ASIGURAREA CALITÃÞII – QUALITY ASSURANCEThe National Symposium “Electronic Technology and Reliability ” organized in Bucharest between 3 to 5 November 1977 represented the

AASSIIGGUURRAARREEAA CCAALLIITTÃÃÞÞIIII –– QQUUAALLIITTYY AASSSSUURRAANNCCEEAprilie – Iunie 2016 Anul XXII Numãrul 86

AASSIIGGUURRAARREEAA CCAALLIITTÃÃÞÞII II –– QQUUAALLIITTYY AASSSSUURRAANNCCEEAASSIIGGUURRAARREEAA CCAALLIITTÃÃÞÞII II –– QQUUAALLIITTYY AASSSSUURRAANNCCEE

CUPRINS – CONTENTS

� Dumitru Felician Lãzãroiu – 90Ioan C. Bacivarov

� La machine à faire malDumitru-Felician Lãzãroiu

� Kaizen: Lost in TranslationJun Nakamuro

� Fault Modeling, Fault Tolerance, and TestTitu-Marius I. Bãjenescu

� Tehnologii clasice ºi moderne pentru protecþia documentelor în format PDFGabriel Petricã

� Tehnologie ºi fiabilitate: cazul componentelor electroniceMarius Bâzu

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DDuummiittrruu FFeelliicciiaann LLããzzããrrooiiuu –– 9900 DDuummiittrruu FFeelliicciiaann LLããzzããrrooiiuu –– 9900

Professor Dumitru-Felician LÃZÃROIU, one of the pioneers of the Romanian research in automationsystems reliability, celebrated on 19th January 2016 nine decades of life and fruitful activity.Encyclopedic personality – researcher, manager, university professor a.o. – dr. D. F. Lãzãroiu has

outstanding contributions in the field of technology and reliability of electrical and electronic components


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Photo-documents for the history of reliability in Romania (Photo-archive of Ioan C. Bacivarov)

(a) ProfessorD.F. Lãzãroiuspeaking at the firstNationalSymposium“ElectronicTechnologyandReliability”1organized in Bucharestin 1977

(b) Some of the main Romanian specialists in the field, participants at the symposium; Prof. V. Cãtuneanu, Prof. G. Cartianu,Prof. V. Corlãþeanu, N. Necula, E. Diatcu, U. Wiener, Angelica Bacivarov, D.G. Stoichiþoiu, A. Mihalache, R. Tomescu a.o.

————————1 Note. The National Symposium “Electronic Technology and Reliability” organized in Bucharest between 3 to 5 November 1977

represented the first large-scale scientific event in the field organized in Romania.The Chairman of the Symposium was Prof. dr. Vasile M. Catuneanu, a pioneer of the researches in reliability field in Romania and the

Scientific coordinator of the symposium was Dr. Ioan C. Bacivarov, a young representative of the of the “new wave” of researchers in thefield of electronic technology and reliability.

This symposium was attended by over 400 specialists from education, research and industry. They presented about 150 scientific papers,which were included in the Conference Proceedings “Researches in Electronic Technology and Reliability” – “Cercetari in tehnologieelectronica si fiabilitate” (coordinated by Vasile M. Catuneanu, Ioan C. Bacivarov and P.Svasta), Editura Didactica si Pedagogica, 1978, about600 pages.

and systems. Numerous awards,academic and scientific affi-liations, which were assigned toProfessor Lãzãroiu throughouthis entire activity crowns a lifededicated to science and truth.I had the opportunity to

perform some of my scientificactivity in the field of reliabilityin the 70s together with ProfessorLãzãroiu, who was the super-visor of my PhD thesis; anopportunity to discover not onlyhis scientific and managerialqualities, but also the MANDumitru-Felician Lãzãroiu.To mark the 90th birthday of

Professor Lãzãroiu, the Academyof Technical Sciences of Roma-nia (ATSR), organized – togetherwith the Romanian Electro-technical Committee (CER) andthe the National Institute forResearch and Development in Electrical Engineering (ICPE-CA) – an impressive homagial meeting inmid February 2016.In order to celebrate the 90th anniversary of Prof. Lãzãroiu, the journal „Asigurarea Calitãþii – Quality

Assurance” publish one of his representative papers (from 1990) „The machine to do harm”, as well ashis extended CV; both are written in French, France being the adoptive country of Professor Lãzãroiu, afterhe was forced to emigrate from Romania at the beginning of the 80s.With the occasion of this beautiful birthday, the Romanian specialists in the field of quality and

reliability wishes Prof. Lãzãroiu a long life, with personal and professional and fulfillment.

