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SURPASS hiT 70354.2
Acceptance Test Manual
Product code P42022-A5248-H420
© Nokia Siemens Networks 1 (73)
The information in this document is subject to change without notice and describes only the product defined in the introduction of this documentation. This documentation is intended for the use of Nokia Siemens Networks customers only for the purposes of the agreement under which the document is submitted, and no part of it may be used, reproduced, modified or transmitted in any form or means without the prior written permission of Nokia Siemens Networks. The documentation has been prepared to be used by professional and properly trained personnel, and the customer assumes full responsibility when using it. Nokia Siemens Networks welcomes customer comments as part of the process of continuous development and improvement of the documentation.
The information or statements given in this documentation concerning the suitability, capacity, or performance of the mentioned hardware or software products are given “as is” and all liability arising in connection with such hardware or software products shall be defined conclusively and finally in a separate agreement between Nokia Siemens Networks and the customer. However, Nokia Siemens Networks has made all reasonable efforts to ensure that the instructions contained in the document are adequate and free of material errors and omissions. Nokia Siemens Networks will, if deemed necessary by Nokia Siemens Networks, explain issues which may not be covered by the document.
Nokia Siemens Networks will correct errors in this documentation as soon as possible. IN NO EVENT WILL NOKIA SIEMENS NETWORKS BE LIABLE FOR ERRORS IN THIS DOCUMENTATION OR FOR ANY DAMAGES, INCLUDING BUT NOT LIMITED TO SPECIAL, DIRECT, INDIRECT, INCIDENTAL OR CONSEQUENTIAL OR ANY LOSSES, SUCH AS BUT NOT LIMITED TO LOSS OF PROFIT, REVENUE, BUSINESS INTERRUPTION, BUSINESS OPPORTUNITY OR DATA,THAT MAY ARISE FROM THE USE OF THIS DOCUMENT OR THE INFORMATION IN IT.
This documentation and the product it describes are considered protected by copyrights and other intellectual property rights according to the applicable laws.
The wave logo is a trademark of Nokia Siemens Networks Oy. Nokia is a registered trademark of Nokia Corporation. Siemens is a registered trademark of Siemens AG.
Other product names mentioned in this document may be trademarks of their respective owners, and they are mentioned for identification purposes only.
Copyright © Nokia Siemens Networks 2007. All rights reserved.
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Statements of compliance
CE statement
The CE conformity declaration for the product is fulfilled when the system is built and cabled in line with the information given in the manual and the documentation specified within it, such as installation instructions, cable lists or the like. Where necessary project-specific documentation should be taken into consideration. Deviations from the specifications or independent modifications to the layout, such as use of cable types with lower screening values for example, can lead to violation of the CE protection requirements. In such cases the conformity declaration is invalidated. The responsibility for any problems which subsequently arise rests with the party responsible for deviating from the installation specifications.
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Certificate of Customer Acceptance
Project Name:
Country:
Customer:
Station:
Product Version: hiT7035 R4.2L4.xx
Number of Pages:
Remarks:
Customer Acceptance Engineer:
NOKIA SIEMENS Networks Engineer:
Date:
Sign for the customer: Sign for NOKIA SIEMENS Networks:
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Product code P42022-A5248-H420
Issue 4.0
Summary of changes
Contents
1 Preface.......................................................................................9
2 Test Preparation.....................................................................102.1 Inventory List............................................................................102.1.1 Circuit Pack List of hiT7035......................................................102.1.2 Load number of hiT7035 and hiT7035 LCT.............................112.2 Tools and Test Equipment List..................................................11
3 Test result...............................................................................12
4 Acceptance test procedure...................................................144.1 Interface Test............................................................................144.1.1 Test of Battery Voltage.............................................................144.1.2 Check of the Management port................................................154.1.3 Function Test of User Channel (F1).........................................164.1.4 Function Test of EOW channels...............................................174.1.5 Function Test of MDI/MDO.......................................................184.1.6 E1 (75ohm) Cabling Test..........................................................194.1.7 E1 (120ohm) Cabling Test........................................................214.1.8 E3/DS3 Cabling Test................................................................234.1.9 STM-1E Cabling Test...............................................................244.1.10 STM-1 Optical Mean Launch Power.........................................264.1.11 STM-4 Optical Mean Launch Power.........................................274.1.12 STM-16 Optical Mean Launch Power.......................................294.1.13 STM-1 Optical Receive Power.................................................314.1.14 STM-4 Optical Receive Power.................................................334.1.15 STM-16 Optical Receive Power...............................................354.1.16 BOA Transmit Power................................................................374.1.17 POA Transmit Power................................................................384.1.18 Ethernet Performance Test – RFC2544 test for 8xFE/T..........404.1.19 Ethernet Performance Test – RFC2544 test for 8xFE/L2........454.1.20 Ethernet Performance Test – RFC2544 Test for 1xGE/T.........504.1.21 IMA Function Test....................................................................554.2 Network Test............................................................................564.2.1 Bit Error Test on E1 (12h).........................................................56
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4.2.2 Bit Error Test on E3 (12h).........................................................584.2.3 Bit Error Test on DS3 (12h)......................................................594.2.4 Bit Error Test on Line Side (12h, STM-1 trib)...........................614.2.5 Bit Error Test on Line Side (12h, STM-1E trib).........................624.2.6 Bit Error Test on Line Side (12h, STM-4 trib)...........................644.2.7 Bit Error Test on Line Side (12h, STM-16 trib).........................654.2.8 Packet Loss Test on Ethernet Card (12h, 8xFE/T)...................674.2.9 Packet Loss Test on Ethernet Card (12h, 8xFE/L2).................684.2.10 Packet Loss Test on Ethernet Card (12h, 1xGE/T Card).........70
Abbreviations............................................................................................72`
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Summary of changes
Summary of changes
Re-issue date Reason Modified by Version
2007-7-13 Initial this document Wang Xiaowei 01
2007-7-24 Update RFC2544 reference results for 8xFE/T, 8xFE/L2 and 1xGE/T
Yan Junhua 02
2007-7-31 Add document part number Yan Junhua 03
2007-8-6 Add IMA test notes Yan Junhua 04
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1 Preface
The purpose of this manual is to provide the necessary test steps and their explanations for an acceptance test of hiT7035 R4.2.
The “System-acceptance” personnel of the customer and/or of the manufacturer will carry out the acceptance tests after installation and commissioning.
