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[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical & Mechanical Engineer [email protected] Engineering 45 Electrical Properties-2

[email protected] ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

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Page 1: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt1

Bruce Mayer, PE Engineering-45: Materials of Engineering

Bruce Mayer, PELicensed Electrical & Mechanical Engineer

[email protected]

Engineering 45

ElectricalProperties

-2

Page 2: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt2

Bruce Mayer, PE Engineering-45: Materials of Engineering

Learning Goals – Electrical Props How Are Electrical Conductance And

Resistance Characterized What Are The Physical Phenomena That

Distinguish Conductors, Semiconductors, and Insulators?

For Metals, How Is Conductivity Affected By Imperfections, Temp, And Deformation?

For Semiconductors, How is Conductivity Affected By Impurities (Doping) And Temp?

Page 3: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt3

Bruce Mayer, PE Engineering-45: Materials of Engineering

SemiConductivity

Materials of Valence 4 (Grp IVA in the Periodic Table) Exhibit the property of Semiconductivity• Si, Ge in

Particular• C, Sn to a

Lesser Extent

Also Observed in Compounds

• III-V → GaAs• II-VI → InP

Semiconductivity Characterized by• Insulative Behavior at

Room Temperature– 106-1012 times LESS

conductive than metals• INCREASING

Conductivity with Increasing Temp– Opposite of

Metal Behavior

Page 4: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt4

Bruce Mayer, PE Engineering-45: Materials of Engineering

Carriers in Semiconductors

At non-zero temperatures, electrons are thermally excited from the valence band to the conduction band.

The activated “free electrons” and the remaining “holes” left behind act as two “ideal gases”!!

Certain types of impurities that are grown or implanted into the SemiConductor crystal produce extra free electrons or holes.

Energy gap, Eg

Conduction band (at T = 0 K unpopulated with electrons)

Valence band (at T = 0 K totally filled with electrons)

Page 5: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt5

Bruce Mayer, PE Engineering-45: Materials of Engineering

Intrinsic (Pure) Semiconductors

σ Data for Pure Silicon• Note σ↑ as T↑

Why This Temp Behavior?• Semiconductor e−

Band StructureSi electrical conductivity, σ

(S

/m)

50 100 100010-210-1

100

101102103104

pure (undoped)

T(K)

Energy

filled band

filled valence band

empty band

filled s

tate

s

GAP?

– Thermal Energy Can Allow the e- to jump the “Forbidden” Gap between the “Valence” Band and the “Conduction” Band

Page 6: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt6

Bruce Mayer, PE Engineering-45: Materials of Engineering

Intrinsic (Pure) Carrier Concen

Recall Conductivity Eqn from the Metals Dicussion

Note the Exponential Increase in the Intrinsic carrier Concentration, ni or

nq

kTEi

gen Since µ Does Not

change nearly as much as ni with T

kTE ge

Page 7: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt7

Bruce Mayer, PE Engineering-45: Materials of Engineering

Some BandGapsInSb 0.17 eV

Ge 0.67 eV

InN 0.7 eV

HgCdTe 0.0 - 1.5 eV

InGaAs 0.4 - 1.4 eV

Silicon 1.14 eV

InP 1.34 eV

GaAs 1.42 eV

CdTe 1.56 eV

AlGaAs 1.42 – 2.16 eV

InGaP2 1.8 eV

GaAsP 1.42-2.26eV

InGaN 0.7 - 3.4 eV

AlAs 2.16 eV

GaP 2.26 eV

AlGaInP 1.91 - 2.52 eV

ZnSe 2.7 eV

SiC 6H 3.03 eV

SiC 4H 3.28 eV

GaN 3.37 eV

Diamond 5.46 - 6.4 eV

Page 8: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt8

Bruce Mayer, PE Engineering-45: Materials of Engineering

Conduction by e− & h+ Migration Concept of Electrons (e-) & Holes (h+)

• When e- moves to the Conduction Band it leaves Its Parent Atom Core, and Moves Freely

