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NanoWizard® 3 NanoScience AFM
Introducing the HyperDrive™ Revolution
Total Flexibility by Design
Optimum imaging in air and liquid for single molecules, polymers and surface-science
HyperDrive™ provides SuperResolution of soft samples in liquids, while QI™ Mode provides Quantitative Imaging
Expanded flexibility and modularity with the widest range of operation modes and accessories for applications ranging from electrochemistry to organic electronics
New Vortis™ digital controller with built-in flexibility
Large sample size compatibility by tip-scanning design
State-of-the-art single molecule force measurements and nanoindentation experiments with ExperimentPlanner™ and RampDesigner™
JPK – dedicated to NanoSciences
Launched in 2002, the NanoWizard® represented the
beginning of a family of AFM systems that introduced
multiple advances in imaging and surface characteriza-
tion in the fields of Life Sciences and Nano Sciences.
The focus in the design of the NanoWizard® 3
NanoScience version is maximum applications
versatility in combination with superior AFM
performance and usability.
Engineered & made in Germany JPK develop, engineer and manufacture instrumentation in Germany to the world-recognised standards of German precision engineering, quality and functionality. The company has a simple philosophy. As CTO, Torsten Jähnke, says - “We have always designed our instrumentation after first listening to users and their challenges. Delivering successful answers for us means no compromises between usability and handling on one side and highest performance on the other. Everywhere where AFM and optics, AFM in liquid and high quality AFM are needed, JPK is the right partner. We do not follow every AFM application but what we do, we do with passion and perfection.”
Building relationships with the SPM community and collaborating with users worldwide has enabled JPK to develop flexible systems which are upgradeable and therefore providing a guaranteed safe investment for users now and for their future research.
A team of experienced scientists and developers backs its instrumentation to the full with field service and support from installation through training and upgrading - worldwide.
NanoWizard® 3 NanoScience AFM setup with TopViewOptics™
The milestones of development
Launch of CellHesion® module: for expansion of the NanoWizard® in the field of cell mechanics
Launch of NanoWizard® II: next generation BioAFM with our proprietary DirectOverlay™ feature which combines AFM and optical images
Launch of the NanoTracker™: first force sensing optical tweezers; Launch of the CellHesion® 200: first dedicated cell mechanics system
1999 was founded
19992002 2004 2005 2006 20082007
Launch of BioMAT™ Workstation: unique coupling of AFM with upright microscopy
Launch of TAO™ module: for tip-enhanced NanoOptics
Launch of the NanoWizard®: the first dedicated BioAFM in the world
Launch of the ForceRobot® 300: worlds first dedicated Automated
Force Spectroscope
2009
now with HyperDrive™ for SuperResolution in liquid
NanoWizard® 3
2010
2012
2013
Launch of QI™: quantitative imaging mode for the most challenging AFM samples
NanoWizard® ULTRA Speed: Fast-Scanning and Super-Resolution AFM on inverted
microscope for real-time studies
HyperDrive™ – SuperResolution AFM imaging in liquids
AFM imaging of soft samples has always provided much
discussion. Which cantilever is correct to use? Should it
be a DC or an AC mode? Does the sample get damaged?
Are the measurements correct?
Remove these questions with HyperDrive™, a soft
sample imaging technique in liquid which provides sub-
nanometer lateral resolution with minimal tip-sample
interactions.
Closed loop image of lambda phage DNA on mica surface scanned in buffer solution (10 mM HEPES, 2 mM NiCl2).
The 3D topography image clearly shows the arrangement of the single DNA molecules.
Scan size: 1µm × 1µm Z-range: 4 nm
DNA origami imaged with HyperDrive™ in buffer solution in closed loop. Scan size: 370 nm × 155 nm, Z-range: 2.9 nm
Sample courtesy of Institute for Bioelectronics, Physics Department, Technical University of Munich, and G. Acuna and P. Tinnefeld from NanoBioSciences, Technical University of Braunschweig, Germany.
Cross section of the marked region: the
height average of the molecule is ~2nm, which is very close to the native size.
This is made possible with HyperDrive™
mode which has the lowest tip sample
interactions.
HyperDrive™
is a sub-nm SuperResolution AFM imaging technique in liquid has extremely low tip-sample interaction is not damaging the sample doesn‘t need a special cantilever is unique to the NanoWizard® 3 AFM
Topography image of a single DNA strand. (zoomed region). Scan size: 185nm × 65nm
HyperDrive™ HyperDrive™ is available with the NanoWizard® 3 AFM head and the Vortis™ high bandwidth, low noise electronic control system. These electronics are extremely stable regarding drift and have the ability to detect the smallest cantilever deflec-tions below a typical noise level of 2 pm RMS. A new designed cantilever excitation is the key for precise control of the probe oscillation.