If the system user wishes to perform the acceptance test procedures, however, he must meet the following conditions:
Training as a service engineer or equivalent,
Sound knowledge of transmission technology,
Appropriate device-specific training by the device manufacturer providing him to get the required device and system knowledge for the planned activity,
PC operation knowledge,
Basic knowledge of handling components, which are sensitive to electrostatic discharges,
Knowledge of handling optical fibbers and laser light sources.
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2 Test Preparation
2.1 Inventory List
2.1.1 Circuit Pack List of hiT7035
Slot name CP Type CP Code S/N number
SC
PWR1
PWR2
CC1_LC
CC2_LC
LC1
LC2
LC3
LC4
LC5
LC6
LC7
LC8
LC9
LC10
LC11
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Slot name CP Type CP Code S/N number
IO1
IO2
IO3
IO4
IO5
IO6
IO7
ST-CLK
2.1.2 Load number of hiT7035 and hiT7035 LCT
hiT7035 NE Load
TNMS-M Surpass hiT7035 LCT Load
2.2 Tools and Test Equipment List
Equipment Type Recommendation Actual Type
Bit Error test set
SDH/PDH Analyzer Agilent Omni718 with STM-16/4/1 interface
IMA test set ATM Analyzer
Ethernet test set
IEEE802.3 data Analyzer
SmartBits 600 with FE module and GE module
Optical Power meter Range –40…+10dBm
Optical test set Cleaning material
Fiber cables According to the delivered cards
Multimeter Range 0-1000VAccuracy +/- 5%
ESD wristband
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3 Test result
Test Item Test result Memo
Pass Fail
Test of Battery Voltage
Communication Management Port
Function Test of EOW
Function Test of MDI/MDO
Cabling Test for Connected E1(75ohm) port
Cabling Test for Connected E1(120ohm) port
Cabling Test for Connected E3/DS3 port
Cabling Test for Connected STM-1E port
STM-1 Optical Mean Launch Power
STM-4 Optical Mean Launch Power
STM-16 Optical Mean Launch Power
STM-1 Optical Receive Power
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Test Item Test result Memo
Pass Fail
STM-4 Optical Receive Power
STM-16 Optical Receive Power
Ethernet Performance Test-FE
BOA Transmit Power
POA Transmit Power
RFC2544 Test for 8xFE/T
RFC2544 Test for 8xFE/L2
RFC2544 Test for 1xGE/T
Bit Error Test on E1 (12h)
Bit Error Test on E3 (12h)
Bit Error Test on DS3 (12h)
Bit Error Test on Line Side (12h, STM-1 trib)
Bit Error Test on Line Side (12h, STM-1E trib)
Bit Error Test on Line Side (12h, STM-4 trib)
Bit Error Test on Line Side (12h, STM-16 trib)
Packet Loss Test on 8xFE/T (12h,)
Packet Loss Test on 8xFE/L2 (12h,)
Packet Loss Test on 1xGE/T (12h,)
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4 Acceptance test procedure
4.1 Interface Test
4.1.1 Test of Battery Voltage
4.1.1.1 Test Purpose:
To avoid damages caused by the DC voltage outside the specification, the voltage needs to be checked before the initial power up of the system.
4.1.1.2 Test Setup:
Connect Multimeter with Power Distribution Panel, located on the top of the rack
4.1.1.3 Test diagram:
NA
4.1.1.4 Recommended Test Analyzer:
Multimeter
4.1.1.5 Test procedure:
Use the Multimeter to check DC voltage at the Power Distribution Panel of the rack for both power supply feeders.
4.1.1.6 Expected Result:
-40V to –72V
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4.1.1.7 Result Record
DC Voltage Comply with table above
Input1Complied Not Complied
Input2Complied Not Complied
4.1.1.8 Estimated Time consumption
0.1 hour
4.1.2 Check of the Management port
4.1.2.1 Test Purpose:
This test checks that the Management port is working correctly.
4.1.2.2 Test Setup:
Connect the Management port on the System Controller to a compatible 10 or 100Mbit Ethernet Interface. Use a cross over LAN cable for this connection.
4.1.2.3 Test diagram:
4.1.2.4 Test procedure:
1. Login to the NE with hiT7035 LCT;
2. Do some configurations via hiT7035 LCT.
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4.1.2.5 Expected result:
NE can be operated via LCT
4.1.2.6 Result Record:
Complied Not Complied
4.1.2.7 Estimated Time consumption
0.5 hour
4.1.3 Function Test of User Channel (F1)
4.1.3.1 Test Purpose:
This procedure tests that User-Channel (F1) is working correctly.
iiNote
This test is only done as field acceptance test if the User channel is used.
4.1.3.2 Test Setup:
1. Connect a SDH analyzer to one optical interface of NE;
2. Loop EOW port with a RJ45 connector.
3. RJ45 loop-connector should be made as the figure shown:
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4.1.3.3 Test diagram:
4.1.3.4 Recommended Test Analyzer:
SDH Analyzer
4.1.3.5 Test procedure:
1. Create OHCC to one line port such as STM-1 port by LCT.
2. Insert RJ45 loop-connector to EOW port.
3. Run overhead BER on SDH analyzer for 5 minutes.
4. Check for error free transmission at SDH analyzer.
4.1.3.6 Expected Result:
The overhead BER should run error free
4.1.3.7 Result Record:
F1 Byte Complied Not Complied
4.1.3.8 Estimated Time consumption
0.5 hour
4.1.4 Function Test of EOW channels
4.1.4.1 Test Purpose:
This procedure tests that EOW-Channels (E1 and E2) are working correctly.
iiNote
This test is only done as field acceptance test if the User channel is used.
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EOWPort
Port
OW Port
Line Port
SDH AnalyzerLoop withRJ45connetor
R
RJ45
Connector
oop with RJ45 Connector
o Loop with RJ45 Connector
p with RJ45 Connector
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4.1.4.2 Test Setup:
1. Connect EOW box to EOW port on NE;
2. Connect phone to EOW phone port.
4.1.4.3 Test diagram:
4.1.4.4 Test procedure:
1. Create OHCC to one line port such as STM-1 port by LCT.
2. Set phone number for every site.
3. Call each other.
4.1.4.5 Expected Result:
Communication can be established.
