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Towards A Connected World
29 June 2016
Confidential
Reorganization (M&A) in semiconductor world
What’s Next??
Moore’s law ：Slowing down?
PC, Tablet : Decrease in demand?
Smartphone : Saturated?
Mega Trend
• Trillion sensors
• 50billion device
connected
• 4ZB->44ZB data
generated
• Communication:
4G->5G
• Server storage:
HDD->SSD
• Optical
interconnect
What’s Coming…..
More & More Data
Sensed,
Communicated,
Analyzed, Stored,
and Loop
Cost Sensitive and Shorter Development Cycles
Source: Yole Development
Source: NXP Inc
Source: smarthomeenergy.co.uk
High product mix, low to high volumes
More precision and high quality aspects
Big data storage management and cloud computing
Increasing connectivity
Sustainability, Security and Safety
What Applications....
Advantest in our Lives
Technology Support on the Leading Edge
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Eco-friendly management
policies emphasize reduction
of our carbon footprint
60+ years of innovation in
the measurement arena
A global leader in the ATE
industry with an installed base
of over 20,000 worldwide
Listed on NYSE & TSE, for
better communication and
optimal brand positioning
Our diverse workforce
includes 4,600 employees
from 50 countries
2016/7/5 8
28 consecutive years on
VLSIresearch’s 10 BEST
supplier list
Advantest at a Glance
2016/7/5 All Rights Reserved - ADVANTEST CORPORATION
1 North America 4 South Korea
2 Europe 5 Taiwan
3 Singapore 6 China
1 San Jose
2 Munich
Boeblingen
Amerang
Gunma
Sendai
4 Cheonan
Penang
13
9
14
Regional Headquarters Major R&D Facilities Major Factories
Gunma
Saitama
Advantest Laboratories
Kitakyushu
7
8
9
10
11
12
Head Office: Tokyo, Japan
9
Global Network
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＜＜＜＜Southeast Asia＞＞＞＞ Head Office： Singapore
● Production Site ：1site
・Penang, Malaysia （ＤＩ）
● Sales & Support Sites ：：：：7Sites
・Singapore
・Penang, Malaysia
・Malacca, Malaysia
・Clark, Philippines
・Baguio, Philippines
・Bangkok, Thailand
・Ho Chi Min, Vietnam
● R&D Sites •Singapore (ATE and THz)
＜＜＜＜India＞＞＞＞
●R&D Sites
• Chennai, India (wireless test software)
●
2016/7/5 10
Global Coverage: Asia
Circuits are printed(drawn) on the wafer
…trimmed and formed.
…molded…
…wire bonded to their packages…
The wafers are diced…
The dies (chips) are mounted…
Burn-in
Role in Semiconductor Manufacturing
A silicon ingot is grown from a seed crystal…
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Package Test
Circuit design /pattern design
Photomask writing
The wafer is put into an oxide etch process
Transistors are built on the wafer through Oxidization / diffusion /
CVD / ion implantation processes
…and planarized
The wafer surface is oxidized…
…coated with photoresist material…
The wafers are finely polished…
The ingot is sliced into wafers…
Electrodes are formed Wafer test
Front End
Back End
MVM-SEM
Repeat
EB lithography
Test system and device interface
Marking
Complete
Burn-in tester
Test systemDevice interface
Test handler
2016/7/5 All Rights Reserved - ADVANTEST CORPORATION 12
Semiconductorand Component
Test Systems
Mechatronics
Systems
Service,Support,
& Others
● EVA Measurement System
● Electronic Measuring Instruments
● Test Burn-in Systems
Test Handlers ●
Device Interfaces ●
MVM-SEM ●
EB Lithography ●
● Support & Service
● Lease & Rental
● Terahertz Analysis Systems
● SSD Test Systems
SoC Test Systems ●
Memory Test Systems ●
Display Driver Test Systems ●
Business Segment
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■ Automated Test Equipment (ATE)
● SoC Test Systems
Advantest’s comprehensive portfolio of test solutions
offers superior productivity and flexible support for the
semiconductor supply chain. V93000 Smart Scale T2000
● Memory Test Systems
The industry-best parallel test capacity of Advantest’s test
systems for DRAM, NAND flash, and other memory devices
helps customers to minimize test cost and test times.T5503HS
T6391
● Display Driver Test Systems
With over 1,500 units shipped, Advantest’s display driver test
systems are the industry standard for testing these specialized
devices which control displays.
