
classification tree using 7 prinicipal components
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCAEffect of different numbers of PCsEffect of different numbers of PCs
N Var %1 47.122 75.293 98.514 98.995 99.336 99.587 99.718 99.789 99.8210 99.8511 99.8812 99.90
1 16 28 26 5 22 25 13 8 23 10 29 12 20 19 7 11 17 2 14 15 27 21 24 3 9 4 30 6 180
0.05
0.1
0.15
0.2
0.25
spec
tral
dis
sim
ilari
ty
1 2 14 21 27 24 5 7 8 12 13 19 22 29 26 23 25 11 20 28 3 4 9 6 30 15 16 17 18 100
0.1
0.2
0.3
0.4
0.5
spec
tral
dis
sim
ilar
ity
30 PCs 30 PCs ((100%100%))
3 PCs 3 PCs ((98.5%98.5%))
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral PCASpectral PCA
Effect of different numbers of PCsEffect of different numbers of PCsSmall numbers of PCs enhance the clusters. Small numbers of PCs enhance the clusters.
Some tags may be wrongly classified, e.g. tag 10, Some tags may be wrongly classified, e.g. tag 10, because some features are overlooked with too few PCs;because some features are overlooked with too few PCs;
When all PCs are used every minor feature is captured;When all PCs are used every minor feature is captured;
Clusters are not tight when all PCs are used;Clusters are not tight when all PCs are used;
If there is a cluster when all PCs are used then it is a If there is a cluster when all PCs are used then it is a really important clusterreally important cluster..
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Detection of distributed disturbances:Detection of distributed disturbances:Spectral independent component analysis Spectral independent component analysis Xia, C., 2003, Control Loop Measurement Based Isolation of Faults and Disturbances in Process Plants, PhD Thesis, University of Glasgow, 2003.Xia, C., and Howell, J., 2005, Isolating multiple sources of plant-wide oscillations via independent component analysis, Control Engineering Practice, 13, 1027-1035.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
t2 t
1
t3
.001 .01 0.1 1.0
P5
P4
P3
P2
P1
frequency
loading vector plotsloading vector plotsscore plotscore plot
{{0,0,00,0,0}}
tt22 --veve
Reconstruction of spectra using Reconstruction of spectra using X = T x P´For instance, red spots are P1 For instance, red spots are P1 -- P2;P2;
Blue spots are P4+P5. They are near origin in a 3Blue spots are P4+P5. They are near origin in a 3--PC plot.PC plot.
Spectral ICASpectral ICA
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
.001 .01 0.1 1.0
P5
P4
P3
P2
P1
frequency.001 .01 0.1 1.0
P5-P4
P4+P5
P3,P1,P2
P1+P2
P1-P2
frequency
Spectral ICASpectral ICA
linear combinations of loadingslinear combinations of loadingsloading plotloading plot
Linear combinations can separate the peaks Linear combinations can separate the peaks
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral ICASpectral ICA
Spectral ICASpectral ICAImplemented by Xia, University Implemented by Xia, University of Glasgow as an extension to of Glasgow as an extension to spectral spectral PCAPCA::
where Pr(X) is the probability where Pr(X) is the probability density function;density function;
PCA loadings are orthogonal PCA loadings are orthogonal but not independent;but not independent;
ICA loadings are independent ICA loadings are independent and each has a unique peak and each has a unique peak like the sums and differences of like the sums and differences of PCA loadings.PCA loadings.
