NanoWizard® 3 NanoScience AFM

Introducing the HyperDrive™ Revolution

Total Flexibility by Design

Optimum imaging in air and liquid for single molecules, polymers and surface-science

HyperDrive™ provides SuperResolution of soft samples in liquids, while QI™ Mode provides Quantitative Imaging

Expanded flexibility and modularity with the widest range of operation modes and accessories for applications ranging from electrochemistry to organic electronics

New Vortis™ digital controller with built-in flexibility

Large sample size compatibility by tip-scanning design

State-of-the-art single molecule force measurements and nanoindentation experiments with ExperimentPlanner™ and RampDesigner™

JPK – dedicated to NanoSciences

Launched in 2002, the NanoWizard® represented the

beginning of a family of AFM systems that introduced

multiple advances in imaging and surface characteriza-

tion in the fields of Life Sciences and Nano Sciences.

The focus in the design of the NanoWizard® 3

NanoScience version is maximum applications

versatility in combination with superior AFM

performance and usability.

Engineered & made in Germany JPK develop, engineer and manufacture instrumentation in Germany to the world-recognised standards of German precision engineering, quality and functionality. The company has a simple philosophy. As CTO, Torsten Jähnke, says - “We have always designed our instrumentation after first listening to users and their challenges. Delivering successful answers for us means no compromises between usability and handling on one side and highest performance on the other. Everywhere where AFM and optics, AFM in liquid and high quality AFM are needed, JPK is the right partner. We do not follow every AFM application but what we do, we do with passion and perfection.”

Building relationships with the SPM community and collaborating with users worldwide has enabled JPK to develop flexible systems which are upgradeable and therefore providing a guaranteed safe investment for users now and for their future research.

A team of experienced scientists and developers backs its instrumentation to the full with field service and support from installation through training and upgrading - worldwide.

NanoWizard® 3 NanoScience AFM setup with TopViewOptics™

The milestones of development

Launch of CellHesion® module: for expansion of the NanoWizard® in the field of cell mechanics

Launch of NanoWizard® II: next generation BioAFM with our proprietary DirectOverlay™ feature which combines AFM and optical images

Launch of the NanoTracker™: first force sensing optical tweezers; Launch of the CellHesion® 200: first dedicated cell mechanics system

1999 was founded

19992002 2004 2005 2006 20082007

Launch of BioMAT™ Workstation: unique coupling of AFM with upright microscopy

Launch of TAO™ module: for tip-enhanced NanoOptics

Launch of the NanoWizard®: the first dedicated BioAFM in the world

Launch of the ForceRobot® 300: worlds first dedicated Automated

Force Spectroscope

2009

now with HyperDrive™ for SuperResolution in liquid

NanoWizard® 3

2010

2012

2013

Launch of QI™: quantitative imaging mode for the most challenging AFM samples

NanoWizard® ULTRA Speed: Fast-Scanning and Super-Resolution AFM on inverted

microscope for real-time studies

HyperDrive™ – SuperResolution AFM imaging in liquids

AFM imaging of soft samples has always provided much

discussion. Which cantilever is correct to use? Should it

be a DC or an AC mode? Does the sample get damaged?

Are the measurements correct?

Remove these questions with HyperDrive™, a soft

sample imaging technique in liquid which provides sub-

nanometer lateral resolution with minimal tip-sample

interactions.

Closed loop image of lambda phage DNA on mica surface scanned in buffer solution (10 mM HEPES, 2 mM NiCl2).

The 3D topography image clearly shows the arrangement of the single DNA molecules.

Scan size: 1µm × 1µm Z-range: 4 nm

DNA origami imaged with HyperDrive™ in buffer solution in closed loop. Scan size: 370 nm × 155 nm, Z-range: 2.9 nm

Sample courtesy of Institute for Bioelectronics, Physics Department, Technical University of Munich, and G. Acuna and P. Tinnefeld from NanoBioSciences, Technical University of Braunschweig, Germany.

Cross section of the marked region: the

height average of the molecule is ~2nm, which is very close to the native size.

This is made possible with HyperDrive™

mode which has the lowest tip sample

interactions.

HyperDrive™

is a sub-nm SuperResolution AFM imaging technique in liquid has extremely low tip-sample interaction is not damaging the sample doesn‘t need a special cantilever is unique to the NanoWizard® 3 AFM

Topography image of a single DNA strand. (zoomed region). Scan size: 185nm × 65nm

HyperDrive™ HyperDrive™ is available with the NanoWizard® 3 AFM head and the Vortis™ high bandwidth, low noise electronic control system. These electronics are extremely stable regarding drift and have the ability to detect the smallest cantilever deflec-tions below a typical noise level of 2 pm RMS. A new designed cantilever excitation is the key for precise control of the probe oscillation.

