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Industry’s first 1200V Half Bridge Module based on GaN
technology
Outline
1200V Module based on GaN MISHEMT
Measurement results
Operational principles
Summary
Product Portfolio
RDSON 22mΩID (DC) 80ASMT pkg
RDSON 80mΩID (DC) 20ASMT pkg
RDSON 150mΩID (DC) 12A
Discrete devices and module - Wide range delivered power!
RDSON, mΩ
0.5 kW
3 kW
10 kW
The lowest RDSON GaN Device on the market
0 20 40 60 80 100 120 140 160
650V
Optimized for:
Tested in a Buck converter, 400V to 200V; CCM; hard switching
• Dead time - 75nS
• Inductor 340uH
VisIC GaN: V22N65A High Efficiency
92
93
94
95
96
97
98
99
100
0 1000 2000 3000 4000 5000 6000 7000 8000 9000
Effi
cie
ncy
[%
]
Power [W]
Efficiency vs load
100kHz
200kHz
300kHz
98.9% @ 100kHz
98.4% @ 200kHz
98.1% @ 300 kHz
• Liquid Cooling
• 28°C ambient temperature 22 mOhm 80 A 650V
Product Portfolio
RDSON 22mΩID (DC) 80ASMT pkg
RDSON 80mΩID (DC) 20ASMT pkg
RDSON 150mΩID (DC) 12A
Half Bridge Module RDSON 40mΩID (DC) 80A
Discrete devices and module - Wide range delivered power!
RDSON, mΩ
30 kW
0.5 kW
3 kW
10 kW
The only company worldwide with 1200V GaN
The lowest RDSON GaN Device on the market
0 20 40 60 80 100 120 140 160
1200V
650V
Optimized for:
VisIC advances GaN to 1200V range
with lower switching losses comparing to Si and SiC
Locked potential of GaN HEMT
Properties Si SiC GaN
Energy Gap, eV EG 1.12 3.2 3.4
Electron Mobility, cm2/Vs μ 1400 500 1200-1800
Breakdown Field, MV EB 0.3 3-5 5
Thermal Conductivity, W/cm τθ 1.5 3.7 3 - 4.5
Drift velocity, cm/s, 1e7 vs 1 1.4 2.5
Relative dielectric constant, εr 11.8 10 11
GaN
offers
the best properties for power
SiliconBsr
Bsr
E
ECFOM
2
2
Baliga FOM:
It is up to us to unlock it
Outline
1200V Module based on GaN
Measured results
Operational principles
Summary
Half Bridge module: VM40HB120D
40 mOhm
80 Amp continuous current, 320A peak
Push
Pull
HV+ MP HV-
Ceramic Cap
Enable
circuit
Balanc
e
Enable
circuit
Balanc
e
Push
Pull
64 mm
31
mm
GaN GaN
D-mode GaN MISHEMT, direct drive approach
(ALL Switch©)
Outline
1200V Module based on GaN
Measured results
Operational principles
Summary
Results: Half Bridge CCM Waveform
Buck, continuous current mode (CCM), hard switching at 3.6kW output power
Results: Half Bridge CCM Waveform
Switching frequency: 100kHz
Duty cycle: 50%
Inductor - 330uH inductance
𝑽𝒊𝒏 = 𝟖𝟎𝟎𝐕
𝐏𝒐𝒖𝒕 = 𝟑. 𝟔𝐤𝐖
Minimum current is 5.5A
Maximum current is 13A
Temperature of module
baseplate after 30 minutes of
work was measured as 45°c
Buck, continuous current mode (CCM), hard switching at 3.6kW output power
Mid Point Voltage; 200V/div
800V/400V;
9.13Amp Pout
Inductor current; 5A/div
Results: Switching time
TRISE= 10 ns
TFALL= 4 ns
I = 32.6A
V = 800V
The lowest switching time for the class of performance
Current; 10A/div
Voltage, 200V/div
Results: Efficiency vs load
Total efficiency including inductor losses is above 97.5% at 3.5kW
CCM, hard switching; 100kHz frequency; 9A output current
97.6197.4897.2496.9196.6996.47
90
91
92
93
94
95
96
97
98
99
100
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Effi
cie
ncy
[%]
Power [W]
Test bench limited at time of test
Switching energy results:
VisIC 1200V HB module 1 leg: 800V
0
50
100
150
200
250
300
350
5 10 15 20 25 30
Ene
rgy
[µJ]
Current [A]
Eon energy (uJ)
Eoff energy (uJ)
Total Energy (uJ)VisIC 1200Vmodule
30.9W @ 100kHz
60.8W @ 200kHz
124W @ 400kHz
Results: Switching energy comparison
Combination of low Coss and fast switching times result inrecord switching loss of GaN device versus SiC :
HEMT vs MOSFET
Outline
1200V Module based on GaN
Measurement results
Operational principles
Summary
Operational principle Two GaN transistors for each side
Push Pull
HV+ MP HV-
Ceramic Cap
Enable circuit
Balance
Enable circuit
Balance
Push Pull
64 mm
31
mm
GaN GaN
Operational principle Two GaN transistors for each side
HV+ MP HV-
64 mm
31
mm
Push Pull
V18
V22
NORMALLY ON
NORMALLY OFF
G1
G2
D2D1
C1
Push Pull
V18
V22
NORMALLY ON
NORMALLY OFF
G3
G4
D3
D4C2
Operational principle
QUESTIONS
How is the high voltage divided between
two serially connected GaN transistors?