( ) ( ) ( )=1 2 1 2Pr , Pr PrX X X X
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Detection of distributed disturbances.Detection of distributed disturbances.Spectral correlation analysisSpectral correlation analysisTangirala, A.K., Shah, S.L., and Thornhill, N.F., 2005, PSCMAP: A new measure for plant-wide oscillation detection, Journal of Process Control, accepted for publication.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral correlation analysisSpectral correlation analysis
Spectral correlation and colour mapSpectral correlation and colour mapDevised by Arun Tangirala, University of Alberta and IIT Devised by Arun Tangirala, University of Alberta and IIT Madras;Madras;
Simpler calculation than spectral PCA, it determines Simpler calculation than spectral PCA, it determines correlation between one spectrum and another;correlation between one spectrum and another;
Visualization: A colour map shows the tags with strong Visualization: A colour map shows the tags with strong spectral similarity;spectral similarity;
The result is theoretically identical to using all spectral The result is theoretically identical to using all spectral PCs.PCs.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral correlation analysisSpectral correlation analysisThe correlation coefficient for data The correlation coefficient for data xx and and yy is:is:
Spectral correlation does not take off the mean value:Spectral correlation does not take off the mean value:
( )
( )( )
( )( )
=σ =
− −= =
∑,1
1 ˆ ˆ
ˆ ˆ
N
x y i ii
i ii i
x yN
x meawhe
n x y mean yx y
std dev x stdre and
dev y
( ) ( )
( ) ( )=
= =
ω ω
σ = ω ω
∑
∑ ∑
2 2
1, 2 22 2
1 1
N
k kk
X Y N N
k kk k
X Y
X Y
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral correlation analysisSpectral correlation analysis
Spectral correlation and colour mapSpectral correlation and colour mapThe example is the SE Asia data setThe example is the SE Asia data setNext slide shows the detected clusters;
Manual inspection is infeasible for large data sets.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral correlation analysisSpectral correlation analysis
0 100 200 300 400 500
PCJ1TIJ1AIJ1
FI1FC11FC10
FC9FC8FC7FC6FC5FC4FC3FC2FC1AI4AI3AI2AI1
LC7LC6LC5LC4LC3LC2LC1PI1
PC5PC4PC3PC2PC1TC5TC4TC3TC2TC1 1
2345678910111213141516171819202122232425262728293031323334353637
time/sample interval
normalised error time trend
10-3
10-2
10-1
100
37363534333231302928272625242322212019181716151413121110 9 8 7 6 5 4 3 2 1
frequency/sampling frequency
spectra
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral correlation analysisSpectral correlation analysisVisualization with spectral color map Visualization with spectral color map
A
BC
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Spectral correlation analysisSpectral correlation analysisTree format Tree format –– more complex but shows more detailmore complex but shows more detail
1 5 21 31 22 7 12 35 36 37 2 10 3 20 19 4 11 13 24 34 25 33 8 9 16 15 28 17 18 30 6 26 23 29 27 14 320
0.1
0.2
0.3
0.4
0.5
0.6
0.7
spec
tral
dis
sim
ilari
ty
classification tree using 37 prinicipal components
ABC
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Diagnosis of distributed disturbances:Diagnosis of distributed disturbances:PlantPlant--wide approacheswide approaches
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– NonNon--linearity testslinearity tests
NonNon--linearity testinglinearity testing70% of process control problems lie with faulty valves 70% of process control problems lie with faulty valves (Ender, 1993);(Ender, 1993);
NonNon--linearity is most strong closest to the root cause;linearity is most strong closest to the root cause;
That is because process plant is lowThat is because process plant is low--pass, it removes pass, it removes harmonics and phase coherence;harmonics and phase coherence;
NonNon--linearity tests are sensitive to phase coherence;linearity tests are sensitive to phase coherence;
Two branches: Two branches: bicoherence analysis and surrogates analysis
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– NonNon--linearity testslinearity tests
NonNon--linearity testinglinearity testingPhase coherence:Phase coherence:the phase in one frequency band is related to phase in other frequency bands.
It is a characteristic of a nonIt is a characteristic of a non--linear system;linear system;
Is in this signal, or is it a random phase? Is in this signal, or is it a random phase? A A nonnon--linearity test will tell. linearity test will tell.
φ = φ + φ3 1 2
( ) ( ) ( )( )( )
= π + φ + π + φ
+ π + + φ1 1 1 2 2 2
3 1 2 3
cos 2 cos 2
cos 2
x t a f a f
a f f
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– NonNon--linearity testslinearity tests
0 0.1 0.2
Tag 25
Tag 19
Tag 33
Tag 13
Tag 34
f / fs
magnitude
0 0.1 0.2f / fs
phase
100 200 300 400
Tag 25
Tag 19
Tag 33
Tag 13
Tag 34
time/sampling interval
normalized trendmost nonmost non--linearlinear
phase is phase is not randomnot random
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Diagnosis of distributed disturbances:Diagnosis of distributed disturbances:Surrogates testSurrogates testKantz, H., & Schreiber, T., 1997, Nonlinear time series analysis, Cambridge University Press, Cambridge, UK.Thornhill, N.F., Cox, J.W., and Paulonis, M., 2003, Diagnosis of plant-wide oscillation through data-driven analysis and process understanding, Control Engineering Practice, 11, 1481-1490.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Surrogates testSurrogates test
NonNon--linearity testinglinearity testingNonNon--linearity test is from Max Plank Institute at Dresden linearity test is from Max Plank Institute at Dresden (Kantz and Schreiber, 1997);(Kantz and Schreiber, 1997);
Could the observed time trend be the output of a linear Could the observed time trend be the output of a linear system driven by white noise?system driven by white noise?