The NanoWizard® 3 is the only AFM system on the market which is designed for optimal and safe use in liquid and comes with a vapour barrier, encapsulated piezos and a variety of dedi-cated liquid cells for applications ranging from single molecules and polymers to electrochemistry.
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NanoWizard® 3 system design
The robust NanoWizard® 3 head is engineered to provide maxi-mum stability and accuracy. The high specification of every com-ponent from the scanner to closed loop sensors, from electronics to optics is the result of continuous advancement over the last 10 years. The tip-scanning head equipped with a flexure scanner gives the highest flexibility for a large variety of different samples, even larger ones without limitations on sample weight and geometry. Only a tip-scanning configuration allows the use of micro-pipettes or multiple electrical probes in contact with the sample simultane-ous to AFM operation.
The NanoWizard® 3 comes with the lowest possible noise level in the cantilever deflection detection system available on the market today. It is the only atomic-resolution AFM to operate successfully
on an inverted microscope. Improved closed loop control on all three axes, highest resonance frequency in z and no cross-coupling between x, y and z axis delivers a scanner performance previously not available in a commercial AFM. This ensures highest data qua-lity for imaging and force measurements in air and liquid. The new Vortis™ SPM controller family delivers cutting edge values for noi-se levels, speed and the highest versatility. The system comes with a huge number of user-accessible analog and digital signal channels via the Signal Access Module (SAM) front panel, multiple fast lock-in amplifiers and digital Q-control. The user can choose a variety of feedback control options to drive different setups with tuning forks, STM based systems or one with high frequency cantilevers. The ad-vanced and high bandwidth phase-locked loop (PLL) gives ultimate control over the probe oscillation. Equipped with digital TTL pixel and line clock, the system can be easily synchronized with other instruments such as spectrometers, detectors and potentiostats.
Benchmark in stability and accuracy
1 DNA on octadecylamine, 3D topo- graphy, scan in closed loop Scan size: 500 nm × 500 nm Z-range: 5.2 nm 2 Island growth of pentacene layers on silicon, scan in closed loop Scan size: 2 µm × 2 µm Z-range: 29.50 nm 3 Thermal noise spectral density of a NCHR cantilever (NanoWorld) mea- sured in water. The solid line is a fit including the sensor deflection noise of 22 fm/√Hz .
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High bandwidth of 8 MHz
Precise stepper motors for intelligent approach and automatic tilt correction
IR light source with lowest noise
Sample stage for tip and sample
positioning
Cantilever holder
Special optical filters avoiding cross-talk
Top view optical access
Flexure scanner with decoupled axes (xy from z)
Flexible sample holder
Bottom view port
Lowest closed loop noise in all 3 axes
Vapor barrier for safe liquid imaging
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Most flexible setup
The NanoWizard® 3 System is made with maximum flexibility and usability in mind. Compromise in the performance is not acceptable. The result is a true multi-purpose system.
Highest AFM performance for the largest variety of samples
Unlimited experimental freedom
Hard or soft samples Measurements in gas or liquid environment From atomic resolution to large scans Force measurements Electrical and magnetic characterization Electrochemistry with or without optical microscopy Heating, cooling and humidity control Local thermal experiments by SThM Measurements of mechanical properties such as Young’s modulus, adhesion, dissipation Study of optical properties Dynamic processes
Electrical oxidation on a plain silicon substrate.
Voltage ramps: 0-10-0 V Ramp speed: 3 V/s Writing speed: 250nm/s Circle radius: 5µm
Conductive AFM topography ( 1 ) and current ( 2 ) images of optically active conductive polymer film on ITO, using the JPK conductive AFM module with environmental control. The conductivity is constant over the film, but highly dependent on incident light. The graph ( 3 ) shows a current trace against time at a typical point, the UV illumination light was switched on and off as marked, giving an increase of the current to around 70pA.
Scan size 5µm × 5µm, imaged in oxygen-free atmosphere.
Sample courtesy of Dr. Yeng Ming Lam and Teddy Salim, School of Materials Science and Engineering, NTU, Singapore.
Piezoresponse Force Microscopy (PFM) on a periodically poled LiNbO3 single crystal. The phase image shows the piezo response of the crystal‘s z-plane in verti-cal direction (zPFM). Scan size: 66µm × 43µm
Magnetic Force Microscopy images (MFM) of six rectangular magnetic structures. 3D plot of the topography with the magnetic information used for the colour scale.
