LEA - S500 Elemental Analyzer

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LEA - S500 (LIBS)

LEA-S500 is a modern powerful tool based on the latest cutting-edge technology

in the fi elds of optics, lasers, spectroscopy and software. The instrument enables

to detect the element (chemical) composition of a sample in a few minutes.

Capabilities Advantages

• Minimal sample preparation when

measuring mass fraction (concentration) of

chemical elements or oxides in a sample

• Express multi-element analysis. Complete

chemical analysis at one measurement

• High sensitivity and precision of

measurements in the wide range of

concentration

• Sample aggregate state change is not

required

• The sample analysis in a given point area

of the surface by means of the positioning and

video systems

• Layer-by-layer analysis of surfaces, fi lms,

deposits, corrosions

• Analysis of inclusions, fl aws, defects

Detectable elements from H to U, the measuring

range from 0.1 ppm to 100%. The minimal mass

of the atomized substance (material consumption

at the analysis) is 50 nanograms.

Qualitive analysis of 50 elements within 5

minutes.

Complete (multi-element) quantitative sample

analysis in 3 to 30 minutes.

Analysis of any solid and powdery materials:

• Ceramics, glass, refractories

• Metals, alloys and slags

• Potassium salt

• Row/basic materials

• Mineral structure of biosphere

objects

• Food

• Forage

• Crude drug

• Rubbers, caoutchoucs, plastics

• Traces and admixtures in pure

materials

• Chemical agents

• Ores, minerals and mono-mineral

inclusions

• Natural materials (clays, sands,

dolomite, soda, salt etc.)

• Ash of herbal and animal origin

• Wood

• Solid residue of liquids

• Frozen liquids

Detectable elements from H to U, the

measuring range from 1 ррм to 100%. The

minimal mass of the atomized substance

(material consumption at the analysis) is 50

nanograms.

Qualitative, semiquantitative and quantative

analysis of materials, components, additives,

impurities, inclusions, etc. at all production

stages as well as control of end products in

practically any industry:

• Glass industry

• Geological industry

• Semiconductor industry

• Ferrous and non-ferrous metallurgy

• Construction materials

• Forensic science

• Materials technology

• Scientifi c research

• Engineering

• Raw materials extraction and

processing

• Ecology

• Certifi cation

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Sample Preparation

There is no need in sample preparation

in case of analysis of solid or monolithic

materials (metals, alloys, glasses, ceramics,

etc.); sometimes fl at area of a sample surface

is required. When analyzing a transparent

sample (glass, crystal) the area under

analysis must be additionally polished.

For powdery sample analysis (refractory

components, slags, concentrates, sands,

ashes, etc.) the materials must be grinded and

then pressed into pellets.

Powdery sample preparation takes about 10-

20 minutes. 100 mg of a sample material is

required for preparation of the pallet.

• Analysis of element distribution in a

sample with step from 30 µm. Mapping of

element distribution along the surface and

depth

• There is no need in superpurity reagents

and expensive consumables

• An inert gas is not required for solution of

most of the tasks

• Cleaning of sample surface by preliminary

laser pulses

• Universality. The instrument does not

require reconfi guration or modernization for

performing the tasks mentioned

• Analysis of conducting and non-

conducting materials

• Analysis of wire of any diameter, balls,

We have designed LEA-S500 simple to operate just after the installation. Training

is a matter of hours and no special knowledge required. More advanced ways to

use LEA-S500 are always open through intuitive and easy learning curve.

cylinders without additional manipulations

with the help of adapters (included into the

delivery set)

• Perfect operating safety, complete

protection from harmful factors exposure

No need in sample prepation in case of analysis

of solid or monolithic materials (metals, alloys, glasses,

ceramics)

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LEA - S500 (LIBS)

• Double-pulse, nanosecond, with double-

pulse repetition rate of 20 Hz

• High energy, space and time stability

• Control over excitation pulse energy and

delay between pulses in the wide range

Special laser source

of excitation

Unique system of recording

short pulse light signals

• High quantum effi ciency within the range

of 175-800 nm

• High sensitivity

• Wide dynamic range

• Low noise of dark signal

• Low relative non-uniformity of output signal

• “back-illuminated” (“back-thinned”) CCD

• Registration frequency – 20 Hz

Spectrograph

• High-aperture aberration-free system with

compensated astigmatism

• Dispersion from 0,5 nm/mm (for 3600

grooves/mm grating) to 1,0 nm/mm (for 1800

grooves/mm grating)

• Air evacuation system with insert gas

induction port (for operation in 175-193 nm

range)

The spectrum of Li (0.02 ppm) in quartz

Titanium alloy spectrum, high resolution spectral lines.

Specially designed laser as a spectrum excitation source allows to analyze conducting and non-conducting materials.