NonNon--linearity test using surrogate data. Test the nonlinearity test using surrogate data. Test the non--linear linear prediction error;prediction error;
Surrogates have the same spectrum as the time series Surrogates have the same spectrum as the time series under test but are phase randomized.under test but are phase randomized.
z = z = FFTFFT(test data)(test data)
z = z *z = z *expexp( j ( j φ φ ) ) ((where where φφ is random, 0is random, 0--22ππ))
surrogate data = surrogate data = inverse FFTinverse FFT(z)(z)
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Surrogates testSurrogates test
-3 -2 -1 0 1 2 3-3
-2
-1
0
1
2
3
x(i-3)
x(i)
test data
-3 -2 -1 0 1 2 3-3
-2
-1
0
1
2
3
x(i-3)
x(i)
typical surrogate
0 50 100 150 200-3-2-10123
test data
0 50 100 150 200-3-2-10123
time/s
typical surrogate
time trend 2time trend 2--D embedded plotsD embedded plots
predictions are averages ofpredictions are averages of
near neighbours in phase plotnear neighbours in phase plot
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Surrogates testSurrogates test
prediction errorprob
abili
ty d
ensi
ty
prediction error for test time series
N = B/AN = B/AAA
mean-3σ
distribution forprediction errorsof surrogates
BB
NonNon--linearity testinglinearity testingNN is the negative offset from the mean in units of 3is the negative offset from the mean in units of 3σσ;;
NN > 1 is interpreted as non> 1 is interpreted as non--linearity in the time series.linearity in the time series.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Diagnosis of distributed disturbances:Diagnosis of distributed disturbances:Bicoherence testBicoherence testChoudhury, M.A.A.S., 2004, Detection and Diagnosis of Control Loop Nonlinearities Using Higher Order Statistics, PhD thesis, University of Alberta.Choudhury, M.A.A.S., Shah, S.L., and Thornhill, N.F., 2004, Diagnosis of poor control loop performance using higher order statistics, Automatica, 40, 1719–1728.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Bicoherence testBicoherence test
NonNon--linearity testinglinearity testingImplemented by Shoukat Choudhuri, University of Alberta;Implemented by Shoukat Choudhuri, University of Alberta;
ItIt’’s a 3s a 3--D graph D graph –– horizontal axes horizontal axes ff11 and and ff22, vertical , vertical bicbic22;;
( ) ( ) ( ) ( )( )= +*1 2 1 2 1 2,B f f E X f X f X f f
( ) ( )( ) ( ) ( )
= +
21 22
1 2 2 21 2 1 2
,,
B f fbic f f
E X f X f E X f f
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Bicoherence testBicoherence test
NonNon--linearity testinglinearity testingThe left hand figure is The left hand figure is a sum of two sine a sum of two sine waves at waves at ωω and and 22ωω;;
The right hand figure The right hand figure is is (1+ (1+ sin(sin(ωωtt)).sin()).sin(ωωtt));;
Only the squareOnly the square--law law signal has signal has bicoherence;bicoherence;
Figure is from Figure is from Choudhury Choudhury et.alet.al., ., 2002.2002.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Both nonBoth non--linearity testslinearity tests
Bicoherence calculations and plots (on next slide) are by courtesy of Shoukat Choudhuri, University of Alberta.
