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The top documents tagged [testability dft]
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The Global Reorganization of Knowledge Work: The Rise of India and China
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VLSI Testing Lecture 10: DFT and Scan
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© 2009 Rockwell Collins, Inc. All rights reserved. From Paper Based Analysis to Model Based Analysis: Applications of AP 210 at Rockwell Collins April
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Béatrice Pradarelli / Laurent Latorre / Pascal Nouet
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