How are the transistors balanced?
What happens with temperature
difference?
How is the high voltage divided
between two serially connected GaN
transistors?
Equally
How high voltage is divided
between two transistors?
0.0E+00
5.0E-07
1.0E-06
1.5E-06
2.0E-06
2.5E-06
3.0E-06
3.5E-06
4.0E-06
4.5E-06
5.0E-06
0 100 200 300 400 500 600 700 800 900 1000 1100 1200 1300
IDS
A
VDS, V
Breakdown Voltage measured on two transistors
Total current capacity 80A continuous current
VGS =-12V
VGS =-12V
How is the high voltage divided
between two transistors?
For two separate transistors: VGS =-12V
VGS =-12V
VGS =-12V
S
0.0E+00
5.0E-08
1.0E-07
1.5E-07
2.0E-07
2.5E-07
3.0E-07
3.5E-07
4.0E-07
4.5E-07
5.0E-07
5.5E-07
6.0E-07
0 100 200 300 400 500 600 700 800 900 1000 1100 1200 1300
IDS,
A
VDS, V
1.0E-09
1.0E-08
1.0E-07
1.0E-06
0 100 200 300 400 500 600 700 800 900 1000 1100 1200 1300
IDS
A
VDS, V
Breakdown Voltage measured on two transistors
How is the high voltage divided
between two transistors? For two separate transistors: Leakage is higher @ same voltage
1.0E-09
1.0E-08
1.0E-07
1.0E-06
0 100 200 300 400 500 600 700 800 900 1000 1100 1200 1300
IDS,
A
VDS, V
Breakdown voltage measured on one transistor
DEG
Si Substrate
Buffer
GaN
AlGaN
source draingate
Lateral GaN HEMT with spatially separated buffer and
channel could be designed to scaled up
Physics of GaN lateral connection
CDS
RDS
gM
RS RSGRDG
RD
RG
CDGCGS CG
DEG
Si Substrate
Buffer
GaN
AlGaN
source draingate
Lateral GaN HEMT with spatially separated buffer and
channel could be designed to scaled up
Physics of GaN lateral connection
No
el
ectr
on
s h
ere
No
el
ectr
on
s h
ere
CDS
RDS
gM
RS RSGRDG
RD
RG
CDGCGS CG
RBUFFER
Lateral GaN HEMT with spatially separated buffer and
channel could be designed to scaled up
Physics of GaN lateral connection
RBUFFER
CDS
RDS
gM
RS RSGRDG
RD
RG
CDGCGS CG
RBUFFER
CDS
RDS
gM
R
S
RS
G
RDGRD
RG
CDGC
GS
CG
Reduced COSS is a bonus
Physics of GaN lateral connection
CDS
RDS
gM
RS RSGRDG
RD
RG
CDGCGS CG
CDS
RDS
gM
R
S
R
SG
RDGRD
RG
CDGC
GS
CG
RBUFFERRBUFFER
𝑪𝑶𝑺𝑺 =𝟏
𝟐𝑪𝑶𝑺𝑺𝟏 + 𝑪𝑶𝑺𝑺𝟐
Operational principle
QUESTIONS
How is the high voltage divided between
two serially connected GaN transistors?