100 200 300 400
Tag 25
Tag 19
Tag 33
Tag 13
Tag 34
time/sampling interval
normalized trend
Tag No max(bic 2) N surr
34 1 4.913 0.9 2.633 1 2.619 0.6 - 25 0.3 -
Max bicoherence and surrogates analysis give the same conclusion.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– NonNon--linearity testslinearity tests
100 200 300 400
Tag 25
Tag 19
Tag 33
Tag 13
Tag 34
time/sampling interval
normalized trend
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Diagnosis of distributed disturbances:Diagnosis of distributed disturbances:Cause and effect analysis.Cause and effect analysis.Schreiber, T., 2000, Measuring information transfer, Physical Review Letters, 85, 461-464.Bauer, M., Thornhill, N.F., and Meaburn, A, 2004, Specifying thedirectionality of fault propagation paths using transfer entropy, DYCOPS4 conference, Boston, July 1-4, 2004.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Cause and effectCause and effect
Entropy methodEntropy methodImplementation is by Margret Bauer, UCLImplementation is by Margret Bauer, UCL
ItIt’’s a method to find directionality in signals;s a method to find directionality in signals;
Based on analysis of probability density functions (pdf)Based on analysis of probability density functions (pdf)
i-k+1 ... i i+1
i-l+1 ... i
time
x
y
time
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Cause and effectCause and effect
Entropy methodEntropy methodFollowing Schreiber (2000);Following Schreiber (2000);
Probability of Probability of xxi+1i+1 when when xx and and yy history are known:history are known:
Probability of Probability of xxi+1i+1 when only when only xx history is known:history is known:
Normalized comparison:Normalized comparison:
+
+→ +
+= ∑ ∑∑
1
11
1
( | , )( , , )log
( | )k li i i
k lk l i i i
Y X i i i kx i i
p xT p x
p xx y
x yx y
x
→ →→
→ →
−=
( )
min{ , }X Y Y X
X YX Y Y X
T Tt
T T
+1( | , )k li i ip x x y
+1( | )ki ip x x
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Cause and effectCause and effect
LC1
TI1
DPI1
TI3
TI2
TC2
Column 1 Column 2
TC1
FC1
LI2
50 100 150 200 250 300 350 400 450 500
TI3TI2TI1
TC2TC1
DPI1LI2
LC1FC1 -
2.43 -1.51 -1.392.13 - -
ti / li i t l
N
ExampleExamplefoamingfoaming
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Cause and effectCause and effect
normal operation foaming
DP1 →LC1 LC1 →DP1
50 100 150 200 250 300 350 400 450 500
TI3TI2TI1
TC2TC1
DPI1LI2
LC1FC1 -
2.43 -1.51 -1.392.13 - -
ti / li i t l
N
→ =1 1 0.805DP LCt → =1 1 0.85LC DPt
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Plantwide Plantwide –– Cause and effectCause and effect
normal operation
TI5
0.013 0.239 0.558 0.137
0.288
0.006
TI6TC1 TI1TI7
LC1
TI1
DPI1
TI3
TI2
TC2
Column 1 Column 2
TC1
FC1
LI2
50 100 150 200 250 300 350 400 450 500
TI3TI2TI1
TC2TC1
DPI1LI2
LC1FC1 -
2.43 -1.51 -1.392.13 - -
ti / li i t l
N
TI1
TC1 TI5
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Diagnosis of distributed disturbances:Diagnosis of distributed disturbances:Single loop approachesSingle loop approaches
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Single loop approachesSingle loop approaches
PlantPlant--wide analysis to isolate suspectswide analysis to isolate suspectsthen
Single loop tests to confirm diagnosis, e.g.Single loop tests to confirm diagnosis, e.g.Analysis of waveform shapes:Analysis of waveform shapes:Pattern recognition
Even and odd cross correlation of op and pv
Plotting of Plotting of opop--mvmv map;map;
Changing controller gain;Changing controller gain;
Putting loop in manual, travel tests.Putting loop in manual, travel tests.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Single loop Single loop –– Shape analysisShape analysis
Waveform pattern recognitionWaveform pattern recognitionFlow loop:Flow loop:mvmv and and pvpv are squareare squareopop is triangularis triangularopop and and mvmv are 90are 90oo out of phaseout of phase
PI x1op mv pv
-
time
pv
op
mv
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Single loop Single loop –– Shape analysisShape analysis
Waveform pattern recognitionWaveform pattern recognitionIntegrating process dynamics:Integrating process dynamics:mvmv is squareis squarepvpv is triangularis triangularopop has parabolic segmentshas parabolic segmentsopop and and mvmv are 90are 90oo out of phaseout of phase
PI levelop mv pv
-
time
pv
op
mv
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Single loop Single loop –– Shape analysisShape analysis
Cross correlation Cross correlation Conceived by Conceived by Alexander Horch Alexander Horch (Figure 10.7 from his (Figure 10.7 from his PhD thesis);PhD thesis);
pvpv and and opop do not do not have classical shapes;have classical shapes;
but
process dynamics are process dynamics are nonnon--integrating;integrating;
opop and and pvpv have odd have odd CCF;CCF;
so stiction is present.
