The top documents tagged [chip test architectures]

EE141 System-on-Chip Test Architectures Ch. 12 - FPGA Testing - P. 1 1 Chapter 12 Field Programmable Gate Array Testing
Documents EE141 System-on-Chip Test Architectures Ch. 12 - FPGA Testing - P. 1 1 Chapter 12 Field Programmable Gate Array Testing

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%%Chapter 13 MEMS Slides 110407
Documents %%Chapter 13 MEMS Slides 110407

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Feng-Xiang Huang MCORE Architecture implements Real-Time Debug Port based on Nexus Consortium Specification David Ruimy Gonzales Senior Member of Technical
Documents Feng-Xiang Huang MCORE Architecture implements Real-Time Debug Port based on Nexus Consortium Specification David Ruimy Gonzales Senior Member of Technical

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EE141 System-on-Chip Test Architectures Ch. 2 – Digital Test Architectures - P. 1 Chapter 2 Digital Test Architectures
Documents EE141 System-on-Chip Test Architectures Ch. 2 – Digital Test Architectures - P. 1 Chapter 2 Digital Test Architectures

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Built-In Self-Test and Calibration of Mixed-signal Devices Wei Jiang Ph.D. Dissertation Proposal June 11, 2009 Advisor: Vishwani D. Agrawal Committee Members:
Documents Built-In Self-Test and Calibration of Mixed-signal Devices Wei Jiang Ph.D. Dissertation Proposal June 11, 2009 Advisor: Vishwani D. Agrawal Committee Members:

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EE141 System-on-Chip Test Architectures Ch. 4 – SOC and NOC Testing - P. 1 1 Chapter 4 System/Network-on-Chip Test Architectures
Documents EE141 System-on-Chip Test Architectures Ch. 4 – SOC and NOC Testing - P. 1 1 Chapter 4 System/Network-on-Chip Test Architectures

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EE141 System-on-Chip Test Architectures Ch. 8 – Physical Failures - P. 1 1 Chapter 8 Coping with Physical Failures, Soft Errors, and Reliability Issues
Documents EE141 System-on-Chip Test Architectures Ch. 8 – Physical Failures - P. 1 1 Chapter 8 Coping with Physical Failures, Soft Errors, and Reliability Issues

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EE141 System-on-Chip Test Architectures Ch. 3 - Fault-Tolerant Design - P. 1 1 Chapter 3 Fault-Tolerant Design
Documents EE141 System-on-Chip Test Architectures Ch. 3 - Fault-Tolerant Design - P. 1 1 Chapter 3 Fault-Tolerant Design

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Built-in Adaptive Test and Calibration of DAC Wei Jiang and Vishwani D. Agrawal Electrical and Computer Engineering Auburn University, Auburn, AL 36849
Documents Built-in Adaptive Test and Calibration of DAC Wei Jiang and Vishwani D. Agrawal Electrical and Computer Engineering Auburn University, Auburn, AL 36849

219 views

EE141 System-on-Chip Test Architectures Ch. 7 – Low-Power Testing - P. 1 1 Chapter 7 Low-Power Testing
Documents EE141 System-on-Chip Test Architectures Ch. 7 – Low-Power Testing - P. 1 1 Chapter 7 Low-Power Testing

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EE141 System-on-Chip Test Architectures Ch. 14 – High-Speed I/O Interface - P. 1 1 Chapter 14 High-Speed I/O Interface
Documents EE141 System-on-Chip Test Architectures Ch. 14 – High-Speed I/O Interface - P. 1 1 Chapter 14 High-Speed I/O Interface

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Chapter 14
Documents Chapter 14

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