4.1.4.6 Result Record:
E1 byte Complied Not Complied
E2 byte Complied Not Complied
4.1.4.7 Estimated Time consumption
1 hour
4.1.5 Function Test of MDI/MDO
4.1.5.1 Test Purpose:
This procedure tests that MDI/MDO function of NE is working correctly.
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EOW Port
Line Port
Line Port
EOW Port
7035 Local Station 7035 Remote Station
EOW
BOX
EOW
BOX
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iiNote
This test is only done, if MDI/MDO is connected to a distributor (external equipment).
4.1.5.2 Test Setup:
Connect hiT7035 MDI/MDO interface with a distributor (external equipment).
For MDI, the active voltage range is -18V ~ -75V.
For MDO, the active activity is shortcut.
4.1.5.3 Test Diagram:
NA
4.1.5.4 Test procedure:
1. Configure MDI/MDO interface as required;
2. Check with test-equipment values on distributor.
For MDI, the active voltage range is -18V ~ -75V.
For MDO, the active activity is shortcut.
3. Additionally check alarms via hiT7035 LCT in MDI/MDO group.
4.1.5.5 Expected Result:
1. Test-equipment values on distributor will be changed according to specification;
2. Alarms of hiT7035 NE will be changed according to the setting.
4.1.5.6 Result Record
MDO Complied Not Complied
MDI Complied Not Complied
4.1.5.7 Estimated Time consumption
1 hour
4.1.6 E1 (75ohm) Cabling Test
4.1.6.1 Test Purpose:
This test gives the steps required to check the E1 (75ohm) port cabling of the hiT7035 63xE1 75ohm card.
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4.1.6.2 Test Setup:
1. Connect SDH/PDH Analyzer to the E1 port;
2. Loop Line port with external fiber, using a 10dB attenuator if needed.
4.1.6.3 Test diagram:
4.1.6.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.1.6.5 Test procedure:
1. Create cross-connection from every E1 port to line port looped by external fiber;
2. Do a short (few seconds) bit error test with the SDH/PDH analyzer for all E1 ports;
3. Use PRBS15 for 2 Mbit/s tribs.
4.1.6.6 Expected Result:
No bit errors.
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4.1.6.7 Result record:
Complied Not Complied
4.1.6.8 Estimated Time consumption
1 hour
4.1.7 E1 (120ohm) Cabling Test
4.1.7.1 Test Purpose:
This test gives the steps required to check the E1 (120ohm) port cabling of the hiT7035 63xE1 120ohm card.
4.1.7.2 Test Setup:
1. Connect SDH/PDH Analyzer to the E1 port;
2. Loop Line port with external fiber, using a 10dB attenuator if needed.
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4.1.7.3 Test diagram:
4.1.7.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.1.7.5 Test procedure:
1. Create cross-connection from every E1 port to line port looped by external fiber;
2. Do a short (few seconds) bit error test with the SDH/PDH analyzer for all E1 ports;
3. Use PRBS15 for 2 Mbit/s tribs.
4.1.7.6 Expected Result:
No bit errors.
4.1.7.7 Result record:
Complied Not Complied
4.1.7.8 Estimated Time consumption
1 hour
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4.1.8 E3/DS3 Cabling Test
4.1.8.1 Test Purpose:
This test gives the steps required to check the E3/DS3 port cabling of the hiT7035 E3/DS3 card.
4.1.8.2 Test Setup:
1. Connect SDH/PDH Analyzer to the E3/DS3 port;
2. Loop Line port with external fiber, using a 10dB attenuator if needed.
4.1.8.3 Test diagram:
4.1.8.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.1.8.5 Test procedure:
1. Create cross-connection from every E3/DS3 port to line port looped by external fiber;
2. Do a short (few seconds) bit error test with the SDH/PDH analyzer for all E3/DS3 ports;
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3. Use PRBS23 for 34 Mbit/s and PRBS15 for 45 Mbit/s tribs.
4.1.8.6 Expected Result:
No bit errors.
4.1.8.7 Result record:
Complied Not Complied
4.1.8.8 Estimated Time consumption
1 hour
4.1.9 STM-1E Cabling Test
4.1.9.1 Test Purpose:
This test gives the steps required to check the STM-1E port cabling of the hiT7035 STM-1E card.
4.1.9.2 Test Setup:
1. Connect SDH/PDH Analyzer to the STM-1E port;
2. Loop Line port with external fiber, using a 10dB attenuator if needed.
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4.1.9.3 Test diagram:
4.1.9.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.1.9.5 Test procedure:
1. Create VC4 cross-connection from every STM-1E port to line port looped by external fiber;
2. Do a short (few seconds) bit error test with the SDH/PDH analyzer for all STM-1E ports;
3. Use PRBS23 for STM-1E test.
4.1.9.6 Expected Result:
No bit errors.
4.1.9.7 Result record:
Complied Not Complied
4.1.9.8 Estimated Time consumption
1 hour
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4.1.10 STM-1 Optical Mean Launch Power
4.1.10.1 Test Purpose:
The test verifies that the optical mean launched power of STM1 port is within specification. The specification is based on the recommendations ITU-T G.957.
4.1.10.2 Test setup:
Connect Optical Power Meter to the optical output interface of STM-1.
4.1.10.3 Test diagram:
4.1.10.4 Recommended Test Analyzer:
Optical power meter
4.1.10.5 Test procedure:
1. Disable Auto laser shutdown function of the appropriate STM-1 port;
2. Record value of optical transmit power.
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STM -1optical.
Line
Line
MGMT Port
ODF
NE
Power Meter
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4.1.10.6 Expected Result:
SFP Type ITU Order number Mean launch power
1310 nm short haul S1.1 S42025-L5135–A1 -15dBm …. -8dBm
1310 nm long haul L1.1 S42025-L5134–A1 -5dBm …. 0dBm
1550 nm long haul L1.2 S42025-L5133–A1 -5dBm …. 0dBm
1550 nm long haul V.1.2 S42025-L5149-A1 0dBm …. 4dBm
4.1.10.7 Result Record:
SlotMean launch Power in dBm Comply with table above
Port1 Port2 Port3 Port4
Complied Not Complied
Complied Not Complied
4.1.10.8 Estimated Time consumption
0.1 hour
4.1.11 STM-4 Optical Mean Launch Power
4.1.11.1 Test Purpose:
The test verifies that the optical mean launched power of STM-4 port is within specification. The specification is based on the recommendations ITU-T G.957.