How are the transistors balanced?
What happens with temperature
difference?
Operational principles:
Follow me balance VD≈0V
+-
G2
G1
C1
D1
D2
VBD1=400V; VBD2=12V;
VCC
V22Normally OFF by direct drive
V18Normally ON
Operational principles:
Follow me balance
Turning OFF:
+12V
0V
VD≈0V
VS2=VCC=+12V
VGS2=VG2-VS2= -12V
+-
G2
G1
C1
D1
D2
zero voltage signal G2
VGS on G2 becomes -12 relative to
source
Voltage at A starts to rise
Voltage at B starts to rise with delay,
due to intrinsic CGS’
When voltage on B reaches -7.5V, V18
closes
VD rises to 800V
If VGS1 >-12V, D2 conducts keeping
safe G1 voltage relative to source.
VBD1=400V; VBD2=12V;
VCC
A
B
CGS
VD=800V
V22
V18
Operational principles:
Follow me balance
Turning OFF:
+12V
0V
VD≈0V
Voltage
Vmid-Point ≈ VD /2
VS=VCC=+12V
VGS=VG-VS= -12V
G2
G1
C1
D1
D2
Safety net:
If point A jumps above 412V, D1
starts to conduct, reducing
voltage at A back to below 412V.
VBD1=400V; VBD2=12V;
VCC
A
B
CGS
VD=800V
+-
Smooth rise/fall time
The lowest switching time for the class of performance
HARD SWITCHING CCM MODE DC/DC 800V/400V
VDS (200V/div)
IDS (5A/div)
Smooth rise/fall time
VDS (200V/div)
2uS/div
Additional Upside: known GaN chip, Mass production ready
97% efficiency at
5.8kW @ 350kHz,
VDS, 200V/div
Inductor Current ≈25A
73°C TJ on High Side
V22N65A switch.
BUCK DC/DC 400V/200V
CCM mode/hard switching conditions
TFALL=7.8nsTRISE=6.3ns
Operational principle
QUESTIONS
How is the high voltage divided between
two serially connected GaN transistors?
How are the transistors balanced?
What happens with temperature
difference?
What happens with temperature
difference?
If one of transistors in pair is hotter?
Leakage current goes UP
Voltage drop goes DOWN
Transistors self-balance
Operational principles: Trace layout
Minimum Gate
inductance
Minimum Gate
inductance
HV+ HV-DC link
MP
Enable circuit
Enable circuit
Bus Power Loop
VGS HS
VGS LS
Thermal image
Thermal management
800V input, under 50°C at the hottest spot
100kHz, 800V Bus, 3.6kW
High side
TVS Diodes
Outline
1200V Module based on GaN
Measured results
Operational principles
Summary
Results: Half Bridge CCM Waveform
Switching frequency: 100kHz
Duty cycle: 50%
Inductor - 330uH inductance
𝑽𝒊𝒏 = 𝟖𝟎𝟎𝐕
𝐏𝒐𝒖𝒕 = 𝟑. 𝟔𝐤𝐖
Minimum current is 5.5A
Maximum current is 13A
Temperature of module
baseplate after 30 minutes of
work was measured as 45°c
Buck, continuous current mode (CCM), hard switching at 3.6kW output power
Mid Point Voltage; 200V/div
800V/400V;
9.13Amp Pout
Inductor current; 5A/div
Summary
The experimental results of 1200V Half Bridge Module,
measured at 3.6kW power at continuous current mode
(CCM) hard switching, are presented
Demonstrated GaN module shows a great potential for
applications in the voltage range of 900 and 1200V
Future work is planned to complete measurements at
higher power level up to 20 kW and optimize module for
high frequency >300kHz and increase current and…
Now GaN starts to fulfill promises
made in 2010 Source: Yole Power GaN Report, November 2010
Thank You for Attention
Operational principles:
Follow me balance
CGS role
+12V
0V
VD≈0V
Voltage
Vmid-Point ≈ VD /2
VS=VCC=+12V
VGS=VG-VS= -12V
G2
G1
C1
D1
D2
CGS in open state ~1uF
CGS in closed state ~700pF
C1 is 100pF
VA = 8.3V; VB = 0.83V; VGS1 =
-7.5V top GaN closed
VCC
A
B
CGS
VD=800V
+-