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The top documents tagged [fit failure]
Education
VLSI Test Technology & Reliabillity Module 1 introduction
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1 IEC 61508 – IEC 61511 Presentation Document last revised October 1st 2005 G.M. International Safety Inc. P.O. Box 25581 Garfield Heights, OH 44125 USA
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IEC 61508 – IEC 61511 Presentation G.M. International s.r.l Via San Fiorano, 70 20058 Villasanta (Milano) ITALY
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April 30, 2014 1 Cost efficient soft-error protection for ASICs Tuvia Liran; Ramon Chips Ltd.
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213 views