4.1.11.2 Test setup:
Connect Optical Power Meter to the optical output interface of STM-4.
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4.1.11.3 Test diagram:
4.1.11.4 Recommended Test Analyzer:
Optical power meter
4.1.11.5 Test procedure:
1. Disable Auto laser shutdown function of the appropriate STM-4 port;
2. Record value of optical transmit power.
4.1.11.6 Expected Result:
SFP Type ITU Order numberMean launch power
1310 nm short haul S4.1 S42025-L5132–A1 -15dBm …. -8dBm
1310 nm long haul L4.1 S42025-L5131–A1 -3dBm …. 2dBm
1550 nm long haul L4.2 S42025-L5130–A1 -3dBm …. 2dBm
1550 nm long haul V4.2 S42025-L5148–A1 0dBm …. 4dBm
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4.1.11.7 Result Record:
SlotMean launch Power in dBm Comply with table above
Port1 Port2 Port3 Port4
Complied Not Complied
Complied Not Complied
4.1.11.8 Estimated Time consumption
0.1 hour
4.1.12 STM-16 Optical Mean Launch Power
4.1.12.1 Test Purpose:
The test verifies that the optical mean launched power of STM-16 port is within specification. The specification is based on the recommendations ITU-T G.957.
4.1.12.2 Test setup:
Connect Optical Power Meter to the optical output interface of STM-16.
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4.1.12.3 Test diagram:
4.1.12.4 Recommended Test Analyzer:
Optical power meter
4.1.12.5 Test procedure:
1. Disable Auto laser shutdown function of the appropriate STM-16 port;
2. Record value of optical transmit power.
4.1.12.6 Expected Result:
SFP Type ITU Order numberMean launch power
1310 nm short haul S16.1 S42025-L5129–A1 -5dBm …. 0dBm
1310 nm long haul L16.1 S42025-L5128–A1 -2dBm …. 3dBm
1550 nm long haul L16.2 S42025-L5127–A1 -2dBm …. 3dBm
1550 nm long haul V16.2 S42025-L5141–A1 -2dBm …. 3dBm
1550 nm long haul U16.2 S42025-L5142–A1 -2dBm …. 3dBm
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4.1.12.7 Result Record:
SlotMean launch Power in dBm Comply with table above
Port1 Port2 Port3 Port4
Complied Not Complied
Complied Not Complied
4.1.12.8 Estimated Time consumption
0.1 hour
4.1.13 STM-1 Optical Receive Power
4.1.13.1 Test Purpose:
The test verifies that the optical receive power of STM1 port is within specification. The specification is based on the recommendations ITU-T G.957.
4.1.13.2 Test setup:
Connect STM-1 optical input to the optical power meter.
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4.1.13.3 Test diagram:
4.1.13.4 Recommended Test Analyzer:
Optical power meter
4.1.13.5 Test procedure:
1. Disable Auto laser shutdown function of the appropriate STM-1 port on the remote station;
2. Record value of optical receive power in the table below.
4.1.13.6 Expected Result:
SFP Type ITU Order number Receiving power
1310 nm short haul S1.1 S42025-L5135–A1 -28dBm …. -8dBm
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SFP Type ITU Order number Receiving power
1310 nm long haul L1.1 S42025-L5134–A1 -34dBm …. -10dBm
1550 nm long haul L1.2 S42025-L5133–A1 -34dBm …. -10dBm
1550 nm long haul V1.2 S42025-L5149-A1 -34dBm …. -10dBm
4.1.13.7 Expected Result:
SlotReceive Power in dBm Comply with table above
Port1 Port2 Port3 Port4
Complied Not Complied
Complied Not Complied
4.1.13.8 Estimated Time consumption
0.1 hour
4.1.14 STM-4 Optical Receive Power
4.1.14.1 Test Purpose:
The test verifies that the optical receive power of STM-4 port is within specification. The specification is based on the recommendations ITU-T G.957.
4.1.14.2 Test setup:
Connect STM-4 optical input to optical power meter.
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4.1.14.3 Test diagram:
4.1.14.4 Recommended Test Analyzer:
Optical power meter
4.1.14.5 Test procedure:
1. Disable Auto laser shutdown function of the appropriate STM-4 port on the remote station;
2. Record value of optical receive power in the table below.
4.1.14.6 Expected Result:
SFP Type ITU Order number Receiving power
1310 nm short haul S4.1 S42025-L5132–A1 -28dBm …. -8dBm
1310 nm long haul L4.1 S42025-L5131–A1 -28dBm …. -8dBm
1550 nm long haul L4.2 S42025-L5130–A1 -28dBm …. -8dBm
1550 nm long haul V4.2 S42025-L5148–A1 -34dBm …. -18dBm
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4.1.14.7 Result Record:
SlotReceive Power in dBm Comply with table above
Port1 Port2 Port3 Port4
Complied Not Complied
Complied Not Complied
4.1.14.8 Estimated Time consumption
0.1 hour
4.1.15 STM-16 Optical Receive Power
4.1.15.1 Test Purpose:
The test verifies that the optical receive power of STM-16 port is within specification. The specification is based on the recommendations ITU-T G.957.
4.1.15.2 Test setup:
Connect STM-16 optical input to optical power meter.
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4.1.15.3 Test diagram:
4.1.15.4 Recommended Test Analyzer:
Optical power meter
4.1.15.5 Test procedure:
1. Disable Auto laser shutdown function of the appropriate STM-16 port on the remote station;
2. Record value of optical receive power in the table below.
4.1.15.6 Expected Result:
SFP Type ITU Order number Receiving power
1310 nm short haul S16.1 S42025-L5129–A1 -18dBm …. 0dBm
1310 nm long haul L16.1 S42025-L5128–A1 -27dBm …. -9dBm
1550 nm long haul L16.2 S42025-L5127–A1 -28dBm …. -9dBm
1550 nm long haul V16.2 S42025-L5141–A1 -28dBm …. -9dBm
1550 nm long haul U16.2 S42025-L5142–A1 -28dBm …. -9dBm
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4.1.15.7 Result Record:
SlotReceive Power in dBm Comply with table above
Port1 Port2 Port3 Port4
Complied Not Complied
Complied Not Complied
4.1.15.8 Estimated Time consumption
0.1 hour
4.1.16 BOA Transmit Power
4.1.16.1 Test Purpose:
The test verifies that the BOA card transmit power.
