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Doc. No.: ATL/RCI/ASB-TME/SOFT/01 AS9100C & ISO-9001:2008 Certified Company

Ananth Technologies Ltd.

1. INTRODUCTION

SCOPE OF THE DOCUMENT

The document brings out the detailed Functional test specifications and

procedure is required to be carried out as a deliverables of TELEMETRY ENCODER.

References documents, system description, functional specification covered

in chapter 2 to 4, physical inspection and screening test and functional test

procedure covered in chapters 5 &6 gives the functional testing procedures at

package level and system level, environmental specifications are covered in

chapter7 for the Telemetry Encoder unit.

Test reports, Integration details are covered in Appendixes.

SOFT for ASB TELEMETRY ENCODER RCI, Hyderabad Page 1 of 78

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2. REFERENCES DOCUMENTS

RCI SUPPLY Order No. RCI/DCMM/LP/LPD-II/00353(C) Dt: 08.11.2011

Technical Specification Document Doc. No.ATL/RCI/ASB-TME/TSD/01 BOM Document Doc. No. ATL/RCI/ASB-TME/BOM/01

MDI document Doc No. ATL/RCI/ASB-TME/MDI

MIL STANDARDS

Electronic / Electrical Components (Capacitors, Resistors, Relays, Connectors,

IC’s etc.) – MIL, LCSO, QML references.

Test Method Standards – Microcircuits – MIL-STD-883E

Test Method Standards for Electrical / Electronics Parts – MIL-STD-202

Micro Circuits Manufacturing, General Specifications – MIL-STD-38535E

Screening as per CEMILAC directive no. CEMILAC/5390/1 Dt. 10-01-2004 Part

B.

ENTEST document No:RCI/412/ASB/02

Environmental Testing

o JSS 55555 (Ground Equipment)

o JSS 0256-01 (On-board Units)

o MIL-STD-810Go MIL-STD-1670A (Environmental Criteria and Guidelines for Air

Launched Weapons)

o MIL-STD-461E


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3. SYSTEM DESCRIPTION

The Programmable Telemetry Encoder is an IRIG compatible Pulse Code

Modulated (PCM) Encoder, with user programmable features and multiple datainterfaces to acquire data in real time, and provides serial streams in NRZ-L and

BiØ-L formats after commutation. The Telemetry Encoder has the provision for 128

analog channels(includes one References channel) with input range of ±2.5V, 32

Discrete channels with input range of TTL to 28V compatible and Four RS-422

channels. The unit has MIL-STD-1553 interface through which complete data

transactions on the 1553 bus can be captured and merged with other TELEMETRY

data.

The unit is user programmable for Bit rate, Word length, Frame Sync code,

Frame Sync length, Words / Frame and Frames / Sub frame. The formats can be

programmed by a Personal Computer (PC) connected through an RS-422 serial

interface even after integration of the package.

The TELEMETRY ENCODER is part of Telemetry system it is mainly an

airborne data acquisition system. it process the data received from various signal

conditioned packages, and direct analog channels the Telemetry Encoder acceptsthe input range from -2.5V to +2.5V, in Analog module the analog channels data is

processed through a Multiplexer, ADC and ADC output is given to the FPGA and will

be used in commutation. The discrete event data is processed by discreet module

the digital data and the data processed is fed into the internal FIFO of FPGA and

data stored will be used for commutation, The Telemetry Encoder has MIL-STD-1553

Bus interface through the Telemetry Encoder communicates with other sub systems

over the Missile Bus. The telemetry Encoder 1553 Bus operates in Both RT and MT

mode. The 1553 Bus data will be captured by the Telemetry encoder and the data isused in commutation and the Telemetry Encoder will send the PCM output data as

serial streams in NRZ-L and BiØ-L formats and sent through Transmitter to ground

station.

The Telemetry Encoder output will be decommuated in the Ground station

and the data of various parameters analyzed.


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Figure No: 1. TELELMETRY ENCODER

The entire hardware is implemented using Three PCBs & DC-DC module. The

Telemetry Encoder Consists of following Three PCB’s which are connected with

stackable connectors. The PCBs are interfaced directly to front panel by Flexi Rigid

PCBs which are connected to connectors.

1. Analog Card

2. Discrete Card

3. Microcontroller Card


32 DiscreteChannels

4 RS- 422Channels

TELEMETRY ENCODER

128 AnalogChannels

RS-422 SerialLink

Output inRS-422 Format

1553 BUS A

1553 BUS B

Biphasel Output tothe Transmitter

28V ± 6V PWR

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1. BLOCK DIAGRAM OF TELEMETRY ENCODER


2 DISCRETEHANNELS

ADDR

FPGA

DA

TA

DATA

CONTROL

OPTOCOUPL

ER

BUFFER

28NALOGHANNELS

OPTOCOUPL

ER

4 RS-422CHANNELS

SDRAM

ADDRCTRL

C

TRL

DA

TA ADD

RCLK

FLASH

CTRL

DATA

Driver

4-RS-422CHANNELS

DAC PREMODFILTER

AMP

MICROCONTROLLER-1

XTALOSC

DDS

BUSIC

MUX ADC

ADDR

BIT2CLK

CLK

CTRL

ADDR

DATA

CTRL

1553 BUS

O/P’s

CTRL

DATA

DC/DCCONVERT

ER

28±6V

±15V+3.3V

MICROCONTROLLER-2

QUADUART

XTALOSC

DA

TA

ADDR

DA

TA

T/F

Transmitter ADDR

SDRAM

Figure No: 2. TELELMETRY ENCODER BLOCK DIAGRAM

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3.1 MECHNICAL SPECIFICATIONS

Mechanical enclosure will be made with HE-15 T5246 Aluminum materialwith Chromatisation.

• DIMENSIONSHeight : 90 mm (Max)Length : 147 mm (Max)Width : 130 mm (Max)

• MATERIALChassis : HE-15 Forged Aluminum as per T5246

• WEIGHTWeight : 2Kgs (Max)

• COOLING REQUIREMENTSCooling not required, as there are no heating components

• OPERATING AND STORAGE LIFE: 12 Years

• MOUNTING DETAILS: At the nose cap of the ASB Glide

• MAINTENANCE REQUIREMENTS: - Nil -

3.2 ELECTRICAL SPECIFICATIONS

The FPGA used is ACTEL make AGL1000V5FGG484I i.e. 484pin re-

programmable flash family device. The Commutation will be done in FPGA,

according with format loaded in Flash.

The MIL-Standard 1553 Interface is implemented with DDC make Total ACE

CMOS device have the 64kb Internal RAM.

The Flash memory having 1Mbit (128Kx8) is used for storing the user

formats.

Silicon Laboratories High Speed Mixed Signal ISP Flash Micro controller used

is a very small TQFP Package.

Micron make High Capacity SDRAM of 512Mb is used for delay data


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transmission.

3.2.1 POWER SUPPLY REQUIREMENTS

This interface consists of DC-DC converter with combination EMI Filters

provides total power for all modules with an input of 28V ± 6V. This DC-DC

converter module provides output voltages in range of ±15V with 1A and +3.3 V

with 3A current ratings. This DC-DC converter module has a provision for Reverse

Polarity protection and input transient protection.

