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9/03/2007 DoD’s Common Test Interface (CTI) David Droste DRS Test and Energy Management Mike Stora System Interconnect Technologies

DoD’s Common Test Interface (CTI)

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DoD’s Common Test Interface (CTI). David Droste DRS Test and Energy Management Mike Stora System Interconnect Technologies. Background. CIWG Report was Published 9/30/96 CIWG was a Government-Funded IPT - PowerPoint PPT Presentation

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Page 1: DoD’s  Common Test Interface (CTI)

9/03/2007

DoD’s Common Test Interface (CTI)

David DrosteDRS Test and Energy Management

Mike StoraSystem Interconnect Technologies

Page 2: DoD’s  Common Test Interface (CTI)

9/03/2007

2

Background

CIWG Report was Published 9/30/96 CIWG was a Government-Funded IPT Identified ATS Mass Termination Interface as a

“Critical” Interface in Need of a Solution Indication an Open-Architecture, Multi-Vendor,

Standards Based Interface was Needed See SCC-20/HIWG Web Site:

http://grouper.ieee.org/groups/scc20/hiwg/

IEEE Standards Coordinating Committee 20 and TC5 of the IEEE IMS Co-Sponsored the Receiver-Fixture Interface (RFI) Effort Has Become a Family of Standards Efforts

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DoD Challenge to Define: Common Test Interface

-

USAFUSAF

1980’s1980’s

NAVYNAVY

CASS

IFTE

AF ATS

TETS

1990’s1990’s

USMCUSMCARMYARMY

• Interoperability

• Low Cost COTS

Availability

• Performance

Repeatability

• Minimum Maint/Support

• Standardized Packaging

• Spiral Development

• Commercial and Military

Applicability

Challenge

General Purpose, Large, Dedicated ATE

Page 4: DoD’s  Common Test Interface (CTI)

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IEEE-Std-1505 RFI – Step One

Defines Framework

Achieves Compatibility/Interoperability Between Manufacturers

Defines All Requirements/Qualifications/Dimensions/Electrical Parameters

Supports Scalability Bench-Top to Multi-bay Test System Applicability Defines Segmented vs Non-Segmented

Defines a Multitude of Connector Module Types Applicable to the RFI System

Page 5: DoD’s  Common Test Interface (CTI)

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IEEE-Std-1505 RFI Scalable Architecture

Page 6: DoD’s  Common Test Interface (CTI)

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IEEE-Std-1505 RFI Segmentation

Segmented Framework SectionSegmented Framework Section Continuous (Non-Segmented) Continuous (Non-Segmented) Framework SectionFramework Section

Page 7: DoD’s  Common Test Interface (CTI)

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Connector Modules

RFI Specification - Sections (Clauses) 7-12 Give Connector Module Details Clause 7 – 200 pin, Single Slot Signal Module Clause 8 – Power Module Size 8 & 16 Contacts

Mixed 8/16 – 45ea. 23Amp & 4ea. 45Amp Size 16

59 Contact Single Slot 152 Contact Two Slot

Clause 9 – Coax Module (3 or 5 GHz) Size 16 Contacts 59 Contact Single Slot 152 Contact Two Slot

Clause 10 – Mixed Power Connector Module 28 each 10A Contact 16 each 20A Contact

Clause 11 –Universal 24 each Size 8 Contacts 40GHz Coax 45Amp Contacts Pneumatic Contacts Fiber Optic Contacts

Clause 12 – High-Speed Signal 300 Contact Single Slot

Page 8: DoD’s  Common Test Interface (CTI)

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IEEE-Std-1505 RFIExample Connector ModulesExample Connector Modules

Signal

Power (Single Slot)

Mixed Power

Multi-slot Coax

Page 9: DoD’s  Common Test Interface (CTI)

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IEEE-Std-1505 RFI Status

Standard Released/Published April 2007 May Be Purchased From IEEE Xplore http://

ieeexplore.ieee.org/xpl/standards.jsp

User Base Already Includes Demonstration and Deployed Systems

IEEE-Std-1505Compliant Interfaces

DRS Large Depot Applic -

SCATE

DRS Benchtop Subset ATE

Page 10: DoD’s  Common Test Interface (CTI)