4.1.16.2 Test setup:
Connect one optical card Tx into BOA Rx. If necessary, add an adjustable attenuator to make the received optical power of BOA card in the allowed range.
4.1.16.3 Test diagram:
4.1.16.4 Recommended Test Analyzer:
Optical power meter
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Line card
BOA
Tx
Rx
Tx
Attenuator
Optical power meter
Local station
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4.1.16.5 Test procedure:
1. Disable Auto laser shutdown function of the appropriate optical port on the local station;
2. Adjust the attenuator to make the received optical power of BOA is in range.
About input optical power range, please refer to the table list below:
BOA Type Optical power range
13dBm BOA-10dBm …. 3dBm
15dBm BOA-10dBm …. 3dBm
18dBm BOA-10dBm …. 3dBm
3. Record values of BOA launch power.
4.1.16.6 Expected Result:
BOA Type Order number launch power
13dBm BOA S42024-L5465-A1 13dBm
15dBm BOA S42024-L5466-A1 15dBm
18dBm BOA S42024-L5467-A1 18dBm
4.1.16.7 Result Record:
BOA Type launch power
13dBm BOA
15dBm BOA
18dBm BOA
4.1.16.8 Estimated Time consumption
0.1 hour
4.1.17 POA Transmit Power
4.1.17.1 Test Purpose:
The test verifies that the POA card transmit power.
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4.1.17.2 Test setup:
Connect one optical card Tx into POA Rx. If necessary, add an adjustable attenuator to make the received optical power of POA card in the allowed range.
4.1.17.3 Test diagram:
4.1.17.4 Recommended Test Analyzer:
Optical power meter
4.1.17.5 Test procedure:
4. Disable Auto laser shutdown function of the appropriate optical port on the local station;
5. Adjust the attenuator to make the received optical power of BOA is in range.
About input optical power range, please refer to the table list below:
POA Type Optical power range
20dB POA -35dBm …. -15dBm
6. Record values of POA launch power.
4.1.17.6 Expected Result:
BOA Type Order number launch power
20dB POA S42024-L5468-A1 -15dBm …. 5dBm
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Line card
POA
Tx
Rx
Tx
Attenuator
Optical power meter
Local station
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4.1.17.7 Result Record:
POA Type launch power
20dB POA
4.1.18 Ethernet Performance Test – RFC2544 test for 8xFE/T
4.1.18.1 Test Purpose:
This test gives the steps required to measure the Ethernet performance of the 8xFE/T card of hiT 7035.
4.1.18.2 Test setup:
Connect the port1 and port2 of Data analyzer to port1 and port2 of FE card on local station.
4.1.18.3 Test diagram:
4.1.18.4 Recommended Test Analyzer:
Data Analyzer
4.1.18.5 Test procedure:
Set up a 100M Ethernet traffic according to the test diagram, the step is as followed:
1. Create 46 VC12 cross-connection from Ethernet card FE port1 to CC_LC1 port.
2. Create 46 VC12 cross-connection from Ethernet card FE port2 to CC_LC2 port
3. Use fiber to connect CC_LC1 port and CC_LC2 port.
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4. Confirm the traffic can transfer along FE1(local)CC_LC1 port(local) CC_LC2 port(local)FE2(local), and the reverse direction is as well.
5. Run the Data analyzer to measure the RFC2544.
4.1.18.6 Reference Result:
Throughput:
Frame Size Passed Rate (%) P1 to P2(pks /sec) Total
64 100 148810 148810
128 100 84459 84459
256 100 45290 45290
512 100 23496 23496
1024 100 11973 11973
1280 100 9615 9615
1518 100 8127 8127
1522 100 8106 8106
1536 100 8033 8033
Test duration (sec): 10 Number of trials: 1
Initial rate: 100 % Maximum rate: 100 %
Back-to-Back:
Frame Size Passed Rate (%) P1 to P2(Frames) Total
64 100 1488100 1488100
128 100 844590 844590
256 100 452900 452900
512 100 234960 234960
1024 100 119730 119730
1280 100 96150 96150
1518 100 81270 81270
1522 100 81060 81060
1536 100 80330 80330
Test duration (sec): 2 Number of trials: 1
Initial rate: 100 % Maximum rate: 100 %
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Latency
Frame Size Rate Tested (%) P1 to P2(us)-S&F Average
64 100 526.2 526.2
128 100 532.0 532.0
256 100 541.3 541.3
512 100 564.5 564.5
1024 100 606.4 606.4
1280 100 625.0 625.0
1518 100 640.7 640.7
1522 100 641.5 641.5
1536 100 641.9 641.9
Test duration (sec): 10 Number of pairs: 1
Initial rate: 100 % Maximum rate: 100 %
Frame Packet Loss:
Frame Size Rate Tested (%) P1 to P2 (%) Average
64 100 0.000 0.000
128 100 0.000 0.000
256 100 0.000 0.000
512 100 0.000 0.000
1024 100 0.000 0.000
1280 100 0.000 0.000
1518 100 0.000 0.000
1522 100 0.000 0.000
1536 100 0.000 0.000
Test duration (sec): 10 Number of trials: 1
Initial rate:100 % Maximum rate: 100 %
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4.1.18.7 Result Record:
Throughput:
Frame Size
Passed Rate(%)
P1 to P2 (pks/sec)
Total Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100.00% Maximum rate: 100.00%
Resolution rate: 1.00%
Back-to-Back:
Frame Size
Passed Rate(%)
P1 to P2 (Frames)
Total Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100.00% Maximum rate: 100.00%
Resolution rate: 1.00%
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Latency
Frame Size
Rate Tested (%)
P1 to P2(us)-S&F
Average Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100 % Maximum rate: 100 %
Frame Packet Loss:
Frame Size
Rate Tested (%)
P1 to P2 (%) Average Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100% Maximum rate: 100%
4.1.18.8 Estimated Time consumption
4 hours
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4.1.19 Ethernet Performance Test – RFC2544 test for 8xFE/L2
4.1.19.1 Test Purpose:
This test gives the steps required to measure the Ethernet performance of the 8xFE/L2 card of hiT 7035.
4.1.19.2 Test setup:
Connect the port1 and port2 of Data analyzer to port1 and port2 of FE card on local station.
