Marcel Gaudet

12/11/2010

Education

• University of Alberta, Edmonton, Canada– BSc Metallurgical Engineering, 1990.– Started MSc Metallurgical Engineering:

• Thesis Incomplete: Electron Diffraction Characterization of Nickel Thin Film Metallization on Indium Phosphide.

• Goal to find a stable thermally resistant thin film Ohmic contact in preparation for AuInNiwork.

• Teaching Assistant for Safety/Risk and Loss Management program (grade papers/exams, substitute lecturing).

• Received Leonard E. Gads Teaching Assistant Award• Received Honorable Mention for ASM Poster

• University of Phoenix, Fountain Valley, CA– MBA Technology Management, 1999. 3.85 GPA

• Virginia Commonwealth University– German Language, Signal Processing, BioSensors.– Started PhD Engineering:

• Thesis: Systems Engineering approach to build an electronic nose using gas exposure to excite a sensor array of conductive polymer over comb structures and other bio-sensors by measuring impedance shift over time and building a library of signatures using principal component analysis.

• Western Governors University– BS IT (database emphasis), Ongoing.

Training / Awards / Projects / Specializations

• MCP (Microsoft certified)• PMP (PMI certification) - Project Management.• CIW Professional certification (including both Web and Data Design Specialist certifications).• A+ and Project+ (CompTIA certified)• Extensive use of PC scripting in Minitab, Excel, Access. • High level use of PC applications including MS Office (Excel, Word, Power Point, Access, and MS Project.• Significant experience with Minitab and JMP statistical analysis software, and limited experience with other statistical packages.• Data mining using MS Business Objects, SQLExpress 2008, Excel (including VBA, ODBC, SQL) and Oracle.• ISO 9000 implementation experience. ISO 9001 and TS 16949 experience.• US Citizen; Bilingual English and French

Semiconductor Specific• Knowledge of a broad spectrum of semiconductor technology and process applications (greatest strength in Etch, Endpoint, APC, SPC) and equipment

vendors (Trikon, Lam, Applied, TEL, Brooks).• Semiconductor process and metrology equipment experience: including ProMetrix; NanoSpec; Tencor; Rudolph; Hitachi SEM & TEM (electron

microscopes), EG&G (optical emission spectrometer)• OEM hardware maintenance and diagnosis: including MKS, ENI, and PC related hardware

STMicroelectronics• Six Sigma - Green Belt (Omnex certification)• Corporate Achievement Award: BQS project contributed to a 74% reduction in yield excursions between 2007 and 2008 by systematically enforcing

standard recovery requirements (project facilitator/champion).• Corporate Achievement Award: KLA ACE (EDA software) implementation, recipe development, and training (program manager for process engineering).

Applied Materials• Corporate cash Award: Statistical yield analysis of modified Interferometric Endpoint hardware• Statistical Analysis of Critical Dimension Response to Wet Clean Cycle and Process Chemistry

VCU• Graduate level course work in Signal Processing and BioMEMS / BioSensor Engineering• Systems Engineering approach to the development of an electronic nose using biosensors

UofA• Electron Diffraction Characterization of Nickel Thin Film Metallization on Indium Phosphide• Leonard E. Gads Teaching Assistant Award• Honorable Mention ASM Conference Poster.

Skills

• “Soft” Assets: While I have an engineering brain, I do have a personality and can communicate with upper management, customers, and line workers alike. I cultivate positive relationships with customers and peers, have a steep learning curve, adapt quickly to changing situations and priorities, and can easily and effectively manage conflicting priorities. I am do my best work when kept in the loop. I prefer a collaborative approach to problem solving, however I am not afraid to confront when it proves necessary.

• “Hard” Assets: My primary experience is shared between Program Management, Quality Management and Continuous Improvement (including Six Sigma, TQM, 8D, FMEA). I have a Customer Service and Problem Solving focus from my years as a field process engineer with semiconductor capital equipment vendors.

