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Institutt for Informatikk IN5240 Fundamentals of RF Circuit Design Part 2 Sumit Bagga * and Dag T. Wisland ** * Staff IC Design Engineer, Novelda AS ** CTO, Novelda AS

IN5240 Fundamentals of RF Circuit Design Part 2

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Page 1: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

IN5240 Fundamentals of RF Circuit Design

Part 2

Sumit Bagga* and Dag T. Wisland***Staff IC Design Engineer, Novelda AS

**CTO, Novelda AS

Page 2: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Outline

• Wireless communication systems• Performance metrics of a wireless receiver• RF building blocks

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 3: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

2 May 16, 2008

7.1 Mixers characteristics

Frequency conversion Frequency Conversion

• RF wanted signal is down-converted by a mixer i.e., multiplication with a local oscillator (LO), 𝑓!" in time domain

• Multiplication in time domain à convolution in frequency domain (shift of RF signal)

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 4: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Image

Image is the unwanted signal that lies symmetrically to the RF signal of interest with respect to the 𝑓!"

[Liscidini, ISSCC, 2015]

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 5: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Hartley Receiver

Spectrum of sine and cosine are asymmetrical à image

[Liscidini, ISSCC, 2015]

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 6: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Noise Mixing

• Receive mixer down converts wanted and the image bands to IF frequency à folding of noise at image frequency on top of wanted band at IF, and is: – Noise at desired and image RF bands down converted à

IF – Added noise from mixer circuit

• If the mixer is noiseless, SSB NF is 3 dB because of the image noise folding

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 7: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

SSB and DSB Noise

• SSB NF assumes no signal at the image frequency except source noise• DSB NF assumes image band w/ noise and an image signal equal to

the wanted signal

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

RFThermal Noise

�f

�LO

Image

IFThermal Noise

Page 8: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

RF MixersPerformance Metrics

• Noise• Linearity: P1dB, input inferred intercept points (IIP3, IIP2)

– OP1dB = IP1dB + (𝐺 − 1)– IP1dB + 10.6 dB = IIP3

• Voltage conversion gain/loss• Port-to-port isolation (LO-RF, RF-LO and LO-IF)

– Leakage from a port to another is undesirable• Supply voltage• Power dissipation

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 9: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Passive and Active Mixers

• Current and voltage mixers à transistors are switches• What is the ideal LO waveform?

– RF signal is multiplied by square wave not sinusoidal

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

EE215C B. Razavi Win. 13 HO #2

56

RF Mixers (I) General Considerations x Performance Parameters - Noise - Linearity: IP3, IP2 - Voltage Conversion Gain - Supply Voltage - Power Dissipation x Passive and active Mixers

x SSB and DSB Noise Figures

[Razavi, EE215C]

Page 10: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Single and Double Balanced Mixers

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

EE215C B. Razavi Win. 13 HO #2

57

x Port-to-Port Isolation The leakage from each port to the other may degrade the performance: - LO-RF Feedthrough - RF-LO Feedthrough - LO-IF Feedthrough And all other combinations … x Single-Balanced and Double-Balanced Mixers

What is the ideal LO waveform?

[Razavi, EE215C]

Page 11: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Passive Voltage Mixer

• Active devices (transistors) operate in triode• Large signals at input/output à difficult to completely

turn on/off transistorsIN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

[Liscidini, ISSCC, 2015]

Page 12: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

Passive Current Mixer

• Active devices (transistors) operate in triode• Low input impedance of transimpedance amplifier

input à small voltage swings at source/drain

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

[Liscidini, ISSCC, 2015]

Page 13: IN5240 Fundamentals of RF Circuit Design Part 2

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Active Current Mixer

• Transconductor stage à input voltage to current• Switches (transistors) operate in saturation (i.e.,

cascodes coupling/de-coupling RF to IF

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

[Liscidini, ISSCC, 2015]

Page 14: IN5240 Fundamentals of RF Circuit Design Part 2

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Mixer Comparison

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

[Liscidini, ISSCC, 2015]

Page 15: IN5240 Fundamentals of RF Circuit Design Part 2

Institutt for Informatikk

LNA Performance Metrics

• ‘Dominant’ input device suppresses noise contributed subsequent blocks à ↑ gain– Trade-off gain for linearity

