www.zeiss.com/asb1detector
400 nm4 µm
ZEISS 1-Channel-AsB DetectorResolve Pure Material Contrast from Your Field Emission Scanning Electron Microscope (FE-SEM)
Higher Productivity and Versatility
• Faster image acquisition and through-
put for automated sample runs
• High long term and temperature
stability
• Clear, noise free imaging at low
accelerating voltages
• Expanded range of applications by
selecting the collection of high and
low angle BSE signals
• Detection of Rutherford Back-
scattered Electrons and Electron
Channeling Pattern to caracterize
crystalline samples
Increase productivity and improve the image quality of your FE-SEM by retrofitting
the new 1-Channel Angle selective Backscattered (AsB) Detector. Benefit from
the high speed and increased sensitivity thanks to improved detector and electronics
design. The new detector builds on the proven detection scheme of Angle selective
Backscatter (AsB) Detector and is available for ZEISS SUPRA, ULTRA and 15×× systems.
Ease of Use
• Complete integration into the pole
piece, no need to move in and out
• Plug and play technology
• No alignment to optical axis necessary
• Safe Navigation prevents samples
and stage from damaging detector
• Seamless integration of software
packages (e.g. SmartPI) in the
workflow
Higher Sensitivity and Resolution
• Higher material, topographical and
channeling contrast
• Reduced noise and improved reso-
lution compared to standard Solid
State Backscattered Detector (BSD)
• Increased signal-to-noise ratio
thanks to improved diodes and
electronics
• Better separation of particles from
bulk due to greater sensitivity at
lower accelerating voltagesEN
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