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1 EiC Corp. Excellence in Communications 2003 PA Workshop 6-2 28V High Efficiency High Linearity InGaP/GaAs Power HBT 28V High Efficiency High Linearity InGaP/GaAs Power HBT N.L. Wang, W. Ma, C. Dunnrowicz, X.Chen, H.F. Chau, X.Sun, Y.Chen, B.Lin, EiC Corporation I.L.Lo*, C.H. Huang*, M.H.T.Yang*, Visual Photonics Epitaxy Co. Ltd. C.P. Lee, National Chiao Tung Univ., Hsinchu, Taiwan

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Page 1: 2003 pa workshop 6 2 for websitepasymposium.ucsd.edu/papers2003/NanLeiWangPAWorkshop2003.pdf · Title Microsoft PowerPoint - 2003 pa workshop 6 2 for website Author Nissa Created

1

EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

28V High Efficiency High Linearity InGaP/GaAs Power HBT

28V High Efficiency High Linearity InGaP/GaAs Power HBT

N.L. Wang, W. Ma, C. Dunnrowicz, X.Chen, H.F.Chau, X.Sun, Y.Chen, B.Lin, EiC CorporationI.L.Lo*, C.H. Huang*, M.H.T.Yang*, Visual Photonics Epitaxy Co. Ltd.C.P. Lee, National Chiao Tung Univ., Hsinchu, Taiwan

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

AgendaAgenda

Introduction28V Operation InGaP/GaAs HBT DesignCircuit Design and AssemblyExperiment ResultsConclusion

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

IntroductionIntroduction

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

28V InGaP/GaAs HBT Power Transistor

28V InGaP/GaAs HBT Power Transistor

BackgroundThe best InGaP/GaAs HBT designed for 3-8V operation achieved excellent linearity and 1010 hours @ Tj=150oC28V HBT was demonstrated as a discrete device for higher power operationFlip chip was attempted to reduce thermal resistance

EiC’s Present EffortBuild MMIC compatible with existing assembly approachDesign SOA (safe operation area) and ruggednessProvide high linearity

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

28V Operation InGaP/GaAs HBT Design

28V Operation InGaP/GaAs HBT Design

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Design of 28V InGaP/GaAs HBTDesign of 28V InGaP/GaAs HBT

BVcbo~70V, BVceo~35VConventional 100µm thick substrate MMIC approach is adopted Thermal resistance design of HBT layout was done with proprietary programSOA (Safe Operation Area) through proper ballasting was designed with another proprietary programInitial “wafer level reliability” study result is very similar to the low voltage InGaP/GaAs HBT

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Measured I-V Curve vs. Designed SOA for Ae=1500µm2

Measured I-V Curve vs. Designed SOA for Ae=1500µm2

Total Emitter Area 1500um2. This is the building block for larger size HBT

I-V Curve

050

100150200250300350400450

0 5 10 15 20 25 30 35 40 45 50Vce

Icc

(mA

) Ib=1mA

Ib=2mA

Ib=3mA

Ib=4mA

Ib=5mA

I-V Curve

050

100150200250300350400450

0 5 10 15 20 25 30 35 40 45 50Vce

Icc

(mA

) Ib=1mA

Ib=2mA

Ib=3mA

Ib=4mA

Ib=5mA

SOA boundary

Class A Quiescent Bias Point

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Power HBT DesignPower HBT Design

Multi-finger building block is paralleled in large size HBTPatented feed structure to provide minimum phase lag from the input feed to the HBT fingers and minimum variation of phase of RF signal at each finger

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Circuit Design and AssemblyCircuit Design and Assembly

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

On-chip Circuit DesignOn-chip Circuit Design

Bias circuit (based on current mirror), RF choke and input pre-match circuit are designed on the same chip with the power HBTTemperature compensation is achieved through the current mirrorOutput matching is done off-chipInput matching is completed by off-chip matching

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Basic Circuit DesignBasic Circuit Design

PartialInput

MatchingRFIN

ChokeVref Vbias

RFOUT

Temperature compensated

PartialInput

MatchingRFIN

ChokeVref Vbias

RFOUT

Temperature compensated

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

AssemblyAssembly

Standard MMIC assembly procedure is followed:– The IC die is 4 mil thick– AuSn eutectic attachment is used– 1mil gold wire bond connects the die to the hybrid

circuit

No reliability concern about the assembly approach

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Experiment ResultsExperiment Results

