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S-3000N 掃描式電子顯微鏡簡易操作手冊 VERSION 1.2S-3000N 外觀圖 電子槍 接物孔徑 SE 偵測器 特性 A)二次電子像解析度(SEI Resolution)3.0nmB)背向電子像解析度(BEI Resolution)4.0nmC)倍率(Magnification)5~300,000 倍,能隨著加速電壓(Acc.V.)及工 作距離(W.D)改變而自動校正。 D)加速電壓(Accelerating Voltage)0.5~30kV E)探針電流(Probe Current)10 -12 ~10 -8 A F)可變真空掃瞄式之氣動閥全自動真空系統(真空值:1~270 Pa 可調 ),並可顯示真空讀值。 GChamber 大小:標準 6 吋樣品空間。 I)樣品座移動範圍:X 80mm Y 40mm Z 5 to 35mm T -20° to 90° R 360° 1

S-3000N 掃描式電子顯微鏡簡易操作手冊

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Microsoft Word - S-3000N.docA(SEI Resolution)3.0nm B(BEI Resolution)4.0nm C(Magnification)5~300,000 (Acc.V.)
(W.D) D(Accelerating Voltage)0.5~30kV E(Probe Current)10-12~10-8A F(1~270 Pa
) GChamber 6 IX80mm Y40mm Z5 to 35mm T-20° to
90° R 360°
(A) .......................................................................................................6
(B) ………………………………………………………………...8
(B) …………………………………………………….13
2
X K1
Y K2
X
Y
5 MAGNIFICATION 6 CONTRAST 7 BRIGHTNESS 8 FOCUS
3

RP
EVAC
LOW
(6) PC Windows 2000 (profession. Workstation Version)
(7) Press Ctrl+Alt+Delete to log on
CtrlAlt Delete
7

PC-SEM
B

()
“Shut down the computer
YES) “It is now
safe to turn off your computer

high()



(3)
X=30mm Y=20mm T=0 Z=EX R=as desired
(4)
EVAC/ AIR EVAC
Z () 15~35mm
T 0
(6) 3~4 HIGH
(7)

BSE
BSE
BSE

BSE
composition image
topographic image
3 Vacuum Mode SEMHigh Vacuum Mode
11Vacuum Mode


VP-SEM
BSE
High vacuum Mode
HV
() ON OFF

3


ABC Image Setup ABC

CONTRAST






IMAGE SHIFT
XY
15mm +/-20μ
m X,Y






2

17
4

B


Alignment STIGMATOR/ALIGNMENT XY
A Aperture



C XStig X YStig Y


ASF
E AGA
AGA




2 HV 3 HV Control AFS
High

4