The NanoWizard® 3 is the only AFM system on the market which is designed for optimal and safe use in liquid and comes with a vapour barrier, encapsulated piezos and a variety of dedi-cated liquid cells for applications ranging from single molecules and polymers to electrochemistry.

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NanoWizard® 3 system design

The robust NanoWizard® 3 head is engineered to provide maxi-mum stability and accuracy. The high specification of every com-ponent from the scanner to closed loop sensors, from electronics to optics is the result of continuous advancement over the last 10 years. The tip-scanning head equipped with a flexure scanner gives the highest flexibility for a large variety of different samples, even larger ones without limitations on sample weight and geometry. Only a tip-scanning configuration allows the use of micro-pipettes or multiple electrical probes in contact with the sample simultane-ous to AFM operation.

The NanoWizard® 3 comes with the lowest possible noise level in the cantilever deflection detection system available on the market today. It is the only atomic-resolution AFM to operate successfully

on an inverted microscope. Improved closed loop control on all three axes, highest resonance frequency in z and no cross-coupling between x, y and z axis delivers a scanner performance previously not available in a commercial AFM. This ensures highest data qua-lity for imaging and force measurements in air and liquid. The new Vortis™ SPM controller family delivers cutting edge values for noi-se levels, speed and the highest versatility. The system comes with a huge number of user-accessible analog and digital signal channels via the Signal Access Module (SAM) front panel, multiple fast lock-in amplifiers and digital Q-control. The user can choose a variety of feedback control options to drive different setups with tuning forks, STM based systems or one with high frequency cantilevers. The ad-vanced and high bandwidth phase-locked loop (PLL) gives ultimate control over the probe oscillation. Equipped with digital TTL pixel and line clock, the system can be easily synchronized with other instruments such as spectrometers, detectors and potentiostats.

Benchmark in stability and accuracy

1 DNA on octadecylamine, 3D topo- graphy, scan in closed loop Scan size: 500 nm × 500 nm Z-range: 5.2 nm 2 Island growth of pentacene layers on silicon, scan in closed loop Scan size: 2 µm × 2 µm Z-range: 29.50 nm 3 Thermal noise spectral density of a NCHR cantilever (NanoWorld) mea- sured in water. The solid line is a fit including the sensor deflection noise of 22 fm/√Hz .

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High bandwidth of 8 MHz

Precise stepper motors for intelligent approach and automatic tilt correction

IR light source with lowest noise

Sample stage for tip and sample

positioning

Cantilever holder

Special optical filters avoiding cross-talk

Top view optical access

Flexure scanner with decoupled axes (xy from z)

Flexible sample holder

Bottom view port

Lowest closed loop noise in all 3 axes

Vapor barrier for safe liquid imaging

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Most flexible setup

The NanoWizard® 3 System is made with maximum flexibility and usability in mind. Compromise in the performance is not acceptable. The result is a true multi-purpose system.

Highest AFM performance for the largest variety of samples

Unlimited experimental freedom

Hard or soft samples Measurements in gas or liquid environment From atomic resolution to large scans Force measurements Electrical and magnetic characterization Electrochemistry with or without optical microscopy Heating, cooling and humidity control Local thermal experiments by SThM Measurements of mechanical properties such as Young’s modulus, adhesion, dissipation Study of optical properties Dynamic processes

Electrical oxidation on a plain silicon substrate.

Voltage ramps: 0-10-0 V Ramp speed: 3 V/s Writing speed: 250nm/s Circle radius: 5µm

Conductive AFM topography ( 1 ) and current ( 2 ) images of optically active conductive polymer film on ITO, using the JPK conductive AFM module with environmental control. The conductivity is constant over the film, but highly dependent on incident light. The graph ( 3 ) shows a current trace against time at a typical point, the UV illumination light was switched on and off as marked, giving an increase of the current to around 70pA.

Scan size 5µm × 5µm, imaged in oxygen-free atmosphere.

Sample courtesy of Dr. Yeng Ming Lam and Teddy Salim, School of Materials Science and Engineering, NTU, Singapore.

Piezoresponse Force Microscopy (PFM) on a periodically poled LiNbO3 single crystal. The phase image shows the piezo response of the crystal‘s z-plane in verti-cal direction (zPFM). Scan size: 66µm × 43µm

Magnetic Force Microscopy images (MFM) of six rectangular magnetic structures. 3D plot of the topography with the magnetic information used for the colour scale.

