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The top documents tagged [device degradation]
Technology
Effect of mesh grid structure in reducing hot carrier effect of nmos device simulation
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Kobrin Nanoweb Metal Mesh
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Incorporating Reliability in SoC Flow
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Robust Low Power VLSI R obust L ow P ower VLSI Aatmesh Shrivastava Taniya Siddiqua Incorporating Reliability in SoC Flow
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