• Project/Program Management• Continuing Process Improvement• Customer Service and Support• Field Installation Management• Problem Solving / Optimizing• Total Quality Management• Computer Aided Production / Manufacturing• Presentations

Situation / Action / Response• Situation: Deadline: STMicroelectronics – Carrollton, TX• Prepared a statistical analysis and sampling plan for a medical device despite the loss of the SME, and within a two week deadline. • Action: A novel statistical process control plan for a new medical device had been completed to monitor physical dimensions during

manufacturing. Production was established and qualified locally and was in the process of being transferred to another facility due to a local permanent shut down of manufacturing operations. RIF of most manufacturing personnel, CAM modelers, and many engineers, including the SME were on a prescribed schedule. Up to this point, the customer had required sampling on each wafer in a batch for qualification purposes. This proved to be an onerous load on the CAM software due to the large number of individualmeasurements and the calculations involved, and would not be manufacturable at the new production site. Data from the final qualification lots was not ready until after the SME was released. Having prepared in advance for the eventuality by obtaining a pass-down from my employee (the SME) and working closely with the division Product Engineer, I completed a statistical analysis showing that only two wafers per batch were required. This represents a reduction from 25/25 to 4/25 (or 84%) in the sampling rate.

• Result: Despite concerns regarding the limited two-week timeframe, the Product Engineer was very pleased to accept the resulting statistical analysis, including the background information used to formulate the sampling plan, and the presentation I prepared to explain the basis for the large reduction in sampling rate. Additionally, we discussed the risk and planned to reduce the sampling rate again by half given analysis of a larger population of qualification data.

• Situation: Training: STMicroelectronics – Carrollton, TX• A company-wide EDA software roll-out was launched and notification that license fees for the existing software would expire in one

year. At that time, the entire database was also being migrated from one vendor to another.• Action: The local CAM model pre-dated corporate standards for setup and this created many problems when pulling information

from the existing databases. In addition to the problems with naming convention, the overall CAM structure had an additional non-standard level of flexibility built-in, and the CAM software had several patches and customizations installed that were not available elsewhere. As representative for Process Engineering, I participated in early adoption of the software, identifying and documenting problems for the OEM, coordinating the replacement of existing web-based queries, validating the function of new queries, and training the Process Engineers as users of the highly complex Object Oriented query and data processing language.

• Result: I received a corporate recognition award for my individual efforts in this program.

• Situation: Program Management: STMicroelectronics – Carrollton, TX• As co-chair of a site-wide effort to reduce the number of manufacturing scrap excursions to zero, I supported and championed a

home-grown Basic Qualification System being developed by the CAM modeling group.• Action: The qualification system permitted interlock of individual manufacturing equipment by preventing its return to production

operation prior to passing specific qualification procedures that were customized based on the description of the maintenance that had been performed.

• Result: The decrease in the number of excursions was 75% in the first year of operation and a further 50% reduction in the next year. I received a corporate recognition award for my efforts in championing this program.

Situation / Action / Response• Situation: Customer Support: Applied Materials – Richmond, VA

• A problem application with a low mean time between clean (high unit cost). Though factory technical support had devised a solution, changing a customer application is very difficult as a complete process requalification is required. We were in danger of losing the application.

• Action: I emphasized the need for marathon testing of the new hardware at AMAT factory (3X more than had ever been done before) and used the data to convince the customer to install a module and attempt qualification (despite several months cycle time required). I also convinced the customer to provide normalized yield data (for a vendor, this is generally unheard of) and completed a yield comparison using JMP statistical software.

• Result: The yield data validated the marathon testing and the comparison showed no statistically significant difference (numerically, slightly better). We then put together a qualification plan to upgrade the remaining chambers. In the end, I received a corporate award for this project.

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• Situation: Cost Reduction: Applied Materials – Richmond, VA

• A problem application, with a long recovery time following cleaning, frequently required engineering and vendor support.

• Action: I monitored endpoint data for several months and worked in conjunction with the customer`s equipment and process engineers responsible for the application to test new seasoning methodologies with the ultimate goal being to shorten the time and cost of seasoning the process chamber by several hundred percent without impact on the overall process.

• Result: The new methodology was refined to minimize seasoning time and material, also permitting a consistent procedure for manufacturing operations that did not require Engineering intervention. The customer’s lead process engineer (a Russian PhD - former nuclear fusion expert) upon receipt of my report, told me in all seriousness "In my country, this is Thesis".

Current Projects

Current Projects

Current Projects

Current Projects

Relative comparison of measurement equipment across a variety of product sizes and set points.

Current Projects

Relative comparison of measurement equipment across a variety of product sizes and set points.

Current Projects

Prototype test station metrics through MSExcel across a variety of product sizes and set points.-Automated Excel macro does ODBC to SQLExpress database, runs macro, creates pivot table, standardizes the chart and publishes to web page.

Thank You!