zander-lynds documents

Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse-grain Redundancy Anthony J. YuGuy G.F. Lemieux September 15, 2005
Documents Defect Tolerance for Yield Enhancement of FPGA Interconnect Using Fine-grain and Coarse-grain Redundancy Anthony J. YuGuy G.F. Lemieux September 15, 2005