3.2.2 POWER CONSUMPTION

DC Supply Input : 28V ± 6V

DC-DC Output : ±15V/1A, +3.3 V /3A

Reverse Polarity and input transient Protection.

CURRENT : 350mA (Approx)

RANGE OF OPERATIONAL: -55°C to +85°C Temperatures,

3.2.3 INPUT SPECIFICATIONS

Analog Channels : 128 (16 of 8 KHz frequency & 112 of 200Hz

frequency)

I/P Voltage : +2.5V, 0V, -2.5V

Discrète Channels : 32 Channels

I/P Voltage : 5V & 28V

RS 422 Channels : 04 Rx Channels

3.2.4 PCM SPECIFICATIONS:

Bit Rate : Upto 4 Mbps

Word length : 8-12 data bits (MSB First)

Frame length : 2-2048

Format length : 1-256 frames

Frame Sync : 1 to 4 word lengths (Pattern Selectable)


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Format Sync : Binary Count 0 to 255 Frames ID,

Delayed Data : Provision to select parameters for delayed

Transmission with programmable delay time

Bus Interface : MIL-STD 1553B Simultaneous RT/MT

terminals

Programme Enable : Format modification through RS-422

3.2.5 OUTPUT SPECIFICATIONS:

Data : BiØ-L Data in RS-422

BiØ-L Output Pre-modulation filter output for

Transmitter

Out put level : BiØ-L signal of 0 to 5Vp-p Adjustable.

Note: Among 128 channels last channel is references channel.


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alog CH-112

alog CH-128



4. FUNCTIONAL SPECIFICATIONS

4.1. ANALOG MODULE:

The Telemetry Encoder supports 128 analog channels with the input range of

+2.5V to -2.5V. The analog interface consisting of analog multiplexers to support up

to 128 analog channels with 2 tier multiplexing, and ADC containing sample and

hold, instrumentation amplifier, analog to digital converter and an output buffer

integrated into single component. The analog data is available in bi-polar (±2.5V);

hence ADC is operated in bi-polar mode. Final multiplexer output is given to ADC

through the buffer.

The analog Module mainly consists of the following

1. Analog Multiplexer

2. Input RC-Filter

3. Analog to Digital Converter (ADC)

Figure No: 3. ANALOG MODULE DIAGRAM


Mux Sel line8

ADG406BP

Multiplexer

Analog CH-16

ADG406BPMultiplexer

ADG406BP

Final

Multiplexer

-15V+15V

Mux Sel line1

ADC Enable

LT1360

Mux O/P

Mux O/P

Mux OP

LTC1412

ADC

Control S/g

ADC Data

lines to FPGA

Analog CH-1

Final Mux Sel

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4.2 DISCRETE MODULE:

The Telemetry Encoder provides 32 discrete channels for monitoring discrete

events (i.e. 0 or 1). The signal levels 5V to 28V. The Opto-isolated event information

goes as discrete bit information to the TM stream.

To provide 32 discrete channels, we use 8 Optocouplers. Each Optocouplers

can handle 4 inputs. The outputs of the each two Optocouplers are given to buffers.

In the system as per the application, only one buffer is activated at a time and the

control signals for enabling the buffer issued by FPGA.

The outputs of the Optocouplers are given to buffer system as per the

application, only one buffer is activated at a time and the control signals for

enabling the buffer will come from FPGA.

The Discrete Module mainly consists of the following

1. Opto Isolator

2. Buffer

3. FPGA


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Figure No: 4. DIGITAL MODULE DIAGRAM

4.3 MICROCONTROLLER MODULE:


4 choptocoupler -1

OctalBuffer -1

Buff Enable

32

OPTO

ISOLATED

INPUT

S

OctalBuffer -4

Buff Enable

FPGA

OUTPUT

OUTPUT

OUTPUT

4 channelOptocoupler -2



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The MICROCONTROLLER Module is heart of the Telemetry Encoder and it has

the following sub-modules.

MIL-STD-1553 B Interface

Format Interface

Delayed RAM Interface

RS 422 Channels Interface

Output Interface

The Telemetry Encoder provides 1553 channels, 4 RS 422 channels and the PCM

output.

4.3.1 MIL-STD- 1553 B Interface:

The Telemetry Encoder has MIL-STD-1553 bus interface for connectivity to

missile bus. The node is connected in Transformer coupled configuration. The

Telemetry Encoder node acts as simultaneous bus Monitor Terminal (MT) cum

Remote Terminal (RT) and monitors the bus transactions and captures the required

messages from the bus. The monitor (MT) mode is useful to capture all the data on

the bus or selectively capture the messages. The messages to be captured can be

specified in a lookup table stored in Total ACE RAM.

Features of Total ACE:

MIL-STD-1553 Module – Provides an interface for MIL–STD–1553 Data.

The Total-ACE is software and architecturally compatible with DDC's enhanced

series of devices.

It integrates dual transceivers, dual transformers, protocol engine and either 4K

or 64K words of internal RAM.

The Total-ACE's flexible processor interface allows direct connection with little or

no glue logic to a variety of 8, 16 and 32-bit processors.

The advanced architecture is key to the Total-ACE series’ high performance.


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The advanced bus controller architecture gives the Total-ACE a high degree of

flexibility and autonomy.

This creates advantages in a number of areas: improving message scheduling

control, minimizing host overhead for asynchronous message insertion,

facilitating bulk data transfers and double buffering, message retry and bus

switching strategies, and data logging and fault reporting.

In addition, its remote terminal architecture provides flexibility in meeting all

common MIL-STD-1553 protocols.

RT data buffering and interrupt options offer support for synchronous and

asynchronous messaging, ensure data sample consistency, and support bulk

data transfers.

The Total-ACE is the industry's smallest, fully integrated MILSTD-1553 terminal &transformer solution, enabling its use in applications where PC board space is at

a premium

The Total-ACE integrates dual +3.3V transceivers, protocol logic, 4K or 64K

words of internal RAM, and isolation transformers.

World’s Smallest CQFP MIL-STD-1553 Device 80-pin Ceramic Flat/Gull Wing

Package or 324-Ball BGA Package

IMPLEMENTATION

• The Total ACE BU64863I8E02 device is connected to Microcontroller and it fully

controls the TOTAL ACE. The Microcontroller issues the control signals for the

TOTAL ACE for 1553 data processing.

• The data Bus and Address Bus of Total Ace is connected to FPGA and

Microcontroller.

• FPGA issues the controls signals like STRB, CSB ACE and clock (16MHz) to the

Total Ace.

• To function the Total Ace in RT mode the Microcontroller sets the RT address of

the device.

• The Telemetry Encoder works in both RT and MT mode.

• The Telemetry Encoder receives the data from the MIL-STD-1553 Bus and

processed in the Total Ace.


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• Total Ace used is fully integrated MIL-STD-1553B chip equipped with Transceiver

and Transformer inside.

• The data over MIL-STD-1553 Bus is captured by Telemetry Encoder and the

Transceiver in Total receives the data and processed in Total Ace.

