hilaire-ananda-perera documents

Early Life Failure Rate Calculation Procedure for Semiconductor Components
Engineering Early Life Failure Rate Calculation Procedure for Semiconductor Components
product assurance capability
Education product assurance capability
Micro electro-mechanical systems
Education Micro electro-mechanical systems
Mechanical component reliability
Design Mechanical component reliability
Thermal cycling screen development
Design Thermal cycling screen development
Use of Failure Mechanisms enhance FMEA and FMECA
Education Use of Failure Mechanisms enhance FMEA and FMECA
Adaptive ESS
Technology Adaptive ESS
Acceleration Factor using norris landzberg equation
Technology Acceleration Factor using norris landzberg equation
Failure rate not inverse of MTBF always
Education Failure rate not inverse of MTBF always
Environmental stress screening
Education Environmental stress screening
Weibull analysis
Education Weibull analysis
Role of The Physics-of-Failure (PoF) Approach
Education Role of The Physics-of-Failure (PoF) Approach
Accelerated Stress Testing
Engineering Accelerated Stress Testing
Vibration before thermal cycling in ESS
Education Vibration before thermal cycling in ESS
Bit effectiveness
Education Bit effectiveness
Testability
Engineering Testability
Junction Temperature in a Pulse Power Application
Education Junction Temperature in a Pulse Power Application
Prognostic health management
Education Prognostic health management
Rating & uprating handbook
Education Rating & uprating handbook
Highly accelerated stress screening
Technology Highly accelerated stress screening
Quality & Reliability
Education Quality & Reliability