Sample courtesy of Philipp Pirro, TU Kaiserslautern.
Scan size: 20µm × 20µm
Scanning Tunneling Microscopy image (STM, current) of arachidic acid molecules on HOPG.
Scan size: 25nm × 25nmCurrent range: 0.8 nA Bias: 0.3 V
Kelvin Probe Microscopy (KPM) on an interdigitated electrode, 21µm scan region. The height image is displayed as 3D topography with the added colour to indicate measured surface potential. The raised electrodes (100nm thick) are interdigitated in pairs, the separation between topography and potential is clearly visible.
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Quantiative imaging & advanced force measurements
Twisted amyloid fibrils measured in buffer solution 1 : height image · 2 : Young‘s Modulus · 3 : force distance curve at the marked point Scan size: 500×500nm · Z-range: 10 nm · Elasticity range: 125 MPa · Imaged in closed-loop · Sample courtesy Dr. Claudio Canale, Italian Institute of Technology, Genoa, Italy
The advanced AFM head and stable, low noise control electronics raise the standard of imaging and force spectroscopy measurements with NanoWizard® 3.
With QI™, the new force curve based imaging mode, the user has full control over the tip-sample inter-action force at every pixel of the image. There is no longer a need for setpoint or gain adjustment while scanning.
The force RampDesigner™ can be used to create custom force curves while the whole experiment and environment can be controlled through the Experi-mentPlanner™ interface. This allows convenient and customized force mapping and force ramp/clamp experiments. Advanced algorithms are in place for easy, rapid analysis of large data sets.
Software design that reduces operator interactions may be important to some users while other prefer full access to instrument parameters.JPK’s latest GUI design gives users control to the level they require.
The ForceWheel™ adds sensitive parameter control while running an experiment.
Accessory versatility is important for users to control the experimental environment whether this is for working at different temperatures or being able to perform advanced electrochemistry experiments. NanoWizard® 3 comes with a broad range of liquid cells, gas flow solutions and sample heaters/coolers for imaging and force measurements.
Imaging and Force Spectroscopy in controlled environment
JPK is the force spectroscopy expert with complete hardware and software solutions to meet individual experimental requirements
Full data sets of force curves with QI™ Advanced imaging mode
Powerful and fast batch-processing with comprehensive fitting routines
Full range of accessories for environmental control from harsh sample environments (e.g. toluene), heating and cooling to liquid exchange
Measurements in controlled atmosphere (e.g. argon or nitrogen)
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Melting and dewetting of a thin film of polystyrene on silicon over 40 minutes, using the JPK Heating Cooling Stage (HCS™) to maintain the temperature at 45 °C.
All images 4µm × 6µm scan region, color range 56nm in height.
Closed loop image of DNA at -25 °C in inert gas atmosphere performed with the Heating Cooling Module (HCM™).
Scan size: 875nm × 785nm Z-range: 2.3nm
Typical BioScience applications and research fields:
High resolution imaging in air and liquid of single molecules such as proteins, DNA/RNA, carbohydrates, lipids, Live Cell Imaging, bacteria and virus characterization, cellular adhesion and cytomechanics, molecular interactions, receptor-ligand, antibody-antigen, molecular unfolding, molecular recognition, biomaterials, compound and implant characterization, material properties such as adhesion, elasticity, hardness; drug formulation, encapsulation and aging studies and many more
Setups and accessories for BioScience applications highlighted with LIGHT BLUE BOXES
Typical NanoScience applications and research fields:
High resolution imaging in air and liquid of single molecules, thin films, nanoparticles or nanowires, surface properties characterization such as adhesion, stiffness, friction, conductivity, charges, hardness; polymer science, single molecule force measurements, smart organic materials, surface properties of conjugated polymers, biosensors, degradable materials, electrochemistry, colloidal probe, surface forces and interface phenomena; and many more
Setups and accessories for NanoScience applications highlighted with GRAY BOXES
For more detailed information about all options see the brochures and product notes or visit www.jpk.com.
