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Solution de test RF et hyperfréquences intégrée basée sur une architecture synthétique
Aeroflex 7700 IntegratedMicrowave Test System
11 avril 2013
4/12/20131 Aeroflex Proprietary
www.aeroflex.com2
Definition & background
▼ Synthetic instruments– “synthesize” the stimulus and
measurement capabilities found in traditional test instruments through a combination of software algorithms and hardware modules that are based on core instrumentation circuit building blocks.
– Signals generation or measurements are using numeric processing techniques.
Spectrum AnalyzerDSP
Network Analyzer(measurement side)
DSP
OscilloscopeDSP
Synthetic Instrument
DSP
▼ “Synthetic Instrumentation” was first inspired by the US Department of Defense (DoD) to describe a new test architecture that would support the charter of their group
– Identify and develop generic test system elements that significantly impact costs and interoperability,
– Open system architecture– Flexible insertion of updates and
new technology
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Aeroflex Synthetic System Heritage
▼ Aeroflex has been delivering synthetic test systems since 1998 for use in different application spaces
– These systems share a general synthetic architectur e, software and complete user interface and development environment
– Over 50+ complete systems delivered and in use in t he United States and Europe
▼ Moving to full PXI environment with common platform interface– Reduced footprint & price, faster, dedicated instru ment “feel” for troubleshooting
4/12/2013 Aeroflex Proprietary3
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Complete Test Environment for RF & Microwaves
Power Meter
Signal Source
Modulation Analyzer
Noise Figure Analyzer
Network Analyzer
Spectrum Analyzer
4/12/2013 Aeroflex Company Confidential4
▼ The 7700 is the industry’s most complete ATE in a box solution
▼ The 7700 combines a synthetic hardware environment with a full featured test executive and DUT control
▼ This approach provides a dramatic reduction in total costs for RF component and module testing
– Eliminates months of software development
– Provides best in class measurement speed and uncertainty
– Provides seamless upgrade integration Synthetic advantage
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Functionality of many Instruments in One Box
Spectrum Phase NoiseNoise Figure
S-parameters
Time Domain versus DUT State Compression, TOI and AM/PM Noise Power Ratio
4/12/2013 Aeroflex Company Confidential5
The single 7700 unit produces the same results as a combination of many traditional instruments
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A True Synthetic Architecture
▼ Reduces Hardware Development Costs– Synthetic approach utilizes common hardware for man y applications
– Smaller footprint than traditional rack and stack
– Mature system level calibration scheme
– Reduced hardware upgrade cost
– System can be programmed for many different uses an d programs
– Systems are inherently more flexible than dedicated instruments and can perform new measurements as required
▼ Reduces Manufacturing Costs– Integrated solution including DUT control yields fa ster measurements than
traditional rack and stack solutions
4/12/2013 Aeroflex Company Confidential6
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Repeatable and Consistent performance
▼ Reduce errors– The system is calibrated to the plane of the device and includes cables and test
fixtures
– More accurate than traditional methods
– Less retest
▼ Reduced Support Costs with Superior Calibration Sch eme– Calibration is performed using a few key standards and doesn’t require a
calibration cart
▼ Cost effective– Don’t need to remove instruments from the station f or calibration
▼ Minimal downtime– Calibration is performed by operator using the AMC with user prompts and looks
just like another test
▼ Simple and safe
4/12/2013 Aeroflex Company Confidential7
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Performance at the DUT level
▼ Specified and demonstrated system level performance at the DUT that matches traditional instrument based systems specif ied at the instrument
– Reduces re-test and improves yield (less rejections due to measurement error)
8
Traditional System Rack
7700 DUT Test Fixture
DUT Test Fixture
DUT
DUT
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Continuity with legacy systems
Also Systems can emulate traditional instrument tec hniques
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Spectrum measurement of a pulsed RF Signal - 7700