4.1.19.3 Test diagram:
4.1.19.4 Recommended Test Analyzer:
Data Analyzer
4.1.19.5 Test procedure:
Set up a 100M Ethernet traffic according to the test diagram, the step is as followed:
1. Configure both 8FE/L2 cards work on DoubleTag mode.
2. Configure LAN1 and LAN2 work on detag mode.
3. Configure WAN1 and WAN2 work on detag mode.
4. Configure both LAN1 and WAN1 with the same PVID such as 11, and in the same VLAN list 11.
5. Configure both LAN2 and WAN2 with the same PVID such as 22, and in the same VLAN list 22.
6. Create 46 VC12 cross-connection from Ethernet card WAN1 to CC_LC1 port.
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7. Create 46 VC12 cross-connection from Ethernet card WAN2 to CC_LC2 port.
8. Use fiber to connect CC_LC1 port and CC_LC2 port
9. Confirm the traffic can transfer along FE1(local)CC_LC1 port(local) CC_LC2 port(local)FE2(local), and the reverse direction is as well.
10. Run the Data analyzer to measure the RFC2544.
4.1.19.6 Reference Result:
Throughput:
Frame Size Passed Rate (%) P1 to P2(pks /sec) Total
64 100 148810 148810
128 100 84459 84459
256 100 45290 45290
512 100 23496 23496
1024 100 11973 11973
1280 100 9615 9615
1518 100 8127 8127
1522 100 8106 8106
1536 100 8033 8033
Test duration (sec): 10 Number of trials: 1
Initial rate: 100 % Maximum rate: 100 %Back-to-Back:
Frame Size Passed Rate (%) P1 to P2(Frames) Total
64 100 1488100 1488100
128 100 844590 844590
256 100 452900 452900
512 100 234960 234960
1024 100 119730 119730
1280 100 96150 96150
1518 100 81270 81270
1522 100 81060 81060
1536 100 80330 80330
Test duration (sec): 10 Number of trials: 1
Initial rate: 100 % Maximum rate: 100 %
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Latency
Frame Size Rate Tested (%) P1 to P2(us)-S&F Average
64 100 304.4 304.4
128 100 319.1 319.1
256 100 349.3 349.3
512 100 404.6 404.6
1024 100 528.4 528.4
1280 100 589.5 589.5
1518 100 647.8 647.8
1522 100 649.2 649.2
1536 100 650.4 650.4
Test duration (sec): 10 Number of pairs: 1
Initial rate: 100 % Maximum rate: 100 %
Frame Packet Loss:
Frame Size Rate Tested (%) P1 to P2 (%) Average
64 100 0.000 0.000
128 100 0.000 0.000
256 100 0.000 0.000
512 100 0.000 0.000
1024 100 0.000 0.000
1280 100 0.000 0.000
1518 100 0.000 0.000
1522 100 0.000 0.000
1536 100 0.000 0.000
Test duration (sec): 10 Number of trials: 1
Initial rate:100 % Maximum rate: 100 %
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4.1.19.7 Result Record:
Throughput:
Frame Size
Passed Rate(%)
P1 to P2 (pks/sec)
Total Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100.00% Maximum rate: 100.00%
Resolution rate: 1.00%
Throughput:
Frame Size
Passed Rate(%)
P1 to P2 (Frames)
Total Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100.00% Maximum rate: 100.00%
Resolution rate: 1.00%
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Latency
Frame Size
Rate Tested (%)
P1 to P2(us)-S&F
Average Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100 % Maximum rate: 100 %
Frame Packet Loss:
Frame Size
Rate Tested (%)
P1 to P2 (%) Average Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100% Maximum rate: 100%
4.1.19.8 Estimated Time consumption
4 hours
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4.1.20 Ethernet Performance Test – RFC2544 Test for 1xGE/T
4.1.20.1 Test Purpose:
This test gives the steps required to measure the Ethernet performance of the GE card (1xGE/T) of hiT 7035.
4.1.20.2 Test setup:
1. Connect the GE1 port of Data analyzer to GE card1 on local station.
2. Connect the GE2 port of Data analyzer to GE card2 on local station.
3. Use fiber to connect the line card ports. If necessary, use a attenuator.
4.1.20.3 Test diagram:
4.1.20.4 Recommended Test Analyzer:
Data Analyzer
4.1.20.5 Test procedure:
Set up a GE Ethernet traffic according to the test diagram, the step is as followed:
1. Create 4 VC4 cross-connection from GE card1 port to CC_LC1 port.
2. Create 4 VC4 cross-connection from GE card2 port to CC_LC2 port.
3. Use fiber to connect CC_LC1 port and CC_LC2 port.
4. Configure the local station Ethernet card , then we can confirm the traffic can transfer along GE(local)CC_LC1 port(local)CC_LC2 port(local) GE(local).
5. Run the Data analyzer to measure the RFC2544.
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4.1.20.6 Reference Result:
Throughput:
Frame Size Passed Rate (%) P1 to P2(pks /sec) Total
64 68.85 1024590 1024590
128 64.91 548246 548246
256 62.44 282805 282805
512 61.29 144009 144009
1024 60.63 72590 72590
1280 59.96 57657 57657
1518 59.98 48752 48752
1522 60.00 48638 48638
1536 59.43 47746 47746
Test duration (sec): 10 Number of trials: 1
Initial rate: 50 % Maximum rate: 70 %
Back-to-Back:
Frame Size Passed Rate (%) P1 to P2(Frames) Total
64 100.00 29061 29061
128 100.00 16493 16493
256 100.00 9946 9946
512 100.00 5161 5161
1024 100.00 2336 2336
1280 100.00 1874 1874
1518 100.00 1583 1583
1522 100.00 1582 1582
1536 100.00 1565 1565
Test duration (sec): 10 Number of trials: 1
Initial rate: 100 % Maximum rate: 100 %
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Latency
Frame Size Rate Tested (%) P1 to P2(us)-S&F Average
64 60 60.7 60.7
128 60 62.7 62.7
256 60 65.7 65.7
512 60 67.5 67.5
1024 60 75.7 75.7
1280 60 80.6 80.6
1518 60 85.4 85.4
1522 60 86.0 86.0
1536 60 89.0 89.0
Test duration (sec): 10 Number of pairs: 1
Initial rate: 60 % Maximum rate: 60 %
Frame Packet Loss:
Frame Size Rate Tested (%) P1 to P2 (%) Average
64 60 0.000 0.000
128 60 0.000 0.000
256 60 0.000 0.000
512 60 0.000 0.000
1024 60 0.000 0.000
1280 60 0.000 0.000
1518 60 0.000 0.000
1522 60 0.000 0.000
1536 60 0.000 0.000
Test duration (sec): 10 Number of trials: 1
Initial rate: 60 % Maximum rate: 60 %
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4.1.20.7 Result Record:
Throughput:
Frame Size
Passed Rate(%)
P1 to P2 (pks/sec)
Total Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 50.00% Maximum rate: 70.00%
Resolution rate: 1.00%
Back-to-Back:
Frame Size
Passed Rate(%)
P1 to P2 (Frames)
Total Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 100.00% Maximum rate: 100.00%
Resolution rate: 1.00%
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Latency
Frame Size
Rate Tested (%)
P1 to P2(us)-S&F
Average Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 60 % Maximum rate: 60 %
Frame Packet Loss:
Frame Size
Rate Tested (%)
P1 to P2 (%) Average Comply with table above
64 Complied Not Complied
128 Complied Not Complied
256 Complied Not Complied
512 Complied Not Complied
1024 Complied Not Complied
1280 Complied Not Complied
1518 Complied Not Complied
1522 Complied Not Complied
1536 Complied Not Complied
Test duration (sec): 10 Number of trials: 1
Initial rate: 60% Maximum rate: 60%
4.1.20.8 Estimated Time consumption
4 hours
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4.1.21 IMA Function Test
4.1.21.1 Test Purpose:
The test verifies that the IMA basic function.