Sample courtesy of Philipp Pirro, TU Kaiserslautern.

Scan size: 20µm × 20µm

Scanning Tunneling Microscopy image (STM, current) of arachidic acid molecules on HOPG.

Scan size: 25nm × 25nmCurrent range: 0.8 nA Bias: 0.3 V

Kelvin Probe Microscopy (KPM) on an interdigitated electrode, 21µm scan region. The height image is displayed as 3D topography with the added colour to indicate measured surface potential. The raised electrodes (100nm thick) are interdigitated in pairs, the separation between topography and potential is clearly visible.

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Quantiative imaging & advanced force measurements

Twisted amyloid fibrils measured in buffer solution 1 : height image · 2 : Young‘s Modulus · 3 : force distance curve at the marked point Scan size: 500×500nm · Z-range: 10 nm · Elasticity range: 125 MPa · Imaged in closed-loop · Sample courtesy Dr. Claudio Canale, Italian Institute of Technology, Genoa, Italy

The advanced AFM head and stable, low noise control electronics raise the standard of imaging and force spectroscopy measurements with NanoWizard® 3.

With QI™, the new force curve based imaging mode, the user has full control over the tip-sample inter-action force at every pixel of the image. There is no longer a need for setpoint or gain adjustment while scanning.

The force RampDesigner™ can be used to create custom force curves while the whole experiment and environment can be controlled through the Experi-mentPlanner™ interface. This allows convenient and customized force mapping and force ramp/clamp experiments. Advanced algorithms are in place for easy, rapid analysis of large data sets.

Software design that reduces operator interactions may be important to some users while other prefer full access to instrument parameters.JPK’s latest GUI design gives users control to the level they require.

The ForceWheel™ adds sensitive parameter control while running an experiment.

Accessory versatility is important for users to control the experimental environment whether this is for working at different temperatures or being able to perform advanced electrochemistry experiments. NanoWizard® 3 comes with a broad range of liquid cells, gas flow solutions and sample heaters/coolers for imaging and force measurements.

Imaging and Force Spectroscopy in controlled environment

JPK is the force spectroscopy expert with complete hardware and software solutions to meet individual experimental requirements

Full data sets of force curves with QI™ Advanced imaging mode

Powerful and fast batch-processing with comprehensive fitting routines

Full range of accessories for environmental control from harsh sample environments (e.g. toluene), heating and cooling to liquid exchange

Measurements in controlled atmosphere (e.g. argon or nitrogen)

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Melting and dewetting of a thin film of polystyrene on silicon over 40 minutes, using the JPK Heating Cooling Stage (HCS™) to maintain the temperature at 45 °C.

All images 4µm × 6µm scan region, color range 56nm in height.

Closed loop image of DNA at -25 °C in inert gas atmosphere performed with the Heating Cooling Module (HCM™).

Scan size: 875nm × 785nm Z-range: 2.3nm

Typical BioScience applications and research fields:

High resolution imaging in air and liquid of single molecules such as proteins, DNA/RNA, carbohydrates, lipids, Live Cell Imaging, bacteria and virus characterization, cellular adhesion and cytomechanics, molecular interactions, receptor-ligand, antibody-antigen, molecular unfolding, molecular recognition, biomaterials, compound and implant characterization, material properties such as adhesion, elasticity, hardness; drug formulation, encapsulation and aging studies and many more

Setups and accessories for BioScience applications highlighted with LIGHT BLUE BOXES

Typical NanoScience applications and research fields:

High resolution imaging in air and liquid of single molecules, thin films, nanoparticles or nanowires, surface properties characterization such as adhesion, stiffness, friction, conductivity, charges, hardness; polymer science, single molecule force measurements, smart organic materials, surface properties of conjugated polymers, biosensors, degradable materials, electrochemistry, colloidal probe, surface forces and interface phenomena; and many more

Setups and accessories for NanoScience applications highlighted with GRAY BOXES

For more detailed information about all options see the brochures and product notes or visit www.jpk.com.