Optional heads
Head
Control electronics options
Temperature control
Extras & OEM
SIGNAL ACCESS MODULE (SAM)Signal acceSS Module (SaM)
PetriDishHeater™
8x FluidicsModule™
BioCell™
Acoustic enclosure
ECCell™ Electrochemistry cell
Vibration isolation
Scanning Thermal Microscopy module
Potentiostats from eDAQ
Base frame for ac- tive isolation tables
HCM™ Heating cooling module
HTHS™ High temperature heating system
ECCell™ – Electrochemisty cell
Stages Motorized precision stage Life sciences stage Standard stage HCS™
Heating cooling stage
Fluid cells & cantilever holders
SmallCell™ CoverslipHoldersmall volume SmallCell™
Standard CantileverHolder
Side-view CantileverHolder
CoverslipHolder electrics
Cantilever holder for electr. experiments
Electrical modes & application modules
STM module
PiezoResponse module
Conductive AFM module
Electrical tip connection
KelvinProbe module
CellHesion® 200CellHesion® 200 NanoWizard® ULTRA SpeedNanoWizard® ULTRA Speed ForceRobot® 300ForceRobot® 300
NanoWizard® 3NanoWizard® 3
Vortis™ SPMControlVortis™ SPMControlVortis™ Advanced
SPMControlSPMControl
Software Experiment Planner™
Manipulation and lithography
Advanced Force Spectroscopy
Direct Overlay
QI™ Advanced
Hyper Drive™™SPM CONTROL AND DATA PROCESSINGSPM Control AnD DAtA ProCeSSing
TAO™
ModuleBioMAT™
CellHesion® Module
System options
2-axesPetriDishHeater™ for BioMAT™ 3-axes
TopView Optics™
Upright Fluorescence Microscope Kit
TopViewOptics™ for inv. opt. microscopes
The NanoWizard® AFM family
Specifications for the NanoWizard® 3 NanoScience AFM
System specifications Atomic lattice resolution on inverted microscope
(< 0.035nm RMS z noise level) Ultra-low noise level of cantilever deflection detection system
< 2pm RMS free (0.1Hz - 1kHz) Best closed-loop AFM on the market for reproducible tip positioning and
long time position stability Tip-scanning stand alone system, the only choice for simultaneous AFM
and laser scanning experiments IR deflection detection light source with low coherence for
interference-free measurements NanoWizard® 3 can be operated:
1) On top of an inverted research microscope for AFM simultaneously with optical Microscopy Find a measurement spot optically on your sample by fluorescent labeling Combine AFM with advanced optical techniques such as confocal, FCS, FRET, TIRF or optical tweezers Exact positioning and overlay of optical and AFM data with the JPK DirectOverlay™ software module 2) Stand-alone based Maximum flexibility even if no fluorescence is needed (the sample stage can be mounted on an optical microscope within a minute) Free access to the sample area for micropipettes or electrical connections TopViewOptics™ optional
NanoWizard® 3 head Rigid low-noise design and drift-minimized mechanics High detector bandwidth of 8MHz for high speed signal capture Liquid-safe design with integrated vapor barrier, special encapsulated
piezo drives and tip-moving design Intelligent and automated approach with user defined parameters for
soft landing even with functionalized tips Transmission illumination with standard condensers for precise
brightfield, DIC and phase contrast Built-in optical filters for fluorescence without crosstalk Scanner unit
Flexure stage scanner design with decoupled, low mass z scanner 100×100×15µm³ scan range for the head in closed-loop mode Position noise level 0.2nm RMS in xy (in closed-loop) and 0.06nm RMS sensor noise level in z (3kHz bw)
Vortis™ SPMControl electronics State-of-the-art digital controller with lowest noise levels and highest
number on signal channels High speed 16 bit AD conversion with 60MHz High speed Lock-in amplifier technology for precise amplitude and
phase detection High speed data capture with optional burst mode Modular hybrid analog/digital design with latest FPGA/PPC technology
(PowerPC @ 660MHz / FPGAs @ 240MHz) Gigabit Ethernet interface for fast data link Number of data points that can be captured continuously: restricted
only by HDD Thermal noise acquisition up to 3.25MHz Optional Signal Access Module (SAM) with analog and digital connectors
for maximum experimental freedom
SPMControl software Fully automated sensitivity and spring constant calibration using
thermal noise method Patented DirectOverlay™ for picture-in-picture functionality Outline™ mode for precise selection of a new scan area even in the
optical image Improved ForceWatch™ mode for force spectroscopy and imaging for
cantilever-drift free measurements Advanced oscilloscope functionality and online measurement of
distances, cross sections etc. True multi-user platform User-programmable software Unlimited pixel resolution for imaging or force curves Comprehensive force measurement with TipSaver™ JPK ExperimentPlanner™ for designing a dedicated measurement
workflow JPK RampDesigner™ for custom designed force curves Advanced spectroscopy modes such as various force clamp modes