• This Leaves behind an electron “HOLE” Which Results in a POSITIVELY Charged Atom/Ion Core

• This Positive Charge can Attract an e- from an ADJACENT Atom, Thus the hole, h+, can move Left↔Right or Up↔Down– This Transfers the POSITIVE Charge-Center to the

Adjacent Atom-Core– From an electrical current perspective, the Step-by-Step

movement of the hole appears as the movement of a POSITIVELY Charged Particle; some Analogies A bubble in a Liquid moves to the high side of a sealed tube One open Spot in A parking Lots Moves Further from the Bldg

as the cars move into the Close spot in Step-By-Step Fashion

Page 9: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt9

Bruce Mayer, PE Engineering-45: Materials of Engineering

e− & h+ Electrical Conduction Schematically

- +

electron hole pair creation

- +

no applied electric field

applied electric field

valence electron Si atom

applied electric field

electron hole pair migration

- + - +

In Metals, only e− Participate in Electrical Conduction (e− “sea”), But in Semiconductors HOLES also aid conduction

Page 10: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt10

Bruce Mayer, PE Engineering-45: Materials of Engineering

SemiConductor Conductivity

With the Participation of Electrons and Holes• Where

– q electronic charge, 1.6x10-19 Coulomb per e- or h+

– n electron concentration, e-/m3

– p hole concentration, h+/m3

– µe electron mobility, m2/V-s

– µh hole mobility, m2/V-s

hesemi pqnq Qty Si GaAs CdTe InP

µe(m2/V-s)

0.19 0.88 0.105 0.470

µh(m2/V-s)

0.05 0.04 0.008 0.018

µe (4-30) times Greater Than µh

• Why?– Parking Garage

Analogy

Page 11: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt11

Bruce Mayer, PE Engineering-45: Materials of Engineering

h+ & e-Parking Garage

Analogy n-Type

Semiconductor illustrated in (a) & (c)

p-Type Semiconductor illustrated in (b) & (d)

Thus µe >µh

Page 12: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt12

Bruce Mayer, PE Engineering-45: Materials of Engineering

INtrinsic vs. EXtrinsic Conduction INtrinsic SemiConductors → n = p

• Case for “pure” Semiconductors; e.g., Si

EXtrinsic SemiConductors → n p• occurs when impurities are added with a different

no. of valence e−’s than the host (e.g., Si atoms)

N-type EXtrinsic: (n>>p) P-type EXtrinsic: (p>>n)

no applied electric field

5+

4+ 4+ 4+ 4+

4+

4+4+4+4+

4+ 4+

Phosphorus atom

no applied electric field

Boron atom

valence electron

Si atom

conduction electron

hole

3+

4+ 4+ 4+ 4+

4+

4+4+4+4+

4+ 4+enq hpq

Page 13: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt13

Bruce Mayer, PE Engineering-45: Materials of Engineering

Doped SemiConductors: vs T increases w/ Doping

Reason: imperfection sites lower the activation energy needed to produce mobile e- or h+

N-Type Si, n vs T

doped 0.0013at%B

0.0052at%B

ele

ctri

cal co

nduct

ivit

y,

σ

(S/m

)

50 100 100010-210-1100101102103104

pure (undoped)

T(K)– FreezeOut → Not Sufficient

Thermal Energy to ionize either Dopants or Si

– Extrinsic → n = doping– Instrinsic → ni > doping

nd = 1021/m3

Page 14: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt14

Bruce Mayer, PE Engineering-45: Materials of Engineering

FreezeOut etc.