• The data Received by the Transceiver is processed and stirred in the shared Ram

of the Total ACE; the RAM is of 64K capacity.

• The Microcontroller takes the Data from the internal Sheered RAM of Total Ace

and sent to the FPGA through the Data Bus.

• The Data stored in internal FIFO of FPGA will be used during commutation of

data and will be sent in Telemetry serial stream.

• The 1553 Bus interface from Telemetry Encoder is provided by the Raychemmake connectors which are mounted on front plate of Telemetry Encoder

chassis.

• The MIL-STD -1553Bus communication in Telemetry Encoder is Transformer

coupled configuration.

4.3.2 RS-422 INTERFACE

The Telemetry Encoder has a provision for 4 Rx RS-422 channels. The baud

rates for these channels are user programmable.

RS-442 QUAD UART IC (XR16L784IV) is used to fulfill these specifications. The

UART IC will have individual internal FIFO for receive and transmit channels

internally. Dedicated microcontroller is used for this interface, which interfaces

QUAD UART and it takes the data of internal FIFO’s and puts into the FPGA Internal

FIFO, whenever digital sync comes from FPGA during commutation. All input receive

RS-422 channels are opt-coupled internally.

The RS-422 Interface Mainly consists of the following devices

• Optocouplers

• QUAD UART


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• Microcontroller

• FPGA

FEATURES OF OPTOCOUPLER

Ultra-low IDD current: 1.3 mA/channel maximum

Low input current: 1.6 mA

Built-in slew-rate controlled outputs

FEATURES OF UART IC

XR16L7841 (784) is a quad Universal Asynchronous Receiver and

Transmitter (UART)

1. 5V and 3.3V Operation with 5V Tolerant s

2. 64-pin TQFP Package

3. Up to 3.12 (16x) and 6.25 (8x) Mbps Data Rate

4. A General Purpose 16-bit Timer/Counter


ADDR ADDR

DATA

4 RS-422 Receivechannels

0PTOCOUPLER

4 RS-422 Receivechannels inputs

4 RS-422 Receive

channels

RS 422 _1

RS 422 _4

CRYSTALOSC

QUAD

UART

FPGA

MICROCONTROLLER

DATA

inputs

control

0PTOCOUPLER

2 RS-422 Transmitchannels

Figure No: 5. RS-422 INTERFACE BLOCK DIAGRAM

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5. Programmable TX and RX FIFO Trigger Levels

IMPLEMENTATION:

• The Telemetry Encoder has provision for acquiring 4 RS-422 Receive

channels data.

• For RS-422 Receive channels interface a QUAD UART of EXAR make

XR16L784 device is used.

• The RS-422 channels are received by Telemetry Encoder by the Front Panel

connectors and they are connected to the Opto couplers.

• The Rs-422 channels data received are first opto coupled internally and theyare given to the FPGA.

• The FPGA converts the differential output opt couplers to single ended and

will be given to the QUAD UART IC.

• There is Dedicated Microcontroller for the QUAD UART operation and control.

• The QUAD UART receives the data at the fixed Baud rates and the Baud rate

is decided by the external clock oscillator frequency, there is crystal oscillator

for this operation.

• The QUAD UART has separate FIFO’s for each RS-422 channels.

• The Microcontroller takes the data from the internal FIFO of the QUAD UART

and keeps it into the FIFO of FPGA.

• The data stored in the FIFO is used during commutation and mixed in the

Telemetry Stream.

4.3.3 PCM OUTPUT SECTION

The Telemetry Encoder provides the output to Transmitter and checkout systems

for the recording and verification of the data from different parameter, the output is

connected to the Front panel connectors which will be connected to Transmitter or

ground station. The PCM Outputs section block diagram is explained as below:


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FPGA

Buffer

BIPHASE

CLOCK

NRZ-L

Controls

CLOCK

AD5424YRU

DAC

BIPHASE Buff Out

NRZL Buff Out

Clock Buff Out

DAC_IN_0o 7

RD/WR

Control

BIPHASE Buff Out

3.3V

LMH6644

PRE MOD

FILTER

+5V

-5V

DACOUTPUT

LMH6718

GAIN

BUFFER

+5V

-5V

3.3V

ADTTITRANSFORMER

OUTPUT HIGH

OUTPUT LOW

DIRECTOUTPUT

DS26LS31

Line driver

BIPHASE

BIPHASE #

Output inform of RS-422 for checkout

Output fo

Transmitt

3.3V

Figure No: 6. PCM OUTPUT SECTION BLOCK DIAGRAM

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The PCM Output section is categorized as following

BiΦ – L: This is BiΦ -L – L data which is generated by the FPGA and given to the a

Buffer and the output of Buffer is connected to the DAC, which controls the outputamplitude, the output of the DAC is connected to the 6th order Bessel Filter to

suppress the harmonics and is connected to the Gain Amplifier and to the

Transformer, the transformer output is connected to the Output Connector placed

on the front panel, the BiΦ – L data is connected to the Transmitter.

BiΦ – L in RS-422 format: This is BiΦ – L data after buffering the data is connected to

RS-422 Line driver and the output is connected to the front panel connector.

NRZ-L: The NRZ-L data is generated by the FPGA is given to the Buffer.

The above module is implemented using the following components

1. FPGA

2. DAC

3. Pre Mod Filter

4. Gain Buffer5. Transformer

6. RS-422 Line driver

4.4 Model Number and Serial Number of the System/ sub-system

Serial No Name Model Number

12-002 ASB Telemetry Encoder ATL-TE-1202/0112-003 ASB Telemetry Encoder ATL-TE-1202/01

5. PHYSICAL INSPECTION AND SCREENING TESTS


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5.1 Physical and visual inspection

After receiving all the components / materials from stores, visual inspection is

to be carried out for all of them for any physical damages and subsequently the

following steps are to be followed in the card fabrication process

♦ Bare PCB cleaning

♦ Baking of bare PCB

♦ Preparation of part leads

♦ Components mounting

Lead trimming

Soldering

Cleaning

Inspection

♦ Connectors Mounting

Connector fixing and torque

Inspection

Connector soldering

Cleaning

Inspection

♦ Final inspection before functional test

Note: 1) each step is followed by inspection and rework (if any).

2) All stages of inspection should be as per the respective QC-checklists and

the

observations to be recorded subsequently by the concerned personnel

(Fabricator

and Online QC Inspector).


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SL NO. Inspection Type Attribute Status(PASS/FAIL)

1

Solder-ability

Clean

Smooth

BrightConcaveLead visibleCompletewetting

Thin edgeNo excesssolder

2Dip components flushed on to theboard

3 Alignment

4 Orientation

5 Components are as per BOM.

6 Lacing provided where required

7Is there any damage on thePCB/tracks?

8Is there any damage on thecomponent?

9Impedance Check conducted for allVCC signals

5.2 ELECTRICAL CONTINUITY & INSULATION TESTS


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Electrical Checks

The following electrical checks are required to be conducted to confirm whether the

Telemetry is meeting the power supply requirements.

Isolation Check:

Check the isolation as per the appendix ’A’ between the connector pins to body with

a Digital Multimeter. The IR measured shall be more than 10 MΩ.

