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PVDF(Piezoelectric)
SiO2
Si
Parylene
PDMS
PLA
Top Electrode
Bottom ElectrodesVia
Ni Traces (Layer 2)
Ni Traces (Layer 1)
Summary of Fabrication
Based on passive PDMS pillar arrays
Add 3-axis force sensitivity on each pillar
Thin membrane over pillars
Alignment is critical Pillars, piezoelectric
elements, electrodes Use single set of
alignment marks for all layers
PDMS Membrane
[Roure, et al. PNAS 2005]
1. Si wafer
2. Deposit silicon nitride by LPCVD
3. Spincoat with resist
4. Pattern alignment features in resist
5. Etch silicon nitride using RIE
6. Strip resist in oxygen plasma
Fabrication - Alignment Features
1. Spincoat with resist
2. Pattern resist by e-beam lithography
3. Etch Si using DRIE
4. Strip resist
6. Pour PLA
7. Deposit common top electrode by e-beam evaporation
5. (Silanize wafer to improve PLA release)
Fabrication - Pillar Mold
1. Spincoat with PVDF (piezoelectric)
2. Spincoat with resist
3. Pattern using e-beam lithography
4. Etch PVDF using RIE
5. Strip resist
Fabrication - Piezoelectric Elements
1. Spincoat with PDMS
2. Pattern bottom electrodes and first set oftraces by e-beam lithography and liftoff
3. Deposit SiO2 dielectric layer by PECVD
11.Deposit parylene by CVD
4. Spincoat with e-beam resist and patternby e-beam lithography
5. Etch through SiO2 by RIE
7. Sputter with Ni
8. Spincoat with e-beam resist and patternby e-beam lithography
9. Etch exposed Ni
6. Strip resist in acetone
10.Strip resist
Fabrication - Electrodes
Electrodes
PVDF
1. Flip over and bond parylene layer to Si wafer with low heat and pressure
2. Peel off top Si wafer and SU-8 mold
Fabrication - Wafer Bonding
1. Begin with Si wafer
2. Spincoat with photoresist
3. Spincoat with diluted PDMS
4. (Treat in oxygen plasma)
PDMS Membrane
1. Flip over PDMS-coated wafer and bond to pillars
2. Peel away support wafer
3. (Treat in oxygen plasma)
Mold Release
Parametric Study
Dependence of output voltage on pillar geometry
Diameter Height Electrode geometry
material properties
2 2
334
material geometry of electrode and pillar
3 6 4 sin / 264 23 x
hD D s s h L
dV F
e D s D
Inverse analysis
1 3
2 2 21 3 1 1 2 2 2 3 3
1 3
1 3
2 2 21 1 2 2 2 3 3
2
2 2 2
2
arccos2 2 2 2
zz
V VF
V V V V V V V V VF
V V
V V
V V V V V V V
33
2 2
334
2
3 6 4 2 sin / 232
3
z
d h
e s D s
D D s s h L hd
e D s D
Additional resultsResonance frequency Tip displacement
3 3 6
4
20.077 μm
3 3x x
x
F L F L
E I E D
22 2
0
2 2
20
33* ( )
4 560
( ) 3*
128
L
L
Dm d y dy L D
d d y Dk EI dy E
dy L
2
2
1 * 77017.41 Hz
2 * 88
k EDf
m L
Frequency Response
Lumped element model Long, thin Ni wires in and out of pillar Electrode of pillar modeled as parallel
resistor & capacitorRwire
Rwire
RPVDFCPVDF
Frequency Response
Circuit element values calculated from material properties
41.2m106.523
m1020m101.63215
69
AR Ni
wire
18
2
18
182
0
1091.1μm 5236.0
)μm 1)(μm10(
F103.34μm 1
μm 5236.0**7.4
PVDF
PVDF
R
C
Frequency Response
Bode plot shows ωC >> any frequency we will be sensing
sRCRRR
R
Z
ZsH
PPWWP
P
EQ
P
22)(
Thermal Noise
The electrodes and PVDF form an RC system
As in Senturia, this arrangement will create thermal noise in the system
Need to ensure RMS thermal noise << output voltages
fTRkV BRMS 4
Thermal Noise
Consider noisy resistor to be a noiseless resistor an a voltage source
RPVDF
CPVDFVOUTVNOISERPVDFCPVDF
RCssH
1
1)(
Thermal Noise
Calculate noise bandwidth
Calculate thermal noise
This is acceptable, since our outputs will be hundreds of mV
mV 1364.04 fTRkV BRMS
Hz0038.04
1
)2(1
10 2
RCdf
RCff
Actuation
Piezoelectrics allow for both actuation and sensing
Electromechanical coupling factor k
kPVDF ≈ 0.1 to 0.3 Easy to run in reverse to stimulate cell
energy mechanicalinput
energy electrical storedor
energy electricalinput
energy mechanical stored 22 kk
Actuation
Applied voltages will have to be roughly 10x the voltage out for a corresponding deflection
This puts it at a reasonable value for actuation voltage
Actuation would have to be calibrated experimentally
2
22
energy electricalinput
energy mechanical stored
V
dk
Sensitivity Analysis Change in voltage output for a given change in
force: Slope of linear parametric plots
y = 24.85x
0
200
400
600
800
1000
1200
0 10 20 30 40 50
Height of the pillar, L (um)
Ou
tpu
t v
olt
ag
e r
an
ge
(m
V)
y = 469.71x
0
200
400
600
800
1000
1200
1400
1600
1800
0 0.5 1 1.5 2 2.5 3 3.5 4
Distance between electrodes, h (um)
Ou
tpu
t vo
ltag
e ra
ng
e (m
V)
Sensitivity Analysis
0
100
200
300
400
500
600
700
0 0.2 0.4 0.6 0.8 1 1.2
Radial width of the electrode, s (um)
Ou
tpu
t vo
ltag
e ra
ng
e (m
V)
Sensitivity Analysis
y = 5.5061x
0
100
200
300
400
500
600
0 20 40 60 80 100 120
Applied Force (nN)
Vo
ltag
e O
utp
ut
(mV
)
5061.5
][][
mVVnNF
nNmV
F 0248.05061.5
1364.0
Resolution where system noise is the limiting factor
Sensitivity Analysis
Effect of variation in pillar diameter on output voltage
ΔV = (30mV/μm)(0.06 μm) = 1.8 mV
Diameter varies by ~10nm → Output voltage varies ~mV
Resolution affected by fabrication processes
Sensitivity Analysis
Effect of PVDF layer uniformity (4% )
At F = 100nN, ΔV[mV] = 450Δx[μm]
This results in an output voltage range of 36 mV
ΔF = 36 mV/5.5061 = 6.54 nN
y = 5.5061x
0
100
200
300
400
500
600
0 20 40 60 80 100 120
Applied Force (nN)
Vo
ltag
e O
utp
ut
(mV
)
Sensitivity Analysis
Worst case scenario: At F=100nN, output voltage varies over a total
range of 20 + 36 + 1.8 mV = 57.8 mV ΔF = 10.50 nN (~10% error)
Effect of variation in pillar height
DRIE allows pillar height to vary ~μm
At F = 100nN, output voltage can range over 20 mV