Spectrum measurement of a pulsed RF Signal – Traditional Instrument
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Superior Performance at the plane of the DUT
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Power setability and power measurement performanceComparison of synthetic power measurement versus po wer senor
-1.00
0.00
1.00
2.00
3.00
4.00
-12 -10 -8 -6 -4 -2 0 2 4 6
Input Power (dBm)
Mea
sure
d P
ower
(d
Bm
)
Pow er SensorCompression (dB)
AMCCompression (dB)
Noise Figure MeasurementComparison of Noise Figure Meter and Synthetic Solu tion
-1
-0.8
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
1
5 7 9 11 13 15 17 19
Freq (GHz)
Diff
eren
ce (
dB)
Error (dB)
High Spec (dB)
Low Spec (dB)
S-Parameter MeasurementSMART^E and PNA
-11.4-11.2
-11-10.8-10.6-10.4-10.2
-10-9.8-9.6
0 5 10 15 20 25
Frequency (GHz)
Mag
nitu
de (
dB)
S21 Mag 10dBPad
S21 Mag 10dBPadCharacterizationS21 Mag 10dBPad Low Spec
S21 Mag 10dBPad High Spec
Phase MeasurementDifference between SMART^E and PNA
-4-3-2-101234
0 10 20
Frequency (GHz)D
iffer
ence
in P
hase
(deg
)
S21 Phs Dev10dB Pad
S12 Phs Dev10dB Pad
Phase LowSpec (deg)
Phase HighSpec (deg)
Power Calibration and Measurement VNA - Amplitude
Noise Figure Measurement VNA - Phase
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Different software interfaces to the user
▼ Reduces Software Development – Many test plans can be implemented with no software development
▼ Eliminates months of software development
▼ Integration into existing factory infrastructure wi th lower integration costs
▼ Flexibility– Host Library (DLL) Interface
▼ Direct access to DLL
▼ Complex measurement are implemented via python scri pts or by calling software using measurement results
▼ Similar to a traditional instrument DLL interface– Local Interface
▼ AMC development includes user programmable front p anels
▼ Measurements implemented in TestStand sequences
▼ Instrument look and feel for operator– Remote Interface
▼ Supported by AMC
▼ Inputs test parameters and high level commands (exe cute, stop, etc)
▼ Outputs test results
4/12/2013 Aeroflex Company Confidential11
www.aeroflex.com4/12/2013 Aeroflex Company Confidential12
Full Featured Execution and Test Environment
Single TestInstrument Look and Feel!
Queue of TestsUser Programmable!
Real-Time Debug
▼ System Delivered with Aeroflex Measurement Console (AMC)– Full featured Test Executive
– Data collection and qualification (pass/fail)
– Built in test sequences
– Report generation– Local or remote control
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DUT Control and Configurable
▼ Drastically reduces cost for DUT control developmen t– Integral programmable pattern generator can be used to provide complex DUT
control
– All the unique details of the DUT control are conta ined in one routine (DUT.dll) and the customer can develop their own DUT.dll inde pendently of Aeroflex
– The test sequences delivered with the system contai n hooks to control the DUTs
– Therefore, the system can be used across many progr ams and DUTs
▼ Reduces training cost– System options can be added to match many different applications
– Third party equipment can be integrated into a comp lete system with minimal development
– Core system, user interface and calibration remains the same
4/12/2013 Aeroflex Company Confidential13
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Sample Configurations
4/12/2013 Aeroflex Company Confidential14
Aeroflex RF Multiplexer
Stimulus
Response
DutControl
DC Power
Stimulus
Response
DC Power
Stimulus/Response
(quantity 12)
DUTControl
DC Power(high current/
multiple)
Environmental ChamberEnvironmentalChamberControl
Test a simple component
Test a subassembly with custom control
Test multiple subassemblies in production environme nt
DC Supply
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7700 base unit▼ 1 MHz to 3 GHz or 6 GHz frequency coverage
▼ Stimulus and response to 32 GHz with external hardw are
▼ Stimulus– Power: from +5 dBm to +30dBm
– AWG based signal generation with 90 MHz instantaneou s BW
– Waveform memory from standard 128 Msamples to 512 Msamples
– Fast frequency switching
– Hardware pulse gating
▼ Measurements and Panels included which generate sti mulus and make response measurements– Spectrum Analyzer, S-parameter, Noise Figure, Phase Noise,
Time Domain, Power Meter ..
▼ Full set of calibration and diagnostic routines
4/12/2013 Aeroflex Company Confidential15
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Key Markets
▼ Aerospace Defense Component and Module Manufacturing
– T/R Modules (R&D, verification, mfg., repair)
– Satellite
– Amplifiers (LNA, TWTA..)