HHaappppyy AAnnnniivveerrssaarryy PPrrooffeessssoorr LLããzzããrrooiiuu!!

Prof. Ioan C. BACIVAROV, PhDDirector of EUROQUALROM-ETTIUniversity “Politehnica” of Bucharest

Editor-in-Chief „Asigurarea Calitãþii – Quality Assurance”


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Presidium of the meeting organized by ATSR in the honor of Professor Lazaroiu in February 2016

(Photo: Ioan C. Bacivarov)

AASSIIGGUURRAARREEAA CCAALLIITTÃÃÞÞIIII –– QQUUAALLIITTYY AASSSSUURRAANNCCEE®® is a peer-reviewed quarterly international scientificjournal aimed at disseminating significant theoretical and practical results in the field of quality anddependability (reliability, maintainability, availability, safety/security a.o.) engineering, assurance,certification and management. An important aim of this journal is to achieve a balance betweenacademic material and practical applications.The manuscripts must be submitted only in electronic form (.doc) on the address of the Editor-in-Chiefof the journal, PPrrooff.. IIooaann CC.. BBAACCIIVVAARROOVV, PhD: [email protected]/[email protected].

Asigurarea Calitatii – Quality Assurance, ISSN 1224–5410

Vol. XXII, Issue 86, April-June 2016

Pages 4-12

La machine à faire mal

Dumitru-Felician LĂZĂROIU Paris, France

Abstract

The paper deals with the application of the systems reliability to the socio-economical systems, i.e.

to the human societies. The types of societies are analyzed in connection with their typological

structures. The role of the feedback in these cases in particularly stressed. The mathematical

calculations presented in the case of a democratic Society, as well as in the case of a bureaucratic-

dictatorial society, exempt from feedback loops, allow to evaluate, in a general form, the lack of

reliability and the impossibility to correct the errors made in a bureaucratic-dictatorial society. In

principle, this paper represents an essay in evaluating the consequences of a given type of society, on

the basis of its structure analysis, by using the mathematical language of systems theory and reliability

theory.

Keywords: Reliability, System, Model, Society, Socio-economical system, Systems theory,

Reliability theory, Human society



Pages 13-15

Kaizen: Lost in Translation

Jun NAKAMURO Enna, Bellingham WA, 98229, USA

[email protected]

Abstract

The Japanese word “Kaizen” has become a blanket term for a variety of improvement initiatives. It

is sometimes used synonymously with “Lean”, which is itself often used synonymously with “Six-

Sigma”, “5S”, and “TPS”. Kaizen stands out from this pack of process improvement labels because,

more than any other, Kaizen has deep cultural connotations. This article seeks remedy the

misinterpretations of Kaizen that have become common outside of Japan. It’s objective is to enhance

the cultural approach to process improvement within all industries by accurately defining Kaizen and

its supporting elements in their original context within Japanese culture.

Keywords: Kaizen, Lean, Hansei, Japanese, Leadership, culture, translation



Pages 16-20

Fault Modeling, Fault Tolerance, and Test

Titu-Marius I. BĂJENESCU Switzerland

[email protected]

Abstract

Fault diagnosis of ICs is essential to reduce design iterations in order to meet the time-to-market goal

of the first prototypes. The paper takes a fresh look at lessons learned and where things stand today,

along with prospects for a next future.

Keywords: MOS, VLSI, fault models and model faults, fault diagnosis, testing strategy

References:

[1] International Technology Roadmap for Semiconductors, 2011 Edition, Test and Test Equipment,

www.itrs.net/Links/2011itrs/.../2011Test.pdf.

[2] M. E. Zaghloul, “Physical Fault Modeling and Simulation for VLSI MOS Circuits”, in Zobrist,

G. W. (Ed.), VLSI Fault Modeling and Testing Techniques, Ablex Publishing Corp., Norwood, 1993.

[3] Belgacem Hamdi, Etienne Sicard, “Introduction to Fault Analysis at Logic Level – An Educational

Approach Based on DSCH”, www.mes.tu-darmstadt.de/...3/.../hamdi_paper.pdf.

[4] K. N. Patel, et al., “Evaluating Circuit Reliability Under Probabilistic Gate-Level Fault Models,”

megaknowledge.info/cadathlon/.../p3-synthesis.pdf.

