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Copyright © 2016, All Rights Reserved
Bridging the gaps….
Testing beyond the Tester capability
Copyright © 2016, All Rights Reserved
Outline
Introduction to Salland
Today’s Test(er) Challenges
Test solution needs
Bridging the gap….Example’s
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We create and deliver Innovative and effective Test Solutions for the Microelectronics market, partnering with our customers to enhance
their success
Test Application Solutions
Salland Engineering Vision and Mission
Instruments Solutions
Supply Chain Services
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Salland Engineering Company Overview
Established in 1992, 40 employees
Headquartered in Zwolle, The Netherlands
Worldwide Sales & Support throughout Europe, USA and Asia
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Company Confidential
Test Experts Test methodology
Design for Test Test setup Characterization Yield Ramp up
Test skills differentiation RF – High Speed Mixed signal VIs, DPS, PMU High parallel testing COT reduction
Test Technology provider Test Program Load board and probe card Test Cell Interfacing Advanced Test configuration
Salland technology Customer IP 3rd party integration
Test setup certification Manufactory Validation Support
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Today's Test Challenges
Device Technology develops faster then ATE High Speed interfacing require Extremely fast signal handling
‐ …. keeping signal integrity up to the device is getting challenging and expensive Smart Power
‐ … handling low power with higher currents, voltages frontend RF/mmWave
‐ .... Far beyond exsisting standard tester capabilities Etc...
Never ending battle’s; QCD
‐ …. Balance between Test Coverage, Cost of Test & Throughput Time to Market, Time to Yield, Time to Volume => There is a need to enhance the standard Tester functionality
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Bridging the gap
Possible ways add (niche) functionality; ‐ On application board ‐ New ATE Instrument ‐ External equipment
Conditions solution:
‐ Like to get it fast (max. 6-9 months) ‐ Will use it a couple of years (< 3-5 years) ‐ Don’t want to spent too much money ( Modular design/solution ‐ Easy to reproduce & Service => ‘’Catalogue product & Support ‐ Production friendly => Run at Subcon
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Possible solutions to deliver new Technology
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Universal
Investment
Application Specific
Loadboard
Universal ATE Instrument
Flexible Fast Costs
Poor Integration Debug tooling Calibration &
diagnostic Supply chain
Universal/Flexible Supply chain Cal & diagnostics Tooling
High Capex costs TTM: x years
$$$$
$
Technology
Rack Instruments
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Possible solution
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Universal
Investment
Application Specific
Loadboard
“SMART Platform solution’’ Device Family based
Universal ATE Instrument
Enhanced Integration Debug tooling Calibration & diagnostic Supply chain Supports families Robustness
Less Universal Less Tooling
$$$$
$
Technology
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Some Use Cases/Concepts
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Use Case: High Speed SERDES Solution
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Objective ‐ Improve Testability by enabling test at-speed on SERDES
Constraints/Requirements ‐ No ATE Instrument Configuration and TOS changes (Teradyne Catalyst) ‐ Portable Solution and ATE independent
Proposal ‐ ATE Independent High Speed SERDES modules inside stiffener with
DSO capability up to 32Gbps & BERT capability up to 30Gbps
Result ‐ Enable High Speed Testing at
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Use Case: High Speed SERDES Solution – DSO
SMPS 40GHz Coaxial connector Ethernet and/or Direct ATE control interface Windows based Signal Debug GUI
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Description: State of the art, 4-channel, 32Gbps Digital
Sampling Oscilloscope for production testing Measures SerDes PHY TX signals on various
ATE platforms with all the logging and analyzing capabilities
Typical applications like High-Speed SerDes Testing & Characterization on various ATE platforms (Catalyst, V93k, ultraFLEX, etc.)
