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Move Forward to What’s Possible in LTE

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Third-generation (3G) wireless systems, based on W-CDMA, are deployed all over the world. W-CDMA maintains a mid-term competitive edge by providing high speed packet access (HSPA) in both downlink and uplink modes. To ensure the competitiveness of 3G systems into the future, a long-term evolution (LTE) of the 3rd Generation Partner-ship Project’s (3GPP) UMTS is being specifi ed in release 8 of the 3GPP specifi cations.

As a world leader in test and measurement solutions, Agilent Technologies is at the fore-front of LTE, offering design and test solutions for the entire lifecycle — from RF and digital early design through conformance testing to network operations and deployment.

Agilent is a member of 3GPP and an active contributor to the development of the LTE specifi cations. We create our product plans based on the knowledge and insight gained from this participation to ensure our suite of design and test solutions keep pace with this evolving technology.

Our engineers, experts in test and mea-surement, have dedicated their careers to understanding the intricacies of this evolving technology to provide you with the LTE solutions you need, when you need them. So, as you take LTE forward, Agilent clears the way.

You take LTE forward. Agilent clears the way.

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Agilent’s Unique Connected Solutions Provide Early Access

to Evolving LTE Signals

Agilent’s unique LTE Connected Solutions extends instrumentation functionality with Agilent’s fl exible Advanced Design System (ADS) simulation capability for 3GPP LTE R&D testing. LTE signals can be simulated using the 3GPP LTE wireless library and downloaded to an ESG or MXG vector signal generator to create real-world physical test signals for device testing during the R&D process. The device under test (DUT) output can be captured with an Agilent MXA Signal Analyzer, a PSA Series Spectrum Analyzer, or a logic analyzer, and then post-processed using the 3GPP LTE wireless library to perform measurements on RF and mixed-signal DUT hardware. So you have the fl exibility to combine design and test environments which provides early access to evolving LTE signals. This capability lets you create and analyze the signals you need during the design process to get your LTE products through conformance, and to market, faster.

www.agilent.com/fi nd/lte

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LTE DesignSimulation

Agilent’s 3GPP LTE wireless library provides signal processing models and preconfi gured simulation setups for Agilent’s ADS software. The 3GPP LTE wireless library lets you create spectrally correct test signals that comply with the LTE specifi cations. The design models and simu-lation test benches can be used as a “golden reference” for simulation and verifi cation of baseband algorithms, digital baseband/IF systems, and verifi cation RF circuitry used in LTE designs.

Agilent’s ADS system incorporates an RF design environ-ment (RFDE) which makes ADS accessible to third party tools. For example, Agilent has an alliance with Cadence, and by using the RFDE, RFIC designers can get access to ADS LTE test benches from within the Cadence Virtuo Custom IC platform.

Use the 3GPP LTE wireless library to easily create signals that comply with LTE specifi cations and measure EVM, PAPR, CCDF, and ACLR performance of RF components such as power amplifi ers, antennas, and fi lters. This wireless library also provides receiver measurements such as BER, BLER and others.

Speed prototype design by measuring EVM, PAPR, CCDF and ACLR with Agilent’s 3GPP LTE Wireless Library.

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LTE Uplink and Downlink Signal

Generation

Agilent has built a solid reputation in the mobile com-munications industry with the combination of our signal generators and Signal Studio signal creation software. The versatile and comprehensive software is available for the development and manufacturing of existing and evolving 2G, 3G, 3.5G and 4G communication systems. You can quickly and easily create performance-optimized LTE reference signals for component-level parametric test, baseband subsystem verifi cation, receiver performance verifi cation and advanced functional evaluation.

Speed Signal Simulation with Signal Studio for 3GPP LTESignal Studio for 3GPP LTE enables the confi guration of coded (physical layer), standard-based LTE test signals to verify RF performance (uplink and downlink). Use this software with the Agilent MXG signal generator for the in-dustry’s best adjacent-channel power (ACLR) performance making it ideal for the characterization and evaluation of BTS components such as multi-carrier power amplifi ers. For applications that require lower phase noise, the best level accuracy, better ACLR, fading capabilities or digital I/Q inputs and outputs, then use Signal Studio with the Agilent ESG signal generator. Highlights of Signal Studio Software for 3GPP LTE include:

• Physical layer coded signals for component test

• Transport layer coded signals for receiver test

• Downlink MIMO pre-coding up to 4x4 (Spatial Multiplexing/Tx Diversity)

• Mixed-carrier confi guration with W-CDMA

• Multiple UE setup

• Constantly tracking the latest 3GPP LTE standards and is updated accordingly as the standard progresses

• Coordinated releases with ADS simulation and 89600 VSA software ensures consistency between Agilent’s LTE solutions

Flexible resource mapping with scalable system bandwidth is available with Agilent’s Signal Studio Software.