Optional heads

Head

Control electronics options

Temperature control

Extras & OEM

SIGNAL ACCESS MODULE (SAM)Signal acceSS Module (SaM)

PetriDishHeater™

8x FluidicsModule™

BioCell™

Acoustic enclosure

ECCell™ Electrochemistry cell

Vibration isolation

Scanning Thermal Microscopy module

Potentiostats from eDAQ

Base frame for ac- tive isolation tables

HCM™ Heating cooling module

HTHS™ High temperature heating system

ECCell™ – Electrochemisty cell

Stages Motorized precision stage Life sciences stage Standard stage HCS™

Heating cooling stage

Fluid cells & cantilever holders

SmallCell™ CoverslipHoldersmall volume SmallCell™

Standard CantileverHolder

Side-view CantileverHolder

CoverslipHolder electrics

Cantilever holder for electr. experiments

Electrical modes & application modules

STM module

PiezoResponse module

Conductive AFM module

Electrical tip connection

KelvinProbe module

CellHesion® 200CellHesion® 200 NanoWizard® ULTRA SpeedNanoWizard® ULTRA Speed ForceRobot® 300ForceRobot® 300

NanoWizard® 3NanoWizard® 3

Vortis™ SPMControlVortis™ SPMControlVortis™ Advanced

SPMControlSPMControl

Software Experiment Planner™

Manipulation and lithography

Advanced Force Spectroscopy

Direct Overlay

QI™ Advanced

Hyper Drive™™SPM CONTROL AND DATA PROCESSINGSPM Control AnD DAtA ProCeSSing

TAO™

ModuleBioMAT™

CellHesion® Module

System options

2-axesPetriDishHeater™ for BioMAT™ 3-axes

TopView Optics™

Upright Fluorescence Microscope Kit

TopViewOptics™ for inv. opt. microscopes

The NanoWizard® AFM family

Specifications for the NanoWizard® 3 NanoScience AFM

System specifications Atomic lattice resolution on inverted microscope

(< 0.035nm RMS z noise level) Ultra-low noise level of cantilever deflection detection system

< 2pm RMS free (0.1Hz - 1kHz) Best closed-loop AFM on the market for reproducible tip positioning and

long time position stability Tip-scanning stand alone system, the only choice for simultaneous AFM

and laser scanning experiments IR deflection detection light source with low coherence for

interference-free measurements NanoWizard® 3 can be operated:

1) On top of an inverted research microscope for AFM simultaneously with optical Microscopy Find a measurement spot optically on your sample by fluorescent labeling Combine AFM with advanced optical techniques such as confocal, FCS, FRET, TIRF or optical tweezers Exact positioning and overlay of optical and AFM data with the JPK DirectOverlay™ software module 2) Stand-alone based Maximum flexibility even if no fluorescence is needed (the sample stage can be mounted on an optical microscope within a minute) Free access to the sample area for micropipettes or electrical connections TopViewOptics™ optional

NanoWizard® 3 head Rigid low-noise design and drift-minimized mechanics High detector bandwidth of 8MHz for high speed signal capture Liquid-safe design with integrated vapor barrier, special encapsulated

piezo drives and tip-moving design Intelligent and automated approach with user defined parameters for

soft landing even with functionalized tips Transmission illumination with standard condensers for precise

brightfield, DIC and phase contrast Built-in optical filters for fluorescence without crosstalk Scanner unit

Flexure stage scanner design with decoupled, low mass z scanner 100×100×15µm³ scan range for the head in closed-loop mode Position noise level 0.2nm RMS in xy (in closed-loop) and 0.06nm RMS sensor noise level in z (3kHz bw)

Vortis™ SPMControl electronics State-of-the-art digital controller with lowest noise levels and highest

number on signal channels High speed 16 bit AD conversion with 60MHz High speed Lock-in amplifier technology for precise amplitude and

phase detection High speed data capture with optional burst mode Modular hybrid analog/digital design with latest FPGA/PPC technology

(PowerPC @ 660MHz / FPGAs @ 240MHz) Gigabit Ethernet interface for fast data link Number of data points that can be captured continuously: restricted

only by HDD Thermal noise acquisition up to 3.25MHz Optional Signal Access Module (SAM) with analog and digital connectors

for maximum experimental freedom

SPMControl software Fully automated sensitivity and spring constant calibration using

thermal noise method Patented DirectOverlay™ for picture-in-picture functionality Outline™ mode for precise selection of a new scan area even in the

optical image Improved ForceWatch™ mode for force spectroscopy and imaging for

cantilever-drift free measurements Advanced oscilloscope functionality and online measurement of

distances, cross sections etc. True multi-user platform User-programmable software Unlimited pixel resolution for imaging or force curves Comprehensive force measurement with TipSaver™ JPK ExperimentPlanner™ for designing a dedicated measurement

workflow JPK RampDesigner™ for custom designed force curves Advanced spectroscopy modes such as various force clamp modes

or user-defined ramp design, e.g. for temperature ramps, pulling speed or force feedback Enhanced fast force mapping capabilities Automated filtering of curves without events