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Additional 1505 RFI - System Applications

DRS DCCT BSTF V6(NGATS)

Page 11: DoD’s  Common Test Interface (CTI)

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IEEE-P1505.1 CTI

Information Shown Subject to Change Until Standard is

Balloted

Page 12: DoD’s  Common Test Interface (CTI)

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IEEE-P1505.1 CTI

Need Transportability/Rehost Capability of Test Program

Sets

Requires a Standard Pin Map of Signals/Capability

Specific Implementation of: Connector Modules Types per Slot Segmentation

Scalability Physical Mating Compatibility

Keying

Page 13: DoD’s  Common Test Interface (CTI)

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IEEE-P1505.1 CTI - Overview

Transportability of TPSs Between ATE Systems “New” ATE That are Legacy Upgrades Desires for New ATE to be Able to Test Legacy

Weapons Systems PLUS the New Systems Factory to Field Test Compatibility

Required Study of Existing “Legacy” ATE Systems CASS TETS IFTE Etc., Etc., Etc.

Total of 3860 Signals are Mapped in Latest Version

Page 14: DoD’s  Common Test Interface (CTI)

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CTI Segmentation/Scalability

Page 15: DoD’s  Common Test Interface (CTI)

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P1505.1 CTI Functional Type Map

Page 16: DoD’s  Common Test Interface (CTI)

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P1505.1 CTI Pin Map Overview

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P1505.1 CTI Connector Blocks

CTI Does not Utilize all the Connector Types Defined in the IEEE-Std-1505 RFI Standard

Signal pins for 3 Amp service up to 750 MHz

Coax Pins for 3 or 5 GHz performance (In either 59 single-wide and 152 Pin, double-wide Module Blocks)

Power Pins 23 Amp service or Pins (In either 59 single-wide or 152 Pin, double-wide Module Blocks)

Page 18: DoD’s  Common Test Interface (CTI)

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P1505.1 Levels of Compliance

Standard Allows Levels of Compliance

Mechanical – Each Slot has a Compliant (Correct) Connector Module

Full – For Populated Slots, Signals Match the Pin Map

Categories are Defined for Scalability and Compliance

Category 1 = Slots 6 thru 9 Category 2 = Slots 1 thru 9 Category 3 = Slots 6 thru 24 Category 4 = Slots 1 thru 24 Category 5 = Slots 1 thru 29

(All/Full Compliance)

Page 19: DoD’s  Common Test Interface (CTI)

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P1505.1 Compliant Keying

Categories That are Fully Compliant MUST Implement the Keying Shown Below

Non-Compliant Systems MUST Implement a DIFFERENT Keying

Page 20: DoD’s  Common Test Interface (CTI)

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P1505.1 Status

Some Systems Have Implemented Draft Standard

Very Near Initiating Ballot

Latest Information From SCC-20 HIWG Meeting Held 9/15 & 9/16 is: . . . . .

Page 21: DoD’s  Common Test Interface (CTI)

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IEEE-P1505.2

Two-Tier CTI

Page 22: DoD’s  Common Test Interface (CTI)

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IEEE-P1505.2 Two-Tier Interface

Not all Identified Requirements Included in P1505.1

Multi-Tier Support B-1B F-15 C-17 IAIS LMStar

Around 1000 Unassigned Pins From 1505.1 Effort More Research Known to

be RequiredTwo Tier Electro-Mechanical RFI

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Two-Tier P1505.2 Demonstrates Vertical as Well as Horizontal Scalability

Horizontal Scalability

Vertical Scalability

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Summary

Hardware Interfaces Working Group Is Creating A Series Of Standards To Provide The Following Benefits Standards-based, Open-architecture Interface Providing

Multi-vendor Availability For Lowest-cost To The User Improved TPS Rehost/Transportability Though A Defined

Pin-map And Segmentation Scheme Scalability For A Range Of ATE/ATS Capability And Sizes

Standards Group is Continuing Effort to Provide Benefits to the System Integrator and the User

Everyone is Invited to Join the Group by Attending Meetings and Completing a “Bluesheet” at: http://grouper.ieee.org/groups/scc20/bluesheet.html

Learn More at the SCC-20 Web Site: http://grouper.ieee.org/groups/scc20/