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XAFS:Study of the local structure
around an X-ray absorbing atom
(1) Principle of XAFS(2) Instrumentation(3) XAFS spectral analysis(4) XAFS applications(5) New directions of XAFS
T.Ohta, Univ.Tokyo, Japan
(1) Principle of XAFS
X-ray
Diffracted X-rays
Photoelectrons
Transmitted X-rays
Diffracted X-rays
Scattered X-rays
Fluorescent X-rays
Desorbed ions
Phenomena caused by X-ray irradiation
1.4 1.0 0.6 0.2波長
L3L2
L1
K
X-ray absorption spectrum from Pt foil
wavelength
XAFSX-ray Absorption Fine Structure :Local electronic and geometric structures around
the x-ray absorbing atom
Abso
rptio
n C
oeffi
cien
t
Photon Energy
NEXAFS EXAFS
Threshold
30-50 eV 50 - 1000 eV
XAFS spectrum from an atom
XAFS spectrum from a diatomic molecule
X-ray absorption: Fermi’s Golden Rule
( )fae EirefN
cρ
ωπµ
2224⋅=
i: wave function of the initial state 1sf: wave function of the final state
superposition of the ejected wave and back-scattered waves
( )0
0
µµµ
χ−
=k EXAFS function
[ ]
( ) ( )222 2exp)2exp(
),(
)(22sin)()(
krkr
kfNkA
kkrkAk
jj
jj
jjj
j
σλπ
δχ
−−=
+= ∑Point atom, plane wave, and single scattering approximations
( ) ( ) ( )iii
i kRkAk φχ += ∑ 2sin
EXAFS oscillation
( )hh
02 EEmpk−
==
Ri:bond distance
Phase shiftφi
R
Phase shift
( ) ( ) ( )iii
i kRkAk φχ += ∑ 2sin
-6.0
-2.0
2.0
6.0
10.0
14.0
4 6 8 10 12 14 16
Pb
SnGe
SiC
Phase shift of the X-ray absorbing atom
k/A-1
( ) ( ) ( )
−−=
λσ i
iii
ii
RkkF
kRN
kA 2exp2exp22
2
*
EXAFS amplitudeEffective Coordi-nation number
Back scatteringamplitude
Debye-Wallerfactor
Electron meanfree path
5 10 15k(A-1)
Backscattering Amplitude F(k)
0.0
0.2
0.4
0.6
0.8
1.0
1.2
F(k)
CSi
Ge
Sn
Pb
( ) ( ) ( )
−−=
λσ i
iii
ii
RkkF
kRN
kA 2exp2exp22
2
*
EXAFS amplitude
Effective Coordi-nation number
Back scatteringamplitude
Debye-Wallerfactor
Electron meanfree path
High coordination numberLow temperature
High Z scatterer Short distance
Au K-EXAFS of Au foil
278K
77K
EXAFS oscillation of Au K-edge
77K
278K
Photon Energy
If the coordination number decreases,
Photon Energy
If the bond distance increases,
(2) Instrumentation
monochromatorIo I
sample
Data processing
X-rays
Ion chamber
《transmission method》
Experimental method of XAFS
X-ray escape depth>1000A
Electron escapedepth <50 A
FluorescentX-rays
Secondary electron
photoelectronAuger electron
sampleX -ray
Ionization chamber
Filter and solar slit
Fluorescence
Absorption
Cu K-XAFS of CuSO4 10mMol aq. solution
Transmission Fluorescence
0.5 mmfilm
6µm film
Partial electron yield x-ray absorption of surface atoms
Total electron yield
Photon energy
Sample leak current
Partial electron yield
(3) XAF S spectral analysis
R+ φ
Fourier transform
Am
plitu
deEX
AFS
func
tion
Back Fourier Transformation
k
Amplitude Envelope
Kind of scattererCoordina-tion number
Polarization
Direction ofBond, Adsorp-Tion site
Temperature