[5] Pradipkumar Arunbhai Thaker, Register-Transfer Level Fault Modeling and Test Evaluation

Technique for VLSI Circuits, Ph. D. Thesis, George Washington University, 2000.

[6] Nor Zaidi bin Haron, Testability and Fault Tolerance for Emerging Nanoelectronic Memories, Ph.

D. Thesis, Delft University, 2012.

[7] Chia Yee Ooi, Hideo Fujiwara, “Enhanced Functional Fault Model for Micro Operation Faults”,

isw3.naist.jp/IS/TechReport/report/2010004.pdf.

[8] Pradipkumar Arunbhai Thaker, Register-Transfer Level Fault Modeling and Test Evaluation

Technique for VLSI Circuits, Ph. D. Thesis, George Washington University, 2000.

[9] Emmanuel Simeu, Salvador Mir, Libor Rufer, “Online Testing Embedded Systems: Adapting

Automatic Control Techniques to Microelectronics Testing”,

http://www.nt.ntnu.no/users/skoge/prost/proceedings/ifac2005/Fullpapers/03994.pdf.



Pages 21-28

Classic and Modern Technologies to Protect

PDF Documents

Gabriel PETRICĂ EUROQUALROM, Faculty of Electronics, Telecommunications and Information Technology,

University “Politehnica” of Bucharest, Romania

[email protected]

Abstract

This article presents techniques used to ensure the security of data in a PDF file: setting a password

(both for opening and modifying the document), encryption using digital certificates and Adobe

LiveCycle Rights Management, an advanced tool which centralizes user access rights on a dedicated

server. Digital IDs (based on user’s digital certificates) are essential elements in securing PDF

documents, applying digital signature and certification. Provided by a Certification Authority, the

digital certificate contains the user’s public key used to sign a product (document, e-mail, VBA script

or a complex application) and distribute on Internet. Finally is presented the concept of Digital Rights

Management (DRM), a technique for protecting the copyright of various types of information (mainly

multimedia, documents and e-books).

Keywords: PDF, digital certificate, public key, encryption, digital rights management

References:

[1] PDF Reference and Adobe Extensions to the PDF Specification,

http://www.adobe.com/devnet/pdf/pdf_reference.html (accessed 10.04.2016).

[2] Ioan-Cosmin Mihai, Gabriel Petrică, Costel Ciuchi, Laurențiu Giurea, Provocări și strategii de

securitate cibernetică, Editura Sitech, Craiova, 2015, ISBN 978-606-11-4951-3.

[3] Lisa Bucki, J. Walkenbach, M. Alexander, R. Kusleika and F. Wempen, Microsoft Office 2013

Bible: The Comprehensive Tutorial Resource, John Wiley & Sons, 2013.

[4] M. Tulloch, J. Koch and Sandra Haynes, Microsoft Encyclopedia of Security, Microsoft Press,

2003.

[5] Wenjun Zeng, Heather Yu, Ching-Yung Lin, Multimedia Security Technologies for Digital Rights

Management, Academic Press, 2011, ISBN 9780080463896.

[6] ***, Digital Rights Management: Concepts, Methodologies, Tools, and Applications, IGI Global,

2012, ISBN 9781466621374.

[7] E. Becker, Digital Rights Management: Technological, Economic, Legal and Political Aspects,

Springer Science & Business Media, 2003.

[8] https://en.wikipedia.org/wiki/Digital_rights_management (accessed 15.04.2016).



Pages 29-32

Technology and Reliability: The Case of

Electronic Components

Marius BÂZU National Institute for Research and Development in Microtechnologies, IMT-Bucharest, Romania

[email protected]

Abstract

The main elements that have to be taken into account on the technological flow for building the

reliability of a product were identified, with examples about electronic components: design for

reliability, process reliability and monitoring and improving the reliability. For each element, the

methods and main results were shown.

Keywords: Reliability, Technology, Electronic components, Design for reliability, Process reliability

References:

[1] Bâzu, M., and T. Bãjenescu, Failure Analysis. A practical guide for manufacturers of electronic

components and systems, J. Wiley & Sons, 2011.

[2] Băjenescu, T., and M. Bâzu, Component Reliability for Electronic Systems, Artech House, 2009.

[3] Bâzu, M., „A Combined Fuzzy Logic and Physics–of–Failure Approach to Reliability Prediction“,

IEEE Trans. on Reliability, Vol. 44, No. 2, June, 1995, pp. 237-242.