Solution: Full Eye and Mask Measurements Rise Time / Fall Time measurements 200fS intrinsic Jitter 32 GHz Bandwidth Reference Optical Receiver
Company Confidential
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Use Case: High Speed SERDES Solution – BERT
Key features: ‐ Supports PRBS patterns and user pattern ‐ Amplitude & Skew settings ‐ Eye Scan & Bathtub measurement
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Description: State of the art, 4-channel, 8.5 to 15Gbps
and 20 to 30Gbps Bit Error Rate Tester for production testing
Stimulates SerDes PHY RX with a controllable signal (level, noise, jitter)
Fits in the V93K, Teradyne Catalyst / FLEX / UltraFLEX
Direct ATE and Fast Ethernet control
Solution: 19/16ps Rise/Fall Times 400fs RMS jitter, 6ps Deterministic Jitter Output Level max. 1600mVpp differential 25mVpp sensitivity
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Use case: Radar Test solution
Objective ‐ Test RF/mmWave parts
Constraints/Requirements ‐ ATE independent ‐ Easy configurable/tunable specifications ‐ Small form factors for ease of use
Proposal ‐ Create set of building blocks to be able to bring RF signals in range of
existing ATE instruments
Result ‐ Enable RF testing of 20 – 30 GHz signals at Teradyne Flex (max 6GHz) ‐ Universal solution that can be used on ATE, Bench, final products
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Use Case: RF (Radar) testing
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RF Amplifier – Low Power
RF switches – T with 2 to 6 Multiplexer
Bandpass Filter
Future Target Applications: - Near future: 77GHz/120GHz automotive radars - MMW Imaging and Sensing - Fast measurement equipment - 60GHz wireless networking - 400Gbit/s optical data communications - 4G photonic mobile communication - Two-way satellite communication
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Use Case: SE-RF Lego®
Crystal Oscillator LO-Generator Frequency Divider Mixer Bandpass Filter RF Amplifiers
‐ Low Power ‐ Medium Power ‐ Low Phase Noise
RF to DC RF Switches
‐ Multiplexer ‐ T-switch
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Use case: RDSon measurement H-Bridge
Objective ‐ Test RDSon of H-bridge at low power tester
Constraints/Requirements ‐ ATE independent ‐ Easy tunable specifications; @ Voltage, Current
Proposal ‐ Creation of Controlled Current Pulse and measure voltage with ATE
instrument
Result ‐ Solution to test H-Bridge on Lower power tester to measure RDSon
(@0.5% Acc) ‐ Universal solution that can be used on ATE, Bench
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Principle
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Current
limiter
MV
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ATE/PC
HCP DUT connection
Instrument
controller
High Current Pulser
High Current
Pulser logic
All 16 switches will
be controlled by the
HCP
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Results RDSon Measurement with HCP
The blue line is the output of the HCP current source connected to 100mOhm (DUT) – At 2V = 20A – After 1.8 usec we have a stable
20A available to do the Voltage measurements
Special design for overshoot reduction as shown on bottom picture with 1uF
19 Company confidential
Current sense
Voltage
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HCP Specification
Item Specification
Max current Programmable pulse of 25A for max 20 usec with a recharge time of
500 usec
Isolation voltage Floating from digital HSD trigger inputs
Isolation voltage 1000V RMS
Pulse programming 0 to 20 usec in steps of 1 usec
Measure current accuracy 0.5% resolution 0.5mA
Measure voltage accuracy 0.5% Range 0 to 2.5V
Current forcing resolution programmable in 256 steps
Simultaneous current/voltage
measurements
Yes
Calibration By means of DC90 connected to Charge inputs
FET switches control The HCP can block up to 150V
20 Company confidential
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Future developments in investigation
High Voltage add-ons for Automotive Applications ‐ Can, Lin Capability
High Parallel test MEMS testing on ATE without physical stimulation
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Conclusions/Lessons learned
Existing testers can be upgraded to do test beyond tester capabilities
Solution can work for older but as well latest generation testers
Can achieve significant COT reduction and faster TTM
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Your Challenge, Our Strength Salland Engineering Instrument Solutions
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Thanks for your attention