Unified Generation of Analog Sizing and Placement … Universität München Institute for Electronic...

Preview:

Citation preview

Technische Universität MünchenInstitute forElectronic Design Automation

Unified Generation of Analog Sizing and Placement Constraints

Michael Eick and Helmut Graeb

Institute for Electronic Design AutomationProf. Dr.-Ing. Ulf Schlichtmann

Technische Universität München

Technische Universität MünchenInstitute forElectronic Design Automation

Overview

• Analog constraints

• Unified constraint generation flow– Universal constraint graph– Sizing and placement constraint generation

• Experimental results

• Conclusion

2

Technische Universität MünchenInstitute forElectronic Design Automation

Constraints in Design Flow

3

specification

structure

sizing

placement

routing

analog block

sizing constraints

placement constraints

routing constraints

process variations,parasitic devices etc.

structural analysis

univ

ersa

l co

nstr

aint

s

Technische Universität MünchenInstitute forElectronic Design Automation

Matching Constraints - Sizing

4

[Hastings, The Art of Analog Layout]

equal lengths

fixed ratio (optional)

current matching (optional)

voltage matching (optional)

limited Vgs, Vds mismatch

min

imal

max

imal

mod

erat

e

Technische Universität MünchenInstitute forElectronic Design Automation

Matching Constraints - Placement

5

min

imal

max

imal

mod

erat

e

[Hastings, The Art of Analog Layout]

equal finger geometriesequal orientationclose proximity

common centroid

quadratic common centroid

Technische Universität MünchenInstitute forElectronic Design Automation

More Constraints

6

Operating Point Constraintslinear / saturation region

Symmetric Place & Route Constraints

Technische Universität MünchenInstitute forElectronic Design Automation

State of the Art

7

sizingconstraints

Massier et al. TCAD’08

placementconstraints

sensitivityanalysis

building blockanalysis

symmetryanalysis

Eick et al. TCAD’11

Kole et al. ISCAS’94 Hao et al. ICCCS’04

Malavasi et al. TCAD’96 Chen et al. IEE Proc. G’92

Abstract constraint management concepts [Jerke et al. ISPD’09]

Technische Universität MünchenInstitute forElectronic Design Automation

Structural Analysis

Building Block Analysis[Massier et al. TCAD’08]

• comparison with library• ambiguity resolution

Symmetry Analysis[Eick et al. TCAD’11]

• Structural Signal Flow Graph• propagation of symmetry pairs

8

currentmirror

differential pair

Technische Universität MünchenInstitute forElectronic Design Automation

Unified Constraint Generation Flow

9

netlist

building blocks

symmetrical devices

universal constraintgraph

sizing constraints

placement constraints

Technische Universität MünchenInstitute forElectronic Design Automation

Overview

• Analog constraints

• Unified constraint generation flow– Universal constraint graph– Sizing and placement constraint generation

• Experimental results

• Conclusion

10

Technische Universität MünchenInstitute forElectronic Design Automation

Universal Constraint Graph (UCG)

Edge Constraint Attributes

proximity

operating pointrobust operation

region: linear, saturation

matchinggrade: minimal, moderate, maximaltype: undefined, voltage, i currentratio: variable, fixed(value)

symmetry

11

Undirected Graph• Nodes: Devices• Edges:

Technische Universität MünchenInstitute forElectronic Design Automation

UCG Generation - Overview

12

building blocks

netlist

symmetrical devices

Edge Constraint

proximity

op. point / robust op.

matching

symmetry

Technische Universität MünchenInstitute forElectronic Design Automation

UCG Generation - Netlist

13

building blocks

netlist

symmetrical devices

Edge Constraint

proximity

op. point / robust op.

matching

symmetry

Technische Universität MünchenInstitute forElectronic Design Automation

UCG Generation – Building Blocks

14

s s s

s s

min,i,v min,i,v

max,v,f(1)

s

building blocks

netlist

symmetrical devices

Edge Constraint

proximity

op. point / robust op.

matching

symmetry

Technische Universität MünchenInstitute forElectronic Design Automation

UCG Generation - Symmetry

15

building blocks

netlist

symmetrical devices

Edge Constraint

proximity

op. point / robust op.

matching

symmetry

mod,u,f(1)

mod,u,f(1)

mod,u,f(1)

Technische Universität MünchenInstitute forElectronic Design Automation

Unified Constraint Generation Flow

16

netlist

building blocks

symmetrical devices

universal constraintgraph

sizing constraints

placement constraints

Technische Universität MünchenInstitute forElectronic Design Automation

Sizing Constraint Generation

17

operating point

linear saturation

matching

minimal moderate maximal

general

current voltage

variable ratio fixed ratio

robust operation

Edge Constraint

proximity

op. point / robust op.

matching

symmetrygeneral

Technische Universität MünchenInstitute forElectronic Design Automation

Sizing Constraint Examples

18

operating point

linear saturation

matching

minimal moderate maximal

general

current voltage

variable ratio fixed ratio (q=1)

robust operationgeneral

Technische Universität MünchenInstitute forElectronic Design Automation

Placement Constraint Generation

19

proximity

matching

minimal moderate perfect

general

variable ratio fixed ratio

symmetric placement

Edge Constraint

proximity

op. point / robust op.

matching

symmetry

general

general

Technische Universität MünchenInstitute forElectronic Design Automation

Placement Constraint Examples

20

proximity

matching

minimal moderate maximal

general

variable ratio fixed ratio (q=1)

symmetric placement

general

general

Technische Universität MünchenInstitute forElectronic Design Automation

Overview

• Analog constraints

• Unified constraint generation flow– Universal constraint graph– Sizing and placement constraint generation

• Experimental results

• Conclusion

21

Technische Universität MünchenInstitute forElectronic Design Automation

Experimental Results - Placement

22

Schematic Layout

A0 [dB] 72 dB 72 dB

fT [MHz] 12.9 MHz 12.6 MHz

CMRR [dB] 138 dB 144 dB

Voffset [mV] 0.008 mV 0.3 mV

Yield [%] 99.0 % 98.8 %

Technische Universität MünchenInstitute forElectronic Design Automation

Conclusion

• Knowledge of constraints necessary for (automatic) design of analog circuits

• Unified constraint generation flow– Structural analysis– Universal constraint graph– Generation of sizing and placement constraints

23

Recommended