Industry-leading performance with the Agilent MXG and ESG vector signal generators.


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LTE Base-BandAnalysis

Logic Analysis In next-generation architectures the physical link between the RF front-end and baseband processing evolves from an analog to parallel, or high-speed, serial digital bus. New interface standards will require test equipment to provide appropriate serial digital inputs and outputs.

The combination of an Agilent logic analyzer and Agilent’s Vector Signal Analysis (VSA) software provides the only Digital VSA (DVSA) package for digital baseband, IF and RF signal analysis. This combination enables digital signal processing (DSP) designers to effectively design and debug interfaces that were once analog and are now digital. The VSA software performs signal analysis functions such as I/Q analysis, EVM, fourier spectrum, etc. using the digital signal captured by the logic analyzer as the input.

To validate RFIC operation, engineers can also leverage the combination of signal generation software and a logic analyzer connected to the system-under-test through a digital connection such as the DigRF v3 stimulus probe.

For R&D engineers designing or integrating MIPI (Mobile Industry Processor Alliance) D-PHY devices within a mobile handset, the same Logic Analysis solution can be used as a MIPI D-PHY protocol test solution, with support for display (DSI) and camera (CSI-2) interfaces. The solution includes a confi gurable stimulus platform which offers bit-to-video level test capabilities for embedded displays, real-time analysis and protocol viewing capabilities. Engineers can gain valuable insight into the exchanges between MIPI D-PHY enabled devices. Characterize behavior of devices, from baseband to antenna,

with access throughout the block diagram.

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LTE Base-BandAnalysis

LTE Digital Real-Time Decode & DebugThe Agilent Infi niium DSO90000A series high performance real-time oscilloscope provides superior signal integrity and deep application analysis. The Infi niium 90000A series, using Agilent’s RF design expertise, proprietary packaging technologies and unique CMOS ADC architecture, offers industry-leading low noise-fl oor levels.

The Agilent 90000A series oscilloscope enables engineers to quickly debug and characterize digital systems. The Infi niiScan Plus event identifi cation system is based on the world’s fastest hardware trigger system. This trigger system can identify glitches faster than 250 ps. No other oscilloscope in the world provides this level of trigger accuracy.

Agilent’s Infi niium 90000A Series oscilloscopes have more than 29 applications — including DDR, PCI Express®, Display Port, HDMI, Serial ATA, Serial Attached SCSI, Ethernet families, USB, certifi ed wireless USB, jitter analysis, RF signal analysis, eye pattern analysis and protocol decoding analysis. They also offer the perfect

amount of memory to verify application compliance and debug the most

diffi cult electronic designs — shortening debug and characterization times.


Access digital interfaces with the Agilent N4850A digital acquisition probe and N4860A digital stimulus probe.

Troubleshoot digital glitches with the Agilent DSO90000A high performance, real-time oscilloscope.

Digital Interface The N4850A digital acquisition probe and N4860A digital stimulus probe operate in conjunction with the 16800 and 16900 series logic analyzers. The probes provide digital acquisition and serial-stimulus capabilities required for DigRF v3 based IC evaluation and integration. The integration of DigRF v3 logic analysis tools with the Agilent RF portfolio provides cross-domain solutions that will help you rapidly deploy your DigRF v3-based designs.

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LTE Uplink and Downlink Signal

Analysis

Agilent PSA High-Performance Signal Analyzer with LTE software running on a PC

Agilent MXA Signal Analyzer with LTE software running internally

The ever-increasing complexity of emerging broadband communication systems demands fl exible signal analysis with in-depth modulation analysis, as well as RF power measurements. The Agilent signal and spectrum analyzers ease measurements of complex signals by providing world-class accuracy, fl exibility and standards-compliant measurement applications. In addition, the Agilent 89600 VSA software, in combination with Agilent’s signal and spectrum analyzers, offer the industry’s most sophisti-cated general-purpose and standards-compliant signal evaluation and troubleshooting tools for R&D engineers.