• Optimize input device for lowest noise figure– NF < 2 dB à CS-stage w/ 𝑔# ≫ $

%&Ω and minimum

gate resistance, 𝑅'• Cover bandwidth specified by standard• Conjugate matching at the input

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 16: IN5240 Fundamentals of RF Circuit Design Part 2

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LNA Stability

• Design for unconditional stability stable across any source (antenna radiation) impedance, 𝑍#– 𝐾 = $(|*!!|"(|*""|"+|∆|"

%|*!!||*""|

– ∆ = |𝑆$$𝑆%% − 𝑆$%𝑆%$|

– 𝜇 = $(|*!!|"

|*""(∆*!!∗ |+|*!"*"!|

• Measure two-port stability– 𝐾 > 1 and Δ < 1 or 𝝁 > 𝟏

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 17: IN5240 Fundamentals of RF Circuit Design Part 2

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LNA Topologies

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Common-Source (CS) Common-Gate (CG) Broadband• +CG (Cascode)

• Resistive feedback

• Inductive load

• Inductive degeneration

• +CG

• Inductive load

• Feedback

• Feedforward (Boosted CG)

• Noise-cancelling

• Reactive cancelling

Page 18: IN5240 Fundamentals of RF Circuit Design Part 2

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Typical CMOS IC Process

p-sub

n-wellp-well p+ n+

thick metal

vias metal

NMOS(not isolated)

PMOSNMOS

For passive devices, the most important things are (in order ofimportance):

Metal conductivity, distance to substrate, substrateconductivityOther important considerations include a triple-well (or deepnwell) for isolation

Top one or two layers are usually thicker

Niknejad Advanced IC’s for Comm

CMOS Process

• Active devices: triple-well (or deep n-well) for isolation

• Passive devices: metal conductivity, substrate resistivity and distance to substrate– Use top 1 or 2 metal layers à ‘thick’ Cu/Al (2-4 µm)

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 19: IN5240 Fundamentals of RF Circuit Design Part 2

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BEOL

• IC fabrication step after FEOL (front-end-of-line) is BEOL (back-end-of-line) à on-wafer interconnection of devices with metal wiring

• Modern sub-micron CMOS (< 90 nm) processes àtypically +9 metal and re-distribution (RDL) layers

• Dielectrics à complex stack-up of low and high-dielectric materials

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 20: IN5240 Fundamentals of RF Circuit Design Part 2

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Passive Devices

• RF components– Inductors/transformers– Capacitors – Transmission lines – Varactors (MOS devices)

• Design considerations– Accurate EM modeling to create SPICE (lumped

element) models– Density fill à

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 21: IN5240 Fundamentals of RF Circuit Design Part 2

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MIM & MOM Capacitors

• MIM (metal-insulator-metal): parallel-plate capacitor à two planes of metal (or polysilicon) separated by a thin oxide w/ high dielectric constant

• MOM (metal-oxide-metal)– Multi-finger inter-digitated capacitor à vertical BEOL

metal stack and inter-metal dielectrics

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 22: IN5240 Fundamentals of RF Circuit Design Part 2

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MOM vs MIM

• High density à MIM (unit capacitance of MOM < MIM)

• High quality factor à MIM• Cost à MOM (MIM require extra mask)

Niknejad, EECS 105

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 23: IN5240 Fundamentals of RF Circuit Design Part 2

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Inductors

• Deep sub-micron processes à low 𝐾 (thin) metals (7-9) à ↓ 𝑄 inductors/T-lines– Reduce cost; alternative à thick/ultra-thick metals

• Uses include filtering, impedance matching (tuning out capacitance (w/ series or parallel resonance)), high gain and power efficiency and low noise figure (e.g., w/ reactive negative feedback), high linearity

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 24: IN5240 Fundamentals of RF Circuit Design Part 2

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Inductor Types

Monolithic Transformers for Silicon RF IC Design, Long, JSSC, 2000

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 25: IN5240 Fundamentals of RF Circuit Design Part 2

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Inductor Topologies and Metrics

• Self-inductance, Q-factor, SRF (self-resonance frequency)

• Geometric considerations– Rectangular/square/octagonal/circular/F8– Spiral or symmetrical– Center-tap – Shielding (floating or grounded)– Tapered

• Physical parameters– Outer to inner area, number of turns, metal width,

spacing; tapering?

