BENEFITS OF THIN FILM MEASUREMENT SYSTEMS By Bruce R. Robinson

Introduction Retired chairman of Belfort Instrument Co., Bruce R.

Robinson also oversaw corporate growth for SCIENTECH, Inc., and Utilipoint International, Inc. Bruce R. Robinson also continues as co-owner and Chairman of GAMMA Scientific Inc.

Manufacturing spectroradiometers, integrated sphere, and UDT instruments, GAMMA Scientific recently introduced its new Thin Film Measurement Systems at the Society of Vacuum Coaters TechCon in April 2015. At the Santa Clara Convention Center, attendees stopped by GAMMA Scientific’s booth to observe demonstrations of the technology, which expedites inspections and maximizes production line uptime.

GAMMA Scientific educated the public on the flexibility of the user interface, its ability to accommodate multilayer film stacks up to 10 micrometers, and the system’s wavelength range of 380 to 830 nanometers. Likewise, the technology leverages surface reflection to speed up the process of taking spectral gonioreflectance measurements. This eliminates the need to blacken or coarse grind the back side and cut samples to test. To learn more about the Thin Film Measurement Systems, visit www.gamma-sci.com.