All Rights Reserved - ADVANTEST CORPORATION 14
■ Semiconductor and Component Test Systems
● EVA(Evolutionary Value Added measurement system)
This all-in-one solution offers the functions necessary to
evaluate analog and mixed signal ICs with superior
measurement accuracy. Its intuitive interface does not
require programming knowledge. Dramatically reduces
device R&D time and cost.EVA100
● Cross-Domain AnalyzerTM
Advantest’s cross domain analyzers represent
a new category of measurement instruments
enabling dual-channel phase measurement for
the resolution of electromagnetic interference
(EMI) in electronic systems, among other
applications.
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U3851
● Test Burn-in System
These systems apply electrical and thermal
stresses to screen devices for early failures,
an essential step in the test process.
B6700
■ Semiconductor and Component Test Systems
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■ Mechatronics Systems
● Test Handlers
Test handlers transfer packaged semiconductors
in large batches to a test system, then sort them
based on the results of test. They enable
massively parallel test and lower semiconductor
test cost.
● Device Interfaces
These precision mechanical and
electrical components connect
semiconductor devices with test
systems.
M6245
Probe card
Change kit
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■ Nanotechnologies
● MVM-SEM®
Advantest’s scanning electron microscopes
perform measurement in real time and in 3D of the
width, height, and side wall angles of nanoscale
patterns on semiconductor wafers and
photomasks.
● EB Lithography
Systems such as our F7000 use electron
beams to etch advanced nanoscale patterns
as fine as 1Xnm. EB lithography is ideal for
high-mix low-volume production and prototype
manufacturing.
E3640
F7000
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■ New Businesses
● Terahertz Analysis Systems
Utilizing terahertz waves, these groundbreaking systems
perform non-invasive analysis of pharmaceuticals,
chemical samples, materials for advanced communications,
and other substances.
TAS7500SP with ThermalControl Accessory
2D Cross-Sectional Imaging
◆ Imaging Analysis of a Drug Tablet
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● Mobile System Level Test
Software to validate mobile devices for smartphones
and other terminal types. Supports all usage
environments, signal carriers, and application software.
＊ Offered by W2BI, an Advantest subsidiary.
● SSD Test Systems
Supports SSD (solid state drive) test to meet
growing SSD demand from data centers, laptops,
and other applications.
MPT3000
■ New Businesses
All Rights Reserved - ADVANTEST CORPORATION 20
CloudTesting™ Station
● AirLoggerTM
Real-time, wireless temperature
logger supports simultaneous
measurement of multiple points, in
small spaces, and even on the move.AirLogger™ WM1010
Measuring temperaturein motion
● CloudTestingTM Service
An industry first. Advantest’s e-commerce platform* offers
on-demand test solutions. Optimal for educational
institutions and semiconductor R&D.
* Offered through Advantest’s Cloud Testing Service subsidiary.
■ New Businesses
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● Hadatomo™ Photoacoustic Microscope
A new hybrid imaging method enables non-invasive, high-contrast
imaging of blood vessels in the dermis to a depth of 3mm. Imaging
takes approx. 20 seconds for a 4mm x 4mm measurement area.
Hadatomo5100Flexible arm enables measurement
of any area of the body.
◆◆◆◆ Graphic Analysis of Blood Vessels
Images can be viewed in 3D with differentiation between
surface and dermis of blood vessels.
3D Image Skin Surface Dermis
■ New Businesses
IOT
PMIC
RF
MEMORY
SOC
PAC
TSV
SENSORS
ANALOG
MEMS
SSDAUTOMOTIVE 3D
EMBEDDED
THZ
CLOUD
SMART
PRODUCTIVITY
INNOVATION
AUTOMATION
CONNECTIVITY
TESTING
TECHNOLOGY
SOLUTIONS
PRECISION
SMART
PRODUCTIVITY
INNOVATION
AUTOMATION
CONNECTIVITY
TESTING
TECHNOLOGY
SOLUTIONS
PRECISION
Measure the Connected World
And Everything in It
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