High-resolution spectrograph allows a high-quality aberration-free fl at optical fi eld to be obtained. Multi-element spec-

trum detection system (2048 pixels CCD camera) ensures fast data readout.

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Technical SupportWe provide technical support services relating to the instrument and

to the software during the operational life of the instrument. Thanks to

our experts’ assistance you will enjoy the instrument perfomance.

Skilled instructors will help you to gain theoretical and practical

training, required to optimize benefi ts from the instrument at your own

site.

Our innovative solutions allow to guarantee:• High accuracy and precision of measurements

• Low detection limit of elements

• Use of analytic lines at the optimal concentration sensitivity,

free from reciprocal overlaps

• Maximum effi ciency of analytical light signal use

• Ease of operation and maintainance

ATILLA 2 Software includes:

• Spectral lines database

• Reference materials

• Analyzed samples database (archive)

ATILLA 2 Software provides:

• Automated sample analysis

• Calibration and recalibration

• Graphic display of continuous spectrum

• Sample surface observation, selection of any point or area

to be analyzed

• Development of analytical programs by a user (selection of

spectra excitation and registration modes, algorithms of spectral lines

mathematical processing, the instrument calibration)

• Quality and reliability control over the analysis results

• Printing out and mathematical processing of analysis results

• Storage of unlimited amount of analytical programs

• Control over the analyzer and the system status

• Wavelength scale autocalibration

Sample Chamber• A sample area to be anlysed is selected by means of the built-in

video camera and positioning system

• The system of air exhaust up to 10mm Hg (mercury column)

is available

• There is air evacuation system with inert gas induction port

(for operation in 175 - 193 nm range) in spectrograph and in sample

chamber

The compact one-piece wheeled design

of the instrument provides smooth and easy moving

along the working area.

Automated analysis can be perfomed at any point on a sample surfase

Карта распределения Al2O3 на поверхности образца, %

Analysis of the refl ective coating, area 2 x 2 mm, 400 points.

Mapping of concentration of Al2O3 on sample surface, %

Atilla 2 software package is a powerful companion to LEA-S500.

It is easy to install and provides “state of the art” aquisition, display

and processing capabilities. Highly confi gurable software settings

make LEA-S500 suitable for scientifi c experiments.

ATILLA 2 Software

Sample chamber

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LEA - S500 (LIBS)

Table of the detection limits and ranges of the analyzed concentrations of some elements in

industrial iron base, copper base, aluminum base and titanium base alloys

Element

Detection

Limits

3s, ppm

Base

Iron , % Copper, % Aluminum, % Titanium, %

Min Max Min Max Min Max Min Max

Al 1 0.001 2 0.01 11 База 0.03 10

Ag 0.1 - - 0.001 0.5

As 40 0.001 0.1 0.015 0.06 0.008 0.5

B 2 0.005 0.2 0.005 0.05

Be 0.1 - - 0.0005 2 0.0001 0.2

Bi 5 - - 0.005 0.1 0.001 0.7

C 1 0.05 4.5 - - 0.001 0.02

Ca 0.1 0.001 0.01 0.0001 0.05

Cd 0.2 - - 0.0001 0.3

Ce 4 0.001 0.1

Co 2 0.005 15

Cr 1 0.005 30 0.01 1.5 0.01 0.5 0.05 4

Cu 0.5 0.001 10 База 0.01 10 0.002 3.5

Fe 0.5 База 0.01 15 0.005 2 0.01 2.5

Mg 0.1 0.001 0.15 0.01 5

Mn 0.2 0.003 18 0.003 7 0.01 2 0.001 3

Mo 1 0.005 20 0.01 7

Na 0.05 - - 0.001 1

Nb 5 0.003 1.5

Ni 0.8 0.001 40 0.01 20 0.001 1 0.01 0.03

P 20 0.01 0.5 0.01 2

Pb 3 0.01 0.5 0.01 15 0.01 0.3

S 10 0.005 0.2

Sb 10 0.001 0.2 0.005 1.5

Si 3 0.005 20 0.01 5 0.01 17 0.06 0.7

Sn 10 0.001 0.15 0.01 20 0.01 2 0.05 4

Ti 0.3 0.001 10 0.01 2 База

V 1 0.005 10 0.05 7

W 5 0.01 16 0.01 1

Zn 0.5 - - 0.01 50 0.001 2

Zr 1 0.001 0.5 0.01 0.3 0.001 6

Au 1

Note:

Average ratio error of measurements - 2 -3 %.