PI compop mv pv
-
pv
op
lags
timeo
pan
dp
vC
CF
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Single loop Single loop –– opop--mvmv plot plot
Check valve using Check valve using op op --mvmv plot;plot;
FI3 is flow through LC2 FI3 is flow through LC2 control valve;control valve;
The LC2 valve clearly The LC2 valve clearly has a deadband.has a deadband.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Single loop Single loop –– Plant testsPlant tests
Manual testingManual testingTravel tests showed deadband;Travel tests showed deadband;Period and amplitude changed with controller gain;Period and amplitude changed with controller gain;
Data from Cox and Paulonis, Eastman Chemical Company.
0 4 8 12
FI3.PV
LC2.OP
LC2.PV
time/hours
routine operation
0 4 8 12
FI3.PV
LC2.OP
LC2.PV
time/hours
test sequence
level level
LC opLC op
flowflow
auto operationauto operationmanual travel testsmanual travel tests KKpp doubleddoubled
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Open issues in diagnosisOpen issues in diagnosis
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Diagnosis Diagnosis –– Open issuesOpen issues
Using plant layoutUsing plant layoutCapture and manipulate plant layout as well as Capture and manipulate plant layout as well as measurements.measurements.
Diagnosis of other root causesDiagnosis of other root causesController interaction;Controller interaction;
Structural disturbances e.g. recycle, snowball effect;Structural disturbances e.g. recycle, snowball effect;
Disturbances entering at plant boundaries;Disturbances entering at plant boundaries;
Poor tuning, hiPoor tuning, hi--lo limits, range problems. lo limits, range problems.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Diagnosis Diagnosis –– Using plant layoutUsing plant layout
Issues resolved using plant layout:Issues resolved using plant layout:Indicators and controllers;Indicators and controllers;LC2 is upstream, FC3 is downstream;LC2 is upstream, FC3 is downstream;No measurement of flow through LC2, No measurement of flow through LC2, so use FI3;so use FI3;How did oscillation get into column 2?How did oscillation get into column 2?
LC2LC2
FI3FI3
col 2col 2
FC3FC3
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Tools for usersTools for users
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Tools for usersTools for users
Tools using algorithms of this talkTools using algorithms of this talkPDA Wizard from ABB (will be an addPDA Wizard from ABB (will be an add--on to Loop on to Loop Performance Manager);Performance Manager);
DataProctor from University of Alberta.DataProctor from University of Alberta.
Controller performance and diagnosisController performance and diagnosisMain vendors are reviewed shortlyMain vendors are reviewed shortly
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Tools for usersTools for users
PDA from ABBPDA from ABBWill be an enhancement to Loop Performance Monitoring Will be an enhancement to Loop Performance Monitoring (LMP);(LMP);
Spectra and time trends
ABB PDA Wizard
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Tools for usersTools for users
Clustering PCA tree
ABB PDA Wizard
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Tools for usersTools for users DataProctor GUI
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Tools for usersTools for usersDataProctor Wavelet analysis
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Survey Survey –– Products and servicesProducts and services
ABB: ABB: Optimize IT Loop Performance ManagerOptimize IT Loop Performance Managerhttp://www.abb.com/http://www.abb.com/ (search for Loop Performance)(search for Loop Performance)
Aspentech: Aspen Watch Aspentech: Aspen Watch http://www.aspentech.com/http://www.aspentech.com/
Entech/Emerson Process Management Entech/Emerson Process Management http://www.emersonprocess.com/entechcontrol/Services/http://www.emersonprocess.com/entechcontrol/Services/
http://www.emersonprocess.com/home/services/http://www.emersonprocess.com/home/services/
Honeywell: Loop ScoutHoneywell: Loop Scouthttp://hpsweb.honeywell.com/Cultures/enhttp://hpsweb.honeywell.com/Cultures/en--US/Products/AssetApplications/AssetManagement/LoopScout/defUS/Products/AssetApplications/AssetManagement/LoopScout/default.htmault.htm
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Survey Survey –– Products and servicesProducts and services
ISC Ltd: Probe (with U of Strathclyde) ISC Ltd: Probe (with U of Strathclyde) http://www.ischttp://www.isc--ltd.com/software/ltd.com/software/
Matrikon: ProcessDoctor Matrikon: ProcessDoctor http://www.matrikon.com/products/processdoc/http://www.matrikon.com/products/processdoc/
PAS: Control Wizard PAS: Control Wizard http://www.pas.com/ControlWizard.htmhttp://www.pas.com/ControlWizard.htm
Expertune: Plant TriageExpertune: Plant Triagehttp://www.expertune.com/planttriage.htmlhttp://www.expertune.com/planttriage.html
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Review of the presentationReview of the presentation
PPlantlant--wide disturbanceswide disturbancesExamplesExamples
Detection and characterizationDetection and characterizationMultiple oscillation detectionMultiple oscillation detectionClustering methodsClustering methods
Isolation and diagnosis of the root causeIsolation and diagnosis of the root causeNonNon--linearity testslinearity testsCause and effect analysisCause and effect analysisSingle loop testsSingle loop testsOpen issues in diagnosisOpen issues in diagnosis
Tools for usersTools for usersUseful literatureUseful literature
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Useful literatureUseful literatureChoudhury, M.A.A.S., 2004, Detection and Diagnosis of Control Loop Nonlinearities
Using Higher Order Statistics, PhD thesis, University of Alberta.