4.1.21.2 Test setup:
Connect the ATM analyzer 155M optical port to IMA IO port 1. Use fiber to loop the line card such as STM-1 port.
Notes: Please restart the correlative IMA group, after the loop is removed.
4.1.21.3 Test diagram:
4.1.21.4 Recommended Test Analyzer:
ATM analyzer
4.1.21.5 Test procedure:
1. Assign an IMA group with 8 links.
2. Create a point to point VP/VC connection between IMA group and IMA uplink. Such as IMA group related VPI/VCI is 255/300; IMA uplink related VPI/VCI is 255/400
3. Create VC-12 cross connections between the IMA group related 8 IMA E1 ports and line card stm-1 port.
4. Set up an ATM stream with VPI/VCI 255/400 on ATM analyzer, and run with 16M bandwidth.
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4.1.21.6 Expected Result:
Traffic is error free.
4.1.21.7 Result Record:
Complied Not Complied
4.1.21.8 Estimated Time consumption
30minutes
4.2 Network Test
4.2.1 Bit Error Test on E1 (12h)
4.2.1.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Bit error measurement of E1 (12hours)
4.2.1.2 Test Setup:
1. Connect SDH/PDH Analyzer with hiT7035 E1 port on Local station;
2. Loop E1 port with external cable on remote station.
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4.2.1.3 Test diagram:
4.2.1.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.2.1.5 Test procedure:
1. Create a VC12 level cross-connection from an appropriate E1 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
2. Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 2MBit/s during 12h (PRBS15).
4.2.1.6 Expected Result
Error free.
4.2.1.7 Result Record
Complied Not Complied
4.2.1.8 Estimated Time consumption
13 hours
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4.2.2 Bit Error Test on E3 (12h)
4.2.2.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Bit error measurement of E3 (12hours)
4.2.2.2 Test Setup:
1. Connect SDH/PDH Analyzer with hiT7035 E3 port on Local station;
2. Loop E3 port with external cable on remote station.
4.2.2.3 Test diagram:
4.2.2.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.2.2.5 Test procedure:
1. Create a VC3 level cross-connection from an appropriate E3 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
2. Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 34MBit/s during 12h (PRBS23).
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4.2.2.6 Expected Result
Error free.
4.2.2.7 Result Record
Complied Not Complied
4.2.2.8 Estimated Time consumption
13 hours
4.2.3 Bit Error Test on DS3 (12h)
4.2.3.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Bit error measurement of DS3 (12hours)
4.2.3.2 Test Setup:
1. Connect SDH/PDH Analyzer with hiT7035 DS3 port on Local station;
2. Loop DS3 port with external cable on remote station.
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4.2.3.3 Test diagram:
4.2.3.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.2.3.5 Test procedure:
1. Create a VC3 level cross-connection from an appropriate DS3 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
2. Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 45MBit/s during 12h (PRBS15).
4.2.3.6 Expected Result
Error free.
4.2.3.7 Result Record
Complied Not Complied
4.2.3.8 Estimated Time consumption
13 hours
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4.2.4 Bit Error Test on Line Side (12h, STM-1 trib)
4.2.4.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-1trib)
4.2.4.2 Test Setup:
1. Connect SDH/PDH Analyzer with hiT7035 STM1 port on Local station;
2. Loop STM1 port with external fiber on remote station.
4.2.4.3 Test diagram:
4.2.4.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.2.4.5 Test procedure:
1. Create a VC4 level cross-connection from an appropriate STM-1 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
2. Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
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4.2.4.6 Expected Result
Error free.
4.2.4.7 Result Record
Complied Not Complied
4.2.4.8 Estimated Time consumption
13 hours
4.2.5 Bit Error Test on Line Side (12h, STM-1E trib)
4.2.5.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-1E trib)
4.2.5.2 Test Setup:
1. Connect SDH/PDH Analyzer with hiT7035 STM1E port on Local station;
2. Loop STM1E port with external cable on remote station.
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4.2.5.3 Test diagram:
4.2.5.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.2.5.5 Test procedure:
1. Create a VC4 level cross-connection from an appropriate STM-1E port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
2. Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
4.2.5.6 Expected Result
Error free.
4.2.5.7 Result Record
Complied Not Complied
4.2.5.8 Estimated Time consumption
13 hours
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4.2.6 Bit Error Test on Line Side (12h, STM-4 trib)
4.2.6.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-4 trib)
4.2.6.2 Test Setup:
1. Connect SDH/PDH Analyzer with hiT7035 STM4 port on Local station;
2. Loop STM4 port with external fiber on remote station.
4.2.6.3 Test diagram:
4.2.6.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.2.6.5 Test procedure:
1. Create a VC4 level cross-connection from an appropriate STM-4 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
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2. Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
4.2.6.6 Expected Result
Error free.