Continuity Check:

Check the continuity between the DC-DC converter mating to the PCB mount

mating connector and PCB test points to the front plate connectors as per

integration details given in appendix ‘A’

Insulation Checks:

Insulation check is done as per the appendix ’A’ , in between the pins of J6

connectors and the chassis using a Megger of 250V. The IR measured shall be more

than 20 MΩ.

Stabilization time:

The functionality of the system should be instantaneous. The system should getstabilized with proper power and current level within 3 seconds after switching ON.

Current Consumption Check:

The Current drawn by the Telemetry at 28 V ± 6V shall be 0.26 A +/- 0.05A.

Screening tests:

Screening for Non-MIL components carried out as per CEMILAC directive No

CEMILAC/5390/1 Dt.10-01.-2004.

Reverse Polarity Check:

Reverse the connections of power supply source of PCM encoder (at 28 V ± 6V) and

note down the current reading of the variable power supply. The current drawn

should be negligible

(Almost zero).


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6. FUNCTIONAL TEST PROCEDURE

The Telemetry Encoder consists of three types of cards, and a chassis

mountable DC-DC converter, which are placed inside the package. The three

different types of cards interconnected through Flexi, which are Analog, Discrete

and microcontroller Card.

Telemetry Encoder is tested using Bit synchronizer, Decommutator system

and input simulators. The input data is given from different sources i.e. Analog,

Discrete, 1553 and RS-422 channels and the output data are monitored in the

Decommutator system.

The Telemetry Encoder Test set up is shown in Figure 7 below. Initially power

up the unit through J7 connector from High precision 28 V DC power supply. The

required formats will be stored in FLASH through RS-422 serial link. The output

connector J6 will be connected to Decommutator system. After powering on the

Decommutator system, Checkout system parameters to be modified/stored. Then

the Decommutator system will give lock status, like format, frame etc. The PCM

Encoder Lock status is O.K then it will display the data on screen as per history files,

which is generated from format.

The Analog, Discrete and 1553 data will be connected through J1, J2 and J4, J5

respectively. The respective data will be monitored in the Checkout system. All

parameters that are within the specified limits then the unit will be processed for

further environmental tests as per user requirements.


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Fig 7: Telemetry Encoder Test Setup


A B

C

TELEMETRY ENCODER

DECOMMUTATOR SYSTEM WITHBIT SYNCHRONISER

1553 SIMULATOR RS-422 SIMULATOR CARD(MOXA) INTEGRATED IN PC

ANALOG CHANNELSSIMULATOR (PRECISION

POWER SUPPLY)/FUNCTIONGENERATOR

DISCRETE CHANNELSSIMULATOR (PRECISION

POWER SUPPLY)

POWER SUPPLY(28V, 2A)

RS-422CHANNELS INPUT

1553 DATA INPUT

DATA DATA #DATA

LOW

VOLTAGEINPUT

GND

VOLTAGEINPUT

GND

28V RETURN28V HIGH

BIT SYNCHRONISER UNIT

(BSU)

DECOMMUTATORSYSTEM (TELEMETRY

ACQUISTION CARD-TAC)INTEGRATED IN PC FOR

MONITORING DATA

TELEMETRYOUTPUT

DATA CLK

DIGITAL MUTLIMETERFOR CHECKING

VOLTAGE INPUTS

J1&J2

J2

J4, J5 J2

J6

J7

HIGH

D

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The following parameters to be monitored while functional testing of TelemetryEncoder

SL. No Name of the Test

1. Sync lock status

3. Functioning of analog channels

4. Functioning of Discrete channels

5. Functioning of 1553 data

6. Functioning of RS-422

As shown in fig 7. The following equipments required for testing of

TELEMETRY Encoder.

• Bit synchroniser

• Decommutator system integrated with TAC add-on card in PC

• 1553 Simulator

• RS-422 simulator card integrated in PC.

• 28V DC Power supply of for Telemetry Encoder.

• Discrete channels (28 V DC Power supply – 2Nos.)

• Analog channels simulator (Power Supply 0-5V DC)/Function Generator

• Digital Multi-meter

Telemetry Encoder is tested using Bit-Synchroniser, Decommutator system

and input simulators. The input data is given to different sources i.e. Analog,

Discrete, 1553 and RS-422 channels and the output data are monitored in the


Telemetry Encoder analog channels are tested by giving the input voltage to

analog channel and output is monitored in the Decommutator system. As per the

specifications the analog channels is tested in bipolar voltage i.e., -2.5V to +2.5V.

The input is given through precision power supply.


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Telemetry Encoder discrete channels are tested by giving input voltage to

discrete channel and output is monitored in the Decommutator system. As per the

specifications the discrete channels is tested for 5V & 28V. The input is given

through precision power supply.

Telemetry Encoder 1553 channels are tested by giving any data

message from the standard 1553 simulator and the same data is monitored in


Telemetry Encoder RS-422 channels are tested by giving the data

message from the standard RS-422 simulator and the same data is monitored in

Decommutator system. The Telemetry encoder has 4 channels, in which the data

message is given through standard simulator by selecting the desired baud rate.

Telemetry encoder is tested in the following modes

a) Functional test mode – used to verify system resources during Lab

level/Environmental testing.

b) Software Loader Mode – used to load all software programs in respectiveFPGA, Microcontroller and flash memories of Telemetry Encoder.

Note: Software loading done externally without opening the unit.

Cables and connectors Interconnection details with Telemetry Encoder and Test Jig

SL.No.

Description Cable or connectorconnected to TelemetryEncoder

Cable or connectorconnected to Test Jig orTest Equipment

1. Analogchannels

J1 ( 100 pin connector) & J2 (79 pin connector)connected using shieldedor bare cable

Connected to Power Supply28 V DC with an input toanalog channels of ±2.5V.

2. Discretechannels

J2 (79 pin connector)connected using shieldedor bare cable

Connected to Power Supply28V DC with an input todiscrete channels of 5V or28V.

3. RS-422 J2 (79 pin connector) Connected to RS-422


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channels connected using shieldedor bare cable.

simulator ( Moxa card)using 9 pin D-subconnectors – 4 Nos

4. 1553 channel J4 and J5 (Raychem)connected using shieldedcable.

Connected to 1553standard simulator usingRaychem connectors.

5. Power supply J6 (5 Pin connector)connected using shieldedor bare cable.

Connected to Power Supply28V

6. TelemetryOutput

J7 (triaxial connector)connected using triaxial orshielded cable.

Connected to BitSynchroniser using BNCconnector

6.1 Typical precondition settings:Before switching on the telemetry unit the following settings have to be made

a) Bit synchronizer settings:

Bit rate: 1Mbps (Depends on the format)input code: BiΦ -L

b) Telemetry Encoder & Decommutator Settings:

Format: The required formats will be stored in FLASH through RS-422 serial link

in telemetry encoder. The Decommutator system is configured as per the

history file which was generated from format. Then only we can see the lock

status on the screen. The format details are given in the appendix ‘B’.

c) RS 422 Settings:

In MOXA RS-422 simulator we have set the port and the required baud rate.

