Determination of variable magnetic anisotropy in sputtered NiFe films using hysteresisloops (abstract)Debasis Baral Citation: Journal of Applied Physics 57, 4202 (1985); doi: 10.1063/1.334613 View online: http://dx.doi.org/10.1063/1.334613 View Table of Contents: http://scitation.aip.org/content/aip/journal/jap/57/8?ver=pdfcov Published by the AIP Publishing Articles you may be interested in Magnetic induced uniaxial anisotropy in NiFe and NiFeCr films (abstract) J. Appl. Phys. 75, 5800 (1994); 10.1063/1.355567 Magnetic anisotropy in Ni/Fe artificial lattice film J. Appl. Phys. 64, 1343 (1988); 10.1063/1.341857 The magnetoresistivity, structure, and magnetic anisotropy of RF sputtered and Ebeam evaporated NiFe films J. Appl. Phys. 52, 2439 (1981); 10.1063/1.328960 Dependence of Magnetic Anisotropy on the Crystal Structure of Ni–Fe Thin Films J. Appl. Phys. 38, 1356 (1967); 10.1063/1.1709620 Influence of Anisotropy Dispersion on Magnetic Properties of Ni–Fe Films J. Appl. Phys. 34, 1841 (1963); 10.1063/1.1729697

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Determination of variab~e magnetic anisotropy in sputtered Ni-Fe fUrns using hysteresis loops (abstract)

4202

Debasis Saral Recording Technology Center, Memorex Corporation, Santa Clara, California 95052

Hysteresis loops from Ni-Fe films are known I to take shapes that do not always resemble hard or easy axis loops. Distortions in the loops have earlier been related to the deposition conditions and thicknesses of the films. In this work a new experimental approach was developed to understand the nature of distortions inM-H loops. Ni-Fe films with 80 wt. % Ni were sputter deposited under different conditions to obtain varying amounts of easy [111] and hard [200J axis textures (producing variable magnetic anisotropy) in the film. After x-ray characterization, in-plane hysteresis loops from these films were plotted, digitized, and stored. The digitization of the loop was done to perform mathematical operations on different sets ofloops. It was found that a distorted loop can be viewed as an algebraic sum ofloops obtained from different crystallographic orientations of the magnetic alloy. This technique was also used to quantify the volume fractions of easy and hard axis orientations present in the film. In this work, it has been shown that observed distortions in M-H loops are due to the presence of easy and hard axis orientations in the plane of the film and can be empirically related to the preparation condition or thickness of the film.

1 G. S. Cargill III, S. R. Herd, W. E. Krull. and K. Y. Ahn, IEEE Trans. Magn. MAG-IS, 182 (1979).

J. Appl. Phys. 57 (1), 15 April 1985 0021-8979/85/014202-01 $02.40 © 1985 American Institute of Physics 4202 [This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP:

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