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EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors (MOSFET) Review Outline

Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

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Page 1: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

1

Chapter 5: MOS Field Effect Transistors (MOSFET)

Review Outline

Page 2: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

2

Devices and Their Operations

Review Outline

Page 3: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

3Representations of NMOS Transistor

Page 4: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

4Summary

The equation used to define iD depends on relationship btw vDS

and vOV.

vDS << vOV

vDS < vOV

vDS => vOV

vDS >> vOV

2

2

represents mobility of electrons at surface of then-channel in /

charge per unitlength of electron

-channel drift velocityin / in /

(eq5.7) in

n

m Vs

nC m m

n DSD ox V

Vs

O

vi C W Av

L

12

2

2

1

2

(eq5.14) in

(eq5.17) in

(eq5.23) i1

1 n 2

D n ox OV DS DS

D n ox OV

D n ox OV DS

Wi C v v v

LW

i C vL

Wi

A

vL

AC v

A

Page 5: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

55.2.4. Finite Output Resistance in Saturation

Figure 5.16: Increasing vDS beyond vDSsat causes

the channel pinch-off point to move slightly away

from the drain, thus reducing the effective channel

length by DL

2

2

valid when

valid when

(eq5.17) in

(eq5.2

1

21

13) i n2

DS OV

DS OV

D n ox OV

D n ox OV D

v

S

v

v v

Wi C v

LW

i C v v AL

A

Q: What effect will increased

vDS have on n-channel once

pinch-off has occurred?

A: Addition of finite output

resistance (ro).

Q: What is the effect on iD?

Page 6: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

65.2.4. Finite Output Resistance in Saturation

Q: What is ?

A: A device parameter with the units of V -1, the value of which depends on manufacturer’s design and manufacturing process.

Figure 5.17 demonstrates the effect of channel length modulation on iD - vDS curves

In short, we can draw a straight line between VA and saturation.

Figure 5.17: Effect of vDS on iD in the

saturation region. The MOSFET

parameter VA depends on the process

technology and, for a given process, is

proportional to the channel length L.

Page 7: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

75.1.7. The p-Channel MOSFET

iD

2

,

2

,

2

,

2

,

2

1

12

1

2

1

)1(2

1

SDSDtpSGoxptriD

SDtpSGoxpsatD

DSDStpGSoxptriD

DStpGSoxpsatD

VVVVL

WCI

VVVL

WCI

VVVVL

WCI

VVVL

WCI

Page 8: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

8

NMOS and PMOS at DC

Review Outline

Page 9: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

9

Page 10: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

10NMOS (and PMOS) at DC

Exercises D5.9

Determine the value of R such that

VD = 0.8V

Vtn = 0.5V, nCox = 0.4 mA/V2

W=0.72 m, and L = 0.18 m

Exercises D5.10

Combine the circuit in D5.9 with transistor Q2 and find R2 such that Q2 is at the edge of saturation.

Page 11: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

11

NMOS and PMOS Amplifiers

Review Outline

Page 12: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

125.4.2. Voltage Transfer Characteristic

Q: How do we define vDS in terms of vGS for

saturation?

Note: vGS and vDS are instantaneous voltages

(DC+AC)

Figure 5.27: (b) the voltage transfer

characteristic (VTC) of the amplifier

from previous slide

this is equation is simply ohm's law / KVL

2

GS

(eq5.32)

(eq5.33)

1

2

2 1 1V

D

DS DD n GS t D

n D DD

tBn D

i

v V k v V R

k R VV

k R

Q: How do we define point B –

boundary between saturation and

triode regions?

Page 13: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

13

Linear amplification

around Q in

saturation region

5.4.3. Biasing the MOSFET to Obtain Linear Amplification

Page 14: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

14

Linear amplification

around Q in

saturation region

5.4.3. Biasing the MOSFET to Obtain Linear Amplification

Page 15: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

15

Note: that slope of load line

= -1/RD

Page 16: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

16

Model (b) is more accurate

than model (a)

ro = VA / ID

Small signal parameters (gm, ro)

both depend on dc bias point

If channel-length modulation

is considered, (5.51) becomes

(5.54).

less accurate, b/c does not considerchannel length modulation

more accurate, b/c does considerchannel length modulation

(eq5.51)

(eq5.54 ||)

dsv m D

gs

dsv m D o

gs

vA g R

v

vA g R r

v

5.5.5. Small-Signal Equivalent Models

Page 17: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

17Small Signal Models of MOSFET

Hybrid-π model T model

Page 18: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

18

Microelectronic Circuits, Sixth Edition Sedra/Smith Copyright © 2010 by Oxford University Press, Inc.

Figure P5.79

Page 19: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

19

Microelectronic Circuits, Sixth Edition Sedra/Smith Copyright © 2010 by Oxford University Press, Inc.

Figure P5.113

Page 20: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

20

Microelectronic Circuits, Sixth Edition Sedra/Smith Copyright © 2010 by Oxford University Press, Inc.

Figure 5.48 (a) Common-gate (CG) amplifier with bias arrangement omitted. (b) Equivalent circuit of the CG amplifier with the MOSFET

replaced with its T model.

Page 21: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

21Summary

The enhancement-type MOSFET is current the most widely used semiconductor

device. It is the basis of CMOS technology.

CMOS provides both n-channel (NMOS) and p-channel (PMOS) transistors,

which increases design flexibility. The minimum MOSFET channel length

achievable with a given CMOS process is used to characterize the process.

The overdrive voltage |VOV| = |VGS| - |Vt| is the key quantity that governs the

operation of the MOSFET. For amplifier applications, the MOSFET must

operate in the saturation region.

In saturation, iD shows some linear dependence on vDS as a result of the change

in channel length. This channel-length modulation phenomenon becomes more

pronounced as L decreases. It is modeled by ascribing an output resistance ro =

|VA|/ID to the MOSFET model. Although the effect of ro on the operation of

discrete-circuit MOS amplifiers is small, that is not the case in IC amplifiers.

The essence of the use of MOSFET as an amplifier is that in saturation vGS

controls iD in the manner of a voltage-controller current source. When the

device is dc biased in the saturation region, a small-signal input (vgs) may be

amplified linearly.

Page 22: Chapter 5: MOS Field Effect Transistors (MOSFET)faculty.weber.edu/snaik/EE3110/03Midterm2_Review.pdf · EE 3110 Microelectronics I Suketu Naik 1 Chapter 5: MOS Field Effect Transistors

EE 3110 Microelectronics I Suketu Naik

22Summary

In cases where a resistance is connected in series with the source lead of the

MOSFET, the T model is the most conveinant to use.

The three basic configurations of the MOS amplifiers are shown in Figure

5.43.

The CS amplifier has an ideally infinite input resistance and reasonably high

gain – but a rather high output resistance and limited frequency response. It is

used to obtain most of the gain in a cascade amplifier.

Adding a resistance Rs in the source lead of the CS amplifier can lead to

beneficial results.

The CG amplifier has a low input resistance and thus it alone has limited and

specialized applications. However, its excellent high-frequency response makes it

attractive in combination with the CS amplifier.

The source follow has (ideally) infinite input resistance, a voltage gain lower than

but close to unity, and a low output resistance. It is employed as a voltage buffer

and as the output stage of a multistage amplifier.

A key step in the design of transistor amplifiers is to bias the transistor to operate

at an appropriate point in the saturation region.