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Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical Transactions A Volume 368(1932):5355-5377 December 13, 2010 ©2010 by The Royal Society

Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

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Page 1: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

Defect characterization in graphene and carbon nanotubes using Raman spectroscopy

by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito

Philosophical Transactions AVolume 368(1932):5355-5377

December 13, 2010

©2010 by The Royal Society

Page 2: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

The first-order Raman spectrum of (a) crystalline graphene, (b) defective graphene and (c) highly disordered single-layer graphene deposited on a SiO2 substrate.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 3: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

(a) Schematic showing the electronic dispersion near the Fermi level at the K and K′ points in the hexagonal Brillouin zone of graphene.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 4: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

(a) Evolution of the first-order Raman spectra (using a λ= 514 nm laser) taken from a graphene monolayer sample deposited on an SiO2 substrate, subjected to Ar+ ion bombardment.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 5: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

(a) Definition of the ‘activated’ A-region (darkest grey) and ‘structurally disordered’ S-region (dark grey).

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 6: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

(a) G-band and (b) D-band confocal (300 nm resolution) Raman images of a graphite crystallite deposited on a glass substrate.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 7: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

Scanning tunnelling microscopy (STM) images with atomic resolution obtained from the surface of a nanographite crystallite of a sample with La= 65 nm.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 8: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

(a) The first-order Raman spectra of a nanographite sample heat treated at 2000°C (La=35 nm), for five different laser energy values (1.92, 2.18, 2.41, 2.54 and 2.71 eV).

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 9: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

(a) The intensity ratio ID/IG for nanographite samples is plotted versus 1/La using five different laser excitation energies (filled star, 1.92 eV; filled square, 2.18 eV; filled diamond, 2.41 eV; filled

inverted triangle, 2.54 eV; filled triangle, 2.71 eV;...

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 10: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

(a) Schematic of the atomic structure of edges in r space with the zigzag and armchair orientations.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 11: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

Plots of the dependence on ion fluence of the ID/IG ratio (a) and of the normalized ( function versus ion fluence probed by two laser energies (open circle, Elaser=2.41 eV; filled circle,

Elaser=2.54 eV) and (b) for Si and C ion bombardments.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society

Page 12: Defect characterization in graphene and carbon nanotubes using Raman spectroscopy by M. S. Dresselhaus, A. Jorio, A. G. Souza Filho, and R. Saito Philosophical

Localized excitonic emission from a semiconducting SWNT. (a) Photoluminescence emission at λem=900 nm.

M. S. Dresselhaus et al. Phil. Trans. R. Soc. A 2010;368:5355-5377

©2010 by The Royal Society