Port: depend on the PC system configuration.

Baud Rate: 115200

d) 1553 simulator :

In 1553 simulator we send standard message (i.e.: 0, 1,2,……9).

e) Analog Simulator:


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For Analog channels from a DC power supply set the voltages of +2.5V, 0 V &

-2.5V apply to required channels and observed the required count as given in

appendix ‘D’.

Set the Function generator for required frequency as per specification

f) Discrete Simulator: (5 V & 28 V)

For Discrete channels from a DC power supply set the voltage of 5V/28V applyto required channels.

Observables:

• Scaling of analog channels for the applied voltages is given in the

appendix’C’

• Discrete channels a bit set is observed as given in appendix’D’

• 1553 configured data will be observed

• What ever the Messages are sent to RS422 channels those messages areobserved in Decommutator for all the 4 channels

Note:

Bit rates: It can be tested for 1, 2 & 3 Mbps with reloading of software.

The BiΦ -L o/p may be 0 – 5 Vpp (max) – programmable

Format settings as per history file, is shown in appendix ‘B’

The Telemetry encoder is configured for bit rate and corresponding bit rate is

set in decommutator.

Function generator is set to <= 8 KHz

6.2 The functional tests are performed on SOFT unit.

1. Test case 1 : Bit Sync lock

Description : To check whether the Telemetry output and the

bit synchronizer

bit rate matches.


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Test procedure : Connect the Telemetry Encoder output at connector J7

to the bit

synchronizer system input through Trompeter to BNC

Cable.

Expected Result : The lock status appears in green as lock when the

Format

matches on bit synchronizer system, else it will show red

color as

Unlocked

2. Test case 2 : Frame Sync lock

Description : To check the validity of the Telemetry data

format.

Test procedure : Connect the Telemetry Encoder output at connector J7

to

Decommutator through bit synchronizer system as show

in fig 7.

Test setup.

Expected Result : The lock status appears in green as lock when the

Format

matches on Decommutator system, else it will show red

color as

unlocked.

3. Test case 3 : PCM OUTPUT (Pre-mod filter)

Description : To check PCM out and the lock status in

Decommutator

Test procedure : Connect probe to the J7 connector cable and monitor

signal using Oscilloscope. And also connect the output

to bit synchronizer.


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Expected Result : 1.The lock status in decommutator

2. BiΦ– L waveform on oscilloscope.

3. BiΦ -L output level 0 – 5 Vp-p (max) as programmed.

4. Test case 4 : Data rate

Description : To check Data rate of the PCM Encoder.

Test procedure : Connect probe at pin numbers 8 & 9 of J3 connector and

monitor signal using Oscilloscope.

Expected Result : Output is measured in oscilloscope, Frequency depends

on

the bit rate. For Ex: for 3Mbps bit rate we get 3MHz.

5. Test case 5a : Analog Channel with frequency.

Description : To check the analog channels functionality

Test procedure : Connect the Telemetry Encoder as per the test setup

shown in

Fig7 and from function generator give an input sine

signal of < 8

KHz to any one analog channel in J1/J2 connector and

check the

output in the Decommutator

Expected Result : Record the channel data to which we have applied the

input and plot the wave form in mat lab as per the

recorded data and also monitored lock status on

Decommutator.

6. Test case 5b : Analog Channel with DC power supply.



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shown in

fig7. And From DC supply Apply +2.5V, 0V, -2.5V as

input to

Analog channels in J1/J2 connectors and check the out

put in the

Decommutator.

Expected Result : The count of 255, 127, and 0 with ±2 count tolerances

w.r.t above

voltages monitored on Decommutator. AS per test report

in

appendix ’D’ and also observe the lock status.

7. Test case 6 : Analog channel cross talk

Description : To check whether any interferences between

analog channels.


shown in

fig7. Give input to both the channels with different

voltages. (Ex:

+2.5, 0V & -2.5 V)

Expected Result : Count must be as per the test report .i.e (255,127, 0)

with ± 3

counts and also observe the lock status.

8. Test case 7 : Discrete Channel with DC power supply.

Description : To check the Discrete Channel functionality


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shown in

fig7. And From DC supply Apply +5V/28V as input to

Discrete

channel in J2 connectors and check the out puts in the

decommutator.

Expected Result : One bit is set from 0 to 1 w.r.t above voltages monitored

on

decommutator. AS per test report in appendix ’D’ and

also

observe the lock status.

9. Test case 8 : 1553 Channels

Description : To check 1553 bus communication.


shown in

fig7. Inputs are given to Telemetry from 1553 simulator

and

check the out puts in the Decommutator

Expected Result : standard message is sent through 1553 simulator the

same

message is monitored on Decommutator and also

observe the

lock status.

10. Test case 9 : RS-422 Channels

Description : To check the status of communication

Establishment.


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shown in

fig7. Inputs are given to Telemetry from RS-422

simulator

(MOXA Card.) And check the out puts in the

Decommutator

Expected Result : What ever data is sent through RS422 simulator the

same data is

monitored on Decommutator on all 4 channels and also


11. Test case 10 : Delay Data

Description : To check, after how much delay the data is

received.


shown in

fig7. On the Telemetry unit and check the delay data

window

note down the time after how much time the data is

received.

Expected Result : The time tag which gives the status of 1553 bus. The

same time

tag will be received after a time delay in delay datawindow of

Decommutator and also observe the lock status.

6.3 Functional test when conducting environmental tests


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1. Test case 1 : Analog Channel with DC power supply.



shown in

fig7. And From DC supply Apply +2.5V, 0V, -2.5V as

input to

analog channels in J1/J2 connectors and check the out

put in the

Decommutator

Expected Result : The count of 255, 127, and 0 with 2 count tolerancesw.r.t above

voltages monitored on Decommutator. AS per test report

in

appendix ’D’ and also observe the lock status.

2. Test case 2 : Discrete Channel with DC power supply.

Description : To check the Discrete Channel functionality


shown in

fig7. And From DC supply Apply +5V/28V as input to

Discrete

Channel in J2 connectors and check the out puts in the

Decommutator

Expected Result : One bit is set from 0 to 1 w.r.t above voltages monitored

on

Decommutator. AS per test report in appendix’D’. And

also



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3. Test case 3 : 1553 Channels

Description : To check 1553 bus communication.


shown in

fig7. Inputs are given to J4 connector from 1553

simulator and

check the out puts in the Decommutator

Expected Result : Standard message is sent through 1553 simulator the

same data

is monitored on Decommutator.

4. Test case 9 : RS-422 Channels

Description : To check the status of communication

Establishment.


shown in

fig7. Inputs are given to Telemetry from RS-422

simulator

(MOXA Card.) And check the out puts in the

Decommutator

Expected Result : What ever data is sent through RS422 simulator the

same data is

monitored on Decommutator and also observe the lock

status.

Note: when conducting environmental test optimal channels are monitored.

As per requirement bit rate is up to 3 Mbps only.


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Among 128 channels 1 channel is reference channel.

7. Environmental Stress Screening Test


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7.1 ESS Test Specifications

7.2 ESS test procedure for SOFT

7.2.1 Random Vibration

Test Objective:

To determine the suitability of equipment to withstand specified severities of

vibration and to bring out the workmanship and latent defect.