Bond stiffness
EXA
FS fu
nctio
n
E
Polarization Dependent EXAFSK-absorption(1s p-like continuum)
Polarization Dependent EXAFSK-absorption(1s p-like continuum)
Temperature dependence
[ ])(22sin)()( kkrkAk jjj
j δχ += ∑
( ) ( )222 2exp)2exp(
),(kr
krkfN
kA jj
jj σλ
π−−=
( ) ( )[ ]22
122
1
2 2),(),(
ln TTkTkATkA
σσ −≅
( ) ( )[ ]22
122
1
2 2),(),(ln TTk
TkATkA
σσ −≅
c-As
Determination of σ2(T)
What can we get from σ2(T)
u0
u0 ui
Ri
R0 Ri
O
( )[ ]( ) ( ) ( ) ( )iiiiii
iii
RuRuRuRu
Ruurvrr
r
⋅⋅⋅+⋅+⋅=
⋅−=
02
02
20
2
2
σ
0
0
RRRRR
i
ii −
−=
r
( )
=
kTT
Ei 2
coth2
2 ωµω
σ hh
−
=
12
2
2coth
2coth
2 kTkTEi
ωωµω
σ hhh
Einstein model
22EE cf µω=
Einstein frequency
c-AsAs-As: 216 cm-1
a-AsAs-As: 234 cm-1
c-As2S3As-S: 332 cm-1
g-As2S3As-S: 330 cm-1
c-As4S4As-As: 222 cm-1As-S : 342 cm-1
Data acquisition
Determine E0 , Convert from eV to k
Background subtraction and normalization
Multiply kn
Fourier transformation
Fourier filtering
Back Fourier transformationCurve fitting in real space
Model structure
X-ray energy(eV) EXAFS χ(k)
Atomic distance(Å) EXAFS χ(k)
EXAF
S χ k (wave number)
EXAFS analysis-1
Ampl
itude
Distance r=r+i iφ
( ) ( ) ( )iii
i krkAk φχ += ∑ 2sin
Phase shift
Atomic distance
amplitude
1st nearest
2nd nearest
3rd nearest
Fourier transformation
EXAF
S χ k (wave number)
EXAFS analysis-2
Effective CoordinationNumber
Debye-Wallerfactor
Backscatteringamplitude
Direction ofchemicalbond
PairPotentialFunction
Kind ofscatteringatom
Limitation and Improvement of XAFS theory
• Multiple scattering effectwhich is enhanced at XANES region and also at longer distance above 3 A.
FEFF program developed by J.Rehr can be used for spectral simulation.
Shadowing effectnegligible
Non-negligible
+−+
−+−=
+= ∑
∞
=
LL 33
44
222
22
34),(2sin
322exp),(
!)2(2exp),(Im)(
kCkRkkRkCkCkRkFkRN
CnikikRkRkf
kRNk
effeff
nn
n
eff
φ
χ
>=< rR
>−=< 22 )( RrC >−=< 3
3 )( RrC22
44 3)( CRrC −>−=<
Limitation and Improvement of XAFS theory•Vibrational anharmonicity
The formula assumes a Gussian distribution.Cumulant expansion method has been developed to takeinto the anharmonicity,
which gives the information of real bond distance, thermal expansion coefficients, radial distribution curve.
where
(4) XAFS applications• Catalysis• Amorphous systems• Material physics(High Tc, CMR,….)• Magnetic materials XMCD• Thin films and Surface science • Environmental science • Biological materials
(5) Challenge of XAFS
• Time-resolved XAFS spectroscopy
• Micro XAFS or Nano XAFS
Summary--Features of XAFS• Applicable to any phase (amorphous, liquid, gas),
surface/interface and biomaterials• Measurable under various conditions
under high pressure, gaseous atmosphere, for real catalysis
• Polarization dependence direction of the bond• Temperature dependence strength of any
specific bond • Combined with microbeam local structure of a
local area• Pump-probe experiment dynamics of local
structure