– Oscillators/Mixers
– EW Pods/Jammers
▼ Depot Repair and Quality Assurance A&D components
– T/R Modules
– EW subassemblies
▼ RF & Wireless Components
4/12/2013 Aeroflex Company Confidential16
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Case Study – TR Module Test – The challenge
▼ On space applications, TRMs in conjunction with Tim e Delay Units are used to supply the radiating elements of SAR linear phased array active antennas for earth observation purposes as well as active parts for the antennas for telecommunications purposes
4/12/2013 Aeroflex Proprietary17
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TR Module Test – Customer Statement
▼ Specifications for this kind of product are very co mplex and a high number of electrical parameters are requested to be verified for each TRM
▼ Testing across the operative temperature range and after the screenings (mechanical shocks and vibrations) are also require d
▼ Furthermore all these requirements have to be verif ied with the thermal compensation applied
▼ A typical testing phase is composed as follows:
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- S parameters over frequency both at linear and nominal compression regions
- Transmitting and receiving within pulse amplitude and phase distortion characterization
- Pulse To Pulse amplitude and phase characterization including pulses rise and fall time
- RX Limiter operation verification- TX Output Power + PAE and TAP
characterization- RX and TX Noise Figure- TX vs RX isolation and Isolation between antenna
polarizations
- RX IP3 power- Compression point characterization- Amplitude and Phase RMS errors over the 4096
combinations of attenuation and phase shifter commands- Static and dynamic AM/AM and AM/PM conversion
coefficient determination- Spurious and Harmonic measurements - Stability vs load variations- Calibration path S parameters characterization- NPR and Multicarrier characterization (only for TLC
TRMs)
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TR Module Test – Customer Statement
▼ The high number of testing requirements has to be c ombined with:
– The large number of TRMs comprising an active anten na, typically from 600 to more than 2000 modules
– The time frame requested to deliver the parts neces sary to assemble a complete antenna, typically 6 to 8 months
– The extremely fine accuracy requested for the resul ts,
▼ typically +/- 0.1 dB peak in amplitude and +/- 1 degr ee peak in phase
– The numerous testing and characterization phases to be conducted during the whole production process
4/12/2013 Aeroflex Proprietary19
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TR Module Test – Customer Statement
▼ To fulfill all these testing requirements within th e necessary time schedule and measurement accuracy, it is been neces sary to combine:
– A very efficient organization of the working team, which must include people with several skills such as measurement engineering , database management, data elaboration capability, and deep knowledge of measurement instrumentation.
– State-of-the-art automatic testing systems which co mbine accuracy, speed, reliability, and re-configurability.
– Multiple DUT supply and control
– Remote and long term programming allowing to perfor m testing 24 hours per day, seven days per week.
– Capability to switch from the automatic testing pha se to the debugging phase where direct control of the DUT and measurements mu st be available in real time. This feature is necessary to support device a lignment as well as device troubleshooting activities.
4/12/2013 Aeroflex Proprietary20
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TR Module Test – The solution
▼ Turn-Key Synthetic Test Solution based on 7700 plat form can be configured to provide a platform ideal for TR Modul e Test
– System can be expanded at a later date to use for o ther applications
– Depending on the requirements, this could be just a software update
▼ Flexible support for multiple and mixed sources, in cluding:– Arbitrary Waveform Generators & RF Signal Generator s
– RF Upconverters
▼ Synthetic receiver supports a wide variety of measu rements:– Narrowband Power: Carrier Power, n-dB Compression P oint, TOI
– Fully-Corrected S-Parameters
– Y-Factor Noise Figure
– Broadband Spectrum and spur searches
– Time Domain: Rise Time, Pulse Droop, Pulse-to-Pulse Performance
– Vector Signal Analysis, Noise Power Ratio
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TR Module Test – The solution
▼ Full-Featured DUT control– DUT Modes, Attenuator and Phase Setting
– Precise control of timing:▼ Source Pulsing
▼ Measurement Triggering
▼ DUT Tx/Rx gating, T/R switch timing
▼ Complex serial and parallel interfaces are supporte d
▼ DUT Control is integrated within each measurement– Allows for rapid characterization of DUT performanc e across many DUT
states
– DUT controller definitions are contained within ind ividual DUT.dll files, allowing the operator to create a library of availa ble DUTs
4/12/2013 Aeroflex Proprietary22
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TR Module Test – The solution
▼ Standard RF Frequency Coverage is 26.5 GHz– Options for 6, 18, or 40 GHz
▼ 1 millisecond RF Frequency switching speed
▼ Standard 12-Port RF Multiplexer– Options for 2, 8, or 64 ports
▼ Mature Calibration routines– S-Parameter, Noise Figure, and Power Calibrations
– Efficient routines to extend calibrations through m ulti-port multiplexers to the plane of the DUT
4/12/2013 Aeroflex Proprietary23
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TR Module Test – The solution
▼ Customer reported test reduction from 30 minutes to 7 minutes for a complete test
– TX SECTION TESTS▼ Power Consumption
▼ S Parameters linear region
▼ Compression Point Search
▼ S Parameters @ Nominal POut
▼ Pulse characterization time domain
▼ Pulse to Pulse characterization
▼ AM/AM and AM/PM characterization
▼ Spurious and Stability
▼ Digital Attenuator functionality
▼ Digital Phase Shifter functionality
▼ Cal Path characterization
– RX SECTION TESTS▼ Power Consumption
▼ S Parameters linear region
▼ Noise Figure
▼ Pulse characterization time domain
▼ Pulse to Pulse characterization
▼ Spurious and Stability
▼ IP3
▼ Digital Attenuator functionality
▼ Digital Phase Shifter functionality
▼ Cal Path characterization
4/12/2013 Aeroflex Proprietary24
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Integrated Microwave Test System
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