Test Level


S

l

.

N

o

Description Level Remarks

ESS

1

.

Random

Vibration

Spectral Density – 0.04g2/Hz

20Hz- 80Hz +3db/octave

80Hz-350Hz 0.04 g2/Hz

350Hz-2000Hz -3db/octave

Duration: 5 minutes/axis

Along all the three axis

PREET at Room

condition

INSET at given level

POET at room condition

2

.

Temperature

Cycling

-40°C dwell 2Hr

+71°C dwell 2Hr

Rate of change of temp : 5°C /

minute

No. of cycles : 6 cycles

PREET at Room temp.

INSET at each high and

low temp. Cycles.

POET after thermal

cycling at room

temperature3

.

Random

Vibration



80Hz-350Hz 0.04 g2/Hz

350Hz-2000Hz -3db/octave



PREET at Room

condition



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Description Level

RandomVibration



80Hz-350Hz 0.04 g2/Hz350Hz-2000Hz -3db/octave



PREET at Room condition



Test Procedure

The random vibration test will be carried out along all three mutually

perpendicular axes for duration of five minutes each, as per profile gives in fig. 8 on

all the test items. The equipment shall be kept energize during the vibration test.

Visual examination will be carried out after the test to check for appearance of any

defect.

Fig 8: Random Vibration test Profile


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1hr

1hr



7.2.2 Temperature Cycling

Test Objective:

To bring out the workmanship and latent defects in the test item by

subjecting it to rapid temperature cycling stress.

Test Level

Description Level

Temperature

Cycling

-40°C dwell 2 Hr

+71°C dwell 2 Hr

Rate of change of temp : 5°C /

minute

No. of cycles : 6 cycles

PREET at Room temp.

INSET at each high and

low temp. Cycles.

POET after thermal cycling

at room temperature

Test Procedure

The test item will be subjected to the temperature extremes of -40oC and

+71oC for ten cycles as per profile given in fig 9 as applicable to the test item. The

rate of change of temperature from minimum to maximum, and vice versa, shall be

at an average rate of 5oC /min. The item shall be at an average rate of 5 oC /min. The

test item shall be powered and the PC taken as indicated in the figure, during each

cycle.

Fig 9: Thermal cycling Test Profile


+710C

-400C

//

Inset Measurement at

this stage

Inset Measurement at

this stage

2 Hr

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7.2.3 Random Vibration

Test Objective:


vibrationand to bring out the workmanship and latent defect

Test Level & Test Procedure

The random vibration test will be carried out along all three mutually

perpendicular axes for duration of five minutes each, as per profile gives in fig. 8 on

all the test items. As given in section 7.2.1


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8. ENVIRONMENTAL SPECIFICATIONS

8.1 Test Specifications for SOFT


S

l.

N

o

.

Descr

iption

Level Remarks

1. Continuou

s

Run Test

8 hrs continuous operation with

parameter checks every 2 hrs

PREET, INSET, POET

2 EMI/EMC CS101, CS114, CS115,

CS116, RS103, HESD,

CE102, RE102

PREET, INSET & POET

3 Power

supply

compatibili

ty

Normal 22-29V

Abnormal 20-31.5V

Transient surge: 59V for

50ms

0V for 7 sec

Emergency operation: 16V

same as normal

Power interruption: 0V for

50ms (AC & DC)4 Random

Vibration

a) Sub system mounted at nose

Section

20Hz 0.0018 g2/Hz

70Hz 0.01 g2/Hz

160Hz 0.0064 g2/Hz

250Hz 0.0081 g2/Hz

430Hz 0.013 g2/Hz

750Hz 0.007 g2/Hz

1350Hz 0.0027 g2/Hz

1600Hz 0.0022 g2/Hz

2000Hz 0.0016 g2/Hz

Over all Grms=3.25

Duration – 15 minutes/axis, in all

the three axes

Duration PREET at

Room condition



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S

L

.

N

o.

Descr

iptio

n

Level Remarks

5 High

Temperature

storage cum

operation

0 - 6 Hrs 35 ºC

6 - 11½ Hrs 35 to 71 ºC

11½ - 13½ Hrs 71 ºC ON

13½ - 14 Hrs 71 to

85 ºC

14 - 15½ Hrs 85 ºC

15½ - 16 Hrs 85 to 65 ºC

16 - 19 Hrs 65 ºC ON

19 - 24 Hrs 65 to 35 ºC

One Cycle of 24 Hrs each.

Test profile is shown in Fig. 10

PREET at Room

temp.

INSET at specified

level ’ON*

Visual inspection

after test.

POET Reading after

test.


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6 Combined

Altitude,

Temperature &

Humidity

(CATH)

15 min ramp to temperature

OFF

4 Hr -40 ºC OFF

30 min ramp to altitude ON

30 Min -40 ºC 12 KmON*

10 min ramp to humidity and

temperature

ON

30 Min +43 ºC 95%RH ON*

15 min ramp to temp & humidity

ON

2 Hr +55 ºC <30% RHON

15 min ramp to altitude

ON

4 Hr +55 ºC 12 Km <30% RH

ON *

Four cycles each of app.12 Hrs

duration.

Test profile is shown in Fig.11

PREET at Room

temp.

INSET at specified

level ’ON*’ Visual

inspection aftertest.

POET Reading after

test.


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S

L

.

N

o.

Descr

iptio

n

Level Remarks

7 Accelerati

on

As per MIL STD 810G

Method 513.6. Table 513.6 –

II & I

a)Operational :

Procedure IIDirections : Severity

Fore : 7g

Aft : 8g

Up : 9g

Down : 5.4g

Lat L : 3g

Lat R : 3g

Duration: 1 min/direction

b) StructuralProcedure -I

Directions : SeverityFore : 10.5g

Aft : 12g

Up : 13.5g

Down : 8.2g

Lat L : 4.5g

Lat R : 4.5g


Equipment in

ON condition

during the

test.

VE (visual

Examination) and

PC (parameter

check) before and

after test.

Equipment in OFF

condition during the

test VE (visual

examination) and

PC (parameter

check) before and

after test


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8 Mechanical Shock

As per MIL STD 810G

Method 516.6

Severity : 20g, 11 m sec

Pulse Shape: Half Sine pulse

No. of Shocks: 3 shocks oneach of 6 directions

Total of 18 shocks.

PREET at

Room Temp.

Inset during

test.

POET aftertest.

8.2 Environmental test procedure for SOFT

8.2.1. Continuous Run

Test Objective


subjecting it to continuous power on.

Test level

Sl.

No

Descr

iption

Level

1. Contin

uous

Run

Test

8 hrs continuous operation with

parameter checks every 2 hrs

PREET, INSET,

POET

Test Procedure

Carry out the functional test as per appendix ‘D’, at room temperature andnote down the outputs for the same as per the format in appendix ’D’. Now power

on the equipment for 8 hours continuously. For every 2 hrs note down the outputs

as per the format in appendix ’D’.

Acceptance Criteria


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There should be no deviation in observed values before, during and after

continuous run.