4.2.6.7 Result Record
Complied Not Complied
4.2.6.8 Estimated Time consumption
13 hours
4.2.7 Bit Error Test on Line Side (12h, STM-16 trib)
4.2.7.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-16 trib)
4.2.7.2 Test Setup:
1. Connect SDH/PDH Analyzer with hiT7035 STM-16 port on Local station;
2. Loop STM-16 port with external fiber on remote station, if necessary add a 10dB attenuator when loop the STM-16 port.
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4.2.7.3 Test diagram:
4.2.7.4 Recommended Test Analyzer:
SDH/PDH Analyzer
4.2.7.5 Test procedure:
1. Create a VC4 level cross-connection from an appropriate STM-16 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
2. Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
4.2.7.6 Expected Result
Error free.
4.2.7.7 Result Record
Complied Not Complied
4.2.7.8 Estimated Time consumption
13 hours
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4.2.8 Packet Loss Test on Ethernet Card (12h, 8xFE/T)
4.2.8.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Packet Loss measurement of line side (12hours, measured via 8xFE/T)
4.2.8.2 Test Setup:
Connect Data Analyzer port1 and port2 with hiT 7035 8xFE/T card FE port1 and port2 on Local station.
4.2.8.3 Test diagram:
4.2.8.4 Recommended Test Analyzer:
Data Analyzer
4.2.8.5 Test procedure:
1. Create two VC12-46v cross-connection from an appropriate 8xFE/T card to the Line side on local station and remote station;
2. Confirm the traffic can transfer along FE1(local)STM-N port1(local)STM-N port1(remote)FE1(Remote) FE2(Remote) STM-N port1(remote) STM-N port1(local) FE2(local).
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3. Do a packet loss measurement on the Data analyzers and perform a packet loss measurement with 90MBit/s signal during 12h (Packet length is 64Byte).
4.2.8.6 Expected Result
No Packet Loss
4.2.8.7 Result Record
Complied Not Complied
4.2.8.8 Estimated Time consumption
13 hours
4.2.9 Packet Loss Test on Ethernet Card (12h, 8xFE/L2)
4.2.9.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Packet Loss measurement of line side (12hours, measured via 8xFE/L2)
4.2.9.2 Test Setup:
Connect Data Analyzer port1 and port2 with hiT 7035 8xFE/L2 card FE port1 and port2 on Local station.
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4.2.9.3 Test diagram:
4.2.9.4 Recommended Test Analyzer:
Data Analyzer
4.2.9.5 Test procedure:
1. Configure 8FE/L2 cards work on DoubleTag mode.
2. Configure LAN1 and LAN2 work on detag mode.
3. Configure WAN1 and WAN2 work on detag mode.
4. Configure both LAN1 and WAN1 with the same PVID such as 11, and both LAN1 and WAN1 are in the same VLAN list such as 11.
5. Configure both LAN2 and WAN2 with the same PVID such as 22, and both LAN2 and WAN2 are in the same VLAN list such as 22.
6. Create two VC12-46v cross-connection from WAN1 to CC_LC1 and WAN2 to CC_LC2 on local station and remote station;
7. Confirm the traffic can transfer along FE1(local)CC_LC1 port(local) CC_LC1 port(remote)FE1(Remote) FE2(Remote) CC_LC2 port(remote) CC_LC1 port(local) FE2(local).
8. Do a packet loss measurement on the Data analyzers and perform a packet loss measurement with 90MBit/s signal during 12h (Packet length is 64Byte).
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4.2.9.6 Expected Result
No Packet Loss
4.2.9.7 Result Record
Complied Not Complied
4.2.9.8 Estimated Time consumption
13 hours
4.2.10 Packet Loss Test on Ethernet Card (12h, 1xGE/T Card)
4.2.10.1 Test Purpose:
This test gives the steps required to measure the line between two terminal NE’s. The following item will be tested: Packet Loss measurement of line side (12hours, measured via 1GE/T)
4.2.10.2 Test Setup:
1. Connect Data Analyzer with hiT 7035 GE card GE port on Local station.
2. Use fiber to loop the GE port on remote station. If necessary.
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4.2.10.3 Test diagram:
4.2.10.4 Recommended Test Analyzer:
Data Analyzer
4.2.10.5 Test procedure:
1. Create a VC4-4v cross-connection from an appropriate 1xGE/T card to the Line side on local station and remote station;
2. Confirm the traffic can transfer along GE(local)STM-N port1(local)STM-N port1(remote)GE(local)loopback.
3. Do a packet loss measurement on the Data analyzers and perform a packet loss measurement with 540MBit/s signal during 12h (Packet length is 64Byte).
4.2.10.6 Expected Result
No Packet Loss
4.2.10.7 Result Record
Complied Not Complied
4.2.10.8 Estimated Time consumption
13 hours
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Abbreviations
Abbreviations
ACO Alarm Cut Off
Bw7R Style 7R
CD-ROM Compact Disc Read Only Memory
DB Data Base
DC Direct Current
DCC Data Communication Channel
EGB Elektrostatisch Gefährdete Bauteile
EMC Electromagnetic Compatibility
EN European Standard
EOW Engineering Order Wire
ESD Electrostatic Sensitive Device
ETS European Telecommunication Standard
ETSI European Telecommunications Standards Institute
F Standardized interface for connection of a local terminal
FAULT Fault Alarm LED
FO Fiber Optic
GMT Greenwich Mean Time
GND Ground
GUI Graphical User Interface
GUIMN Graphical User Interface Manual
HS Handset
HW Hardware
IEC International Electrotechnical Commission
LCAS Link Capacity Adjustment Scheme
LCT Local Craft Terminal
LED Light Emitting Diode
LWL Lichtwellenleiter (optical fiber)
MSP Multiplex Section Protection
NCT Network Craft Terminal
NUBAT Negative Power Supply Voltage
OK Service LED
OSN Optical Service Node
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Abbreviations
PDF Portable Document Format
PE Protective Earth (Ground)
PPP Point to Point Protocol
PUBAT Positive Power Supply Voltage
RAM Random Access Memory
Rx Received signal
SDI Serial Debug Interface
SEC SDH Equipment Clock
SELV Separate Extra-Low Voltage
SFP Small Form Factor Pluggable (Module)
SNCP Sub-Network Connection Protection
SW Software
T3 Clock input
T4 Clock output
TIF Telemetry Interface
TNMS Telecommunication Network Management System
Tx Transmitted signal
UMN User Manual
VCDB Variable Configuration Data Block
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