NanoFocus AGGERMANY

Optical 3D Measurementby NanoFocus

µsurf – Custom + AFM

NEW

µsurf Custom Portal

NaniteAFM 110µm

µsurf – Custom + AFM

Easy 2D- and 3D Analysis

µsurf – Custom + AFM

membrane ceramics

AFM AFM

Very high resolution: XY = 1,7nm / Z = 0,34nm

Same analysis platform (MountainsMap) for both systems (µsurf & AFM)

µsurf – Custom + AFM

Benefits

2in1 - Confocal 3D Microscope and AFM Fast and time efficient measurement Easy to use High resolution pictures No application preparation necessary

(cutting, sputter coatings, fixing) no vaccuum necessary Non destructive observation and

measurment 2D and 3D measurements (profile, radius,

area, volume, angles pores, etc.) Same analysis software for both systems

(MountainsMap) Also large samples can be measured (No

vacuum chamber) Customized software Automatable Interfaces (Qs-STAT)

µsurf – Custom + AFM

µsurf + AFM SEM

Full focused pictures possible possible

High resolution observation possible possible

2D measurements possible possible

3D pictures possible Not possible

3D measurements profile, radius, area, volume, angles pores, etc.

Not possible

Roughness measurement Possible (according to ISO Norms 4287, 25178)

Not possible

Time for gaining one picture 10 seconds 30 minutes

Sample preparation No preparation Cutting, sputtering, fixing on specimen holder

Vacuum chamber No vacuum Vacuum necessary

Easy to use Very easy Advanced

Non destructive measurement Non destructive Destructive

Size of sample Not limited Limited through size of vacuum chamber

Sample type No limitations limitations

References - Industry

References - University

Thank you very much!

www.nanofocus.de