Choudhury M.A.A.S. , Shah, S.L., and Thornhill, N.F., 2002, Detection and diagnosis of system nonlinearities using higher order statistics, IFAC World Congress 2002, Barcelona, Spain.
Choudhury, M.A.A.S., S.L. Shah, and N.F. Thornhill, 2004, Diagnosis of poor control loop performance using higher order statistics, Automatica, 40, 1719–1728.
Forsman, K., and Stattin, A., 1999, A new criterion for detecting oscillations in control loops, European Control Conference, Karlsruhe, Germany.
Hägglund, T., 1995, A control-loop performance monitor. Control Engineering Practice, 3, 1543-1551
Harris, T.J., Seppala, C.T., Jofreit, P.J., and Surgenor, B.W. 1996, Plant-wide feedback control performance assessment using an expert system framework, Control Engineering Practice, 9, 1297-1303.
Horch, A., 1999, A simple method for detection of stiction in control valves, Control Engineering. Practice, 7, 1221-1231
Horch, A., 2000, Condition Monitoring of Control Loops, PhD Thesis, KTH Royal Institute of Technology, Stockholm.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Useful literatureUseful literature
Horch, A., 2002, Patents WO0239201 and US2004/0078168. Kantz, H., & Schreiber, T., 1997, Nonlinear time series analysis. Cambridge
University Press, Cambridge, UK. Paulonis, M.A., and Cox, J.W., 2003, A practical approach for large-scale controller
performance assessment, diagnosis, and improvement. Journal of Process Control, 13, 155-168.
Rengaswamy, R., and Venkatasubramanian, V., 1995, A syntactic pattern-recognition approach for process monitoring and fault-diagnosis, Engineering Applications of Artificial Intelligence, 8, 35-51.
Ruel, M., and Gerry, J., 1998, Quebec quandary solved by Fourier transform, Intech(Aug), 53-55.
Schreiber, T., 2000, Measuring information transfer. Physical Review Letters, 85, 461-464.
Shunta, J., 1995, Achieving world class manufacturing through process control. Prentice Hall.
Tangirala, A.K., Shah, S.L., and Thornhill, N.F., 2005, PSCMAP: A new measure for plant-wide oscillation detection, Journal of Process Control, accepted for publication.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
Useful literatureUseful literatureTheiler, J., Eubank, S., Longtin, A., Galdrikian, B., and Farmer, J.D., 1992, Testing
for nonlinearity in time-series, the method of surrogate data. Physica D, 15, 77-94.Thornhill, N. F., Shah, S.L., Huang, B., and Vishnubhotla, A., 2002, Spectral principal
component analysis of dynamic process data, Control Engineering Practice, 10, 833-846.
Thornhill, N.F., and Hägglund, T., 1997, Detection and diagnosis of oscillation in control loops, Control Engineering Practice, 5, 1343-1354.
Thornhill, N.F., Cox, J.W., and Paulonis, M., 2003, Diagnosis of plant-wide oscillation through data-driven analysis and process understanding, Control Engineering Practice, 11, 1481-149.
Thornhill, N.F., Huang, B., and Zhang, H., 2003, Detection of multiple oscillations in control loops, Journal of Process Control, 13, 91-100.
Xia, C., 2003, Control Loop Measurement Based Isolation of Faults and Disturbances in Process Plants, PhD Thesis, University of Glasgow, 2003.
Xia, C., and Howell, J., 2003, Loop status monitoring and fault localisation. Journal of Process Control, 13, 679-691.
Xia, C., Howell, J., and Thornhill, N.F., 2005, Detecting and isolating multiple plant-wide oscillations via spectral independent component analysis, Automatica, accepted for publication.
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IEEE APC Applications for Industry Workshop, Vancouver May 9-11th 2005
ENDEND