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 26: IN5240 Fundamentals of RF Circuit Design Part 2

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Substrate, Skin and Proximity Effects

• Current flows through a loop (or spiral) àmagnetic fields pass through substrate à induce eddy currents in opposite direction (Lenz’ Law)– ↓ w/ high resistivity substrate (luxury!)

• ↑AC resistance and current flows near surface à↑ distance – Skin depth Cu (5.8x107 S/m) is 0.66 at 10 GHz

• Proximity of adjacent conductor à ‘current crowding’

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 27: IN5240 Fundamentals of RF Circuit Design Part 2

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Passive Filters

• Butterworth, Chebyshev, Elliptic, Bessel, …• Design methodology

– Prototype low pass filter design– Transformation from LPF to high pass, band pass and

band stop – Frequency translation

• Impedance transformation

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 28: IN5240 Fundamentals of RF Circuit Design Part 2

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Filters Comparison

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 29: IN5240 Fundamentals of RF Circuit Design Part 2

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LPF Design (rfcooltools.com)

• Normalized capacitors and inductors (𝑔$, 𝑔%, …𝑔&) à denormalized by:

𝐶 = 4!567"8

& 𝐿 = 9!8567"

• 𝑔$ and 𝑔&'$ denote source and load impedances and are equal to 1

• 𝐶, 𝐿 and 𝑔 (normalized values) are obtained from a look-up table

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 30: IN5240 Fundamentals of RF Circuit Design Part 2

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Transformation from LPP

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

[Kim, EEE 194]

Page 31: IN5240 Fundamentals of RF Circuit Design Part 2

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T and π Filter Networks (rfcec.com)

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 32: IN5240 Fundamentals of RF Circuit Design Part 2

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What is an Oscillator?

• Converts dc power à sinusoidal waveform• High-Q LC tank or a resonator (crystal, cavity, …)

– Lossy LC-tank à amplitude of the oscillator decays

• Oscillation frequency, power, phase noise/jitter, stability, tuning range

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 33: IN5240 Fundamentals of RF Circuit Design Part 2

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Oscillator Design

• Amplitude and frequency stability • Concept of negative resistance • Oscillator topologies (Colpitts, Hartley, Clapp,

Cross-coupled, …)• Injection locked oscillators

– Locking range, injection pulling,

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 34: IN5240 Fundamentals of RF Circuit Design Part 2

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Positive Feedback

• Oscillators à feedback systems• Fraction of the output signal is fed back to sustain

oscillations à ‘injected’ energy required to compensate for lossy tank

Feedback Perspective

vo

−vo

n

gmvin : 1

Many oscillators can be viewed as feedback systems.The oscillation is sustained by feeding back a fraction ofthe output signal, using an amplifier to gain the signal,and then injecting the energy back into the tank. Thetransistor “pushes” the LC tank with just about enoughenergy to compensate for the loss.

A.M. Niknejad University of California, Berkeley EECS 142 Lecture 21 p. 6/25 – p. 6/25

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

[Niknejad, EECS 242]

Page 35: IN5240 Fundamentals of RF Circuit Design Part 2

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Barkhausen’s CriterionLoop Gain ( 𝐴𝛽 )

• Magnitude of the product of open loop gain and the magnitude of the feedback factor of the amplifier is unity– 𝐴𝛽 = 1

• System poles are on jω-axis à constant amplitude oscillations– 𝐴𝛽 < 1à decay– 𝐴𝛽 > 1à amplitude increases exponential to steady-state

• Phase shift around the loop is 0 or integral multiples of 2𝜋

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

Page 36: IN5240 Fundamentals of RF Circuit Design Part 2

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Phase Noise

• Phase noise spectral density (PN) units à dBc/Hz and measured at ∆𝑓 from the 𝑓(

• Low spectral purity à convolution of blocker (∆𝑓) & 𝑓!" à noise contribution in RF BW (reciprocal mixing)

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga

[Liscidini, ISSCC, 2015]

Page 37: IN5240 Fundamentals of RF Circuit Design Part 2

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Key References

1. A. M. Niknejad, EECS 142, 242 and 1052. A. Liscidini, “Fundamentals of Modern RF

Receivers,” ISSCC 20153. E. Kim, EEE 1944. B. Razavi, EE215C

IN5240: Design of CMOS RF-Integrated Circuits, Dag T. Wisland and Sumit Bagga