or user-defined ramp design, e.g. for temperature ramps, pulling speed or force feedback Enhanced fast force mapping capabilities Automated filtering of curves without events
Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section etc. DataProcessing Image-Viewer for picture-in-picture display and export,
including calibrated optical images Powerful batch processing of force curves including WLC, FJC,
step-fitting and other analysis
Stages Liquid-safe, robust and drift-minimized design for highest stability Motorized precision stage with 20×20mm² travel range with joystick
or software control Manual precision stage with 20×20mm² travel range Independent positioning of tip & sample with respect to the optical axis Stages are available for all major inverted optical microscope
manufacturers (see below)
Sample holders Holders for Petri dishes, coverslips, microscope slides or metal SPM stubs Special holders and liquid cells possible Ø140×18mm3 free sample volume
Optical configurations Fits to inverted microscopes from
Zeiss (Axio Observer, AxioVert 200) Olympus (IX line) Nikon (TE 2000, Ti) Leica (DMI line) Fully simultaneous operation with optical phase contrast and DIC,
using standard condensers Compatible with commercial confocal microscopes and fluorescence
techniques such as TIRF, FRET, FCS, FRAP, FLIM Upgradeable for scatter-type SNOM, Raman, TERS measurements AFM and upright high-NA optics combination with the JPK BioMAT™
workstation (see BioMAT™ brochure) Large variety of high-end EM-CCD cameras supported TopViewOptics™ video optics for opaque samples
Temperature control options RT - 300°C temperature range with 0.1°C precision with the
JPK High Temperature Heating Stage (HTHS™) -35°C - 120°C temperature range with 0.1°C precision with the JPK
Heating Cooling Module (HCM™) (~0 °C - ~80 °C for experiments in buffer solution) All heaters and heating/cooling solutions are software-controlled
Fluid cell options Inert glass standard cantilever holders for experiments in droplets or
custom fluid cells JPK‘s patented BioCell™ for high-NA immersion lenses and high
resolution AFM down to the single molecule level allows temperature control between 15 - 60°C, perfusion and gas flow for standard cover slips JPK CoverslipHolder offers the same capability as the BioCell™ for
ambient temperature experiments JPK temperature controlled electrochemistry cell ECCell™ with
transmission illuminations JPK PetriDishHeater™ perfect for living cells
accommodates 35mm Petri dishes even with coverslip bottom ambient to 60°C temperature range perfusion and gas flow possible JPK SmallCell™ small volume version for aqueous solutions
Closed fluid cell for minimized volumes (< 60µl) 3 easily accessible sample ports, 2 for buffer exchange and 1 for adding chemical detergents
Flexibility integrated Different sample holders, cantilever holders & stages for every application Large choice of add-ons such as temperature controls, liquid cells even
for aggressive solvents JPK‘s ForceWheel™ handheld accessory for most sensitive experiment
control Full experimental control by scripting functionality and access to all signals
Options (see accessories data sheet) Sample holders for all kinds of substrates CellHesion® module with extra 100µm closed loop z range TAO™ module with 100×100µm² or 100×100×10µm³ closed loop
sample scanning stage Vortis™ Advanced SPMControl station for maximum flexibility Electrical measurement modes Cameras and light sources for video imaging or fluorescence Vibration and acoustic isolation from leading suppliers
JPK Instruments AG
Bouchéstraße 12 12435 Berlin, Germany tel.: +49 30 5331 12070 fax.: +49 30 5331 22555www.jpk.com
Standard operating modes
Imaging modes (air or liquid)
QI™ Quantitative Imaging
Contact mode with LFM
AC modes with Q-control
Phase detection
Force spectroscopy (air or liquid)
Static and dynamic spectroscopy
Force clamp & ramp
Fast Force Mapping
QI™ Advanced imaging mode
Optional modes
HyperDrive™
Advanced AC modes like FM or PM
Higher harmonics imaging
MicroRheology
KPM, SCM
MFM
EFM in one-pass
Conductive AFM (CAFM)
STM
Electrical spectroscopy modes
Piezo-Response Force Microscopy
Electrochemistry with temperature
control and optics
NanoLithography and NanoManipulation
NanoIndentation
Scanning Thermal AFM
Environmental control
DirectOverlay™ for combined AFM and optics
All i
nfor
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NanoWizard, ForceRobot, CellHesion, BioMat, Vortis, HyperDrive, TAO,
ForceWheel, SmallCell, PetriDishHeater, BioCell, HCM, HTHS, RampDesigner, ExperimentalPlanner, DirectOverlay,
TopViewOptics and QI are trademarks or registered trademarks of JPK Instruments AG
NanoWizard® 3 AFM on a Olympus IX71
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Web address: www.jpk.com
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