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NC STATE UNIVERSITY
Manipulation of Room Temperature Ferromagnetic Behavior of GaMnN Epilayers.
Our work at NCSU on GaMnN
DMS device fabrication and testing
*GaMnN i-p-n structures with different Xp were fabricated
*I-V curve for Xp=0.17m is almost flat due to an almost fully depleted p-GaN
*As Xp increases, I-V curves of device rectifying p-n junctions are more evident
* Our experimental results are consistent with a simple estimate of carrier
depletion solving 1-D poison’s Eqn.
DMS device fabrication and testing
*For VR ≤ 3V, the Ms is independent of applied voltage
*Ms starts to decrease at VR =4V
*For VR=5V the p-layer is fully depleted and the GaMnN film is almost paramagnetic
Contact for Hallmeasurement
Sapphire
GaN template (0.75m)n-GaN (0.5m)
p-GaN (Xp)
34
1Va
Wp
GaMnN (0.5m) 2
Contact for Hallmeasurement
Sapphire
GaN template (0.75m)n-GaN (0.5m)
p-GaN (Xp)
34
1Va1Va
Wp
GaMnN (0.5m) 2
*Demonstration of the first electric field controlled room temperature DMS-based devices
GaMnN heterostructures on GaN:Mg/GaN:si/GaN stacks were grown by MOCVD. The
RT FM of these multilayer structures increases with Xp in the range 0.16 m ≤ Xp ≤ 0.25
m. These heterostructure based devices were fabricated and studied by AGM
measurement. AGM measurement shows decrease in Ms with reverse bias due to
depletion of p-GaN. The FM of these multilayer with undepleted p-GaN layer is
independent on the top GaMnN for tGaMnN >200 nm and decreases for tGaMnN < 200 nm.
Thus the RT FM of GaMn i-p-n structure based devices can be changed by manipulating
hole concentration in the p-GaN layer and tGaMnN, which would have application in room
temperature spin electronic components.
Conclusions:* We found that the ferromagnetism in GaMnN is carrier mediated
* GaMnN i-p-n devices were designed and fabricated for RT FM
* GaMnN i-p-n devices show electric field controlled FM at RT
* Demonstrated manipulation of RT FM in GaMnN based DMS devices
Magnetoresistance of GaMnN i-p-n devices
Summary
This work was supported by U. S. Army Research Office
Ferromagnetic semiconductor based devices that utilize both the charge and spin of
electrons to process and store information can have higher speed and efficiency, as well
as reduced size and power consumption. Most recent studies on dilute magnetic
semiconductor (DMS) materials have been focused on GaMnAs and InMnAs.
* Enhancement of FM by activating more
holes in p-GaN/GaMnN/p-GaN
heterostructures.
* Annealing activates more holes from the
* The starting film is Paramagnetic, where the Mn energy band is completely filled with electrons.
Structure GaMnN/GaN:Mg
Ec
Ev
EF
Ec
Ev
GaMnN GaN:Mg
Mn Mg
PM
GaN:Mg; 0.15 m
GaMnN; 0.375 mGaMnN; 0.375 m
GaN:Mg; 0.35 m
FM
N. Nepal1, M. Oliver Luen1, P. Frajtag2, J. M. Zavada1, S. M. Bedair1, and N. A. El-Masry2
1Electrical and Computer Engineering, North Carolina State University, Raleigh, NC 27695 USA2Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695 USA
Introduction
Motivation
Magnetic random access memories (MRAM)
Europhysics News (2003) Vol. 34 No. 6
DMS: offers a multifunctional device that could replace several components.
FM Semiconductor
Current injection
Suffers with interface scattering
Solution
Using dilute magnetic semiconductor (DMS)
Ref. H. Ohno et al., Nature 408, 944 (2000).
Metal gateInsulatorInMnAsInAs(AI,Ga)SbAISbGaAs substrate
RHall was measured at 22.5 K
VG>0 VG=0 VG<0
Ref. Fukuda et al., Appl. Phys. Lett. 91, 052503 (2007).
GaAs
InAlAs
GaMnAs
GaAs
AlAs
GaMnAs
(a)Schematic view of the device and microscope image of the channel region of the device. (b) Setup for TMR measurement. (c) TMR of MTJ-A measured at temperatures between 50 and 60 K.
Ga(In)MnAs based spin electronic devices work at low temperatures only!
SiGe
AlPAlAs
GaNGaP
GaAsGaSb
InPInAs
ZnOZnSe
ZnTe
10 100 1000Curie Temperature (K)
Computed Values of the Curie Temperature (using the Zener model description) for various p-type semiconductors containing 5% of Mn and 3.5 X 10 20 holes/cm3.
Ref: Dietl, et. al., Science, Vol. 287, 1019 (2000).
* According to Zener model, predicted Tc for GaMnN is above room temperature
* Highest reported Tc for Ga(In)MnAs
material system =185 K
* Tc (GaMnN) > 300 K (RT)
Ref. National Laboratory for Advanced Tecnology and nano Science, Nottingham Univ.
GaMnN could be the potential DMS to manipulate FM at room temperature
Previous work on III-V DMS
Variation of Ms with Xp and tGaMnN
A strong dependence of the GaMnN film ferromagnetism on p-GaN thickness was observed
Our work at NCSU on GaMnN
Heterostructure design and MOCVD growth
Magnetic measurement on heterostructures
* GaMnN layer on top of n-GaNparamagnetic
* GaMnN layer on top of p-GaNferromagnetic
* Annealing GaMnN/p-GaN doubles Ms
FM is hole mediated
*For Xp = 0.17 m, GaMnN i-p-n structure is
PM due to fully depleted p-GaN
* For Xp=0.25 and 33 m, it is FM
*By changing thickness of p-GaN layer in GaMnN i-p-n structure we can manipulate FM
FM of GaMnN i-p-n structures can be manipulated by varying the p-GaN or GaMnN layer thickness
*Ms increases with Xp and saturates for Xp ≥
0.25 m
*For Xp ~ 66 nm the GaMnN structure is PM
*No effect of tGaMnN on Ms for Xp=0.17 m
*For Xp = 0.25 m, MS decrease for tGaMnN
< 200 nm
Variation of Ms with Xp Variation of Ms with tGaMnN
Sapphire
GaN template (0.75m)
n-GaN (0.5m)
p-GaN (Xp)
i-GaMnN (0.5m)
,0 Md
RB
d
RR s
Hall
*VR increases the depletion width at the p-n junction by depleting the holes at the
junction that interact with the localized Mn ion spins.
* Only the holes near the GaMnN/p-GaN interface interact with localized Mn ion spins
Ref. NCSU- Nepal et al., Appl. Phys. Lett. 94, 132505 (2009).
OHE AHE
FM of GaMnN i-p-n structures can be manipulated by biasing p-n junction
Ref. NCSU-Reed et al., Appl. Phys. Lett. 86, 102504 (2005).
Si-
dop
ing
CB
VB
t2 Mn3+
0.3 eVe
1.7. eV
Mg-d
opin
g
* Si-doping moves the fermi level “Ef” up completely filled Mn band
* Mg-doping moves the fermi level “Ef” down empty Mn band
* Since Mn forms deep level in GaN, Si and Mg doped GaMnN films are insulating.
)exp(KT
Ep A∝
Loss of the ferromagnetism (FM)
Gain of the ferromagnetism (FM)
Ref. Arkun et al., Appl. Phys. Lett. 85, 3809 (2004).
GaMnN heterostructures were grown by metal organic chemical vapor deposition (MOCVD) and studied by alternating gradient magnetometer (AGM) and Hall measurements.