8.2.2. RANDOM VIBRATION

Test Objective


vibration and to bring out the workmanship and latent defects.

Test level

Sl.

No

Descr

iption

Level

1. Rando

m

Vibrati

on

20Hz 0.0018 g2/Hz

70Hz 0.01 g2/Hz

160Hz 0.0064 g2/Hz

250Hz 0.0081 g2/Hz

430Hz 0.013 g2/Hz

750Hz 0.007 g2/Hz

1350Hz 0.0027 g2/Hz

1600Hz 0.0022 g2/Hz

2000Hz 0.0016 g2/Hz

Over all Grms=3.25

Duration – 15 minutes/axis, in all

the three axes

PREET at Room

condition



Test Procedure

Carry out the functional test as per appendix ’D’, at room temperature and

note down the outputs for the same as per the format in appendix ’D’. Now fix the

equipment on the Vibration table and apply vibration to the specified level along all


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three axes. Carry out the functional test at the given level and note down the

outputs as per the format in appendix ‘D’. Now carry out the functional test at room

temperature and note down the outputs in the same manner.

Acceptance Criteria There should be no deviation in observed values before, during and after

vibration.

8.2.3. HIGH TEMPERATURE CYCLE

Test Objective


subjecting it to rapid temperature cycling stress.

Test Level


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6 11.5 13.5 14 15.5 16 19 24

Duration in Hours

Tempo C)

35

65

71

85

ON



Test Procedure

Keep the equipment in the chamber and switch on the equipment and Carry

out the functional test at room temperature and note down the outputs as per

Appendix ’D’. Now increase the temperature to the specified levels and keep it for

the mentioned time. Carry out the functional test at the 71 o C and note down the

outputs as per Appendix ’D’. Now decrease the temperature to room level. Carry

out the functional test and note down the outputs as per Appendix ’D’.


1. High

Temperature

storage cum

operation

0 - 6 Hrs 35

ºC

6 - 11½ Hrs 35

to 71 ºC

11½ - 13½ Hrs 71 ºC13½ - 14 Hrs 71

to 85 ºC

14 - 15½ Hrs 85 ºC

15½ - 16 Hrs 85 to

65 ºC

16 - 19 Hrs 65 ºC

19 - 24 Hrs 65 to 35

ºC

One Cycles of 24 Hrs each.

Test profile is shown in Fig. 10

PREET at Room temp.

INSET

Visual inspection after

test.

POET Reading after test

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ON

Fig No: 10 High Temperature Storage cum Operation

Acceptance Criteria

There should be no deviation in observed values before, during and after the

test.

8.2.4. COMBINED ALTITUDE, TEMPERATURE & HUMIDITY (CATH)

Test Objective


subjecting it to CATH Test.

Test Level


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TEST PROCEDURE

Keep the equipment in the chamber and switch on the equipment and Carry

out the parameters checks test at room temperature as per Appendix ‘D’. Now

change the temperature to the specified levels and keep it for the mentioned time.

Carry out the parameters checks at the specified level’s and note down the outputs

as per Appendix ‘D’. After completion of cycles decrease the temperature to room

level. Carry out the parameters checks and note down the outputs as per Appendix

‘D’.


1. Combined

Altitude,

Temperature &

Humidity

(CATH)

15 min ramp to temperature

OFF

4 Hr -40 ºC OFF


30 Min -40 ºC 12 Km

ON*

10 min ramp to humidity and

temperature

ON

30 Min +43 ºC 95%RH ON*

15 min ramp to temp & humidity

ON

2 Hr +55 ºC <30% RH

ON


4 Hr +55 ºC 12 Km <30% RH

ON *

Four cycles each of app.12 Hrs

duration.

Test profile is shown in Fig.11

PREET at room Temp.

INSET at specified level

'ON*’.

POET at room Temp.

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Note: Ramp rates are subjects to tailoring and facility limitations.


1 2 3 4 5 6 7 8 13

Time in HoursFig NO:-11 Combined Altitude – Temperature & Humidity

empC)

titudekm)

umidity%)

-40

43

55

0

18

95

Parameter checkOFFON

ON

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Acceptance Criteria


test.

8.2.5. ACCELERATION

Test Objective

To demonstrate the ruggedness of the systems under vibration.

Test Level


1

.

Acceleration As per MIL STD 810G

Method 513.6. Table 513.6 –

II & I

a)Operational :

Procedure IIDirections : Severity

Fore : 7g

Aft : 8g

Up : 9g

Down : 5.4g

Lat L : 3g

Lat R : 3g


b) StructuralProcedure -I

Directions : Severity

Fore : 10.5g

Aft : 12g

Up : 13.5g

Down : 8.2g

Lat L : 4.5g

Lat R : 4.5g


PREET and POET at

room temp.

Equipment is off during

test.

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Test Procedure

Carry out the parameter checks at room temperature and note down the

outputs as per appendix ‘D’. Now fix the equipment on the Acceleration bench and

apply the acceleration to the specified level along all six directions. Now carry out

the parameter checks after completion of test and note down the outputs as perappendix ‘D’.

Acceptance Criteria

There should be no deviation in observed values before and after

Acceleration.

8.2.6. MECHANICAL SHOCK

Test Objective

To expose any defects in the test item by subjecting it to Mechanical Shock

test.

Test level

Test Procedure

Carry out the Parameter checks at room temperature and note down theoutputs as per appendix ‘D’. Now fix the equipment on the Shock bench and apply 3

shocks in one direction. Carry out the parameter checks in all 6 directions. Now

carry out the parameter checks after completion of test and note down the outputs

as per appendix ‘D’.

Acceptance Criteria


1

.

Mechanical

Shock

As per MIL STD 810G

Method 516.6

Severity : 20g, 11 m

sec

Pulse Shape: Half Sine pulse

No. of Shocks: 3 shocks on

each of 6 directions

Total of 18 shocks.

PREET at Room Temp.

INSET during test.

POET at room Temp.

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test.

8.2.7. Power Supply Compatibility

Test Objective

To demonstrate the ruggedness of the Power supply module.

Test level

1

.

Power supply

compatibility

Normal 22-29V

Abnormal 20-31.5V

Transient surge: 59V for 50ms0V for 7 sec

Emergency operation: 16V same as

normal

Power interruption: 0V for 50ms (AC & DC)

Test Procedure

Carry out the parameter checks at room temperature and note down the

outputs as per appendix ‘D’. Now apply the specified voltage and check.

Acceptance Criteria


test.


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EMI/EMC SPECIFICATION

8.2.8 CONDUCTED SUSCEPTIBILITY (CS101) TEST

Test Description: Conducted Susceptibility power leads, 30Hz to 150 KHz

Applicability: `

Applicable to subsystem AC and DC input power leads, not including returns. On AC

lines this requirement is applicable starting from the second harmonic of the

equipment under test power frequency.

Test setup and Test Procedure: As per MIL-STD- 461E

Test Duration:

The test signal voltage shall be applied on to the each power lead

separately for the complete band of frequency. That is approx. 30 minutes for each

test run.