Reach Deeper into LTE Signals with the 89600 VSA SoftwareGain greater insight into the performance of your LTE devices using the 89600 VSA software with LTE analysis capability. This high-performance VSA software provides RF and baseband engineers with the industry’s most comprehensive LTE physical layer signal analysis. Highlights of the 89600 VSA software include:

• Downlink (OFDMA) and uplink (SC-FDMA) in a single option

• FDD mode, frame structure type 1

• All LTE bandwidths: 1.4 MHz to 20 MHz

• All modulation formats: BPSK, QPSK, 16QAM, 64QAM

• All modulation sequences: CAZAC and OSxPRS

• Auto detection and demodulation of downlink user bursts

• Industry-leading EVM of < -50 dB (<0.35%) (dependent on choice of measurement platform)

• A rich selection of in-channel measurements and traces — overall/data/RS EVM, EVM per channel, carrier, symbol, resource block and slot.

An uplink LTE analysis made on the demodulation reference signal (DM-RS) and payload data. The DM-RS uses a CAZAC sequence as shown by the constant amplitude on trace A.

Trace A shows a spectrogram of a downlink allocation. Putting a spectrogram marker on the reference signal (RS) shows the RS occupying every 6th subcarrier as shown on trace B.

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LTE UE Development Solutions Platform E6620A Wireless Communications Test Set

The Agilent E6620A Wireless Communications Test Set is designed to provide early leading-edge solutions for the LTE UE development lifecycle from early protocol development through RF and protocol conformance and interoperability test. Built on an advanced and scalable platform, the E6620A Wireless Communications Test Set uses the same 3GPP-compliant LTE protocol stack across all solutions to shorten design cycles and ensure con-sistent testing leading to the highest quality UE designs. Highlights of the Agilent E6620A include:

• Scripting interface for protocol development and conformance testing

• Real-time, system-rate network emulation for easy-to- use, real-world integration and validation testing

• Two-cell capability

• L1/L2/L3 uplink and downlink via RF or digital baseband

• MIMO 2x2, integrated fading/channel emulation and RF parametric measurements planned for the future

• 2.7 GHz frequency range and internal PC controller with Windows XP®

LTE UE Development

The E6620A Wireless Communications Test Set — from early protocol development through RF and protocol conformance test


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LTE UE Protocol Development and

Conformance Test

Anite SAT LTE Development Toolset (DT) using theAgilent E6620A is a comprehensive suite of tools which supports all phases of wireless terminal development.

Anite SAT LTE Protocol Tester and Development Toolset with the Agilent E6620A New handset designs must meet the standards expected by the consumer — not to mention those required by industry bodies such as the GCF or PTCRB — and that means carrying out earlier and more comprehensive development, design verifi cation and regression testing. In order to achieve this goal, versatile but rigorous testing solutions are required. From pre-silicon protocol module development through system integration and verifi cation, use this toolset to shorten your development time and validate your designs. With the Anite SAT LTE solution you can:

• Cost effectively analyze LTE UE product designs early in the process

• Resolve emergent issues before they become costly problems

• Simulate and test a broader range of functionality

• Bring advanced products to market quickly

• Assure products will meet or exceed industry certifi cation and quality requirements

LTE UE Protocol Conformance TestAgilent and Anite are leading the way in test-case implemen-tation, offering proven conformance-test solutions to ensure the performance of the protocol components of a handset.

Anite’s conformance test solutions based on the Agilent E6620A incorporate comprehensive campaign management and analysis tools to assess the quality of handsets under evaluation, as well as extensive automation and a remote control interface to help maximize test throughput. These solutions can be used throughout the product lifecycle for in-tegration, conformance and certifi cation testing of handsets. Anite systems support a wide range of radio technologies, from GSM and EDGE through to enhancements of W-CDMA R’99 such as MBMS, HSPA, CLTD and LTE.

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The Agilent signaling analyzer platform is an industry-leading solution for 3G, 2G & IMS networks today. With the addition of LTE & SAE technology support, the signal-ing analyzer software provides a common and intuitive user interface to support all mobile & IMS technologies.

Together with a new high-density probing solution the signaling analyzer software enables passive probing & analysis of LTE network interfaces (e.g. S1, X2, S3, S4, S5). This powerful combination of distributable hard-ware pre-processing with scalable software architecture meets the current and future performance requirements necessary for the successful deployment of an integrated LTE/SAE network. Highlights of the Agilent signaling analyzer include:

• Total visibility for all layers from L1 to L7• Complete decoding of all protocol messages• Full hardware and software reassembly at each layer in the protocol stack• Real-time call/session tracing on a single or multiple interfaces including mixed technology interfaces• Real-time KPIs, statistics, and distributed performance management

Network Signaling Analysis

The Agilent Signaling Analyzer provides real-time analysis for LTE.


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Product specifi cations and descriptions in this document subject to change without notice.

© Agilent Technologies, Inc. 2008Printed in USA, February 25, 20085989-7817EN

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5989-7817EN