Powerful Data Processing (DP) functions with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section etc. DataProcessing Image-Viewer for picture-in-picture display and export,

including calibrated optical images Powerful batch processing of force curves including WLC, FJC,

step-fitting and other analysis

Stages Liquid-safe, robust and drift-minimized design for highest stability Motorized precision stage with 20×20mm² travel range with joystick

or software control Manual precision stage with 20×20mm² travel range Independent positioning of tip & sample with respect to the optical axis Stages are available for all major inverted optical microscope

manufacturers (see below)

Sample holders Holders for Petri dishes, coverslips, microscope slides or metal SPM stubs Special holders and liquid cells possible Ø140×18mm3 free sample volume

Optical configurations Fits to inverted microscopes from

Zeiss (Axio Observer, AxioVert 200) Olympus (IX line) Nikon (TE 2000, Ti) Leica (DMI line) Fully simultaneous operation with optical phase contrast and DIC,

using standard condensers Compatible with commercial confocal microscopes and fluorescence

techniques such as TIRF, FRET, FCS, FRAP, FLIM Upgradeable for scatter-type SNOM, Raman, TERS measurements AFM and upright high-NA optics combination with the JPK BioMAT™

workstation (see BioMAT™ brochure) Large variety of high-end EM-CCD cameras supported TopViewOptics™ video optics for opaque samples

Temperature control options RT - 300°C temperature range with 0.1°C precision with the

JPK High Temperature Heating Stage (HTHS™) -35°C - 120°C temperature range with 0.1°C precision with the JPK

Heating Cooling Module (HCM™) (~0 °C - ~80 °C for experiments in buffer solution) All heaters and heating/cooling solutions are software-controlled

Fluid cell options Inert glass standard cantilever holders for experiments in droplets or

custom fluid cells JPK‘s patented BioCell™ for high-NA immersion lenses and high

resolution AFM down to the single molecule level allows temperature control between 15 - 60°C, perfusion and gas flow for standard cover slips JPK CoverslipHolder offers the same capability as the BioCell™ for

ambient temperature experiments JPK temperature controlled electrochemistry cell ECCell™ with

transmission illuminations JPK PetriDishHeater™ perfect for living cells

accommodates 35mm Petri dishes even with coverslip bottom ambient to 60°C temperature range perfusion and gas flow possible JPK SmallCell™ small volume version for aqueous solutions

Closed fluid cell for minimized volumes (< 60µl) 3 easily accessible sample ports, 2 for buffer exchange and 1 for adding chemical detergents

Flexibility integrated Different sample holders, cantilever holders & stages for every application Large choice of add-ons such as temperature controls, liquid cells even

for aggressive solvents JPK‘s ForceWheel™ handheld accessory for most sensitive experiment

control Full experimental control by scripting functionality and access to all signals

Options (see accessories data sheet) Sample holders for all kinds of substrates CellHesion® module with extra 100µm closed loop z range TAO™ module with 100×100µm² or 100×100×10µm³ closed loop

sample scanning stage Vortis™ Advanced SPMControl station for maximum flexibility Electrical measurement modes Cameras and light sources for video imaging or fluorescence Vibration and acoustic isolation from leading suppliers

JPK Instruments AG

Bouchéstraße 12 12435 Berlin, Germany tel.: +49 30 5331 12070 fax.: +49 30 5331 22555www.jpk.com

Standard operating modes

Imaging modes (air or liquid)

QI™ Quantitative Imaging

Contact mode with LFM

AC modes with Q-control

Phase detection

Force spectroscopy (air or liquid)

Static and dynamic spectroscopy

Force clamp & ramp

Fast Force Mapping

QI™ Advanced imaging mode

Optional modes

HyperDrive™

Advanced AC modes like FM or PM

Higher harmonics imaging

MicroRheology

KPM, SCM

MFM

EFM in one-pass

Conductive AFM (CAFM)

STM

Electrical spectroscopy modes

Piezo-Response Force Microscopy

Electrochemistry with temperature

control and optics

NanoLithography and NanoManipulation

NanoIndentation

Scanning Thermal AFM

Environmental control

DirectOverlay™ for combined AFM and optics

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NanoWizard, ForceRobot, CellHesion, BioMat, Vortis, HyperDrive, TAO,

ForceWheel, SmallCell, PetriDishHeater, BioCell, HCM, HTHS, RampDesigner, ExperimentalPlanner, DirectOverlay,

TopViewOptics and QI are trademarks or registered trademarks of JPK Instruments AG

NanoWizard® 3 AFM on a Olympus IX71

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Web address: www.jpk.com

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