Time of analysis – from 40 sec to 3 min depending on quantity of simultaneously detected elements

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Table of the detection limits and ranges of the analyzed concentrations of elements in some

non-conducting materials

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tectio

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imits

3s, p

pm

O X I D E S, %

Mineral components in

dry plant materials, %

(elements)Medical, fl at, cut

glasses & crystal

High silica sand

and otherOres, rocks, soils

Building

materials,

refractories,

cement

Potassium salt

*compounds

KCl, NaCl,

MgCl2CaSO

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Min Max Min Max Min Max Min Max Min Max Min Max

Al 1.0 0.02 7.5 0.04 0.5 1.0 30 3.0 99.0 0.09 0.15 0. 001 4.2

As 40 0.015 0.5

B 2.0 0.001 12.0 0.0005 0.02

Ba 0.2 0.01 4.0 0.001 0.03

C 1.0 6.0 17.0

Ca 0.1 0.012 12.0 0.003 0.1 0.1 12.0 0.15 75.0 0.1* 0.6* 0.001 3.0

Cd 0.2 0.0001 0.0004

Ce 4.0 0.02 0.15

Co 2.0 0.0003 0.001

Cr 1.0 0.01 0.2 0.0005 0.02 0.0002 0.004

Cu 0.5 0.0001 0.01

Fe 0.5 0.008 0.5 0.003 0.5 1.0 95.0 0.03 12.0 0.25 0. 5 0.0001 1.2

K 0.06 0.03 17.0 0.004 0.04 0.1 7.0 0.01 2.0 93.0* 99.0* 0.01 3.5

Li 0.01 0.0001 1.2

Mg 0.1 0.004 5.0 0.002 0.2 0.1 7.0 0.2 99.0 0.1* 0.3* 0.01 0.5

Mn 0.2 0.001 0.2 0.001 0.1 0.01 1.0 0.01 0.2 0.0001 0.1

Mo 1.0 0.0001 0.0003

Na 0.05 0.09 15.0 0.004 0.5 0.1 5.0 0.1 1.0 0.9* 5.0* 0.003 1.0

P 30 0.01 0.10 0.03 2.0 0.03 8.0 0.01 0.4

Pb 3.0 0.003 33.0 0.0005 0.002

S 10 0.005 0.5 0.01 5.0 0.3 5.0

Si 3.0 50.0 82.0 98.5 99.8 3.0 90.0 0.18 70.0 0.2 0.7 0.01 10.0

Sn 10.0 0.003 0.01

Sr 0.2 0.003 0.30 0.0001 0.02

Ti 0.3 0.01 0.05 0.01 0.5 0.05 2.0 0.02 5.0 0.0001 0.15

V 1.0 0.0001 0.1 0.001 0.2 0.0005 0.005

Zn 0.5 0.004 2.0 0.0005 0.01

Zr 1.0 0.002 0.5 0.001 0.2 0.0003 0.001

Note:

Average ratio error of measurements - 2 -5 %, for base elements - 0,2-1%.

Time of analysis – from 40 sec to 3 min depending on quantity of simultaneously detected elements

* In addition, the following elements can be detected:

LEA-S500 History

1999

The fi rst model of the instrument with the use of

double-pulse laser.

2003

The fi rst line of 5 instruments was released. The

fi rst analysis techniques for metals, glass and

ceramics were developed.

2004

The instrument was equipped with the fi ltration

system of the operating chamber to prevent

personnel intoxication by disintegration products.

2005

Automated sample positioning for the surface

mapping (making the maps of elements distribution

along the sample surface) and for the enhancement

of analysis representation. The technique of

impurity analysis of up to fi ve-layer coatings was

developed.

2007

Metrological certifi cation

The system of air exhaust provided the operating

chamber pressure up to 10mm Hg.

The air evacuation with inert gas induction port in

the operating chamber and the spectrograph.

2008

New double-pulse (collinear) excitation source of

spectra. High space, energy and temporal stability.

Wide range of excitation modes (from 40 to 150 mJ

per pulse in the spot of 30-1200 µm) allows analysis

of any elements in any samples.

2010

Unique registration system of short pulse light

signals synchronized with the excitation source.

2011

New algorithm of analysis results calculations with

simultaneous use of several dozens of analytical

channels with the aim of minimizing error random

component and non-spectral inter-element impact.

SOL instruments Ltd.

tel: +375 17 290-07-17

fax: +375 17 290-07-16

sales@solinstruments.com

www.solinstruments.com

58, Nezavisimosti ave.

Minsk 220005 Republic of Belarus

Mailing address:

Minsk 220005 BY P.O. Box 235

SOL instruments Ltd. is an innovation-focused developer and manufacturer of technologically

advanced instruments for light measuring, elemental analysis and nano-scale microscopy.

For two decades we inbreed our knowledge and expertise in spectroscopy, microscopy and

lasers and create robust tools for scientifi c and industrial applications in three core segments:

analytical equipment, spectroscopy instruments and laser systems.

We are proud to be a part of the world most advanced scientifi c explorations and excited to

bring high quality solutions to our customers.