Recall Reln for ni

The similar Reln for (N-Type) dopant Concentrations

– FreezeOut → kT << [Eg or Ed] Neither Si or Dopants are Ionized

– Extrinsic → Ed < kT < Eg

Only Dopants are (Singly) ionized and nd >> ni

– Intrinsic kT>> [Ed or Eg] nd fixed at dopant at%,

ni continues to Rise

kTEi

gen

kTEd

den Impurity

Donor Ed Acceptor Ea

P 0.044

As 0.049

Sb 0.039

B 0.045

Al 0.057

Egap 1.1 1.1

Si D

opan

t Ion

izat

ion

(eV

)nd = 1015/cc

Page 15: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt15

Bruce Mayer, PE Engineering-45: Materials of Engineering

p-n Junction Physics

P and N Type Semi Matls Brought Together to form a METALLURICAL (seamless) Junction

The HUGE MisMatch in Carrier Concentrations Results in e- & h+ DIFFUSION• Remember that?

Carrier Diffusion• e- Diffuse in to the

P-Type Material• h+ Diffuse in to the

N-Type Material

Page 16: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt16

Bruce Mayer, PE Engineering-45: Materials of Engineering

p-n Junction Physics cont.

In a p-n Jcn Carrier Cross-Diffusion is SELF-LIMITING• The e-/h+ Diffusion

leaves Behind IONIZED Atom Cores of the OPPOSITE Charge

• The Ion Cores set up an ELECTRIC FIELD that COUNTERS the Diffusion Gradient

For Si the Field-Filled Depletion Region• E-Field 1 MV/m• Depl Reg Width,

xd = 1-10 µm• E-fld•dx 0.6-0.7 V

– “built-in” Potential

E-Field

Page 17: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt17

Bruce Mayer, PE Engineering-45: Materials of Engineering

p-n Junction Rectifier

A Rectifier is a “Check Valve” for Current flow• Current Allowed

in ONE Direction but NOT the other

Side Issue → “Bias” Voltage• A “Bias” Voltage

is just Another name for EXTERNALLY APPLIED Voltage

E-Field

Page 18: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt18

Bruce Mayer, PE Engineering-45: Materials of Engineering

p-n Junction Rectifier cont

p-n junction Rectification• A small “Forward

Bias” Voltage results in Large currents

• Any level of “Reverse” Bias results in almost NO current flow

Class Q:• For Fwd Bias,

Which End is +; P or N???

A: the P end • The Applied Voltage

REDUCES the internal E-Field; This “Biases” The Junction in Favor of DIFFUSION

E-Field

Page 19: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt19

Bruce Mayer, PE Engineering-45: Materials of Engineering

p-n Junction Rectifier cont.2

p-n junction No Applied Voltage

• Internal Field ENHANCED– Carriers Pulled AWAY

from Jcn; xd grows

Forward Bias

• Diffusion & E-Field in Balance, No Current Flows

Reverse Biased

• Internal Field REDUCED– Carriers PUSHED and

Diffuse to the Jcn where they are “injected” into the other side; xd Contracts

Xd

Page 20: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

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Bruce Mayer, PE Engineering-45: Materials of Engineering

Properties of Rectifying Junction

ForwardReverse

IN914 PN Diode• IF = 75 000 µA

• IR = 0.025-50 µA

Page 21: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

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Bruce Mayer, PE Engineering-45: Materials of Engineering

Transistors

Transistors are “Transfer Resistors”

Xsistors Have Three Connections • Input• Output• CONTROL

In Electronic Applications Transistors have TWO Basic Fcns

• Amplification – Both Current & Voltage

• On/Off Switching Two Main Types

• BiPolar Junction Transistor (BJT)– Good Amps

• Field Effect Transistor (FET)– Depletion Mode

Good Amps– Enhancement Mode

Good Switches

Page 22: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

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Bruce Mayer, PE Engineering-45: Materials of Engineering

BJT

The Classic pnp or npn configurations• Basically Two pn

jcns Back-to-Back

npn In “Forward-Active” mode• b-e pn jcn

FORWARD Biased• b-c pn jcn

REVERSE Biased Very Little “base”

Current Large emitter &

collector currents• Good Current-Driving

Amplifiere

b

c

e

b

c

Page 23: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt23

Bruce Mayer, PE Engineering-45: Materials of Engineering

Depletion Mode - JFET

JFETs are “Normally On” Transistors

Reverse Bias on the “gate” expands the NonConducting depletion region Until the channel is “Pinched Off” and no longer conducts• Gate is Reverse

