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The top documents tagged [agrawal bushnellvlsi]
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 161 Notation Neighborhood pattern sensitive fault algorithms Cache DRAM and ROM tests Memory
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 241 Lecture 24 Design for Testability (DFT): Partial-Scan & Scan Variations n Definition n Partial-scan
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