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

HighlightsHighlightsThermal resistance of 30-35oC/W was measured for the building block of Ae=1500 µm2 HBTOutput power scales with HBT size to 25W at 900MHz, while maintaining the efficiency over 60%.Two tone test IMD3 maintains below –40dBc until reaching saturation power.At 900MHz under CDMA2000 9 fwr ch condition, 4.5W with ηc=42% was measured with ACLR1=-45dBc / ACLR2=-58dBc, and 35% at ACLR1=-50dBcAt 2GHz under CDMA2000 9fwr ch condition, 0.5W with ηc=32% is achieved at ACLR1=-50dBcAt 2GHz under WCDMA, 23dBm with ηc=18% at ACLR1=-45dBc

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Temperature Compensated Bias Circuit

Temperature Compensated Bias Circuit

<9% change of Icq over –45 to +85oC rangeIcq vs. Temperature

0

10

20

30

40

50

-50 -25 0 25 50 75 100

Temperature, degC

mA

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Gain / Efficiency of HBT with Ae=1500 µm2

Gain / Efficiency of HBT with Ae=1500 µm2

Pout=36dBm, G=14dB, ηc=71% Pout=35dBm, G=13.5dB, ηc=67%

HVHBT Gain, Efficiency, 900MHz

0

2

4

6

8

10

12

14

16

18

20

10 15 20 25 30 35 40Pout(dBm )

Gai

n(dB

)

0

10

20

30

40

50

60

70

80

90

100

Effic

ienc

y

Gain Efficiency

Gain, Efficiency vs Pout, 2GHz HBT Ae=1500um 2̂

0

4

8

12

16

20

10 20 30 40Pout(dBm)

Gai

n (d

B)

0102030405060708090100

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Thermal ResistanceThermal Resistance

30 to 35oC/W thermal resistance is measured from the HBT of Ae=1500um^2Measurement relies on the Vbe vs.Temperature relationshipAt full power operation, temperature rise is 50oC

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Output Power vs. HBT Size @900MHz

Output Power vs. HBT Size @900MHz

61687170ηc %

9.9213.1815.3416.8Gain(dB)

44413835Pout(dBm)

12000600030001500Emitter size

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

Two Tone Test Result @ 2GHzTwo Tone Test Result @ 2GHzTwo Tone Test @ 2GHz HBT Ae=1500

-80

-70

-60

-50

-40

-30

-20

-10

0

10 15 20 25 30 35Pout (dBm) average power

dBc

IMD3 20mAIMD5 20mAIMD3 40mAIMD5 40mA

Two Tone Test @ 2GHz HBT Ae=1500

0

1020

3040

50

6070

8090

100

10 15 20 25 30 35

Pout (dBm) average powerm

A o

r %

Icc 20mAIcc 40mAEff 20mAEff 40mA

Single tone CW P1dB is 32.5dBm; Gss=13.2dB

Output power is average. Each tone power is 3dB lower; PEP is 3dB higher

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

CDMA2000 Test ResultCDMA2000 Test Result

Efficiency is 32 to 35% at ACLR1=-50dBcAt 900MHz, 36.5dBm is achieved at ACLR1=-45dBc with 42% efficiency. 35dBm is achieved at ACLR1=-50dBc. HBT size is 4 building blocks.At 2000MHz, 27dBm is achieved with ACLR1=-50dBc from 1 building block.

HVHBT ACLR vs. Pout, Ae=6000, 900MHz

-80-75

-70-65-60-55

-50-45-40

-35-30

20 25 30 35 40

Pout(dBm)

AC

LR (d

Bc)

010

20304050

607080

90100

ACLR1 ACLR2 Eff

CDMA2000 ACPR vs Pout, 2GHz, HBT Ae=1500

-80-75-70-65-60-55-50-45-40-35-30

10 15 20 25 30Pout(dBm)

AC

PR(d

Bc)

0102030405060708090100

ACPR1 ACPR2 Efficiency

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

WCDMA Test Method 1WCDMA Test Method 1WCDMA ACLR vs. Pout, 2GHz, HBT Ae~1500um 2̂

-65

-60

-55

-50

-45

-40

-35

-30

10 18 20 22 24 26

Pout (dBm)

ACLR

(dBc

)

0

5

10

15

20

25

30

35

ACLR1 ACLR2 Efficiency

Peak to average ratio is 9.8dBP1dB is 32.5dBmAt ACLR1=-45dBc, Pout is 23dBm with 18% efficiency

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

ConclusionConclusionKey Advantages

InGaP/GaAs HBT achieves high efficiency: over 60% at 2GHzExcellent linearity under modulated signalsLong lifetime and stable gain is expected from the standard InGaP/GaAs HBT result

Major Achievement25W is achieved in the standard MMIC approachInGaP/GaAs HBT can be further developed to serve the high power / high reliability applications

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EiC Corp.Excellence in Communications

2003 PA Workshop 6-2

AcknowledgmentAcknowledgment

The authors like to thank Mr. Jerry Curtis for his encouragementMany colleagues’ invaluable support on this project is also acknowledged here