Biased → little Control-Current

• Good Depl Region modulation → good I/V amp

OPEN “Channel” Between the “source” and “drain”

Page 24: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt24

Bruce Mayer, PE Engineering-45: Materials of Engineering

Enhancement Mode - IGFET Insulated Gate

Field Effect Transistors are Normally-Off devices

Applying a Positive Voltage to the Gate will attract e− to the Channel• This will eventually

“invert” a thin region below the gate to N-type, creating a conducting channel between S & D

IGFETs are Great Switches• Used in almost all

digital IC’s

Back-to-Back pn Jcns Between “source” & “drain”

Page 25: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt25

Bruce Mayer, PE Engineering-45: Materials of Engineering

Ionic Materials In Metals and

Semiconductors, the atomic Ion-cores are fixed in the crystal Lattice• Although they

have the same charge as a “hole” they have almost NO “Mobility”– Thus They do

NOT contribute to Electrical Conduction

Some Small Atomic Radii impurities can be CHARGED (ionic) and MOBILE within another material• e.g., Na+ can move

fairly easily thru GLASS (SiO2)

The Total σ for Ionic Materials

ioniceletronic tot

Page 26: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt26

Bruce Mayer, PE Engineering-45: Materials of Engineering

Ionic Mobility • Diffusion• E-Field

Combine These two effects into Mobility

• Where– nI Ion Valence

– DI Ion Mass Diffusion Coeff, m2/s

– q, k, T as Before

• Exercise → Find units for nI

As in the Electronic case

IIionic qN

kT

qDn III • Where

– NI Ion Concen, Ions/m3

– q electronic Charge– µI Ionic Mobility,

m2/V-s

Two Forces move The Ions

Page 27: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

[email protected] • ENGR-45_Lec-09_ElectProp-Semi.ppt27

Bruce Mayer, PE Engineering-45: Materials of Engineering

Ceramics Most Ceramics have

WIDE BandGaps• SiO2 9 eV

• Si3N4 4.7eV

Thus Ceramics Tend to be VeryGood Electrical INSULATORS

But as with SemiConductors. for Ceramics nintrinsic Increases with Temperature• Thus Insulative Capacity DEGRADES at Hi-T

– e.g; mullite = 3Al2O3•2SiO2

ρ(25°C) 1012 Ω-m; ρ(500°C) 106 Ω-m

Energy

filled band

filled Valence band

empty band

fille

d s

tate

s

GAP

ConductionBand

Page 28: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

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Bruce Mayer, PE Engineering-45: Materials of Engineering

Polymers Most “Standard” Plastics are Good Insulators

• c.f. Their use as insulation on metal WIRES• Conduction Mechanism Not well understood

– Believed to be More Electronic than Ionic

A Few Polymers are Good Conductors, with σ 107 S/m• About 2X HIGHER than Cu for Conductivity/lb • Mechanism appears to be SemiConductor-like

with a doping Requirement• Discovery of these “synthetic metals” Resulted in

the 2000 Chemistry Nobel Prize for Heeger, MacDiarmid and Shirakawa

http://webpages.charter.net/dmarin/coat/#history

Page 29: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

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Bruce Mayer, PE Engineering-45: Materials of Engineering

PiezoElectric Materials

Piezoelectricity application of force pressure produces Electrical Potential

at rest compression induces voltage

applied voltage induces

expansion

Page 30: BMayer@ChabotCollege.edu ENGR-45_Lec-09_ElectProp-Semi.ppt 1 Bruce Mayer, PE Engineering-45: Materials of Engineering Bruce Mayer, PE Licensed Electrical

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Bruce Mayer, PE Engineering-45: Materials of Engineering

WhiteBoard Work

Problem 18.30• Antimony Doped

Germanium• EXtrinsic form

– All Sb Ionized

• The μ’s:– μe = 0.1 m2/V·s

– μh = 0.05 m2/V·s