Specification Limit Lines

The EUT shall not exhibit any malfunction, degradation of performance, or

deviation from specified indications, beyond the tolerances indicated in the

individual equipment or subsystem specification, when subjected to a calibrated

test signal with voltage levels as per Curve #2 specified in Figure: 1 CS101-1.


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Figure: 1 CS101-1 Voltage limit for all applications


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Fig: 2 CS101 TEST SETUP

Test Method: Take PREET, INSET and POET as per the appendix ‘D’.

8.2.9 CONDUCTED SUSCEPTIBILITY (CS114) TEST


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Test Description: Conducted Susceptibility, bulk cable injection, 10 KHz to

200MHz

Applicability:

Applicable to all interconnecting cable bundles, power cable, and separately

on positive (high) line/wire, excluding neutral/ground lines.


Test Duration:

The test signal current shall be applied on to the each cable for the complete

band of frequency. That is approx. 90 minutes for each test run.

Specification Limit Line


deviation from specified indications beyond the tolerances indicated in the

individual equipment or subsystem specification, when subjected to a pre-calibrated

current limit CURVE #3, shown in fig: 4 CS114-1 test limit (selected from Table VI

applicable for platform) and is modulated as specified in test procedures of Mil-Std-

461E, i.e., 1 kHz pulse modulation, 50% duty cycle.

The test shall be performed for a complete band of frequency on each connector.


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Figure No: 3 RS114 test levels


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Figure No: 4 Table VI CS114 Curve


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Fig: 5 CS114 Test Setup



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8.2.10. CONDUCTED SUSCEPTIBILITY (CS115) TEST

Test Description: Conducted Susceptibility bulk cable injection, impulse excitation

Applicability:

Applicable to all interconnecting cable bundle, power cable and separately on

positive line/wire excluding neutral / ground line.


Test Duration:

The test signal voltage shall be applied on to the each cable for duration of 60

seconds.

Specification Limit Line:


deviation from specified indications, beyond the tolerances indicated in theindividual equipment or subsystems specification, when subjected to a pre-

calibrated signal having rise and fall times, pulse width, and amplitude as specified

in Figure 6 CS115-1 at a 30 Hz rate for one minute.


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Fig: 6 CS115 Signal characteristics


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Fig: 7 CS115 Test Setup


8.2.11. CONDUCTED SUSCEPTIBILITY (CS 116) TEST

Test Description:


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Conducted Susceptibility, damped sinusoidal transients 10 KHz to 100MHz

Applicability:

Applicable to all interconnecting cable bundles, power cable, and separatelyon positive (high) line/wire, excluding neutral/ground lines.


Test Duration:

The test signal current shall be applied on to the each cable for six spot

frequencies. That is approx. 45 minutes for each test run.

Specification Limit line:



individual equipment or subsystem specification, when subjected to a signal having

the waveform shown in Figure: 8 CS116-1 and having a maximum current limit of 5

Amperes as specified in Figure: 9 CS116-2. As a minimum, compliance shall be

demonstrated at the following frequencies: 0.01, 0.1, 1, 10, 30, and 100

MHz, if there are other frequencies known to be critical to the equipment

installation, such as platform resonances, compliance shall also be demonstrated at

those frequencies. The test signal repetition rate shall be no greater than one pulse

per second and no less than one pulse every two seconds. The pulses shall be

applied for duration of five minutes on each Connector.


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Fig: 8 Typical CS116 Sinusoidal waveform


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Fig: 9 CS116 limit wave


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Fig: 10 CS116 Test setup



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8.2.12. RADIATED SUSCEPTIBILITY (RS103) TEST

Test Description: Radiated Susceptibility electric field 2 MHz to 18GHz

Applicability:

Applicable to all equipment / subsystem enclosures with interconnecting cables.


Test Duration:

The electric field shall be applied for completed band of frequency with the

scan rates specified or minimum 10 minutes in each band.

Specification limit line



individual equipment or subsystem specification, when subjected to the radiated

electric fields 20 V/m and 60V/m in the frequency range of 2 MHz to 1 GHz and

1GHz to 18 GHz respectively (selected from the Table VII RS103 limits applicable for

Plat form Air force) with 1 kHz pulse modulated, 50% duty cycle. Up to 30 MHz, the

requirement shall be met for vertically polarized fields. Above 30 MHz, the

requirement shall be met for both horizontally and vertically polarized fields.

The duration of the test shall be as per the Mil-Std-461E susceptibility

requirements or minimum of 10 minutes in each frequency band.


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Fig: 11 RS103 test levels


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Fig: 12 RS103 Test Setup


8.2.13. RADIATED EMISSIONS ELECTRIC FIELD (RE102) TEST

Test description: Radiated Emissions Electric field 10 KHz to 18GHz


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Applicability:

Emissions from equipment and their interconnecting cables at 1 meter

distance from the equipment shall be measured.


Test Duration: NA

Specifications limit lines:

Radiated Electric Field emissions from the on board equipment and

interconnecting /associated cables shall not be radiated in excess of those shown in

Figures RE102-3 CURVE for Fixed wing internal <25 meters nose to tail. Above 30

MHz, the limits shall be met for both horizontally and vertically polarized fields.


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Fig: 13 RE102 Test level waveform


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Fig: 14

RE102 Test Setup


8.2.14. CONDUCTED EMISSIONS POWER (CE102) TEST


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Test Description: Conducted Emissions Power leads 10 KHz to 10MHz

This requirement is applicable for radiated emissions from equipment and

subsystems on AC and DC input power leads, including returns (which are not

grounded internally), that power from other sources.

Emissions on 28V power leads shall not be exceeded the values shown in figure

CE102-1(basic curve) in the frequency range of 10 KHz to 100 MHz

Applicability:

Applicable on AC and DC input power leads, including returns (which are not

grounded internally), that power from other sources.


Test Duration: NA

Specification Limit Line

Conducted emissions on power leads (AC and DC) shall not exceed the

applicable values as shown in Figure CE102-1 limit line.


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Figure: 15 CE102-1 limit lines (EUT power leads, AC and DC) for all

applications


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Fig: 16 CE102 Test Setup


8.2.15 HUMAN ELECTROSTATIC DISCHARGE (HESD) TEST

Test Description: Human Electrostatic Discharge


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The EUT shall not be exhibit any malfunction, degradation of performance,

deviation from specified indication, beyond the tolerances indicated in the individual

equipment or subsystem specification when subjected to a 20kV pulse amplitude (A

150 pF capacitor is charged to an amplitude of 20 KV Pulse and discharged through

150 resistor) on each connector of EUT and the chassis. Two pulses shall be

discharged on each of the connector and EUT chassis with a time interval of 5

seconds between the pulses

Applicability:

Applicable to all interfacing connectors mounted on the equipment and chassis


Test Duration: 2 pulses to be discharged on each connector and equipmentchassis.

Specification limit line

The EUT shall not be exhibit any malfunction, degradation of performance,

deviation from specified indication, beyond the tolerances indicated in the individual

equipment or subsystem specification when subjected to a 20kV pulse amplitude

(A 150 pF capacitor is charged to an amplitude of 20 KV Pulse and discharged

through 150 resistor) on each connector of EUT and the chassis.


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